Teradyne, Inc.
Teradyne tests and helps build the world’s most innovative products. Our leading-edge testers make sure that new products work right the first time, every time. And our robotics portfolio helps manufacturers to develop and deliver new products quickly, efficiently and cost-effectively.
- +1 800-837-2396
978 370-2700 - 978 370-1100
- customercare@teradyne.com
- 600 Riverpark Drive
North Reading, MA 01864
United States of America
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Product
Memory Test Software
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Teradyne’s customers count on us for our Near Device Under Test (DUT) technology that gives memory device manufacturers a guaranteed performance advantage. A brief description of dynamic memory and storage memory devices will highlight why device manufacturers depend on Teradyne’s memory test solutions.
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Product
5G Testing
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Teradyne test solutions are at the forefront of the 5G test era. Why? We work with the leading semiconductor manufacturers and provide optimized test coverage for the major wireless standards. From emerging millimeter wave devices to the traditional sub-6GHz, our test solutions are already leading the way.
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Product
In-Circuit Test
TestStation LH
Test System
The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family.
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Product
Portable, Integrated O-Level Test Platform
Guardian™
Test Platform
Guardian is a ruggedized automated testing platform that quickly and accurately verifies the operational readiness of complex electronics systems in aircraft, ships, and vehicles.
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Product
Asynchronous System Level Test Platform
Titan
Test Platform
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Product
Digital Test Instrumentation
EDigital-Series™
Test Instrument
Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
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Product
Digital and Mixed-Signal Test Solutions
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A digital device processes electronic signals that represent either a one (on) or a zero (off). The ‘ones’ and ‘zeros’ represent data. Each one or zero is referred to as a bit and a group of 8 bits equals a byte
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Product
Digital Test Instrumentation
Di-Series™
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The Di-Series tests all levels of integration from board level (SRA/SRU) to box level (WRA/LRU) units under test (UUTs), while maintaining full compatibility with previous generations of Teradyne instrumentation and systems. Excellent usability and reliability reduce programming and support effort, as well as straightforward upgrades of existing test program sets (TPS).
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Product
TestStation Rackmount
TSR
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TestStation Rackmount (TSR) is designed for easy integration into high-volume automated manufacturing lines. This solution is a collection of specifically designed hardware modules that can be easily integrated into standard or custom automation handling equipment.
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Product
Functional Test System Optimized For Real-Time Digital Bus Test
Spectrum HS
Test System
Spectrum HS is Teradyne’s fully integrated functional test system. Optimized for real-time test of low latency buses, it’s a high-performance system delivering excellent test coverage of current and future products.
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Product
Disk Drive Test System
Saturn
Test System
The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
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Product
Automotive Production Board Test
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Teradyne's TestStation platform enables manufacturers to easily react to rapidly changing product requirements. From volume, mix and test complexity - there is a TestStation configuration to meet your production requirements at the highest fault coverage and yield rate. configurable from a range of a few test points for basic shorts detection up to more than 15,000 test points for more complex PCBAs.
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Product
Scalable Test Solution for Mixed-Technology Test Applications
Spectrum RF Systems
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The Spectrum RF Systems are fully integrated, configurable test platforms combining several digital, analog, RF, and switching instruments to provide automated functional test solutions for a wide range of mixed-signal and microwave test applications including radars, Electronic Warfare, missile, and satellite communications.
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Product
High-Speed Digital Bus Test Instruments
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Teradyne and AIT instruments test legacy and newer digital buses.The enormous variety of digital buses used in defense and aerospace applications requires comprehensive, yet efficient testing.Teradyne and AIT COTS instruments meet these challenging bus test requirements for legacy and standardized buses, as well as evolving digital buses that have faster speeds, larger data volumes, and increasingly complex protocols requiring real-time test and emulation.
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Product
Integrated Solution for Digital Switching & Fiber Optics Operational Verification
VERTA
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When incorporated into defense/aerospace ATE, Verta enables reliable, error-free bus communication and interoperability tests to verify performance of high-speed, optically networked military weapon assemblies.

















