Test Electronics
Manufacturers of Electronic Test Equipment, Bed of Nails Test Fixtures, Solder Pallets, and Production Assembly Fixtures
- 831 763 2000
- 909.498.8709
- 821 Smith Road
Watsonville, CA 95076
United States of America
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Product
GPIB Controlled Signal Routing Box
3000GPIB
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Test Electronics will customize the TE3000 GPIB signal routing box for your test application. Then, you simply rack and stack all the equipment, cable all the switched signals to the back of this GPIB box, add a rack mount computer, plug in the National Instruments GPIB board and software. Then run your customized GPIB based test system.
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Product
Heavy Board & Heavy Board
Protector Lever Actuated Clamshell
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Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.
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Product
Insert Based Design & Insert Based Design
Prober Production Clamshell
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Production volume test fixture with swappable test plates, front and rear panel inlays, and multi-testing compatibility with process carrier pallets. Swappable test plates provide the ability for one fixture base to support a variety of units under test. Interchangeable front and rear panel inserts provide further customization. Interoperability with process carrier pallets provide multiple board testing capabilities, panelized testing, and flex circuit testing. A selection of interfaces to general testing equipment provide for a wide selection of customized testing features.
