Pulse Instruments
Pulse Instruments is a leading manufacturer of systems and equipment for characterization and production test of CMOS, CCD and IR image sensors, including science-grade devices. Science teams have used Pulse Instruments systems to extract maximum performance from several HST CCDs, including the chip in the most recently installed Advanced Camera System that is providing 10x the performance of its predecessor.
- (310) 515-5330
- sales@pulseinstruments.com
- 22301 S. Western Ave.
#107,
Torrance, CA 90501
United States of America
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Product
Mainframes
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Our CompactPCI series mainframes are industry-standard, open-architecture chassis with enhancements to support Pulse Instruments' clock driver and DC bias cards. The enhancements are transparent to the CompactPCI specification, and 3rd-party cards CompactPCI/PXI cards can be used in our mainframes without hardware or software modification*.
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Product
Dual Channel, Low-Noise DC Bias Card
PI-41701
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The PI-41701 is a dual channel bipolar DC Bias supply that can provide an output current up to 100 mA per channel. The output voltage ranges from –8 V to +8 V and features programmable current limits with LED indicators and software interrupt to show/alert the user if the channel is in current limit. This card has special filter circuitry to reduce the output noise for those applications that require a low noise bias output.
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Product
Dual Channel Driver Card
42460
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Two channels of 32 MHz clock drivers with up to 20 volt amplitude. The output voltage range is ±20 V, with independent high and low voltage settings. The inputs to the Card can be optically isolated. The card also contains voltage and current sense capability, which allows muxing of the current or voltage output measurements from all the Driver Channels in the system to a single DVM. The card allows independent programming of the rise and fall time of each channel one nanosecond increments.
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Product
Dual Channel Clock Driver Card
PI-41400
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The PI-41400 is a dual channel Clock Driver card capable of operating up to 190 MHz into a 50-ohm load and up to 80 MHz at an amplitude of 8 volts into a 1-megohm load. Into a high impedance load the output voltage range is from a –3 volts to 8 volts with the output pulse amplitude ranging from 0.5 V to 9 V. When driving a 50 load the voltage range is –1.5 volts to 4.5 volts with the output pulse amplitude ranging from 0.25 V to 4.5 V. The rise and fall times of the output pulse are variable from 1.2 ns to 9 ns into a 50-ohm load and <5 ns to 9 ns into a HiZ load. The output pulse amplitude and the load being driven determine the range of variability. The driver output can be set for tri-state operation and the output polarity can be set for ‘Normal’ or ‘Inverted’ operation through software.
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Product
Characterization System
System 7700
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Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
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Product
Dual Channel Tri-Level Driver Card
40465
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Two channels of 10MHz drivers, that can be operated as standard Two-Level Drivers or operated as two channels of Tri-Level Drivers. In the Two-Level mode, the input to each driver channel requires one channel of TTL level timing. Tri-and four level modes require a second clock input. In the Tri-Level Mode, the output from lowest rail to high rail can be 18.5V. Like the 40460 the rise and fall time as well as the high and low voltage levels of each channel is programmable.
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Product
Software
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Test and Control Software is also available for several of our products. All of our software is designed by Pulse Instruments for optimum flexibility and control. Please fill out the following form to request an evaluation copy.
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Product
Low-Noise DC Bias
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Imaging devices, such as CCDs, IR FPAs, and CMOS image sensors, require DC bias with very low electrical noise to prevent contamination of the image. Image quality can also be enhanced by carefully tuning each bias voltage to extract the maximum signal/noise ratio out of an array. Pulse Instruments has decades of experience providing DC bias supplies with the flexibility required tocharacterize and test a variety of devices while maintaining the noise immunity required for satellite and astronomy applications.
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Product
Pulse Instruments Data Acquisition and Test Software
PI-DATS
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PI-DATS is Pulse Instruments Data Acquisition and Test Software, our user-friendly system software that allows complete control over Pulse Instruments test systems and test equipment. PI-DATS can dramatically increase your testing productivity by decreasing the amount of time it takes to set up and change test plans.
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Product
Visible / Infrared / Imaging Test System
System 1808
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Testing Low-voltage CCDs and IR FPAs; Military, science-grade and medical CCDs or IR FPAs; CMOS ROICs and multiplexers; CMOS sensors. Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
