TESEC, INC
TESEC Corporation has established a firm position of leadership in the semiconductor equipment industry due to our original, state of the art handling and test technology coupled with our long business history. We offer automated handlers and test systems, which play an important role in the manufacturing of high quality and performance semiconductor products.
- 1-310-817-4904
- 1-310-817-4914
- 1225 W. 190th Street
Suite 350
Gardena, CA 90248
United States of America
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product
MEMS Handler
4664-IH
The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
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product
Gravity Handler
State of the art model, which features a high throughput capability, eight sites, and high and low temperature measurements, and meets all high-frequence contact requirements. Complete measures to prevent jamming and lead deformation enable high availability. This model is highly regarded by top users around the world because of its high throughput and high reliability.
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product
Inductive Load Tester
4602-LV
There is a tendency that MOSFET has Low On Resistance so that it demands that Inductive Load Tester to have higher forcing current for measurement. The forcing current is limited by forcing voltage with previous test method. Thus it becomes difficult to test this kind of middle power range devices.
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product
Die Sorter Handler
4605-HTR
4605-HTR is a MAP Sorter which picks up devices from wafer ring and sorts to tape or bin according to the MAP file created by film frame test handler or prober. 4605-HTR is a high speed handling system, available for 12 inches wafer rings. When used in combination with 4170-IH, 4605-HTR much improves efficiency in testing process of leadless devices as a high speed sorting machine.
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product
Dynamic Test System
3430-SW
The Dynamic Test System 3430-SW measures dynamic characteristics of IGBT/MOSFET devices at high speed. Maximum of 4 parallel measurement is available by connecting the 3430-SW mainframe test stations for each test items ( normal 2stations). One PC controls the whole system.
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product
Film Frame Test Handler
4170-IH
High throughput ・High withstand load, and high thrust table ・Expansion of the strip attachment area ：260(L) X 300(W) [Withinφ300mm for WLCSP]・LOT control by barcode/2D code reader ・Easy device type exchange only test socket and display screen setting・Auto-cleaning function unit is installed to clean the socket at any desired timing.・8/12 inches ring conversion ・S2/S8 regulation compliance・SEMI G85 compliance・SECS/GEM compliance
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product
Discrete Device Test System
capability to perform parallel testing of power discrete devices. As the standard specifications of mainframe, 341-TT/P has 1.2kV/20A and 351-TT/P has 2kV/50A capabilities. These systems have 2 testing subsystems, each of which has 4-station capability by multiplexing to 4 handler/prober stations for high volume production testing.
