Integrated Technology Corp.
We provide solutions for metrology, testing and OEM equipment requirements in many areas: Test, analysis, and repair of IC probe cards; Innovative metrology and inspection solutions for industry; Solutions for dynamic testing of power semiconductors; Numerous OEM Electronic Controls.
- 480-968-3459
- 480-968-3099
- sales@inttechcorp.com
- 1228 North Stadem Drive
Tempe, AZ 85281
United States of America
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Product
Probe Card Analyzers
PB3600
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The PB3600 provides the latest techniques in testing and maintaining probe cards. Designed through joint development with many of the world’s largest semiconductor and probe card manufacturers, ITC has produced an ergonomic analyzer with the greatest measurement resolution, highest throughput, most flexibility and still made it easy to use.
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Product
Test System Mainframe
ITC59000
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The ITC59000 Test Platform is a desktop DynamicParametric Test System mainframe. The ITC59000Test Platform accepts up to four Test MeasurementUnits (TMUs) that perform transient measurements onsemiconductor devices such as power MOSFETs,IGBTs, and diodes.
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Product
Probe Card Analyzers
PB6500
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The Probilt PB6500 has many features that make it the ideal analyzer for all probe card technologies, including the latest probe tip geometries being used to test leading edge semiconductor devices. Its excellent electrical measurement capability and the ability to drive relays on any channel make it the best tool for probe cards with complex circuits and relays on the PCB.
