Integrated Technology Corp.
We provide solutions for metrology, testing and OEM equipment requirements in many areas: Test, analysis, and repair of IC probe cards; Innovative metrology and inspection solutions for industry; Solutions for dynamic testing of power semiconductors; Numerous OEM Electronic Controls.
- 480-968-3459
- 480-968-3099
- sales@inttechcorp.com
- 1228 North Stadem Drive
Tempe, AZ 85281
United States of America
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Product
Unclamped Inductive Load Tester
ITC75100
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The ITC75100 is an enhanced unclamped inductive load (UIL) test system that builds on the success of ITC’s industry leading ITC55 series of testers by adding additional test and measurement capability.
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Product
Test System
ITC57300
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The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Product
Probilt™ Probe Card Analyzers
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ITC has a complete range of probe card metrology products that address all probe technologies, probe card sizes and probe counts.
