Olympus Corp.
Manufacture and sales of precision machineries and instruments.
- (81) 3-3340-2111
- Shinjuku Monolith, 3-1 Nishi-Shinjuku
2-chome
Shinjuku-ku, Tokyo 163-0914
Japan
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Portable Flaw Detector
EPOCH 6LT
Portable and easy to use, the EPOCH 6LT flaw detector is an ergonomic, rugged instrument that delivers user comfort and more uptime. Weighs just 1.95 pounds (890 g) with a grip-oriented weight distribution for one-handed operation with minimal wrist fatigue. Rotary knob and simple button design make it easy to use, even when wearing gloves. Engineered to IP65/67 and drop tested. Clear, bright screen for readable A-scans in any light. The EPOCH 6LT flaw detector’s workflow is simple and straightforward. Despite the instrument’s small size, it has the features and functions to meet the requirements of nearly any conventional ultrasonic inspection application.
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Videoscope
IPLEX G Lite
The IPLEX G Lite industrial videoscope packs powerful imaging capabilities into a small, rugged body. Lightweight and able to go almost anywhere, users working in challenging applications have a remote visual inspection tool with the image quality and ease of use to get the job done.
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Portable XRD System
TERRA
The TERRA Mobile XRD System, a high performing, completely contained, battery operated, closed-beam portable XRD, provides full phase ID of major, minor and trace components with a qualitative XRF scan of elements Ca - U. Its unique, minimal sample prep technique and sample chamber allow for fast, in-field analysis.
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Ultrasonic Thickness Gage
27MG
The Olympus 27MG is an affordable ultrasonic thickness gage designed to make accurate, measurements from one side on internally corroded or eroded metal pipes, tanks, and other equipment. It weighs only 12 oz. (340 g) and is ergonomically designed for easy, one-hand operation. Thickness range 0.50 mm to 635 mm (0.020 in. to 25.0 in.) depending on material, transducer, surface conditions, temperature.
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Cleanliness Inspection System / Microscope
CIX90
The OLYMPUS CIX90 technical cleanliness inspection system is a dedicated, turnkey solution for manufacturers who maintain high quality standards for the cleanliness of manufactured components. The OLYMPUS CIX90 system makes it easy to quickly acquire, process, and document technical cleanliness inspection data to comply with international standards. The system is intuitively designed to guide users through each step of the process so that even novice inspectors can acquire important cleanliness data quickly and easily.
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Mining and Geochemistry Handheld XRF Analyzer
DELTA Mining & Geochemistry Handheld XRF Analyzers provide immediate results to help determine the next course of action for the entire process - exploration, ore grade/process control, environmental sustainability. On-site detection of metals, minerals & contaminants. GPS-GIS-XRF for instant metal mapping, time, cost savings
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Process XRF Analyzer
X-STREAM
The X-STREAM and X-STREAM: Glass are high-speed, automated sorting systems for automatic identification and sorting of material by chemical composition. Take metal, glass and mineral recycling to a new level of high speed, accuracy and profitability.
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Normal Incidence Shear Wave Transducers
Single element normal incidence Shear Wave Transducers contact transducers introduce shear waves directly into the test piece without the use of refracted wave mode conversion. We recommend the use of our SWC shear wave couplant for general purpose testing.
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Inverted Metallurgical Microscope
GX53
Designed for use in the steel, automotive, electronics, and other manufacturing industries, the GX53 microscope delivers crisp images that can be difficult to capture using conventional microscopy observation methods. When combined with OLYMPUS Stream image analysis software, the microscope streamlines the inspection process from observation to image analysis and reporting.
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Semiconductor & Flat Panel Display Inspection Microscopes
MX63 / MX63L
The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables you to choose the components you need to tailor the system to your application. These ergonomic and user-friendly microscopes help increase throughput while keeping inspectors comfortable while they do their work. Combined with OLYMPUS Stream image analysis software, your entire workflow, from observation to report creation, can be simplified.
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Laser Scanning Microscopes
The Olympus FLUOVIEW confocal microscopes are designed for high-resolution, confocal observation of both fixed and living cells, enabling visualization deep within samples. From the New FV3000, optimized for the most robust interactive live cell and tissue experiments, to easy-to-use high content imaging, explore the wide range of options with Olympus exclusive optical technologies.
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Micro Spectrophotometer
USPM-RU III
The USPM-RU III is a reflectometer that provides highly accurate spectral reflectivity measurements of small, curved, and thin samples without interference from rear surface-reflected light. The curved surface of the lens can be measured from a minute spot as small as ø60 µm formed on the sample surface. This provides the ability to use a goniometer to examine even the curved side lenses or other optical component.
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Portable XRF Analyzer
GoldXpert
XRF is a widely used, proven, and accepted method of chemistry analysis and determination of purity and fineness of precious metals. XRF analysis is a multielemental testing alternative that is quicker and less expensive than fire assay and chemical tests. XRF provides on-the-spot analysis of your silver, platinum, and PGM metals and impurities, making it an easy way to boost customer confidence and ensure dealer reliability.
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Benchtop XRD System
BTX
The BTX Benchtop XRD System is a fast, low cost, small footprint, benchtop XRD for full phase ID of major, minor and trace components and quick XRF scan of elements Ca – U. Its unique, minimal sample prep technique and sample chamber allow for fast, benchtop analysis rivaling the performance of large costly lab units.
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Deep Ultraviolet Observation System for Microscope
U-UVF248
Model Capable of High-magnification/High-contrast Deep Ultraviolet (DUV) Observation. A Semiconductor / FPD Inspection Microscopes.
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