Electronic Components Test
Parameters to be measured (absolute value): Measure hypo-class U, Iout, Hz, Hc, Br, Bm, Hm, Br /Bm, m, magnetic core loss, B-H curve, U curve and I curve Output capacity of the high frequency power: Uout: 1~300V, Iout: 0.05~5A, Pout: 300VA, frequency: 10~300kHz Accuracy: 2% With 12-bit high-speed A/D, sampling rate up to 40MHz, ensuring data precise and stable test result Supermaximal database, suitable for almost all kinds of magnetic material in market, such as: circle, E ,U , ETD-EER, JAR, RM , EP , PM , EL , ER, PQ, EFD, plane E, etc Perfect software interface enables observation of curve in detail Meet international test requirements for magnetic particle ASTM E1444, ASTM E709-08.
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Product
Magnetic Material Analyzer
UI9730
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Parameters to be measured (absolute value): Measure hypo-class U, Iout, Hz, Hc, Br, Bm, Hm, Br /Bm, μm, magnetic core loss, B-H curve, U curve and I curve• Output capacity of the high frequency power: Uout: 1~300V, Iout: 0.05~5A, Pout: 300VA, frequency: 10~300kHz
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Product
Electrolytic Capacitor Tester
HF2686C
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Test voltage: 0-200V/0-500V• Output current range: 0.1μA-30mA• Maximum charge current: 200mA ±10%• Charge time: 0.5s/1s/2s/3s/4s/5s/7s/10s/30s/60s• Accuracy: ±2%
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Product
DC Bias Current Source
FD1772B
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• Constant DC output 0-6A• Auto or manual current sweep output• 5 current range output• Output voltage range: 0-11.5V• Current accuracy ± (1%reading + 2digit)
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Product
LCR Digital Bridge
FD2810B
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• Test parameter: C, R, L, Z, D, Q• Test frequency: 100Hz, 120Hz, 1kHz, 10kHz• Test level range: 0.1V, 0.3V, 1.0V• Output impedance: 30Ω, 100Ω• Slow or fast (15 times/s)• Automatic selecting, out of limit alarming• Provide the RS-232 & HANDLER interface• Accuracy: 0.1%
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Product
Magnetic Core Selector
UI9702
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• Measure relative value of μm, Bs, Br, Hc integrated factor• No need of wiring, direct testing, being convenient• Automatic selecting, out of limit alarming, freely setting of the selecting limit• Driving current for test: 0-2A, frequency for test: 20-50kHz, both continuously adjustable, Comply with actual working situation of electronic ballast• No need of adjusting the instrument every day• Digital display, easy to read, simply and quickly to operate• Print B-H curve
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Product
MOS Transistor Selector
UI9610
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MOS with superior performance has now been widely used in electronic ballasts, energy-saving lamps were. But power MOS test screening, matching problem. It is difficult due to a lack of corresponding inspection means that many enterprises do not have to engage seriously in quality control as well as the effect of product consistence and reliability. The equipment in a unique program designed to solve the power MOS test problem containing micro-processing, intelligent a few significant simple application.
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Product
Thermal Sensitive Parameter Selector
UI9600
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Parameter measured under normal temperature:1) β (0-99)2) Switching time T (0.01μs-99.9μs), including Tr, Ts, Tf3) VCES (0-2V), VBE (0-2V)4) Leakage current ICEO (0.01μA-99.9mA)5) Withstand voltage BVCEO (50V-650V)• Parameter measured under high temperature: VBE, β, ICEO
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Product
Multi-Functional Selector
UI9600A
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How to test a transistor with digital transistor selection tool? Please check the belowing Transistor’s Multi-Functional Selector measurement.
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Product
MOS Transistor Selector
UI9611
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Measure parameters: Open voltage UGS (th), internal resistance RDS, Transconductance gm, Withstand voltage V (BR) DS• Test range: UGS (th) 0.1-9.9V; RDS 0.001-9.999Ω gm; 0.10-10.00s; V (BR) DS 50-650V• Test current range: 0.1A-5A adjustable, comply with different working situation• Automatic selecting, out of limit alarming, advance the work efficiency• The technique of testing RDS under the big-current, is advanced technique
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Product
Current Transformer Tester
HTCT-300
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Full-featured, can not only satisfy various CT (eg: protection, measurement and TP category) but also PT type electromagnetic unit for its excitation characteristics (ie voltage current characteristics), ratio, polarity, secondary winding resistance, secondary load, ratio deviation, angle deviation and other test requirements.
