Electron Spectroscopy for Chemical Analysis
determine the atomic composition of a surface.
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Programmable DC Electronic Load
IT8500+ Series
IT8500+series (150W~3000W) single-channel programmable DC electronic loads are designed for middle & high-end applications. They can be offered as multiple solutions according to customer's design and testing requirements.
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High Power Beam Analysis
The advantages of fiber lasers are their high power, mechanical stability and good beam quality; however beam quality and beam profile has to be periodically checked. In general, there are many difficulties in checking beam quality especially at the focal point, where densities will exceed 50KWatt per square cm. On one hand those energies are capable of melting and destroying most known materials, while on the other hand measuring a focused profile is the most significant measurement.
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Sensor Scene Modeling and Analysis Software
INSSITE
INSSITE is a sensor scene modeling and analysis environment. Different sensor types and modalities, spanning radar (synthetic aperture radar [SAR], ground moving target indicator [GMTI], detection and ranging, radio frequency [RF] communications), visible/infrared (passive electro-optical/infrared [EO/IR], laser radar [ladar], thermal IR), can be evaluated against high fidelity scenarios constructed by the user.
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Electron Microscope Analyzer
QUANTAX EBSD
QUANTAX EBSD system, with its popular OPTIMUS 2 detector head, is the best available solution for analyzing nanomaterials in the SEM
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Pro Antenna Analysis Software
MININEC
MININEC Pro is an antenna analysis program for Windows and Macintosh computers. Any type of antenna may be analyzed. The physical design of the antenna is entered (such as the lengths of wires and elements). For a given frequency, the feedpoint impedance is calculated, along with theoretical efficiency.
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VUV PIONA+ Analysis
This high-speed gasoline PIONA analyzer is compliant with ASTM D8071. It supports simultaneous analysis of PIONA compounds, specific oxygenated compounds, and BTEX in gasoline, and can quickly analyze samples within 30 minutes by classifying compounds based on VUV absorption spectra. The simple system configuration provides broad applicability, including analyzing other petroleum products.
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Thermal Imaging System for Electronics Testing
ETS320
Whether the goal is product testing or scientific research, heat can be an important indicator of how a system is functioning. The FLIR ETS320 is a non-contact thermal measurement system that pairs a high-sensitivity infrared camera with an integrated stand, for hands-free measurement of printed circuit boards and other small electronics.
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High Current Electronic Load (600W-1200W)
ELCH600 & ELCH1200
- Low lead resistance <5m Ohm for Fuel-cell- Battery Testing- VFD display- High resolution 0.1mA/1mV- Voltage range 0V to 500V- Working mode CV/CC/CW/CR- OV/OC/OP/OT protection- Communication: USB/RS232/GPIB
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Vibration Analysis
The vibration analysis software WaveImage includes a full set of methods providing an accurate and detailed overview of your vibration measurement data. This gives you a clear understanding of the cause-and-effect relationships between specific excitations and their vibrational response. Create a simple geometry model of your structure and link your multi-channel measurement data to the points in the geometry where the data was recorded. Then visualize the dynamic deformation of the structure under specific operating conditions with a detailed animation.
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Electronical Load Board 3U VME64x (air cooled)
056-921
The 3U load boards are designed to simulate the power consumption of a single board computer and other boards on the backplane.
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Impact Analysis
MetaDex™
Allows you to instantly see the impact of any changing data object or application on all downstream objects and applications.
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Surface Analysis
Innova-IRIS
This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.
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Electronic Dmm Test Lead Kit For Hand-Held Meters
5543B
Electronic DMM test lead kit for hand-held meters. Test leads with a right angle banana plug are ideal for use with hand held digital multimeter. Flexible test leads feature high strand count silicone wire for extreme flexibility and high temperature resistance.
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ELM Electronic Load Module
Circuit breakers are often overlooked during maintenance of electrical systems in aircraft, or often only verified for open and closed states. To test the true functional purpose of a circuit breaker it requires the application of current in excess of the rated trip value and then measure the time for the breaker to actually trip. This is the only way to verify that a circuit breaker will react as designed if an electrical failure occurs.
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Multiport Electronic Calibration Module (ECal), DC To 9 GHz, 6-ports
N7562A
A series of multiport ECal that cascade-able up to 36-ports which makes it possible to calibrate a wide frequency range from DC up to 9 GHz without making numerous connections during calibration process. Ideal for multiport measurement application with VNA in such as high-volume PA/FEM, massive MIMO antenna or high-speed digital interconnect test applications
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Electronic DC Load, 80V, 80A, 400W With/without Remote Interfaces
LD400 Series
Versatile solution for testing dc power sourcesConstant current, resistance, conductance, voltage and power modesWide voltage and current range, 0 to 80V and 0 to 80A400 watts continuous dissipation at 28°C (360W at 40°C)600 watts short-term dissipation (up to 60 seconds)Low minimum operating voltage of <1V at 40AHigh resolution and accuracy for level settingBuilt-in transient generator with variable slewCurrent monitor output for waveform viewingVariable drop-out voltage for battery testingHigh resolution backlit graphic LCD with soft key controlAnalogue remote control of levels and TTL control of on/off and transient switchingFront and rear input terminals (front terminals 30A max.)Full bus control via USB, RS232 and LXI compliant LAN interfaces (LD400P)GPIB option (LD400P only)
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Load Cell Electronics
All our electronics are continuously evolving to feature faster and more powerful components. This commitment to innovation ensures that we can meet any new challenge or application.
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Electronic Tensile Tester
QT-ETT
QT-ETT tensile testing equipments are specially designed considering tensile testing requirements for flexible materials that are commonly used in product packaging to study different properties of materials. This instrument utilizes Qualitest's latest embedded control system and operating software, with user-friendly operating interface and intelligent data management system.
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92 Electronics Applications
Electronics Engineering Apps. PRO.
Electronics Engineering Apps. PRO.
The Electronics Engineering ToolKit is a universal App. It is designed for both iPhone and iPad.
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Electronic Tensile Testing Machine
Shenzhen Chuangxin Instruments Co., Ltd.
Tensile Testing Machine, Universal Tensile Electronic Power and Textile Testing Instrument Testing Machine
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Sematech Analysis and SEMI Standards Analysis
Rocky Mountain Laboratories, Inc.
Rocky Mountain Laboratories, Inc. provides SEMI Standards analyses that conform to the following SEMATECH and SEMI Standards for testing of passivated 316L stainless steel components being considered for installation into a high-purity gas distribution system:SEMASPEC #90120401B-STD (SEM Analysis)SEMASPEC #90120402B-STD (EDS Analysis)SEMASPEC #90120403B-STD (XPS Analysis)SEMASPEC #91060573B-STD (Auger (AES) Analysis)SEMI F60-0306 (based on F60-0301) (XPS Analysis)SEMI F72-1102 (Auger (AES) Analysis)
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CD Measurement and Advanced Film Analysis
FilmTek CD
Scientific Computing International
SCI’s leading-edge solution for fully-automated, high-throughput CD measurement and advanced film analysis for the 1x nm design node and beyond. Delivers real-time multi-layer stack characterization and CD measurement simultaneously, for both known and completely unknown structures. Patented multimodal measurement technology meets the challenging demands associated with the most complex semiconductor design features in development and production.
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Spectrum Analysis, Up To 13.5 GHz
S930901B
The S930901B spectrum analysis adds high-performance microwave spectrum analysis to the PNA family up to 13.5 GHz. With fast stepped-FFT sweeps resulting from optimized data processing, the SA application provides quick spurious searches over broad frequency ranges. Simultaneous spectrum measurements can be done using up to five test and reference receivers. This multi-channel SA can be used with the internal swept-signal generators for efficient measurements of spurious signals emanating from mixers and frequency converters. The SA application employs source-power and receiver-response calibration as well as fixture de-embedding, providing in-fixture and on-wafer spectrum measurements with the highest level of accuracy.
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Electronic Drum Latency
EDLM iPhone app was developed specifically for measuring latency in electronic drums. It connects to the input and output points of an e-drum system and provides automated and accurate latency measurements.
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Spectrum Analysis For P50xxB Up To 20 GHz
S970904B
Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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Transmission Electron Microscope
TEM
Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 63 pm.
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Analysis
External appearance due to non-destructive semiconductor · X-ray fluoroscopic observation, SAT observation, electrical operation confirmation, ESD fracture analysis, plastic opening observation of Chip, search for abnormal portions by EMS / OBIRCH, package (PKG) analysis, Please do not hesitate to contact us anything related to semiconductor analysis, such as observation by polishing / parallel polishing (ball and bump observation etc.), peeling observation of defective part, analysis of foreign matter by EDX · FT - IR etc.
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Electron Sources
SPECS Surface Nano Analysis GmbH
To our customers in research and industry we offer a variety of sources for deposition, excitation and charge neutralization as well as analyzers and monochromators. Most of our sources originate from product lines which we have taken over from Leybold AG, Cologne, and from VSI GmbH. The X-ray monochromator Focus 500 and the UV monochromator TMM 302 are original developments by SPECS.Compliance with industry standards, a good price-performance ratio, stability, and longevity are the guidelines for our product development. We focus on standardized easy handling, user-friendliness, standardized software interfaces and safety.
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Video Quality Analysis Systems
ClearView Extreme 8K and 4K Systems
Highest Resolution Video and Audio Quality Analyzers with 12G-SDI Interfaces and ST 2110 Networking Option
