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Product
Temperature Test Chamber
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Temperature Test Chamber is designed for testing the capability of heat-endurance, cold-endurance, dryness-endurance, and humidity-endurance, suitable for quality control of the industries of electron, electrical equipment, vehicle, metal, foodstuffs, chemistry, building materials, luggage, adhesion tape, printing, packaging, etc.
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Product
Kelvin Clip Test Lead Set
5940
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Kelvin Clip Test Lead Set. Ideal for resistant measurementsbelow 1 ohm.
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Product
Electrical Test Instruments
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Transcat offers all types of electrical test instruments for diagnosis, troubleshooting, and repairing of any products and devices. Our wide array of handheld, bench, and portable equipment covers virtually every electrical testing application. Whether its battery testing, fault location, or resistance testing Transcat has all the essentials to outfit an electrician.
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Product
JIS/ASTM Standard-Compliant Plastic Bending Test System
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Testing of Plastic in Accordance with JIS, ISO and ASTM Standards Can Be Performed
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Product
High Voltage Test & Measurement
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High-voltage (HV) testing utilizes the phenomena in electrical insulations under the influence of the electric field for the definition of test procedures and acceptance criteria.
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Product
Eddy Current Test System
CIRCOGRAPH® Product Family
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Foerster Instruments, Incorporated
The CIRCOGRAPH eddy current test system with rotating probes guarantees maximum detection sensitivity for exposed longitudinal surface defects on bright material. The test system is primarily used for wire drawing machines, Cu tube rewinders, and finishing sections in the bright steel sector. The individually tailored test systems by FOERSTER can be fitted with rotating sensors or CIRCOSCAN rotating discs. They scan flat and profiled material, e.g. when testing rails and billets.
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Product
Magnum VUx for NAND Protocol Test Enhancement
Magnum VUx
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Teradyne’s Magnum VUx system is a flexible, superset test platform for all NAND and MCP products, both cutting edge UFS 3.0, uMCP, and PCIe Gen 4 mobile and automotive devices, as well as SSD NAND ONFI and Toggle, and legacy NAND products such as UFS 2.1, PCIe Gen 3, e.MMC, and eMCP.
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Product
Test Sphere Probe
CX-500
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Shenzhen Chuangxin Instruments Co., Ltd.
Test Sphere Probe This sphere is intended to verify the degree of protection of enclosures for an IP2 Code per IEC 529. Sphere is hardened steel with chrome finish. TOP
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Product
Cable Test Van
BAUR Transcable 4000/S 70-3
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Transcable 4000/S 70-3. The transcable 4000 70 kV 3/S cable test van varies in comparison with the transcable 32 kV - 3S in the 70 kV voltage level. The system is controlled with the MGS semi-automatic control unit. The high voltage switch unit is 3-phase, air and solid matter insulated and safe to touch.
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Product
AC Resonant Test System
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Yangzhou Power Electric Co., Ltd
Testing of certain apparatus requires much high voltage or current that a straight AC test system is not sufficient. Thus resonant test reactor with a variable core is needed. The main advantage of such test systems is lower input power and larger output power. The resonant test system is designed to compensate capacitance in the testing circuit precisely by tuning inductance of the test system. AC resonant test system is used for factory testing of middle, high and ultra-high voltage cables, capacitors, generators, motors, power transformers and gas-insulated switchgears.
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Product
Test adapter LRM-LR (Type F)
MA-LML01D
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Hachmann Innovative Elektronik
Our test adapter MA-LML01F connects LR measuring devices to standardized LRM string parts. Due to small dimensions and skid-proof design it's easy for him to catch up with everything.
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Product
Calibration and Test Equipment Management
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Is every value precise? The comparability of measurement results has never been more important than in the present era of globalization. The ability to reduce variables to basic units is the fundamental prerequisite to objectively guarantee, increase, and optimize quality. Our calibration service guarantees full correlation to national standards for test equipment of all physical variables – either at our laboratory or on your premises (for measuring tools).
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Product
Battery Test System
WBCS3000Ls32
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Low current model32 channel battery cycler (expandable up to 128 channels)No. of minimum channel : 16 channelsmax. voltage range : ±5Vmax. current range : ±10mA
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
In-Circuit Test System
Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
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Product
Optical Receiver Stress Test Solution
N4917B
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The N4917B software provides an automated standard compliant stressed receiver sensitivity test according to 100GBASE-LR4, ER4 and SR4 test specification. In order to do this kind of test, several test instruments such as a bit error ratio tester, digital sampling oscilloscope, optical reference transmitter and tunable laser source are required to operate together to achieve a compliant, repeatable optical stressed eye. This stressed eye is then fed to the receiver under test, where bit error ratio is measured under the stress conditions as defined in the standard.
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Product
Test Equipment Calibration
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EMC Technologies can provide convenient, local, NATA accredited calibration services which greatly reduces lead time and costs for EMC test equipment. In the past these items had to be sent overseas or to expensive government laboratories. We can calibrate these items against common standards such as CISPR 16 (and subparts), IEC 61000-6-X series, ANSI C63.4, ANSI C63.5 and ARP 958.
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Product
Test Pattern Generator Software
ScanExpress TPG
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To deliver a product meeting the highest standards of quality and reliability, design engineers and test engineers alike must maintain test capabilities throughout the entire product life cycle, from prototype to manufacturing. Automation in test generation is essential to ensure that tests keep up with the rapid development of modern products.The ScanExpress TPG™ Intelligent Test Pattern Generator Software provides a highly advanced, automated boundary-scan test design environment—perfect for quick and efficient creation of complete boundary-scan tests for all IEEE-1149.1 and IEEE-1149.6 compliant circuit boards.
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Product
Test Kits
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Optical Wavelength Laboratories
Deluxe color LCD fiber link certifier (includes MASTER and REMOTE devices) Tests two fibers at a time, cutting testing time in half (when compared to traditional fiber certification) Ideal for installers and contractors who need to certify fiber cables BI-DIRECTIONALLY Measure the end-to-end length of the fiber cable with every test Unlimited sets of job parametersOWLView software allows tri-report capability certification, OTDR, and endface all on one report) Multimode and singlemode options available.
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Product
Four-module test set
F8200
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Use the F8200 Power System Simulator for testing single-phase conventional schemes, digital protection systems, and more. This four-module F8000-series instrument is available in four standard configurations of HVA Current, HVA Voltage, and Low-Density Logic I/O modules.
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Product
Open Flanges Test Rig
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Flexible cell dimensions: cells of Ø 8 to Ø 80 mm (or square till 70x70 mm) can be successively installed Quick start of experiment: less than 20 minutes to remount a new cell with different dimension, thanks to the simple design without sealing Other SOFC components: the open flanges test rig is also useful for conductivity measurements (electrolyte, electrode material, interconnect etc.) and sealing tests End of broken cells and secure testing: the cell is squeezed by a soft alumina felt that prevents any damages, the excess fuel burns continuously in the alumina felt at the cell edges
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Product
SAX Test Block & PAX Probes
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The SecuControl SAX is a versatile, space-efficient, and two-in-one terminal and test block that brings safety and consistency to substation testing. Its finger-safe design, keyed PAX/STP plugs, make-before-break operation and built-in CT shorting deliver reliable secondary injection without wiring changes or open-circuit risks. Ideal to modern substations where speedy deployment and simplicity are key.
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Product
Software Test Framework for LabVIEW
VI Tester
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VI Tester is a software test framework for LabVIEW that allows software developers to test their LabVIEW code (VIs). Software testing is a critical component of agile development and test driven development processes and is also critical for validating software functionality. VI Tester is based on the industry standard xUnit software test architecture that is used in many other programming languages. This architecture is very flexible and powerful, but also very easy for beginners to learn.
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Product
Memory Burn-In Test
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The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies.
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Product
COMPUTERIZED LCRTZ TEST SYSTEM (Automatic Transformer Test System)
CVCT-S20
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Ideal for fast and fool proof testing of COILS AND SMALL TRANSFORMERS like SMPS transformers, Telecom transformers (HYBRID, POT CORE, RM-CORE), Pulse transformers etc. The systems scans at one stroke, all the windings of a transformer and tests as per definition of test procedure. The test procedure can be pre-programmed and stored under User friendly menu driven software . Any semi-skilled and unskilled person can be engaged for actual testing purpose. Can Select test frequency, pin number, parameters, test conditions, limits for each test. Test any pin to any other pin any defined parameter.Test Parameters :-> Inductance-> Capacitance-> AC Resistance, -> DC Resistance, -> Impedance, -> Leakage Inductance,-> Transformation Ratio & Winding PolaritySPECIFICATIONS :Measurement Frequencies : 50 Hz, 100 Hz, 500 Hz, 800 Hz; 1 KHz, 2 KHz, 5 KHz, 10 KHz. Measurement Voltage: 0.1 V – 1.0 V RMS adjustable under program control.
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Product
Turret Test And Scan Handlers
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Turret platforms for semiconductor test, inspection and packaging.
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Product
Power mixed test system
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Power device or module with which are digitally controlled and memory can be measured per system.
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Product
AFDX ® /ARINC664P7 Networks Test, Simulation, Monitoring & Analyzer
ACE-FDX-3U-2
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AFDX®/ARINC664P7 Test and Simulation module for PCIe x1 with 2 full duplex ports programmable for 10/100/1000 MBit/s. Versions available for both Airbus and Boeing variants of ARINC664P7. Test, verification and simulation of AFDX®/ARINC664P7 End Systems, Switches and Networks. Support for Single or Redundant AFDX®/ARINC664P7 operation. Support for Boeing ARINC664 extensions for EDE at the hardware interface layer.
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Product
FMC Loopback Test Board
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The FMC loopback tester board enables developers and assembly factories to test and characterize the FMC carrier board interfaces. The board features full differential loopbacks on all the FMC high pin count (HPC) connector interfaces including LA, HA, HB, DP and CLK. It also provides a 125MHz transceiver LVDS reference clocks on GBTCLK signals. The FMC loopback board is based on VITA 57 standard with ruggedized conduction or air cooling.
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Product
Charge-Discharge, Li-ion Cell Formation, and Test Solution
BT2200
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The BT2200 charge-discharge platform is cost-effective and easily configurable for Li-Ion cell formation and lifetime cell cycling. A modular design supports cells requiring maximum currents ranging from ± 6 A to ± 800 A, with up to 256 cells or channels per chassis. You can quickly deploy different channel configurations as your cell requirements change and capacities grow.
