USB Test
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MirrorLink Test System
Catena 2210
The Catena 2210 is a test tool with two USB Network Control Model ("NCM") devices. These devices create a bridge between two USB hosts. Validation testing is made possible by connecting a test control computer to the USB host being tested. Ethernet traffic from the test host is transferred through the Catena 2210 device to the control host, and vice versa.
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USB PD Test System
6050
Single Output USB PD USB PD basic version：the single-group test systemarchitecture is as shown in the table, 5302A AC Source, 3302F + 3310F series and9922-R Quick Charge Controller.
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EBIRST 9-pin Male D-type Termination Fixture
93-003-103
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Programmable USB Hub with 4 Charge Ports
The USBHub2x4 is a programmable USB 2.0 compatible hub featuring 4 device downstream ports with standard USB type-A receptacles and each port is capable of delivering up to 2.5A simultaneously. With two host (upstream) connections using usb mini-B connectors, the USBHub2x4 is perfect for environments where multiple devices need to be shared or switched between two host computers. E.g.: software regression testing, iPhone software development and validation, Android software development and validation, USB device regression testing, manufacturing testing, device burn-in testing and USB device charge-curve testing.
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USB 4-port Hub For Elan's USB T&M Instruments
USBMicroHub4
The MicroHub4 has connections for 4 USB2.0 measurement tools, and uses only one host USB port. Elan's test and measurement products can be interconnected to allow them to operate in synchronised mode, or left non-connected for distinct operation.
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EBIRST 50-pin D-type Test Tool
93-005-001
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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MIL-STD-1553 USB & LAN Test & Simulation Module
UXI-1553
Avionics Interface Technologies
Dual redundant, single, dual, or quad stream configurationsConcurrent BC, 31 RTs, and BM operations - Physical Bus ReplayFull error injection/detection capabilities - Programmable trigger and capture - Programmable Bus Coupling and Output Voltage Levels - Onboard IRIG-B time code encoder/decoder for Synchronization - Time Synchronization to IEEE 1588 via Ethernet LAN port - 10 Discrete I/O Interfaces (5 Outputs / 5 Inputs) - Operates from a single USB or Ethernet LAN connection - Supports SAE AS4112/4114 protocol testing requirements- Flight Simulyzer™ GUI Analyzer software
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ARINC 429 USB & LAN Test & Simulation Module
UXI-429
Avionics Interface Technologies
8 Channel (4Tx/4Rx) & 16 Channel (8 Tx/8 Rx) models available - Programmable Tx channel output amplitude - Programmable high/low speed operation - Concurrent operation of all Tx/Rx channels at high speed rates - Full error injection & detection - Rate-oriented label transmission - Label selective trigger for capture/filtering - Real-time recording & post analysis of multiple channels - Physical Bus Replay - Onboard IRIG-B time code encoder/decoder for Synchronization - Time Synchronization to IEEE 1588 via Ethernet LAN port - 10 Discrete I/O Interfaces (5 Outputs / 5 Inputs)
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Programmable USB Hubs & Multiplexers
Acroname's unique line of programmable USB products help automated tedious USB port handling and monitoring tasks. Simplify and automate USB testing in manufacturing test, validation, regression or stress testing of your USB products.
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EBIRST 8-pin Male Power D-type Termination Fixture
93-012-103
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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EBIRST 78-pin D-type Test Tool
93-006-001
The 93-006-001 eBIRST 78-pin D-type test tool is part of a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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EBIRST 78-pin D-type To 68-pin Male SCSI Adapter
93-006-401
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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EBIRST 104-pin D-type To 96-pin SCSI Adapter Cable
93-022-226
The 93-002-226 104-pin to 96-pin eBIRST adapter cable is part of a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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USB 2-port Hub For Elan's USB T&M Instruments
USBMicroHub2
The USB MicroHub is designed to make it easy to connect multiple USB2.0 devices via a single USB port, and is ideal for use with the USB test and measurement family. Connecting multiple scopes, function generators and pulse generators together is made simple with this clever little unit.
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Imperial Test Executive
ITE
The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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Semiconductors Testing
Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Test Workflow Standard
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Cable Free ATE
CABLEFREEATE
Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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Wafer-Level Parametric Test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Automatic Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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Scienlab Battery Test System – Module Level
SL1001A Series
The SL1001A and SL1006A Battery Test Systems – Module Level Series help you emulate sink and source for battery modules for automotive and industrial applications.
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Fast and Flexible WLAN Measurements up to 802.11ax
WLAN Test Toolkit
The WLAN Test Toolkit gives you direct and fine control over the generation and analysis of IEEE 802.11a/b/g/n/ac and ax signals, as well as 802.11j/p/ah/af waveforms, with industry-leading speed and accuracy. It empowers you to characterize, validate, and test a variety of WLAN connectivity products, such as RF front end components, wireless modules, and user devices.The toolkit includes extensive support for the latest features of the 802.11ax standard, including extended single-user packets, multiuser OFDMA, and multiuser multiple input, multiple output (MIMO) functionality with per-user configuration and measurement results. The WLAN Test Toolkit helps you solve demanding new access point test cases by generating signals that simulate multiuser environments, including per-user impairments. You can also use the new software to generate trigger frames to test the real-time response of client devices and make power precorrection and relative center frequency measurements.
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Test Fixture (SMD Components)
16034E
Perform impedance evaluation on a minimum SMD size of 1.6(L) x 0.8(W) [mm]
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Bottom Electrode SMD Test Fixture
16197A
The 16197A is designed for impedance evaluations of bottom electrode SMDs. It achieves stable frequency characteristics up to 3 GHz and provides highly repeatable measurements. The Keysight 16197A supports various SMD sizes, as small as 1005 (mm)/0402 (inch) and as large as 3225 (mm)/1210 (inch). Accommodation of the 0603 (mm)/0201 (inch) size is available with option 001.
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NI's Wireless Connectivity Functional Test Solution
The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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SAS Protocol Test System
Sierra M124A
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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EMI Test System
TS9975
The R&S®TS9975 is the base system for conducted and radiated EMI measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for large equipment under test. Combinations of different applications or incremental expansion are easily possible.
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PCI Express 3.0 Test Platform with SMBus Support
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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Functional Test System
TS-5040
The Keysight TS-5040 Functional Test System is a cost effective, robust and reliable test system that gives you the lowest cost of ownership. In addition, the open architecture Test Exec SL gives you the flexibility to do just about anything you want.
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FADEC/EEC Test Platform
The FADEC/EEC Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of full-authority digital engine control (FADEC) and electronic engine control (EEC) units of both rotary- and fixed-wing airframes. The system simulates one or more turbofan engines, including its sensors and actuators for use with the most sophisticated FADECs and EECs on the market. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
