Moving Probe Testers
multiple probes move robotically to contact integrated circuits, printed circuit and SMT boards.
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Light 0.75 (21.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-25L18-2
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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BROADCAST PROBE
VB120
The VB120 BROADCAST PROBE is a blade based platform for continuous digital TV monitoring, its modular concept providing the flexibility needed for a cost-effective surveillance system tailor-made for each operator. System scalability in terms of monitoring capacity, signal formats handled and functionality ensures a future-proof solution, an invaluable asset in an ever changing world.
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Standard 1.60 (45.00) - 4.50 (128.00) General Purpose Probe
EPA-3F
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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AC / DC Current Probe, 2 MHz, 500 Arms
N2780B
The N2780B current probe is an accurate and reliable solution for measuring AC and DC currents. Using a hybrid technology that includes a Hall effect sensor and an AC current transformer, the probe provides accurate measurement of DC or AC currents up to 500 Arms continuous.
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Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-1I40-7
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1P-8-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1T24-4-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Temperature Probes
Is a device, typically, a thermocouple or RTD, that provides for temperature measurement through an electrical signal. A thermocouple (T/C) is made from two dissimilar metals that generate electrical voltage in direct proportion to changes in temperature.
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Flying Probe Tester
Condor MTS 505
Primarily the Flying Probe Tester was developed to enable In-Circuit testing (ICT) of prototype PCBs. For testing a new design an existing fixture has to be changed or a new fixture has to be procured. The fixtureless design of the MTS 505 Condor is one of its most attractive properties, where the unnecessary and costly time delays incurred for fixture build or changes can be avoided. It is the ideal platform for testing prototypes.
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Probe Card
VC43™/VC43EAF™
VC43™/VC43EAF™ probe cards offer a larger format version of the popular VC20. In addition to saving time, another advantage of the modularity is the ability to leave the interface in place and simply install the VC43™ topside using Celadon’s twist and lock insertion tool which minimizes the possibility of triboelectric or interconnect issues that can occur during typical probe card changes. The VC43™ can be used for production parametric test, modeling, characterization, and wafer level reliability testing. Cards can be configured up to 104 probes in either single or dual layer with near vertical probes to minimize scrub lengths on pads allowing the VC43s to probe pads as small as 30 microns.
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Probing Solutions
High Power Pulse Instruments GmbH
Probing Solutions and Probe Arms by HPPI GmbH
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type K, Ø1.50mm, 230gf
K100-K150230-SKAU
K100 Series, Pitch 100mil, Tip Style K, Tip Diameter Ø1.50mm, Spring force 230gf, Steel with Gold Plating.
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High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1I-8-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Coaxial Probes
Smiths Interconnect offers the industry's most extensive line of high reliability coaxial probes. Our coaxial probes provide a low noise, controlled impedance signal path with reliable and easy connect/disconnect options.
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Energy Probes
RjP-600 Series
The RjP-600 Series energy probes integrate the detector and preamplifier in the same enclosure, thereby maximizing signal integrity between the detector and preamplifier. This permits longer cable runs between the probe and instrument, as is often necessary in production environments. Probe specific information, like calibration date and wavelength response curves, is stored in the probe for access by the instrument. Other features include interchangeable filter holders and ¼-20 mounting hole.
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Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-1T30-7
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Ultra High 12.90 (366.00) - 48.00 (1361.00) General Purpose Probe
EPA-5E-2
Current Rating (Amps): 8Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,420Overall Length (mm): 36.07
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Standard 1.17 (33.20) - 4.50 (128.00) Battery Probe
CP-2SB-8
Current Rating (Amps): 5Average Probe Resistance (mOhm): 50Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 88Full Travel (mm): 2.25Recommended Travel (mil): 78.7Recommended Travel (mm): 2.00Overall Length (mil): 315Overall Length (mm): 8.00Overall Length Remark: Overall length does not include tail.Recommended Drill Size: #53 or 1.51 mmRec. Mounting Hole Size (mil): 61Rec. Mounting Hole Size (mm): 1.55
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Standard 0.50 (14.00) - 3.40 (96.00) Non Replaceable General Purpose Probe
C-S-R
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 45Full Travel (mm): 1.14Recommended Travel (mil): 30Recommended Travel (mm): 0.76Overall Length (mil): 395Overall Length (mm): 10.03Rec. Mounting Hole Size (mil): 46.5Rec. Mounting Hole Size (mm): 1.18Recommended Drill Size: 56
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C-S General Purpose Probes
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 45Full Travel (mm): 1.14Recommended Travel (mil): 30Recommended Travel (mm): 0.76Overall Length (mil): 395Overall Length (mm): 10.03Rec. Mounting Hole Size (mil): 46.5Rec. Mounting Hole Size (mm): 1.18Recommended Drill Size: 56
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Differential Probe
DP-15K
DP-15K is a 100mV high sensitivity and able to measure 15KVp-p high voltage and high dynamitic range model.
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High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1H-INS-8
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Probe Card
Japan Electronic Materials Corp.
The probe card is a tool for testing semiconductors used at "Wafer Test" to check quality of IC or LSI in the first process of semiconductor manufacturing. The probe card is expendable.
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Probes And Accessories
Choose from a broad portfolio of Tektronix probes and accessories, all perfectly matched to our industry-leading oscilloscopes. With over 100 choices available, select the oscilloscope probe you need for your specific testing application. Download our Probe Selector Guide here.
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Alternate 2.64 (75.00) - 6.50 (184.00) General Purpose Probe
EPA-2X-1
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Alternate 1.10 (31.18) - 7.20 (204.00) Switch Probe
TSP100-C100-2
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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High 2.84 (81.00) - 8.00 (227.00) Bead Probe
BTP-25C-8
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
