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- Applied Rigaku Technologies, Inc
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NEX CG II Energy Dispersive X-ray Fluorescence Spectrometer
NEX CG II
Applied Rigaku Technologies, Inc
NEX CG II, a powerful second-generation energy dispersive X-ray fluorescence (EDXRF) spectrometer, delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films.
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Total Reflection X-Ray Fluorescence (TXRF) Products
Total Reflection X-Ray Fluorescence (TXRF) Products by Rigaku
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Total Reflection X-ray Fluorescence (TXRF) Services
A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
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TXRF Spectrometers
Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.
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TXRF Spectrometers
Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.
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X-ray Fluorescence
XRF analysis – one of the best analytical techniques to perform elemental analysis in all kinds of samples, no matter if liquids, solids or loose powders must be analyzed.
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X-Ray Fluorescence Analyzer
MESA-50
HORIBA has been selling the XGT-WR series of EDXRF analyzers for many years, providing screening measurements of samples containing hazardous elements such as Pb, Cd, Hg, Cr, Br, Sb, As for RoHS, ELV, and Cl for halogen free applications.XGT systems are used daily throughout the world. HORIBA has now developed the new MESA-50 EDXRF analyzer, based on its long experience with customer requirements and knowledge. MESA-50 provides user friendly operation and good performance. MESA-50 includes three analysis diameters, suitable for every sample, from thin cables and electronic parts to bulk samples. The combination of SDD detector and Digital pulse processor(DPP) changes the image of EDXRF.HORIBA's new MESA-50 supports ecological procurement; it contributes not only to EU RoHS and ELV compliance testing, but also regulatory work for many other countries.
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X-ray Fluorescence Spectrometers
Is a non-destructive analytical technique used to determine the elemental composition of materials.
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X-ray fluorescence spectrometers
SPECTRO Analytical Instruments GmbH
SPECTRO is a world leader in the manufacture of energy dispersive X-ray fluorescence spectrometers. In recent years, SPECTRO has set standards by further developing X-ray fluorescence technology to create many new fields of operation for ED-XRF spectrometers.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDL®
Your entry into automated measuring. Robust XRF measuring device for quality control of electroplated bulk parts and for bath analysis.
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X-ray Fluorescence Spectroscopy (XRF) Services
Work we''ve done: Coating identification, Measuring lead levels in paint and solder, Elemental comparison of two metal ingots, Restriction of Hazardous Substance (RoHS) testing.
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X-ray Fluorescence Sulfur-in-Oil Analyzer
SLFA-60
HORIBA introduces the new standard of transportable sulfur-in-oil analyzers, the SLFA-60. This instrument introduces new software and hardware features to meet the growing changes in the petroleum industry. The instrument has expanded storage of calibration curves and data can be exported using USB output. The measurement range has increased to 0-9.9999 wt% to cover high sulfur crudes and shale oil markets.
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X-ray Fluorescence Spectrometer
X-ray fluorescence spectrometer that provides quick, easy elemental analysis using touch screen operation. It is equipped with functions for conventional qualitative and quantitative analysis (FP method, calibration curve method), as well as screening for RoHS elements. With a variety of both hardware and software options available, it is customizable to cover a wide range of analysis needs.
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Energy Dispersive X-ray Fluorescence Spectrometer
Pharmaceutical Elemental Impurities Analysis System
Control of Elemental Impurities in Pharmaceuticals In the pharmaceutical industry, the analysis of elemental impurities is necessary to ensure the safety of pharmaceuticals. In December 2014, the "Guideline for Elemental Impurities" (Q3D) was issued by the International Council for Harmonisation of Technical Requirements for Pharmaceuticals for Human Use (ICH), consisting of representatives from Europe, the U.S. and Japan. In Japan, the "Guideline for Elemental Impurities in Drug Products" (PFSB/ELD Notification 0930 #4 from the Ministry of Health, Labour and Welfare) was issued, and will be applied to new drug products submitted for approval after April 1 2017. For 24 elements categorized in Class 1 to Class 3, residual quantities in pharmaceutical drug products must be controlled within permissible limits. Although ICP-AES and ICP-MS are used for precise analysis of elemental impurities, X-ray fluorescence spectrometers can be used as an alternative analysis method. This is because they can quantitatively and qualitatively analyze a variety of elements nondestructively, and without chemical pretreatment, unlike ICP-AES and ICP-MS systems. The X-ray fluorescence spectrometry has been adopted as a general method of analysis in the U.S Pharmacopeia and the European Pharmacopoeia. (USP<735>, Ph.Eur.2.2.37)
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X-ray Fluorescence Measuring system
FISCHERSCOPE® X-RAY 4000 Series
Inline measuring with maximum endurance. Robust inline device for measuring on solid strips, punched grids with measuring structures from a few millimeters up to coated membranes or solid strips up to one meter wide.
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Dispersive X-ray Fluorescence (EDXRF) Analyzers
Petro-Marine
The powerful Energy Dispersive X-ray Fluorescence (EDXRF) analyzers of Xenemetrix are capable of more sensitive and precise analysis than can be expected from a laboratory class analyzer.
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Total Solution
SD 4.1 Family
To meet the ever increasing data transfer rate in high end applications, such as professional broadcasting transmission or advanced high resolution display, the SD 4.1 specification calls out the maximum performance of 1.56 Gbps at UHS-II full duplex mode per lane or half duplex UHS-II at 3.16 Gbps. In real applications, due to the system overhead and different SD 4.1 device controller designs, the actual measured performance can vary dramatically from system to system. With the newly introduced ADMA 3, the OS driver is now able to issue multiple read or multiple write commands at once, without having to wait for the SD controller to complete one command at a time. Once the SD host controller has collected multiple commands, it will then manage and complete them without intervention from the host software drive. Thus, the UHS-II 1.56 Gbps interface can be more effectively utilized and maximize the system throughput. This feature can be very useful when running multithreaded applications where multiple applications are constantly updating their status or swapping their contents by writing or reading small chunk of data to or from the memory card.
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Fluorescence Illuminators
In fluorescence microscopy, fluorescent substances are viewed or imaged with a microscope. These fluorescent substances may be naturally occurring in the sample or may be introduced to assist in the identification of specific features in the sample. Multiple fluorescent substances (fluorophores) with different fluorescent properties can be visualized within the same sample using the capabilities of fluorescence illumination and fluorescence filter combinations.
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Fluorescence Imaging
A next-generation fluorescence lifetime imaging microscopy (FLIM) camera that simplifies FLIM for researchers and imaging centers by combining excellent light sensitivity with easy image acquisition and data analysis.
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X-ray Fluorescence, XRF Analysis Services
Two XRF systems are available, a wavelength dispersive system (WDXRF) and an energy dispersive system (EDXRF). The difference is the manner in which the x-rays are detected. WDXRF instruments have very good energy resolution which leads to fewer spectral overlaps and improved background intensities. EDXRF instruments have higher signal throughput which can shorten analysis times. The higher signal throughput also makes EDXRF systems suitable for small spot or mapping analysis.
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X-ray Fluorescence Sulfur/Chlorine-in-oil Analyzer
MESA-7220V2
The MESA-7220V2 measures both sulfur and chlorine in petroleum based products using the Monochromatic Energy Dispersive X-ray Fluorescence (EDXRF) method. A monochromatic X-ray source is used in order to obtain an ultra-low noise background which affords the best detection limits for both sulfur and chlorine.The detector window size was increased to collect more fluorescent X-rays and thus achieve lower level ppm values. This provides excellent, repeatable performance at both low and high concentrations of both elements.By adjusting the angle of the graphite crystal, the excitation beam can be measured to excite sulfur in the sample, increasing sensitivity.
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X-Ray
VJ Electronix offers manual and fully automated inspection systems for applications such as PCB assembly, semiconductor packages, electromechanical assemblies, biomedical/pharmaceuticals, batteries, and more. Our systems offer a range of imaging options and simple manual or programmable operation. In addition, custom inspection systems are available tailored specifically for your production requirements. All of our products are easily integrated into the manufacturing process for fast start-up and 24/7 operation. Their versatility and ease-of-use deliver repeatable results with all levels of production staff.
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Fluorescence Spectrometers
Our experience and expertise as manufacturers of fluorescence spectrometers is second to none. Spanning more than 50 years, we have over 1000 high-end spectrometers installed in universities and leading research laboratories worldwide. Our sales team would be delighted to assist you with your fluorescence spectroscopy analysis and instrumentation requirements.
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Multi-Channel X-Ray Fluorescence Spectrometer
FACTORY LAB MXF-2400
Wavelength Dispersive X-Ray Fluorescence Spectrometer The Shimadzu MXF-2400 is an improved version of the Shimadzu Multi-Channel X-ray fluorescence spectrometer, which has been rated highly in the overseas market as well as in the Japanese market. The latest hardware designed to fully utilize the principle of X-ray fluorescence spectrometry and the data processing unit that uses various software programs to permit automatic management of analysis data combine to provide high analytical productivity both in R&D and production control. Up to 36 elements can be simultaneously determined by the fixed monochrometer and up to 48 elements can be determined sequentially by the optional scanning monochrometer. High analytical precision is provided even in high sensitivity analysis of a few ppm quantity level.
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Total Stations
Zoom40 Series
The Zoom40 manual total station, with its high resolution color and touch display, gives you the flexibility to run X-PAD, Field Genius, SurvCE, or any custom windows CE software.
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X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY/XDV-SDD
Premium model for universal use for the inspection of very thin or complex layers up to RoHS screening at very low detection limits.
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X-Ray Cameras
A range of scientific camera solutions optimized for high energy / X-Ray detection.
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X-ray Fluorescence Sulfur-in-Oil Analyzer
K581
Chongqing Kailian Yongrun Industrial Co.,Ltd.
It is designed to test mass(%) of total sulfur in crude petroleum, petroleum, heavy oil, diesel oil, gasoline and naphtha; to test total sulfur content in products of coal chemical industry, for instance primary benzene; to test total sulfur or sulfide in other liquids or solid power samples.Conforms to ASTM D4294, GB/T 17040 and GB/T 11140.
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X-Ray Inspection
X-ray inspection systems are used wherever defects need to be detected by non-destructive means. The spectrum of use is broad and ranges from quality controls for complex assemblies, to the testing of materials for cracks and air inclusions, to foreign matter inclusions and shape deviations. The trend toward miniaturization, higher packing densities, and the relocation of components to the interior of the assembly require precise X-ray inspections that detect hidden defects quickly and reliably. X-ray systems from Viscom are used for the inspection of series assemblies as well as sampling and prototype controls. They take care of typical inspection tasks in concealed areas such as void controls, THT filling level measurements, and HIP inspections. At the same time, the systems reliably determine defect features such as coplanarity and polarity – at high inspection speeds and in a cost-effective way.
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Total Stations
X-Pole
Work simultaneously with Total Stations and GNSS by combining the advantages of both systems. GeoMax X-POLE significantly improves the performance and flexibility on the jobsite.
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Total Sulfur Process Analyzer
NEX XT
Applied Rigaku Technologies, Inc
Featuring third-generation X-ray transmission technology, the NEX XT represents the next evolution of process gauge for sulfur measurement (0.02% to 6% S) of crude, bunker fuel, fuel oils, and other highly viscous hydrocarbons, including residuums.The Rigaku NEX XT system is faster, more sensitive and far more compact than competitive systems, and provides continuous, reliable detection of sulfur at pressures up to 1480 psig. Rigaku NEX XT can operate as a stand-alone analyzer or provide real-time closed-loop control when tied into a blending or plant-wide automation system. Among its other key features are a simplified user interface, reduced standards requirement, automatic density compensation, password protection, and standard platform for communicating sulfur and density to a plant-wide DCS. Due to its unique design and robust construction, sample conditioning and recovery systems are typically not required.
