Electron Microscopes
scientific instruments that use a beam of highly energetic electrons to examine objects on a very fine scale.
See Also: Transmission Electron Microscopes
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Electronically Tunable Filters
ETF
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Radar. Communications. EW/SIGINT. Frequency agile channelization. Frequency agile noise rejection filter. Local oscillator tracking filter. Controlled bandwidth and center frequency noise source.
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Microscope Photoluminescence Spectrometer
Flex One
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Photoluminescence (PL) is the light emission from a material under the excitation by ultraviolet, visible or near infrared radiation. In semiconductor luminescent property measurements, the sample (e.g. GaN, ZnO, GaAs etc.) was usually excited by a laser (with a wavelength of 325 nm, 532 nm, 785 nm etc.), and its PL spectrum is measured to analyze the optical physical properties, such as the band gap width etc.. Photoluminescence is a high sensitivity, non-destructive analysis method, which can provide the information about the structure, composition and surrounding atomic arrangement of materials. Therefore, it is widely used in physics, materials science, chemistry and molecular biology and other related fields.
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Electronic Resistance Store
MEMS2-4L
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The mezzanine serves as an electronic store of resistance to direct current, the value of which is set by software, through two isolated channels.
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Electronic Tensile Testing Machine
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Shenzhen Chuangxin Instruments Co., Ltd.
Tensile Testing Machine, Universal Tensile Electronic Power and Textile Testing Instrument Testing Machine
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Modular DC Electronic Load
N3300A Series
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The new N3300A Series of dc electronic loads is fast, accurate, and ideal for increasing production throughput in high volume dc power supply manufacturing. This series consists of a full rack width (1800 watts max) mainframe and a half rack width (600 watts max) mainframe, and 7 interchangeable electronic load modules. The modules provide a variety of voltage, current and power ratings. New dc connectors for test system configurations are now available on all modules.
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X-ray Analytical Microscope (Micro-XRF)
XGT-9000
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- <15µm probe size with ultra-high intensity without compromising sensitivity or spatial resolution. - High resolution cameras and multiple illumination modes to help capture images.- Dual types of detectors for transmission and fluorescent X-rays.- Detectable element range down to carbon with a light element detector.
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Digital Electronic Tyre Pressure Gauge
6515
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Peaceful Thriving Enterprise Co Ltd
To measure tyre pressure, measuring range: 5-150 PSI.
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Electronic Inspection Systems
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Intego's knowhow even makes it possible to identify challenging defects that may be located under the surface. One system is the inspection of chips by means of lock-in thermography, which visually represents the IR radiation intensity signal of electronics. Special lasers and flash lamps generate a very short heat impulse (10 ms) on the chip, which generates a measurable heat flow. In most cases, a resolution of < 1 μm can be achieved.
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EQE/Photon-Electron Conversion Testing
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Enlitech offers different solutions for incident photon-electron conversion testing systems. The available systems include IPCE, PV External quantum efficiency (PV-EQE), Internal Quantum Efficiency, Spectral Response (SR), Highly-sensitive EL-EQE. There are over 1,000 SCI papers cited Enlitech‘s systems to provide reliable experimental data for significant scientific publication. The Highest PV-EQE sensitivity and EL-EQE both reach 10-5 % (7 orders). They can be utilized to PV conversion efficiency, HJT/ PERC/TOP-CON current-loss analysis, Organic PV charge-transfer-state and Perovskite PV trap state measuring, and Organic PV and Perovskite PV Voc loss analysis.
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Electron Diffraction System
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Modern physics is the post-Newtonian conception of physics. It implies that classical descriptions of phenomena are lacking, and that an accurate, " Modern", description of nature requires theories to incorporate elements of quantum mechanics or relativity, or both. This section includes many of the most important experiments in physics, including e/m tubes, the Franck-Hertz experiment, and nuclear magnetic resonance (NMR)
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Eyepiece-less Stereo Microscopes
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Vision Engineering’s eyepiece-less stereo microscopes are better for users and for business. Their ergonomic design lets the operator sit back in a comfortable position, and the expanded pupil technology delivers an enhanced 3D view of the subject. The relaxed natural posture makes it easy and to work with tools and to manipulate the subject. Greater comfort and ease of use directly translate into greater productivity and quality.
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Electronic Engineering
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By combining our core skills in electronic and electrical engineering we can design and support all aspects of test and measurement equipment.
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Joint Services Electronic Combat Systems Tester
JSECST™
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The Joint Services Electronic Combat Systems Tester (JSECST) is part of the family of testers, supporting the U.S. Air Force, Navy, Army, and over 23 allied nation platforms. JSECST performs full end-to-end diagnostic tests of installed systems including radar warning receivers (RWRs), jamming systems, communication systems, and navigation systems. Our JSECST delivers confidence for flight crews and the technicians who support them. It quickly and accurately tests and fault-isolates electronic combat and avionics systems for today's most advanced combat aircraft.
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4kW Electronic Load
PT04-110
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For Telecom Rectifier and Power Supply testing. This model has been developed to accommodate testing of both 110V and 48V telecommunications power systems or Power Supplies. It is also useful as a general-purpose variable Load. Its founding principle is simplicity – ease of use, enhanced reliability, greater value for money and wider applicability.
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Semiconductor / FPD Inspection Microscope
MX61L
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Motorized Microscope for 300mm dia. Wafer/17 inch Glass Substrate use Reflected/Transmitted Illumination.
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Electronic Load Device
786532-01
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The RMX-4006 provides capabilities for qualifying power designs and validating power supply functionality in a production environment. You can combine Electronic Load Devices to customize your test system based on the number of channels, maximum load power, and voltage and current of each channel. You can connect multiple RMX-4006 devices in parallel to provide higher power capabilities for your power supply tests. This feature gives flexibility for future projects that have different power requirements.
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Infrared Microscope
DDR200/300 NIR
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The McBain DDR200 NIR (for 200mm) and DDR300 NIR (for 300mm) provide high-speed defect detection and precision measurement on wafers and other parts. These cost-efficient systems offer unique advantages for both production and process development use, providing an optimum near-infrared (900-1700nm) solution when both subsurface defect detection and dimensional metrology are required.
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Industrial Microscope Solutions
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Industrial microscopes are a vital tool used for measuring, quality control, inspection, and in soldering and manufacturing. Each industrial microscope we offer uses complex designs that provide unique solutions for the inspection process and aim to improve resolution and sample contrast.
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Misc. Electronic Instruments
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Electronic components for test and measurement come in all sizes.
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Programmable LED DC Electronic Load
M98 Series
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M98 series DC electronic load, as a new generation product of Maynuo Electronic Co., Ltd, is designed for the LED driver application. A special circuit is desiged for the LED driver on the base of the M97XX sereies. Incorporating high-performance chips, the M98XX series delivers high speed and high accuracy with a resolution of 0.1 mV and 0.01 mA (basic accuracy is 0.03% and basic current rise speed is 2.5 A/μs). M98XX series have wide application from production lines for cell phone chargers, cell phone batteries, electronic vehicle batteries, switching power supplies, linear power supplies, and LED drivers, to research institute, automotive electronic, aeronautic and astronautic, maritime, solar celland fuel cell etc.test and measurement applications.
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Stereo Zoom Microscopes
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Our product range includes a wide range of gemstar stereo zoom binocular microscope, gemstar stereomaster binocular stereo zoom microscopes, zoomstar iii trinocular stereo zoom microscopes, zoomstar ii trinocular stereo zoom microscopes, zoomstar vi trinocular stereo zoom microscopes and zoomstar v trinocular stereo zoom microscopes.
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Ultraschallmikroskop And Scanning Acoustic Microscopes
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Microtronic Microelectronic Vertriebs GmbH
mage quality. Speed. Uptime. They’re all crucial. Getting all three at the same time in a nondestructive testing (NDT) solution for package inspection is the challenge. It takes continuous innovation, advancing the state of the art to keep pace with the semiconductor industry’s own exponential progress.Sonix has been the innovation leader since 1986. Today, the ECHO line of scanning acoustic microscopes sets the standard for package inspection speed and image quality, to help you keep pace with new packaging materials and difficult form factors. The ECHO platform will remain at the forefront as we continue to add features and enhance performance for years to come.
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Electronics For Signal Processing
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PCB Piezotronics manufactures a wide variety of electronics to power ICP®, PE (Charge Mode), MEMS, strain gage and other types of sensors. All of these products provide conditioning of sensor signals for transmission to data acquisition systems.
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600~1500W DC Electronic Loads
JT632 series
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Nanjing Jartul Electronic Co., Ltd
JT632 series electronic load is functioned with 500KHz high-speed synchronous sampling, DSP technology, powerful dynamic test and multi-aspect intelligence analysis. All these are fully integrated into auotmatic test function, which makes JT632 series load very suitable for testing power supply when produced in large quantity. Besides, JT632 series load also possesses the features of current rising slew rate programmable, high-speed dynamic loading and programmable list function, which makes JT632 series load satisfing most of R&D requirements.
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Toolmakers Microscope
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Sinowon Innovation Metrology Manufacture Ltd.
It is widely used in mechanical, meter, electronic and light industry; university, Institute and metrology department. The measuring profile projector can detect the contour dimension and surface shape of variety complex workpiece, such as templates, punching pieces, cams, threads, gears, molding milling cutters.
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DC Electronic Load Control Software
EES-100-xx
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EES-100 Software controls all electronic load types. ( Single & Dual channel) data logging, constant current, constant voltage, constant power, constant resistance, up-down timing, V/I Curves, Graphing, Response Testing
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ELECTRONIC CIRCUIT TRACER
PPECT3000
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*Locate short and open circuits without having to remove plastic panels, molding and carpet*Traces shorts and open wires with visual navigation and sound indicators*Pinpoint shorts, open circuits, switches and breaks in wires
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Online OK Tester for Electronic Ballast and CFL
WT-1
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• Test 6 pieces at one time, suitable for mass testing in assembly line. • Measure parameter: Vrms, lrms, W, PF. • Freely set upper and lower limit for lrms, W, PF, alarm when value out of limits. • Freely set test duration in range: 0-99.9s, tested data automatically locked. • Test range: 1) Vrms: 10.0-300.0V 2) lrms: 5-999mA 3) W: 0.1-300.0W 4) PF: 0.0001-1.000 • Accuracy: 0.5% • Digital display on 6 windows is easy to read • Print port and communication port available (optional)
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LED DC Electronic Load Simulator
3340G Series（150W~300W）
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Each 3340G Series module has its own control and display panel, LED/CC/CR/CV/CP/ Dynamic modes, plug in 3300F with 150 sets Store/Recall memory which provides load set-up more efficiently，also can be controlled intranet via RS232、Ethernet、USB and GPIB interface.
