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Product
Microscopy
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Microscopy is the technical field of using microscopes to view objects and areas of objects that cannot be seen with the naked eye. There are three well-known branches of microscopy: optical, electron, and scanning probe microscopy, along with the emerging field of X-ray microscopy.
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Product
Advanced 4-CH Encoder Card with High-speed Triggering Function
PCI-8124-C
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PCI-8124-C is a 4-CH trigger board which is suitable for advanced line scan application which need high line rates. PCI-8124-C has internal FIFO to realize the high speed position compare and trigger pulse output. For this application, ADLINK proposes you can use PCI-8134 and PCI-8124-C together to gain the advantage of motion control and high speed trigger function. For position compare, PCI-8124-C provides two method: linear function or variable interval. PCI-8124-C also provides the variety of mapping function between comparator and trigger output. The comparator condition can be associated with latch signal, TTL input and EA/EB signal.
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Product
Sensors
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Contact and Non-Contact Sensors for CMM, Optical High Speed Scanning and Computed Tomogrpahy Systems
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Product
EMI Test Receiver
ESRP
Receiver
The R&S®ESRP EMI test receiver has been designed for diagnostic measurements during development and for precompliance measurements to prepare products for final certification testing. It measures electromagnetic disturbances in the 10 Hz to 7 GHz frequency range, using either conventional stepped frequency scans or FFT based time domain scans to significantly speed up measurements.
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Product
Automated Optical Inspection System
AOI Series
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Perform visual inspections of printed circuit boards (PCB) during manufacturing in which a camera is used to scan the board in extremely fine detail to check for any defects or failures.
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Product
8 Channel ADC for PCI
PCI393
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The PCI393 8-Channel Differential Input ADC for PCI is very well suited to be used in applications in which autonomous signal conversion is an issue, as well as in standard mid-range applications. Enabled channels are scanned at maximum rate and conversion results are stored in shared memory. A local DSP performs all functionality and user-specific functions can be added for customized operation.
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Product
Analytical Services
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IGC: Inverse Gas Chromatography; Understand surface energies, polarities, acid/base properties and nanomorphology on powders and fibers. ToF-SIMS: Time-of-Flight Secondary Ion Mass Spectrometry. Localize your molecules at the first nanos! 2D imaging with resolution up to 200 nm. Highest sensitivity up to 10 ppm. CM: Quarz Crystal Microbalance In-situ observation of thickness and stiffness of any films in liquid environmentSEM: Scanning Electron Microscopy Images say more than words, especially with an artistic eye XPS/ESCA: X-ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis.
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Product
Time Delay and Integration (TDI) Line Scan Camera
Piranha HS
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The Piranha HS cameras provide an alternative to traditional line scan imaging. They enable you to meet the line rates and responsivity necessary for your high performance applications and allow you to reduce the number of cameras in your system. When you use fewer cameras, you use fewer framegrabbers, lenses, computers and cables. The Piranha HS family delivers the lowest price/pixel TDI system solution ever offered by Teledyne DALSA. Lighting costs can also be reduced. With TDI imaging, you can use LED lights, helping you to optimize system up-time and productivity.
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Product
Fourier Transform Optical Spectrum Analyzer, 350 - 1100 nm
OSA201C
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Thorlabs' Optical Spectrum Analyzers (OSAs) perform highly accurate spectral measurements. Compatible with fiber-coupled and free-space light sources, these compact benchtop instruments suit a wide variety of applications, such as analyzing the spectrum of a telecom signal, resolving the Fabry-Perot modes of a gain chip, and identifying gas absorption lines. Many commonly available OSAs use grating-based monochromators, which have slow acquisition times due to the need to mechanically scan the grating and average out noise at each wavelength. Thorlabs' OSAs acquire the spectrum via a Fourier transform using a scanning Michelson interferometer in a push/pull configuration. This approach dramatically improves the acquisition time, enables a high-precision wavelength meter mode with 7 significant figures and ±1 part-per-million accuracy, and allows the included software to provide robust statistical analysis of the acquired spectra, as explained in the Design tab.
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Product
Spectroradiometers
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Konica Minolta Sensing Americas, Inc
Spectroradiometers are instruments that scan different regions of the light spectrum, providing simultaneous representations of amplitude versus wavelength of the spectrum.
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Product
Electromagnetic Immunity Scanner
SmartScan BASIC
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The BASIC is manually operated system for performing susceptibility scanning at the system level with minimal data storage capability. This system includes:1. Up to 8kV (optional. 4kV base) pulse generator for ESD susceptibility testing- Camera and camera shutter to take DUT picture and failing spots- Control computer2. Up to 8kV Probe Sets:- 1mm Hx/y Field Probe- 5mm Hx/y Field Probe- D=8mm Hz Field Probe- D=8mm Ez Field Probe- Contact API for custom design probes3. Manual input of testing location and failing condition over the DUT to be included in final report.
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Product
WAFERMAP
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WAFERMAP is an award winning software package used to collect, edit, analyze and visualize measured physical parameters on semiconductor wafers. WAFERMAP can import data files from various metrology tools such as ellipsometers, thickness gauges and four point probes. The imported data can then be visualized or printed as line scans, contour plots, 2D or 3D plots or as a histogram.
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Product
JTAG Boundary-Scan Controller
NetUSB-1149.1/SE
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8-TAP USB 2.0 and LAN Based JTAG Controller. The NetUSB-1149.1/SE is an advanced 8-TAP USB 2.0 and LAN-based JTAG/boundary-scan controller that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard.
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Product
3D Multibeam Scanning Sonar
ProScan™
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Teledyne BlueView's 3D Multibeam Scanning Sonar user interface software. ProScan connects to the sonar and pan/tilt unit, configures each scan, generates full 3D point clouds, and optionally streams output to third party hydrographic software for fusion with other sensors. Data is recorded in multiple file formats: .son (raw acoustic data file for ProScan reprocessing), .txt (plain text record of all point locations and positional data) and .xyzi (industry standard xyzi data for 3D point cloud viewers, registration software, etc.). In playback mode, users can review and reprocess scans to modify sound speed, intensity threshold, multidetect and range settings as needed. ProScan coupled with Teledyne PDS MotionScan, pitch, roll heading and position sensors provides the capability to scan areas to collect 3D point clouds while correcting for motion.
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Product
Scanning Electron Microscope
Verios G4 XHR SEM
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The Thermo Scientific™ Verios G4 scanning electron microscope (SEM) provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
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Product
Handheld Spectrometer
SCiO
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SCiO is the world''s first molecular sensor that fits in the palm of your hand. Scan physical objects and receive instant and relevant information to your smartphone. SCiO reads the chemical make-up of materials. It is a non-intrusive, no-touch optical sensor that provides a seamless user experience. Discover your world with the click of a button. Food, plants, medication, oil and fuels, plastics are only part of what SCiO could analyze.
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Product
Atomic Force Microscope
NX-Hivac
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Park NX-Hivac allows failure analysis engineers to improve the sensitivity of their measurements through high vacuum Scanning Spreading Resistance Microscopy (SSRM). Because high vacuum scanning offers greater accuracy, better repeatability, and less tip and sample damage than ambient or dry N2 conditions, users can measure a wide range of dope concentration and signal response in failure analysis applications.
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Product
Fourier Transform Optical Spectrum Analyzer, 600 - 1700 nm
OSA202C
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Thorlabs' Optical Spectrum Analyzers (OSAs) perform highly accurate spectral measurements. Compatible with fiber-coupled and free-space light sources, these compact benchtop instruments suit a wide variety of applications, such as analyzing the spectrum of a telecom signal, resolving the Fabry-Perot modes of a gain chip, and identifying gas absorption lines. Many commonly available OSAs use grating-based monochromators, which have slow acquisition times due to the need to mechanically scan the grating and average out noise at each wavelength. Thorlabs' OSAs acquire the spectrum via a Fourier transform using a scanning Michelson interferometer in a push/pull configuration. This approach dramatically improves the acquisition time, enables a high-precision wavelength meter mode with 7 significant figures and ±1 part-per-million accuracy, and allows the included software to provide robust statistical analysis of the acquired spectra, as explained in the Design tab.
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Product
Universal Cable/Harness Tester
LX-680
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Shenzhen Lian Xin Technology Co., Ltd.
The system provides Chinese/English free switch operation interface·Starting up conducts self-diagnosis and self-correction·The system can scan and direct automatically.·The system provides advanced instant open-circuit, short-circuit, continuity test, can test the wire break·It can function as unilateral, standard, multi-segment and spot test of wire·The maximum test voltage is AC1000V / DC1500V·The maximum test spot is 256.
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Product
AFM & NSOM
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A new sample scanning atomic force microscope (AFM) designed for ease-of-use and simple installation.
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Product
Monitor and Test Video Quality
Torque Electronic Couch Potato (ECP)
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The ECP is designed to monitor and test video quality of experience. This affordable, compact, palm-sized monitoring probe monitors true customer viewing experience by providing measurements from the end users’ point of view, after the STB. Scanning through available channels or navigating through interactive content menus via an external IR blaster, the ECP provides a single dashboard highlighting service quality across all channels.
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Product
Silicon Nails Feature, GTE 10.00p
K8214B
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Keysight’s Silicon Nails feature enables all the tools required to develop and execute tests on non-compliant boundary scan devices that are connected to boundary scan compliant devices on the printed circuit board.
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Product
64-CH, 12/16-Bit, Up to 3 MS/s Multi-Function PXI Modules
PXI-2200 Series
Multifunction I/O
ADLINIK PXI-2204, PXI-2205, and PXI-2206 are high-density, high-performance multifunction PXI modules. These devices can sample up to 64 AI channels with various gain settings and scan sequences---making them ideal for high-density analog signals with various input ranges and sampling speeds. These devices also offer a differential mode for 32 AI channels to achieve maximum noise elimination. The PXI-2200 series also features analog and digital triggering, 2-CH 12-bit analog outputs with waveform generation capabilities, 24-CH programmable digital I/O lines, and 2-CH 16-bit general-purpose timers/counters.
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Product
Individual UPC Bar Code Standards
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The UPC Verification Calibration standards are a unique set of symbols that assures an exact and reliable primary bar code standard exists for UPC codes based on ANSI X3.182/ISO 15416 methodology. These standards assures that manufactures of verification equipment, scanners, QC labs and end users now have an accurate basis for checking the measurement capabilities of their equipment. These standards are intended as a fundamental calibration tool for an QC program, providing a continuous scale from best to worse case characteristics of each parameter. With complete NIST traceable data supplied, it is ideally suited to those requiring traceability, such as ISO certification. Each symbol is individually calibrated to ANSI X3.182/ISO 15416 standards using a custom built microdensitometer. These cards are supplied calibrated for use with a 6 mil scan aperture and 660nm wavelength. (calibration wit other aperture sizes or wavelengths is available)
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Product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Product
Monochromator Gratings - Type IV
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HORIBA Scientific produces a wide range of holographic master gratings from which high precision replicas are manufactured.Using Type IV aberration-corrected monochromator gratings, a single concave grating disperses, collimates, and refocuses the light from the entrance slit onto the exit slit. Wavelength scanning is obtained through a simple rotation of the grating.The groove spacing of these gratings is computer-optimized to produce high quality images with a minimum of astigmatism and coma, even at large numerical apertures. Compared with Czerny-Turner monochromators (equipped with one plane grating, one collimating mirror and one focusing mirror), Type IV aberration-corrected monochromator gratings provide much better light collection efficiency and signal-to-noise ratio.
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Product
PCIe Color Industrial Camera
CMOSIS CMV4000
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2K camera Applications: In-situ optical inspection camera, fast process capturing, e.g. Golf club swings, Intelligent Transportation Systems (ITS), Open road tolling and Traffic monitoring, Industrial Automation, Machine Vision, Facial Recognition, Motion Capture, Automotive crash testing, OCR/ OCV, 3D scanning, Robotic Arms, Material and Life science Microscopy, Ophthalmology and Retinal imaging, Medical Imaging, Flat panel inspection, Dental, Kiosks, Security, Biometrics
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Product
Ultrasonic Thickness Gauge
UTG-2800
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State of the art, digital ultrasonic thickness gauge is packed with features typically found on high end models only. This multi-functional ultrasonic thickness gauge offers everything from basic measurement, Scanning Capabilities, Adjustable Sound Velocity, extended memory and USB output capabilities.
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Product
Software
Thor3D Suite
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Since both the Thor3D scanner and the Drake 3D scanner are wireless, an embedded software program is pre-installed on the internal computer of the scanners. This software launches when you start your scanner and facilitates the acquisition of 3D data. Using the build-in touch screen, control the scanner with the help of this straightforward program. The interface is simple to use and understand. It has several buttons (such as “Start”, “Stop”, “Power Off”) and a few settings for the adventurous users (such as “Sensitivity” parameters to help when scanning in bright lighting conditions).
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Product
Contactless Laser Extensometers
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Jinan Testing Equipment IE Corporation
Model LE-05 and LE-15 extensometers measure strain optically, without contacting the specimen, using laser diode technology. The extensometers are self-contained and portable. They may be interfaced with a variety of testing machines and data acquisition systems using the ±10V analog output or bi-directional RS-232 serial port. Operation may be local or remote. A digital display is included. The scanning beam is always perpendicular to the specimen, unlike most laser extensometers. This eliminates errors when viewing through windows in chambers. It also minimizes sensitivity to the distance between the extensometer and the sample. Because the unit measures reflected light, no receiver is required behind the sample.





























