Nanometer
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Surface Measurement Instrumentts
Analyze surfaces texture with nanometer precision is already a technological challenge, but TR Scan Premium is able to perform this task with unprecedented speed! The TR Scan Premium is used in workshops and laboratories worldwide. It is completely designed and manufactured in Switzerland by TRIMOS. The TR Scan is focusing on Digital Holographic Imaging Technology. Accuracy, speed, ease of use and modular construction make it ideal for all types of surface measurements.
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Submicron Particle Imaging
FlowCam Nano
Yokogawa Fluid Imaging Technologies, Inc.
FlowCam Nano is the next-generation dynamic image analysis instrument for submicron particle imaging and sizing in real-time. FlowCam Nano extends subvisible particle analysis to detect objects between 300 nanometers and 2 micrometers - the smallest visible with light microscopy.
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Nanopositioning Stage & Controller
PInano
Physik Instrumente GmbH & Co. KG
PInano® XY and XYZ low-profile piezo scanning stages are optimized for easy integration into high-resolution microscopes. They feature a very low profile of 20 mm (0.8") and a large aperture designed to hold Petri dishes and standard slide holders. The long travel ranges of up to 200 x 200 x 200 µm with nanometer closed-loop resolution are ideal for leading-edge microscopy and imaging applications. PInano® series piezo positioning stages are available in two versions: A) Highest Stability, Linearity and Precision with capacitive feedback sensors. B) High Precision with lower cost piezoresistive sensor feedback. Both types provide very high sensitivity and responsiveness as well as nanometer resolution. A proprietary servo controller significantly improves the motion linearity of the piezoresitive version compared to conventional piezoresistive sensor controllers.
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Optical Tweezers
PicoTweezers
Single or dual beam optical tweezers system based on an inverted microscope • 3D real-time video-based force measurements with sub-pN resolution • Huge free space above optical trap for all kinds of sample chambers and carriers • Manipulate and navigate trapped objects with nanometer precision • Easily extendable to fluorescence, STED, Raman spectroscopy, TIRF, or CLS.
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Surface Analysis
Shimadzu offers a range of instruments that are ideal for all sample forms handled by customers in the fields of steel, non-ferrous metals, environment, foods, chemicals, pharmaceuticals, semiconductors, ceramics, and polymers. EPMA/SEM offers analysis of targets from several centimeters to several microns; XPS offers analysis from several millimeters to several microns; and SPM permits observations from over a hundred microns to several nanometers.
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40mA Multi-Channel Amplifier
For the precise nanometer movement of actuators and other piezo products, an amplifier is required. Multi-channel amplifiers allow you to control multiple actuators or piezo products with a single amplifier. The NV40/3 piezo amplifier was designed for controlling low voltage piezo elements. It includes a voltage amplifier, a display and a PC-interface. The high-resolution display shows the voltage of the actuator, along with the mode of operation and the temperature inside the amplifier.
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Detectors
Solar blind detector for operation in the 1 to 180 nanometer region. It is encased in a vacuum tight housing for vacuum operation. The Model 425 is ideal for measurements in the Extreme and Vacuum UV (EUV and VUV) where the solar blind feature eliminates potential interference from long wavelength ultraviolet and visible light. It may be operated in pulse-counting mode or DC. The CEM is also available with coatings like Cesium Iodide or Magnesium Fluoride to enhance response in different energy regions.






