ESD Test Systems
See Also: ESD Test, ESD Simulators
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Product
IC Testing System
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Is a system for giving electrical signals to a semiconductor device to compare output signals against expected values for the purpose of testing if the device works as specified in its design specifications.
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Product
Vibration Test Systems
G-5 Series
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Both Shock tests at from relatively high acceleration(max. 4900m/s2 -500G) to low acceleration with wide pulse width, difficult to achieve with conventional Shock Test Systems and Vibration tests for not only IEC, MIL and JIS but also requiring higher acceleration, velocity and displacement than ordinary VTSs can be carried out with one system.
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Product
Software for Testing Systems
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Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
We offer extensive and powerful software packages for our systems. All of our testing systems are controlled with our Hillgus testing software and the test results are stored in our open file formats. With our evaluation software Oculus, the findings can be subsequently evaluated and documented. Both Hillgus and Oculus were developed in-house and are constantly being improved. Due to the modular structure, the software can be optimized for every requirement and expanded at any time.
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Product
Test Automation System
RT-Tester
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Verified Systems International GMBH
Designed to perform automated hardware-in-the-loop tests and software component test on process or thread level for embedded real-time systems. The functional components of RT-Tester can be structured as shown in the figure to the left. Please click on the small image to enlarge the picture. The System Under Test (SUT) denotes the object to be tested.
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Product
Test System
LB302
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Computer Gesteuerte Systeme GmbH
The LB302 test system is the most used midsize range version of the LB-300 series. It is designed for development as well as for production. The ‘device under test’ (DUT) is connected with a G12 receiver (Virginia Panel Company), which has a high number of possible contacting and a low transition resistance.
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Product
Memory Test System
T5851/T5851ES
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The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Product
Discharge Test System
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The automated testing equipment automatically performs charge and discharge of energy devices such as the rechargeable batteries(cells, modules, packs) that are installed in PHV/ EV and mobile devices, while measuring the voltage, current, temperature, and impedance.
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Product
Optics Test Systems
IR Autocollimator
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Optik Elektronik Gerätetechnik GmbH
The infrared autocollimator was specially designed for the 1550 nm wavelength range. In conjunction with the CROSDETECT evaluation software, it achieves a measuring accuracy of 1 arcsec with a resolution of 0.1 arcsec. The camera used is suitable for the wavelength range from 900 nm to 1700 nm.
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Product
Multi-Cell Test System
Cellcia
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Next-generation wafer probing system for 300mm wafers. The multi-layer system structure maximizes the efficiency of testing, further reducing the total testing cost.
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Product
Transformer Test System
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Transformer testing instrument, can be used as a stand-alone device and has the highest efficiency. Can be used in power transformers, network communication transformers, etc.
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Product
Mixed Signal Test Systems
MTS1010i
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The MTS-1010i is a more economical version of the MTS-2010i & MTS-1020i testers. It has a reduced platform size and reduced power supplies. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process.
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Product
Battery Test System
WBCS3000Le32
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Low current model32 channel battery cycler (expandable up to 128 channels)No. of minimum channel : 16 channelsmax. voltage range : -1V to 5Vmax. current range : ±1A
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Product
Dayton Audio Test System
DATS V2
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Highly accurate measurement of loudspeaker impedance and T/S parametersEasy-to-use, fully-featured measurement software with intuitive interfaceCompact USB measurement module with molded test leads and alligator clipsSoftware includes signal generator, scope, and measurement of inductors and capacitorsData can be saved to create a driver parameter library or exported to popular box design programsNew V2 hardware and software simplify setup and eliminate warm-up/cool-down times
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Product
Test System
Griffin III
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The Griffin III system brings new price/performance efficiency to the Tester-in-a-Head tradition, a concept created and introduced by HILEVEL in 1987. This tester is a superior cost-effective solution for Engineering, Production, and Failure Analysis test applications.
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Product
EW System Test Set
MS 1107
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PSS LRU Test Set is used to test the RWR (Radar Warning Receiver) system by simulating the input signals and testing the output signals.
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Product
Dynamic Component Test Systems
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RedViking brings advanced engineering and proven implementation expertise to your next dynamic component test stand. We’ve designed entire fleets of multi-model and single-model test systems for new component development and production as well as military and commercial MROs. We have decades of experience building and implementing turnkey dynamic component test systems, and we’ll work with your teams virtually anywhere in the world.
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Product
Short Circuit Test System
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Shanghai Guantu Technology Co., Ltd.
The short-circuit test system refers to what kind of short-circuit test is carried out by which equipment, and how long is the test time. But I have one thing to tell you, the short circuit test is a kind of destructive test, mainly to test the working condition of the used equipment in a crisis situation, or to test how strong the anti-destructive ability of the used equipment is. Just like a lot of equipment in the military must undergo a short-circuit test, some for 3 minutes or longer, in order to resist breaking calls against the enemy during wartime.
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Product
Protocol Test System
USB Explorer 260
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The Ellisys USB Explorer 260 is a sophisticated protocol test system for USB traffic monitoring, driver and software stack debugging, protocol compliance verification and performance analysis. Analyze USB 1.1 and USB 2.0 links at any speed, including OTG and the new InterChip-USB at all speeds and all voltages; emulate USB hosts and devices; inject pre-defined error patterns for stress and error recovery testing.
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Product
High Voltage Test System
CKT1175-15
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12.5 mV – 2000 VDCIR measurements to 5000 megohmsHipot testingDwell time prog. from 1 ms to 1000s in 1 ms steps
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Product
Count Down Test System
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The Second Launch Pad Count Down system is implemented using VXI hardware designed by Data Patterns specific to the application requirements, featuring a redundant system handling upto 14000 I/O points.
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Product
ESD Voltmeters And Sensors
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Achieve High Accuracy Without Fixed Spacing Requirements. We offer diagnostic tools for ESD in-line sensing and hand-held electrostatic voltmeters that are ideal for use in ESD-sensitive environments. Accurately measures surface voltage or charge build-up over a wide range of spacings.
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Product
Capacitance & Tan-Delta Test System
TD-1
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By measuring the electrical properties such as capacitance and Tan-Delta regularly on periodical basis, it is possible to ensure the operational unexpected breakdown. Dissipation factor (Tan Delta) is one of the most powerful off-line nondestructive diagnostic tool to monitor the condition of solid insulation of various high voltage equipment.
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Product
System Test
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Testing a complete system is very different from unit and integration test. It starts with the V model that defines the system requirements, and this needs an effective system test capability that includes both the system and the environment around it. If the system has interfaces to the outside world, communications links or human control, these interfaces have to be tested.
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Product
Discrete Device Test System
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capability to perform parallel testing of power discrete devices. As the standard specifications of mainframe, 341-TT/P has 1.2kV/20A and 351-TT/P has 2kV/50A capabilities. These systems have 2 testing subsystems, each of which has 4-station capability by multiplexing to 4 handler/prober stations for high volume production testing.
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Product
Portable Test System
MT686s
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Actual value, vector, curve displaypower generationerror measurementMeasurement of harmonics up to the 40thVoltage supply via existing measurement voltage
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Product
Macro-Vickers Hardness Testing System
LV Series
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LECO's LV Series Macro-Vickers Hardness Testing Systems offer an affordable testing system suitable for larger, heavier samples used in welding and other demanding applications. Models include analog and digital, with options to upgrade to automatic configurations.
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Product
Multi-Function Test & Measurement System
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Optoplex’s Multifunction Test and Measurement System (TM100 Series) is designed to provide a flexible and cost effective optical test and measurement solution, particularly for manufacturing lines. The mainframe can be mounted in 19” rack or stationed on desk-top for ease of use. There are many selections of the pluggable modules, from tunable laser, optical spectrum analyzer, EDFA, power meter, ASE light source, optical tunable filter, optical performance monitor, …, etc.
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Product
CRPA Test System
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The Spirent CRPA Test System is a development of Spirent’s GSS9000 Series platform for testing Controlled Reception Pattern Antenna (CRPA) systems with a separate RF output per antenna element. The CRPA Test System generates both GNSS and interference signals. Users can control multiple antenna elements. Null-steering and space/time adaptive CRPA testing are both supported by this comprehensive wavefront approach.
