Microscopes
Enlarge view of minute objects.
See Also: Scopes, Microscopy, Fiberscopes, Borescopes, Endoscopes, Oscilloscopes, Stethoscopes, Stroboscopes, Synchroscopes, Telescopes, Vectorscopes, Acoustic Microscopes, Infrared Microscopes, Atomic Force Microscopes
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Objective Lenses
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The objective lens is the most complex and the most important component in a microscope. The multi-element design of these lenses works to produce the real image, which is then seen through the ocular lens. With Olympus’ range of microscope objective lenses, we provide outstanding optical performance from visible light to near infrared.
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Laser Repair System
LCD-4400
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The LCD4400 offers an economical, precision instruments designed to repair short, remove excess material (ITO, Cr, Al…) on panel before or after assembly. Featuring lightweight, state of the art technology, the LCD4400 focuses a Nd:YAG laser directly through microscope objective.
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AFM (Atomic Force Microscope) Optical Platform
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The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
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Semiconductor Wafer Microscope Inspection System
MicroINSPECT
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MicroINSPECT Semiconductor Wafer Defect Microscope Inspection System combines state-of-the-art robotics, intelligent microscopes and SITEview software to provide a flexible, easy-to-operate defect inspection platform for either micro or macro defect wafer inspection.
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Cleanliness Inspection System / Microscope
CIX90
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The OLYMPUS CIX90 technical cleanliness inspection system is a dedicated, turnkey solution for manufacturers who maintain high quality standards for the cleanliness of manufactured components. The OLYMPUS CIX90 system makes it easy to quickly acquire, process, and document technical cleanliness inspection data to comply with international standards. The system is intuitively designed to guide users through each step of the process so that even novice inspectors can acquire important cleanliness data quickly and easily.
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Raman Imaging & High Resolution Spectrometer
LabRAM Odyssey
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Special 50 years anniversary series: true confocal Raman microscope enabling the most detailed images and analyses to be obtained with speed and confidence. Ideally suited for both micro and macro measurements, it offers advanced confocal imaging capabilities in 2D and 3D. With guaranteed high performance and intuitive simplicity, the LabRAM Odyssey™ is the ultimate instrument for Raman spectroscopy, widely used for standard Raman analysis, PhotoLuminescence (PL), Tip Enhanced Raman Spectroscopy (TERS) and other hybrid methods.
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Atomic Force Microscope
Flex-Mount
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Flex-Mount is a unique AFM that can be configured to acquire high-resolution information on large, non-planar and demanding samples. The Flex-Mount solution combines the superior resolution and performance of the Nanosurf FlexAFM scan head with the integrability of the Nanosurf NaniteAFM.
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X-ray Analytical Microscope (Micro-XRF)
XGT-9000
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- <15µm probe size with ultra-high intensity without compromising sensitivity or spatial resolution. - High resolution cameras and multiple illumination modes to help capture images.- Dual types of detectors for transmission and fluorescent X-rays.- Detectable element range down to carbon with a light element detector.
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Microscope
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Shanghai Selon Scientific Instrument Co. Ltd.
An optical instrument used for viewing very small objects, such as mineral samples or animal or plant cells, typically magnified several hundred times.
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AFM & NSOM
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A new sample scanning atomic force microscope (AFM) designed for ease-of-use and simple installation.
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Fluorescence Microscopes
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Bruker’s suite of fluorescence microscopy systems provides a full range of solutions for life science researchers. Our multiphoton imaging systems provide the imaging depth, speed and resolution required for intravital imaging applications in neuroscience, oncology and immunology. Our confocal systems enable cell biologists to study function and structure using live-cell imaging in cell cultures and invertebrate model organisms at speeds and durations previously not possible. Bruker’s super-resolution microscopes are setting new standards with quantitative single molecule localization which allows for the direct investigation of the molecular positions and distribution of proteins within the cellular environment. Our latest addition, Luxendo light-sheet microscopes, are revolutionizing long-term studies in developmental biology and investigation of dynamic processes in cell culture and small animal models.
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Product
Modular Infinity Microscope
MIM
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Applied Scientific Instrumentation
ASI Modular Microscope components consist of tube lenses along with adapters and accessories that either are primarily used in the collimated light space or adapters that are to be used on the image side. Collimated light adapters use the 38mm diameter C60-RING system to connect components. Focus-side adapters attached to lens tubes with either a 30mm diameter coupling to the I.D. of the C60-TUBE, or with a 50mm coupling on the O.D. of the lens tube.
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Product
SAM Auto Line
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PVA TePla Analytical Systems GmbH
The fully automated acoustic microscopes from the SAM Auto Line enable simple detection of cavities, voids, bubbles, inclusions, and delamination and are ideally suitable for wafer inspection, bond checking, and MEMS inspection. An automatic defect-review software package performs a fully automated evaluation of the entire wafer. The results can be issued as klarf files and VEGA MAP. A GEM/SECS connection is also possible.
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Digital Video Inspection Microscope
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Contamination is the first reason for troubleshooting optical networks. Proactive inspection and cleaning of fibre connectors can prevent poor signal performance, damage to equipment, and network downtime. DIAMOND’s Video Microscope Kit contains all necessary tools for proper inspection and cleaning of the connector’s front-faces to help ensure optimal connector performance.
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Flexible AFM
SA-AFM
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The SA-AFM is a flexible AFM for scanning all sizes and shapes of samples. A complete system for life sciences samples, large samples, routine scanning of technical samples, and nanotechnology research. The SA is easily integrated with inverted microscopes.
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Microscope Cameras
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Leica microscope cameras are remarkable for their fast live image speeds, short reaction times, high pixel resolution, and clear contrast. They can be installed on many of the Leica microscopes and macroscopes.
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Galvo-Resonant Scan Head and Controller
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Our LSK-GR08(/M) Galvo-Resonant Scanner contains one resonant scan mirror and one galvo scan mirror that deflect an incident laser beam in X and Y, respectively. Identical to the galvo-resonant scanner used in our Bergamo® II multiphoton microscopes and complete Cerna®-based confocal systems, the 8 kHz resonant frequency of the resonant scan mirror enables much higher-speed scans than a galvo-galvo system. In our Bergamo system, the scanner can achieve 30 fps at 512 x 512 pixels image resolution.
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Product
MPO Visual Cable Verifier Kit
KI-TK824
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Kingfisher's unique and innovate MPO Visual Cable Verifier Kit is a quick, versatile and inexpensive way to visually check MPO cable installations and patch leads for polarity and continuity, and overall end face condition. Just connect the source, and view the far end with the microscope to observe the repeating color pattern at the far end. Fiber 1 is easily identified with a winking light.
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Nuclear Magnetic Resonance Spectrometer
NMR
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NMR is an abbreviation for Nuclear Magnetic Resonance. An NMR instrument allows the molecular structure of a material to be analyzed by observing and measuring the interaction of nuclear spins when placed in a powerful magnetic field.For the analysis of molecular structure at the atomic level, electron microscopes and X-ray diffraction instruments can also be used, but the advantages of NMR are that sample measurements are non-destructive and there is less sample preparation required.Fields of application include bio, foods, and chemistry, as well as new fields such as battery films and organic EL, which are improving and developing at remarkable speed. NMR has become an indispensable analysis tool in cutting-edge science and technology fields.
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End Face Inspection Microscopes
D SCOPE EFI – D SCOPE EFI-C – D SCOPE EFI-C LWD
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The new D Scope EFI for MTP/MPO and multifibers field connectors is a cost effective microscope for inspecting fiber optic patchcords and cassettes.
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Metallographic Equipment
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Beijing TIME High Technology Ltd.
Specialized tools for preparing and examining materials, such as cutting machines, mounting presses, grinding and polishing machines, and metallurgical microscopes.
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Digital Microscope Camera
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Providing you the best range of digi eye 510 microscope camera, digital microscope camera, digi eye 510c microscope camera, digi eye 210 digital microscope camera, digi eye 510c digital tablet and digi 4k microscope camera with effective & timely delivery.
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Scanning Electrochemical Microscope
VS-SECM (DC And AC)
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The SECM integrates a positioning system, a bipotentiostat, and an ultramicroelectrode probe or tip. The positioning system moves the probe close to the surface of the sample, within the local imaging zone. The bipotentiostat can polarize the probe only (feedback mode) or the sample and the probe independently (generator-collector mode), while measuring the resulting current(s). The probe is specially designed to have a specific tapered polish (per the RG ratio) and active radius below 100 microns. The positioning system scans the probe and charts position with measured electrochemical parameters, creating a data map of local current.
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Complex of Visualization and Image Recording for a Video Microscope
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To develop a complex for visual inspection of electronic components (other micro-objects) in order to identify visual defects, record the resulting image and transfer information for processing.
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Imaging & Analysis
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Microscopes offered by Buehler generally fall into the categories of stereo microscopes, upright microscopes, or inverted microscopes. Inverted microscopes are commonly referred to as metallurgical microscopes. Microscopes may offer episcopic (reflected light) observation, diascopic (transmitted light) observation, or both possibilities. Illumination may be delivered in bright field mode (BF) or dark field mode (DF), and several techniques such as differential interference contrast (DIC) and polarized light microscopy make use of the nature of light to reveal specific pieces of information when studying materials.
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Low to Modest Volume Clean, Inspect & Test
KI-TK071A
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1310/1550 nm & 850/1300 nm source & Autotest power meter + acceptance reporting software, inspection microscope, cleaning materials. Interchangeable MPO, MPO/APC, SC, LC connectors (EAR99 Restricted)
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Failure Analysis
MicroINSPECT 300FA
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The MicroINSPECT 300FA is an automated wafer inspection tool used for semiconductor wafer failure analysis. Its small footprint, high speed, and low cost relative to its rich features yield a superb cost of ownership and makes this an ideal tool for your fab or failure analysis lab. The MicroINSPECT 300FA combines advanced robotics, wafer sorting, an intelligent wafer inspection microscope together with SiteVIEW Software to produce an integrated failure analysis tool.
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Low to Modest Transmission Test Kit
KI-TK082
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Power meter, VFL pen, inspection microscope, cleaning materials. Interchangeable SC / LC connectors
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Thermal Microscope Stage For Petri Dish
TS-4SMP
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With our TS-4SMP Thermal Stage for Petri Dish, a specimen on a microscope slide or culture dish can be maintained at any temperature between -20°C and +60°C. Setup is easy, takes little time, and the controller will regulate the stage temperature to within +/-0.1°C. The collar on the stage is designed to accommodate a 35mm 'Nunc' petri dish. The collar may also be removed for use with slides.
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Infrared Microscope
DDR200 & DDR300
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The McBain DDR200 and DDR300 for 200mm and 300mm wafer defect detection and review are unmatched in value and features in this special application and price category. The systems offer significant and unique advantages for both production and engineering use, and provide an ideal solution when both defect detection and dimensional metrology are required.
