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Product
Micro Vickers Hardness Tester
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Sinowon Innovation Metrology Manufacture Ltd.
◆ MicVision main use in testing materials allows for the measurement of the hardness of small or thin specimens and small areas of larger specimens, MicVision testing is commonly used to determine characteristics of thin sheets, foils, fine wire, epoxies, paints, etc. and is often employed in R&D applications .◆ MicrVision hardness is especially useful in determining hardness variations, caused by hardening, quenching, plating, fabrication, welding or annealing, bonding, etc. Micro hardness testing can be accurately employed using loads as slight as 10 gram, somewhat less and considerably more in certain situation.
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Product
RF Power Transistors
Silicon Bipolar
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Macom Technology Solutions Holdings Inc.
At MACOM we offer a broad range of silicon bipolar transistor products designed for applications ranging from DC to 3.5 GHz. Our silicon bipolar transistors are ideal for civil avionics, communications, networks, radar, and industrial, scientific, and medical applications. Our all-gold metallization fabrication processes ensure high performance and long term reliability for ground and space applications.
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Product
20μm Transparent Quartz Interdigitated Electrode (IDE)
TIE1
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20 μm transparent interdigitated electrode (IDE) fabricated on a high-quality quartz substrate for MEMS sensors, gas sensing, biosensing, optoelectronic detection, and electrochemical research. Manufactured using precision microfabrication with customizable electrode materials, dimensions, and layouts for laboratory, sensor development, and OEM applications.
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Product
Terahertz imaging cameras
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The detectors are fabricated with a GaAs high-mobility heterostructure in the standard semiconductor cycle using conventional optical lithography. The imaging sensor is manufactured on a single wafer. That process ensures high homogeneity and reproducibility of the plasmonic detector parameters (pixel-to-pixel deviation responsivity is within a 20- percent range). Each detector unit has a room-temperature responsivity up to 50 kV/W with read-out circuitry and noise-equivalent power of 1 nW/\sqrt{\rm{Hz}} in the frequency range 10 GHz — 1 THz. The detection mechanism is based on excitation of plasma oscillations in a two-dimensional electron system with subsequent rectification. The rectification takes place on special defects made in the electron system.
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Product
L-Band RF Tuner and 2-Channel 500 MHz A/D with Virtex-7 FPGA - XMC
Model 71791
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- Accepts RF Signals from 925 MHz to 2175 MHz- Programmable LNA handles L-Band input signal levels from -50 dBm to +10 dBm- Programmable analog downconverter provides IF or I+Q baseband signals at frequencies up to 123 MHz- Two 500 MHz 12-bit A/Ds digitize IF or I+Q signals synchronously; optional: 400 MHz 14-bit A/Ds- Two FPGA-based multiband digital downconverters- Xilinx Virtex-7 VX330T or VX690T FPGAs- 4 GB of DDR3 SDRAM- Sample clock synchronization to an external system reference- PCI Express (Gen. 1, 2 & 3) interface, up to x8- Clock/sync bus for multimodule synchronization- VITA 42.0 XMC compatible with switched fabric interfaces- Optional user-configurable gigabit serial interface- Optional LVDS connections to the Virtex-7 FPGA for custom I/O
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Product
CXAR Custom Chassis
Chassis
Cytec has a complete metal fabrication shop and a laser etching machine so we can build custom systems with very low NRE. Module arrangement, custom labeling, custom configurations are done fairly easily and nearly 50% of the systems we build are not shown in our standard product line. Don't see what you need? Just ask!
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Product
ICI Pilling Box Tester
UI-TX05
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ICI Pilling Box Tester is used to assess fabric surface pilling and fuzzing by tumbling randomly. This pilling test machine is also called as ICI pilling and snagging tester/ICI pilling box. ICI pilling box test method includes ISO 12945.1, BS 5811, GB/T 4802.3, JIS L1076, etc.
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Product
Fabric Pneumatic Bursting Tester
TF142C
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TESTEX Testing Equipment Systems Ltd.
Fabric Pneumatic Bursting Tester, to determine the bursting pressure of fabrics uses pneumatic test method, including knits, woven fabric, non-woven fabric, laminated fabric and other craft-made fabric.A test specimen is clamped over an expansive diaphragm by a circular clamping ring, increasing compressed air pressure is applied to the underside of the diaphragm, causing distension of the fabric until the test specimen bursts, the bursting strength and distension are determined.
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Product
Sensor
Lepton
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The FLIR Lepton™ is the most compact longwave infrared (LWIR) sensor available as an OEM product. It packs a resolution of 80 × 60 or 160x120 pixels into a camera body that is smaller than a dime. This revolutionary camera core is poised to equip a new generation of mobile and handheld devices, as well as small fixed-mount camera systems, with thermal imaging capabilities never seen before. Lepton contains a breakthrough lens fabricated in wafer form, along with a microbolometer focal plane array (FPA) and advanced thermal image processing. In order to support the lepton and make it easy to use, we have developed a breakout board to support the module along with example source code. Please see the Lepton Thermal Camera Breakout Datasheet for more information.
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Product
Yarn Count Tester
TY361
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TESTEX Testing Equipment Systems Ltd.
Yarn Count Tester, automatically calculates count systems used for sliver, roving and yarn, and can also be used for fabric yield. Yarn Count Tester consists of an accurate electronic balance and built-in calculating program.
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Product
VPX
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VPX, formerly known as VITA 46, is an ANSI standard (ANSI/VITA 46.0-2007) that provides VMEbus-based systems with support for switched fabrics over a new high speed connector.
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Product
Electronic Crockmeter
UI-TX51
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Electronic Crockmeter (Crock Meter) is used to test color transfer of colored textile (leather, fabric and etc,) to other surface due to rubbing. It is test of colour fastness to rubbing, one of physical testing of textiles.
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Product
3-Channel 200 MHz A/D and 2-Channel 800 MHz D/A with Virtex-6 FPGA - 3U VPX
Model 52620
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- Complete radar and software radio interface solution- Supports Xilinx Virtex-6 LXT and SXT FPGAs- Supports gigabit serial fabrics including PCI Express, Serial RapidIO and Xilinx Aurora- Three 200 MHz 16-bit A/Ds- One digital upconverter- Two 800 MHz 16-bit D/As- Up to 2 GB of DDR3 SDRAM or 32 MB of QDRII+ SRAM- Sample clock synchronization to an external system reference- LVPECL clock/sync bus for multimodule synchronization- Optional LVDS connections to the Virtex-6 FPGA for custom I/O- 3U VPX form factors provides a compact, rugged platform- Compatible with several VITA standards including: VITA-46, VITA-48 AND VITA-65 (OpenVPX™ System Specification)- Ruggedized and conduction-cooled versions available- Synchronize up to eight modules with Model 7893 System Synchronization and Distribution Amplifier - PCIe
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Product
Wrinkle Recovery Tester
TF112 AATCC
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TESTEX Testing Equipment Systems Ltd.
AATCC Wrinkle Recovery Tester is used for determining a fabric's ability to recoverafter wrinkling under a pre-determined load for a set period of time.Provided with a set of 5x3 dimensional plastic replicas to grade fabrics 1-5.
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Product
0 Hz/DC to 14 GHz, Single-Pole, Four-Throw MEMS Switch With Integrated Driver
ADGM1304
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The ADGM1304 is a wideband, single-pole, four-throw (SP4T) switch, fabricated using Analog Devices, Inc., microelectro-mechanical system (MEMS) switch technology. This technology enables a small, wide bandwidth, highly linear, low insertion loss switch that is operational down to 0 Hz/dc, making it an ideal switching solution for a wide range of RF applications. An integrated control chip generates the high voltage necessary to electrostatically actuate the switch via a complementary metal-oxide semiconductor (CMOS)-/low voltage transistor-transistor logic (LVTTL)-compatible parallel interface. All four switches are independently controllable. The ADGM1304 is packaged in a 24-lead, 5 mm × 4 mm × 0.95 mm lead frame chip-scale package (LFCSP).
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Product
PULSE IMPATT DIODES FROM 30 TO 140 GHz
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Insight Product Company offers IMPATT diodes with pulse power up to 20 Watt and operational frequency range up to 140 GHz. Silicon p+-p-n-n+ IMPATT diodes are designed to be used in the millimeter wave oscillators and amplifiers. They are fabricated in the metal-ruby packages with hard-lead carrier (diameter 3.0 mm, 1.5 mm).
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Product
Fabric Unidirectional Water Transmission Performance Tester
DRK-UPT1
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Shandong Drick Instruments Co., Ltd.
The unidirectional water transmission performance tester is a special instrument for measuring the unidirectional water transmission performance of textiles.
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Product
ICI Mace Snag Tester
UI-TX07
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ICI Mace Snag Tester – ICI Mace Tester is used to test fabric snagging resistance ability. It is suitable for woven and hnitted fabric made from textured or untextured filament yarns and etc. ICI Mace Snag Test Method includes ASTM D3939, JIS L1058, GB/T 11047 and etc.
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Product
Scorch Tester (Sublimation Fastness Tester)
TF415D
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TESTEX Testing Equipment Systems Ltd.
Scorch Tester, to determine fabrics Ironing color fastness and sublimation color fastness, and dimensional stability under hot dry conditions. Sublimation Fastness Tester complies with ISO 105, BS 1006, AATCC 92/114/117/133. Sublimation machine price is reasonable.
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Product
Textiles
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Physical Property Testers Group
From raw materials to fabric manufacture, to garment makers and machinery manufacturers, all of varying size and resource. Within this chain sits 'Textile Testing', the purpose of which is to test materials before, during and after material processing, to confirm the finished product quality.
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Product
1 kW and 2 kW Laser-Based Floating Zone Furnace
Laser Furnace
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The 1 kW and 2 kW laser furnace for single crystal fabrication is based on a design and developed in close cooperation with the RIKEN Center for Emergent Matter Science under the leadership of Yoshio Kaneko. Both melting zones have 5 lasers each, which guarantees a high uniformity of power density in the melting zone range. The laser profile has been optimized to reduce thermal stress during the crystal growth process. In addition, the system includes an integrated temperature sensor for real-time temperature monitoring. Temperatures up to 3000 °C can be reached and therefore materials with a very high vapor pressure, a narrow temperature range of the melt, a high thermal conductivity coefficient and incongruent melts can be melted.
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Product
Reverberation Tent
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This product is a chamber made of metal flexible fabric tent assembled as a cavity that provides a periodic electro-magnetic environment randomly polarized, spatially uniform, and isotropic.
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Product
CW IMPATT DIODES FROM 30 TO 140 GHz
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Insight Product Company offers IMPATT diodes with CW power up to 400 mW and operational frequency range up to 140 GHz. Silicon p+-p-n-n+ IMPATT diodes are designed to be used in the millimeter wave oscillators and amplifiers. They are fabricated in the metal-ruby packages with hard-lead carrier (diameter 3.0 mm, 1.5 mm).
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Product
Design and Fabrication Laboratory
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Trialon’s on-site Fabrication Shop is equipped with the tools and experienced staff to design and fabricate custom parts, test fixtures or small batch finished product. Our team is ready to provide your organization with a best-in-class experience that will meet tight timeline.
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Product
Substrate Manufacturing
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KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
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Product
Fryma Extension Tester
TF143
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TESTEX Testing Equipment Systems Ltd.
Fryma Extension Tester, to simply and economically determine the stretch and recovery of textile fabrics, both knitted and woven. The apparatus consists of a loading frame with clamps and a screw tensioning device, two 3kg loading weights and sample cutting templates.
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Product
12 lane, 5 port, PCI Express
PEX 9712
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Broadcom has extended the reach of PCIe for use as a fabric for data center and cloud computing through its ExpressFabric initiative and platform of hardware and software. ExpressFabric can eliminate expensive bridging devices within the rack, such as adapter cards that translate native PCIe to Ethernet and back to PCIe.
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Product
Pressure Sensors
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ST’s tiny silicon pressure sensors use innovative MEMS technology to ensure extremely high-pressure resolution in ultra-compact and thin packages. The devices implement proprietary technology for the fabrication of pressure sensors on monolithic silicon chips, which eliminates wafer-to-wafer bonding and maximizes reliability.
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Product
Hot Embossing Systems
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EV Group’s series of high-precision hot embossing systems are based on the company’s market-leading wafer bonding technology. Excellent pressure and temperature control as well as uniformity over large areas allow for high accuracy imprints. Hot embossing is a cost-effective and flexible fabrication technology with very high replication accuracy for feature sizes down to 50 nm. The systems are well suited for embossing complex micro- and nanostructures and high-aspect ratio features into a wide range of polymer substrates or spin-on-polymers. The combination with stamp-to-substrate alignment allows alignment of hot embossing to pre-processed substrate structures.
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Product
Growler Tester
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Being the reckoned names in the industry, we offer wide range of Growler Tester that are fabricated using"very high quality raw material which ensures high durability at its user end. These armature growler tester are widely finds its application in industrial and commercial sectors. They are light in weight and ensure performance based. Furthermore, we offer them at most affordable rates.
