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Inspection Microscope
Z-NIR
The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
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Spectroscopic Ellipsometers
SENresearch 4.0
The SENresearch 4.0 is the new SENTECH spectroscopic ellipsometer. Every individual SENresearch 4.0 spectroscopic ellipsometer is a customer-specific configuration of spectral range, options and field upgradable accessories. SENresearch 4.0 uses fast FTIR ellipsometry for the NIR up to 2,500 nm or 3,500 nm, respectively. It provides broadest spectral range with best S/N ratio and highest, selectable spectral resolution. Silicon films up to 200 µm thickness can be measured. The measurement speed of FTIR ellipsometry compares to diode array configurations, which are also selectable up to 1,700 nm. The new motorized Pyramid Goniometer features an angle range from 20 deg to 100 deg. Optical encoders ensure highest precision and long term stability of angle settings. The spectroscopic ellipsometer arms can be moved independently for scatterometry and angle resolved transmission measurements.
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FT-NIR for Process Analytics
QuasIR™ 2000E
Galaxy Scientific’s QuasIR™ 2000E is designed for continuous measurement of the chemical composition of material transported on a conveyor belt, through a pipe, or in a chute. Our unique external projection optics use high powered tungsten lamps to illuminate the sample from as far as 24 inches away and collect the scattered reflection off the sample through a fiber optic cable. The analysis spot size can be set as small as 0.5″ or as large as 8″ in diameter and can be custom tailored to applications needs.
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Automated Coolant and DEF Analyzer
CoolCheck 2
The analyzer employs both NIR and UV spectrometers to determine the health of your coolant system.
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Spectroscopy
NIRS XDS Process Analyzer
NIRS XDS Process Analyzer systems can measure a variety of sample types, such as granules, powders, liquids, slurries, or opalescent substances, among others. These analyzers provide fast, nondestructive analysis of pharmaceutical, chemical, and petrochemical products. If required, up to 9 inline measuring channels can be multiplexed with this system.
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OEM CCD Camera
Syncerity BI-NIR Camera
The TE-cooled back illuminated 2048 x 70 CCD Camera combines affordability, performance and versatility for OEM applications. With peak QE of 84% @ 700nm and 20% at 1050nm, Syncerity BI-NIR offers a relatively broad response and addresses multiple applications. In the near-NIR, this detector is a much lower cost alternative to a deep depleted CCD, with no etaloning. Syncerity’s flexible design allows our OEM-dedicated team to quickly adapt the camera for industrial requirements, ranging from alternate CCD chips to electronics
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10 Gigabit Ethernet Cameras
HR Series
Our cameras are available with resolutions of 2, 4, 12, and 20 megapixels in monochrome, color, or near-infrared enhanced (NIR) with full frame rates of up to 338fps, 179fps, 84fps, and 32fps respectively (we can also provide taped on glass). As the first 10GigE industrial digital camera series in the world, our HR and HT cameras (coming soon) obtain their high performance from industrial CMOS sensors with Global Shutter technology in combination with the cross-industry standard 10 Gigabit Ethernet (10GigE) interface.
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Spectrometer
VIS-NIR
Wavelength range is 420 nm to 1100 nm with 4 nm resolutionHD Volume Phase Holographic GratingBack-thinned Si CCD with low noise electronicsExtreme low stray light and high transmissionShort acquisition time and high SNR spectraTEC cooling option availableBluetooth option availableFiber coupled or free spaceOEM Solution
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Spectroscopy
NIRS Analyzer PRO
The NIRS Analyzer PRO is a system for the nondestructive, direct analysis of granules, powders, liquids, slurries, or opalescent substances.
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Incoherent Sources
Our Incoherent Sources include unmounted LEDs, mounted LEDs, collimated LEDs, LED light sources, superluminescent diodes, and broadband light sources. Our collimated LEDs are particularly popular and are compatible with many microscopes. Versions are available with center wavelengths from the UV into the NIR or that emit white light.
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Mercury Argon Calibration Source
HG-1
The compact, low-cost HG-1 Mercury Argon Calibration Source is a spectral wavelength calibration source for UV-VIS-Shortwave NIR spectrophotometric systems.
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UV-VIS-NIR Spectrophotometer
SolidSpec-3700i/3700iDUV
The SolidSpec-3700i/3700i DUV have three detectors which cover the range from ultraviolet to near-infrared.
