Memory Device
directly accessible computer's internal or main memory.
See Also: Memory, Memory Test, DDR, NAND, DRAM, RAM, ROM, Memory Testers, DUT
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RF Device Tester
RF ITS
Sterner's automated test management system, combined with integrated RF technology modules, provides full functionality, including: Apply power to the device under test (DUT). Read and write blocks of data to set up and validate product EEPROM using a hard-wired communications interface. Scan transmitting devices or traveller barcodes and write the information to the DUT (the "sign-up process"). Inject an RF signal of known frequency and power level to test receiver sensitivity.
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High Speed Device & Flash Programmer
JT 2147 QuadPOD
The JT 2147 QuadPOD high speed device programmer and flash programmer comprises JT 2148 transceiver and four independent, programmable JT 2149 TAP PODs and provides signal conditioning for the DataBlaster series of boundary-scan controllers. Used for gang, parallel, fast testing / Programming of devices.TAP pods can be housed integrally within the transceiver or they can be detached and reconnected via the (optional) one meter extension cable. The JT 2148 transceiver is available in standard (/10) or industrial (/13) variants. The /13 variant includes a SCSI cable splitter to allow system integrators to use flat ribbon cables into the transceiver itself which often simplifies fixture building.A fixture-embedded variant of the JT 2147 is available as part reference JT 2147/FXT. This unit integrates the function of the transceiver and four pod onto a single assembly. This variant can also support 64 DIOS channels and SCIL functions (see more images below for a picture of the JT 2147/FXT).
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Clock Distribution Devices
Analog Devices offers ultralow jitter clock distribution products that fan out given signals for wireless infrastructure, instrumentation, broadband, ATE, and other applications demanding subpicosecond performance. Our clock products are ideal for clocking high performance analog-to-digital converters (ADCs) and digital-to-analog converters (DACs). ADI clock ICs integrate PLL cores, dividers, phase offset, skew adjust, and clock drivers in small chip scale packages.
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Stand Alone Test Device
The ENGMATEC Smart Contact Cell works with goods carriers that move above and below each other. This enables the test objects to be fed in and removed in parallel, which significantly reduces handling times.
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Battery Test device
ATGB 1200
The ATGB 1200 is a battery tester for all standard battery technologies aimed at quality assurance, production and product development. Advantages of the ATGB: Creation of customized test sequences. Generation of load curves and peaks. Temperature measurement at the battery
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Microfluidic Device Manufacturing Solutions
We provide production automation solutions for microfluidic device manufacturing with precise liquid dispensing. We offer solutions for your POC test, molecular and immunodiagnostics and microfluidic devices manufacturing.
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DC High-Voltage Test Device
PGK 80
BAUR Prüf- und Messtechnik GmbH
Cable testing and diagnostics with the BAUR PGK 80. The portable, one-piece PGK 80 high-voltage test device for generating negative DC voltage up to 80 kV is primarily used for onsite testing of paper-insulated mass-impregnated cables in the medium-voltage network. The high voltage is generated through a high-voltage transformer with secondary voltage-multiplier. The internal operating frequency of 20 kHz enables the smallest of device dimensions.* Continuous adjustable output voltage* The voltage measurement is done directly at the high voltage output* Timer of 1-30 min* Sensitive current measurement for recording the smallest of insulation currents with 6-time range switch, decadal
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Charge-Coupled Devices ("CCD") Cameras
Improve limits of detection and quantification. The camera generates large amounts of data, but handles it smoothly via the new super speed USB 3.0 interface.
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Passive Devices
Passive Devices by Senko - attenuators, fused products, optical switches, plc splitter series, routing, WDM series, and more
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PCI-8532, 1-Port, DeviceNet Interface Device
781062-01
The PCI‑8532 is a high-speed DeviceNet Interface for developing applications with the NI‑Industrial Communications for DeviceNet driver. DeviceNet is based on the controller area network (CAN) physical layer and increases strength and interconnectivity by specifying various parameters, such as the required cable length, connectors, and baud rates. The DeviceNet specifications are managed by OVDA, Inc. You can program the PCI‑8532 to add high-performance master/scanner or slave capabilities to DeviceNet networks.
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DC High-Voltage Test Device
PGK 50
BAUR Prüf- und Messtechnik GmbH
Cable testing and diagnostics with the BAUR PGK 50. The portable, one-piece PGK 50 high-voltage test device for generating negative DC voltage up to 50 kV is primarily used for onsite testing of paper-insulated mass-impregnated cables in the medium-voltage network. The high voltage is generated through a high-voltage transformer with secondary voltage-multiplier. The internal operating frequency of 20 kHz enables the smallest of device dimensions.* Continuous adjustable output voltage* The voltage measurement is done directly at the high voltage output* Timer of 1-30 min* Sensitive current measurement for recording the smallest of insulation currents with 6-time range switch, decadal
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G7 Connected Safety Devices
Our G7 product line incorporates leading incident detection and advanced location technology with 3G and satellite communications to ensure seamless monitoring. From gas detection to lone worker monitoring and evacuation management, G7 has your teams covered.
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Highest Throughput For Fragile Devices
Ismeca NY20
20-position turret platform for semiconductor test, inspection and packaging, provides the highest quality yield and throughput. It integrates innovative hardware and software technology such as intelligent features that enable extended autonomous operation and productivity.
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Biomagnetic Devices
Electrical measurements of physiological potentials are well established in clinical diagnostics. The flow of an electrical current creates a corresponding magnetic field. Thus bioelectric activity will generate biomagnetic fields. These fields can be detected with Tristan SQUID magnetometers. For many of the classical electrical techniques such as ECG and EEG, there are corresponding magnetic techniques (magnetocardiography or MCG and magnetoencephalography or MEG). In some cases (magnetopneumography, hepatic iron store measurements, intestinal ischemia, peripheral nerve and muscle activity), there is no corresponding electrical technique and biomagnetic measurements offer unique measurement capabilities. Unlike CT or MRI imaging which yield structural information, biomagnetic measurements offer real-time functional imaging.
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Photonic Device Assembly
Although the lion’s share of photonic device assembly is still for discrete components and devices, the recent developments in photonics integration illustrate well the ensuing dramatic evolution of the photonics market. In transitioning from the use of bulky macro-systems to micro-optical components to integrated optics, the photonics sector is experiencing what has become true for the electronics market since the 1970’s.
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Discrete Device Test System
capability to perform parallel testing of power discrete devices. As the standard specifications of mainframe, 341-TT/P has 1.2kV/20A and 351-TT/P has 2kV/50A capabilities. These systems have 2 testing subsystems, each of which has 4-station capability by multiplexing to 4 handler/prober stations for high volume production testing.
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Rugged Aircraft Interface Devices
AB2-AID
The AB2-AID is ready to go with high-performance avionics I/O combined with valuable built-in features such as a 9-port Ethernet switch, Ethernet to serial bridge, and 8GB flash memory. All in a compact, rugged package for easier integration and longer life.
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Flash Storage Device
Axiomtek provides various industrial-grade flash storage device for customers to simplify and shorten the system design time.
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Wired Serial Device Server
SD-300
The Silex SD-300 and SD-310AN are designed to easily connect and share RS-232 serial devices over a wired or wireless network. Industrial automation, building automation, medical devices, security access and control, point of sale devices, LED signs, bar code/label and other specialty printers, or virtually any other device with a serial port can be now be enabled with secure, robust wired or wireless network capability.
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Semiconductor Memory Tester
T5851
Advantest Corporation has introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops. The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well as test-program development or, when equipped with an automated component handler such as Advantest''''s M6242, high-volume production. As a fully integrated, system-level test solution, the T5851 provides multi-protocol support in one tool while its tester-per-DUT architecture and proprietary hardware accelerator allow it to achieve industry-leading test times.
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Differential And I/Q Device Measurements
S97089B
The S97089B combines source-phase control of multiple internal or external sources with frequency-offset mode, enabling simplified test of I/Q modulators/converters, differential mixers, and harmonics or amplifiers
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High-Voltage Test Device
PGK 110 HB
BAUR Prüf- und Messtechnik GmbH
Cable testing and diagnostics with the BAUR PGK HB. There are hardly any other longer-lasting, more robust and cost-effective testing devices than the two-piece high-voltage test devices from the PGK HB series. They generate continuous adjustable test voltages with mains frequency or optionally DC with positive or negative polarity. The display instruments for current and voltage, the safety control unit and the regulating transformer for the voltage are integrated in the operating unit.* Testing of medium- and high-voltage cables* DC voltage testing of up to 110 kV output voltage with positive or negative polarity* AC voltage testing - up to 80 kV for switchgear, busbars and insulating elements* Easy-to-maintain 2-piece design
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Backend Test For Packaging Devices
Power MOSFETs need a lot of different tests. We understand backend test, and have over 80% of our installations used in this application, operational 24hrs every day delivering fully tested and QA approved products at throughput rates up to 20kuph. Backend test, for power devices in particular, has a diverse, but well-established list of technical demands to detect both failures and failure mechanisms.
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Pinhole Detection Devices
ElektroPhysik Dr. Steingroever GmbH & Co. KG
The coating control by means of pore testing makes use of electrical voltage in order to uncover microscopically small defects (> 20 μm) in the coating of a surface. If even a small defect can be detected during pore testing of surface coatings, urgent action is required. Minimal flaws in the coating are sufficient to cause great damage.
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All-in-one Positioning, Navigation and Timing Device
VersaPNT
VersaPNT is the first all-in-one Resilient Positioning, Navigation and Timing (PNT) solution that delivers accurate, software-configurable position, navigation, altitude, time, and frequency signals under any circumstances. Now with M-Code!
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High-Voltage Test Device
PGK 150 / 5 HB
BAUR Prüf- und Messtechnik GmbH
Cable testing and diagnostics with the BAUR PGK H. There are hardly any other longer-lasting, more robust and cost-effective testing devices than the two-piece high-voltage test devices from the PGK HB series. They generate continuous adjustable test voltages with mains frequency or optionally DC with positive or negative polarity. The display instruments for current and voltage, the safety control unit and the regulating transformer for the voltage are integrated in the operating unit.* Testing of medium- and high-voltage cables* DC voltage testing of up to 150 kV output voltage with positive or negative polarity* AC voltage testing - up to 110 kV for switchgear, busbars and insulating elements* Easy-to-maintain 2-piece design
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PathWave IC-CAP Device Modeling Platform
W7300B
The W8500BP IC-CAP Device Modeling Platform Bundle provides the basic tools you need to start modeling devices and circuits. It provides the necessary tools to:
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Keysight 64-bit Digital I/O with Memory and Counter for 34980A
34950A
The Keysight 34950A module for the 34980A Multifunction Switch/Measure Unit has 64 bi-directional lines configured as eight 8-bit channels. Each 8-bit channel has programmable polarity and thresholds up to 5V. The memory is useful for simulating and capturing digital patterns up to 10 MHz. It provides configurable handshaking protocols for a wide variety of applications.
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Asphalt Layer Thickness Measurement Devices
ElektroPhysik Dr. Steingroever GmbH & Co. KG
Non-destructive road layer thickness measuring gauge to measure bituminous road layers or other electrically insulating road layers.
