System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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Compliance Test Systems
LMG Test Suite
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ZES ZIMMER Electronic Systems GmbH
The ZES ZIMMER test system LMG Test Suite tests in accordance with the currently valid version of EN 61000-3-2/-12 or EN 61000-3-3/-11 and also supports measurements per ECE R-10.4 Annex 11 (e.g. electromagnetic compatibility of vehicles). As a manufacturer of precision power measurement technology, we are represented on the international standards committee. As a result, changes in standards are immediately incorporated into our test systems.
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Product
2-Slot USB/LXI Modular Chassis
60-104-001
Chassis
This 2-slot USB/LXI modular chassis offers a small lightweight form factor, making it ideal for portable, benchtop, and space restrictive applications. The chassis is designed for desk or rack mounting and features remote control via USB or LXI Ethernet. Remote control over a network enables the switching function of a test system to be located as close as possible to the target equipment. The 60-104 chassis supports one or two 3U PXI modules and accepts Pickering's PXI products, it is the perfect platform to construct small scale applications. Possible systems include switching matrices up to 1104 crosspoints, 396 channel multiplexer or up to 36 channels of programmable resistor/sensor emulation.
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PXI 5W Programmable Resistor Module, 1-Channel, 3Ω to 22.3MΩ
40-252-054
Programmable Resistor Module
The 40-252-054 is a programmable resistor module with 1 channel which can be set between 3Ω and 22.3MΩ with 2Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Manual Flying Probe Test Systems
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They provide flexible measurement technologies like Kelvin and high voltage tests in combination with low tooling costs. atg Luther & Maelzer offers a wide range of different systems starting from standard systems with 8 heads up to oversized systems with 24 test heads.
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Discrete Device Test System
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capability to perform parallel testing of power discrete devices. As the standard specifications of mainframe, 341-TT/P has 1.2kV/20A and 351-TT/P has 2kV/50A capabilities. These systems have 2 testing subsystems, each of which has 4-station capability by multiplexing to 4 handler/prober stations for high volume production testing.
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PXI Precision Resistor Module 18-Channel, 1 to 31.5
40-297-010
Programmable Resistor Module
This PXI precision resistor provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Test Database Software Module
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The relational test database is the pivotal point of the software structure. On one hand, this is where the test applications and test systems used for productive testing are stored; on the other hand, it provides the storage space for all DUT-related test data. Depending on customer requirements, the test database may either be hosted locally on the test system or centrally on a server, supporting several test systems. The database performance is sufficient for a high-volume production environment with many test systems which access the central database in parallel. LXinstruments prefers to implement the database as a license-free MySQL database; it is however also possible to realize a version based on Microsoft SQL.
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Product
SWB-2815, 4x86, 0.3 A, Row Access, Reed Relay Matrix Module for SwitchBlock
781420-15
Reed Relay
4x86, 0.3 A, Row Access, Reed Matrix Module for SwitchBlock - The SWB‑2815 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Multi-Wafer Test & Burn-in System
FOX-XP
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The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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PXI Resistor Module 2-Channel 2R to 131k
40-293-034
Programmable Resistor Module
The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Semiconductor Test System
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IST Information Scan Technology, Inc.
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
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Magnetic-Field Test System
MTS-800
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The MTS-800 is a compact test system for broadband generation and measurement of magnetic fields. Its internal components allow automatic EMC tests according to automotivestandards where high field strength need to be generatedor measured.
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Bare Fiber Aligner
1120
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The Photon Kinetics 1120 Bare Fiber Aligner makes it possible to reduce test setup time to seconds, thereby reducing overall testing cost. Just strip the fiber, scribe and break it (or use a more precise fiber cleaver, if desired) and then insert the prepared end into the 1120. In an instant, the fiber is coupled to your OTDR or chromatic dispersion test system with low optical loss and low reflectance. The 1120's compact, ergonomic industrial design is well-suited for low to moderate volume fiber and cable testing applications where automated fiber alignment systems are less economical. It is particularly useful as part of an in-process or finished cable test station employing either the 8000i or 8000 OTDR, and the OASYS.net OTDR Automation Software.
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PCI High Density Pecision Resistor Card, 6-Channel, 4Ω To 5.82MΩ
50-298-052
Programmable Resistor Module
The 50-298-052 is a high density programmable resistor card with 6 channels which can be set between 4Ω and 5.82MΩ with 0.5Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Exchangeable Test Fixture
MA 2111/D/H/S-5/HG
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 10,70 kg
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Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
Test System
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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Stator & Coil Testing
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Electronic Systems of Wisconsin, Inc.
ESW Stator Test Systems come fully equipped with the latest industry features. The on-screen display in our testers allows the operator to visually see the part lead hook-up to the tooling connections. Our software makes it easier to read, track, and record your stator test information. While performing tests, you can watch the testing throughout the process in real time. You can view various wave-forms for surge or magnetic field, which can be displayed real-time and printed if desired. The software logs all test results, so that you do not have to worry about losing important information. ESW designs the tooling to be simple to connect the part. We work closely with you to define and implement your customized testing needs. The videos and slideshow below show some of our Stator Testers.
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PXI 10W Programmable Resistor Module, 2-Channel, 1Ω to 62.1Ω
40-253-011
Programmable Resistor Module
The 40-253-011 is a programmable resistor module with 2 channels which can be set between 1Ω and 62.1Ω with 0.25Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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IQC Test Systems
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Signalysis has worked with many Tier I and Tier II Automotive sub-suppliers to provide production test systems. Below are some examples of our systems; we have also supplied systems for wiper motors, axles, door panels, window mechanisms, and many other interior components.
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Battery Simulator
1200
Battery Simulator
The Battery Simulator 1200 provides isolated channels to simulate battery sink and source characteristics often used for testing a Battery Management System (BMS). The instrument can be used standalone with the soft front panel, or integrated into a larger test system. Its proper industrial cooling and cell channel isolation allows units to be easily stacked, providing solutions with over 200 channels of simulation capability. The built-in channel voltage and current readback reduces the need for external monitoring equipment.
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Testing Aircraft Components
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Sun Test Systems develops, produces, installs and services high-quality test equipment for testing various components of civil and military aircraft and helicopters.
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Radiated Immunity Test System
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Beijing KeHuan Century EMC Technology Co,.LTD
Radiation Immunity Test System.
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Test Cell Controller
RAPID
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The Rapid II Test Cell Controller is an integrated, multi-loop control and data acquisition system for test cell applications, designed to provide maximum performance at an affordable price. Rapid II combines the latest in digital control technology with off-the-shelf hardware to produce one of the industry's most powerful, flexible and advanced controllers at a cost-effective price. This high-speed, 4-channel PID controller includes ample I/O to act both as a system controller and a data acquisition system, reducing overall system cost and complexity. Designed for integrators, OEMs, and DIYers, these systems can be configured to fit your needs with little upfront costs and minimal risk while benefiting from a stable, powerful platform.
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Partial Discharge Test System
TPP
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The Partial Discharge Test System type TPP is used for non-destructive insulation and quality testing of electrical components (for example according VDE 0110-1, EN 50178, IEC 60270 and IEC 60060).
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Surge Arrester Testing
SCAR 10
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This MOV- Metal Oxide Varistor test system is the perfect device to perform analysis and diagnostics on metal oxide arrestors. It is supplied with a special current clip-on transformer designed for the measurement of current leakage.
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Informtest SAT
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«Информтест САТ» - это инновационная, высокотехнологичная среда для разработки циклограмм, осуществления процессов моделирования и тестирования любых объектов контроля, не имеющая аналогов российского производства. Крупнейшие научные и производственные центры (РКК «Энергия», ОАО «ИСС» им. Академика М.Ф. Решетнева) уже используют данное программное обеспечение. Informtest Holding presents a unique software product "Automatic Testing System". This product eliminates the need to involve programmers in the development of open source software for testing and modeling, a CAD of the Informtest SAT shell and one specialist is enough. Thanks to an intuitive graphical interface, the development of any necessary sequence diagrams is not difficult even for a user unfamiliar with the basics of programming. The system is constantly being improved and updated. It is possible to make the necessary changes for each customer.
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PXI High Density Precision Resistor Module, 9-Channel, 3Ω to 6.97kΩ
40-298-030
Programmable Resistor Module
The 40-298-030 is a high density programmable resistor module with 9 channels which can be set between 3Ω and 6.97kΩ with 0.125Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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OPTICAL PHASE NOISE TEST AND MEASUREMENT SYSTEM
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OEwaves’ HI-Q® Optical Test Measurement System utilizes a homodyne methodology for automated measurement capable of testing ultra-low phase noise laser sources. The user friendly test system is capable of rapidly measuring laser phase noise and estimating its FWHM linewidth down to < 3 Hz without complex setup or reference lasers normally required to make such a narrow linewidth measurement.
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PCI Programmable Resistor Card 4-Channel 2 Ohm To 63.7 Ohm
50-294-011
Programmable Resistor Module
The 50-294 series of PCI Programmable Resistor cards are available with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single card. These cards are ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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PXI Precision Resistor Module 3-Channel, 2.5 to 102k
40-297-140
Programmable Resistor Module
This 3-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
