System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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Upgrades and Parts
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The Lorlin Test Systems Impact Testing Software Upgrade Version 7+® operates under Windows 7/8/10® 64-BIT with a USB 2.0 tester interface is available for Impact and Dataspec Testers.
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Product
Nanomechanical Test System
Hysitron TS 77 Select
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The Hysitron TS 77 Select automated benchtop nanomechanical and nanotribological test system provides the highest level of performance, functionality, and accessibility of any instrument in its class. Built around Bruker’s renowned TriboScope capacitive transducer technology, this new test system delivers reliable mechanical and tribological characterization over nanometer-to-micrometer length scales.
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In-Circuit Test
TestStation LH
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The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family. TestStation LH features SafeTest protection technologies for accurate, reliable, and safe testing of the latest low-voltage technologies.
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Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
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The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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PXI High Density Precision Resistor Module, 9-Channel, 2Ω to 62.1Ω
40-298-111
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The 40-298-111 is a high density programmable resistor module with 9 channels which can be set between 2Ω and 62.1Ω with 0.25Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PXI 5W Programmable Resistor Module, 1-Channel, 3Ω to 1.51MΩ
40-252-050
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The 40-252-050 is a programmable resistor module with 1 channel which can be set between 3Ω and 1.51MΩ with 0.125Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PCI Precision Resistor Card 9-Channel, 1.5Ω To 472Ω
50-297-020
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The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Flying Probe Tester
FA1817
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Flying Probe Tester FA1817, an automatic testing system designed to inspect printed wiring on bare boards. The FA1817’s features and capabilities make it ideal for use in inspecting high-density printed wiring boards. With support for a broad range of test types, from low-resistance measurement to high-insulation-resistance measurement, the system reliably detects the latent defects that trouble end-users.
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Eurostat Turnstiles
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For companies who need to ensure that the operators cannot enter the EPA unless their wrist straps and footwear are compliant every day• The turnstiles comply with ANSI/ESD S20/20 specification and ISO standards record keeping requirements • Both ESD safe shoes are tested separately through measuring electrodes, installed in the contact mat.• This system tests operators quickly (≤ 3 sec) and automatically and generate reports for the ESD coordinator• Communication with a server for traceability (Operator ID, Time & Date, Test values etc…)• LCD screen showing real time measurement• Keypad• Hygrometry measurement• Choice of measuring ranges and system calibration directly with the software• HID Wiegand interface, compatible to any HID card format
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PXI Solid State Versatile Multiplexer
40-683-001
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The 40-683 Very High Density Versatile Multiplexer module features a wide range of selectable switching configurations. The 40-683 is especially useful where a high density MUX array is required that can adapt to different test configurations for different test targets, or where a test system may have to be reconfigured in the future. The 40-683 uses high performance solid state switching to ensure a service life of greater than 10 years and fast operation.
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Testing Accessories
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Instron has used its wealth of applications and engineering experience to produce the most extensive range of accessories for materials testing instruments in the industry. Made up of hundreds of grips, fixtures, load cells, and other accessories, our vast range of general purpose and application-focused accessories are designed to help you get the most from your materials testing system.
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Product
Spring Tension & Compression Testing Machine
WDW-T Series
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Jinan Testing Equipment IE Corporation
WDW-T Spring Testing System (STM) is a specialized application on the basis of WDW-E series Economic materials testing systems. The STM for Tension & Compression adopts rigid load frames, accurate load weighing system, advanced PCIE measuring & control system, and intuitive modular application software. The Spring Testing System is a perfect choice for spring testing, of which the parameters are much better than that of other existing spring testing machines on the market.
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Product
SWB-2812, 16x9, 1 A, Reed Matrix Module for SwitchBlock
781420-12
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16x9, 1 A, Reed Matrix Module for SwitchBlock - The SWB‑2812 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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PXIe Audio Analyzer
M9260A
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M9260A is significantly different from the traditional general purpose PXI digitizer modules which are being used for today's audio measurement. In order to achieve fast test speed and high performance it comes with large one million sample arbitrary waveform buffer and one million sample "limitless" input buffer, as well as super-linear/low noise amplifiers and digital to analog converters. This enables M9260A's ultra-low residual distortion and high amplitude accuracy. M9260A is now an important part of Keysight Radio Test Solution, and may also be easily integrated into any audio related PXI test system with its developer-friendly drivers and commands.
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PXI 10W Programmable Resistor Module, 1-Channel, 1Ω to 239Ω
40-253-113
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The 40-253-113 is a programmable resistor module with 1 channel which can be set between 1Ω and 239Ω with 1Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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Fixed Laser Source Module
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Keysight offers a broad choice of fixed laser sources, which are available as single-wavelength and dual-wavelength modules as part of the Keysight Lightwave Solution Platform. The Keysight 8165xA Fabry-Perot laser sources can be used in conjunction with optical power meter modules for insertion loss, optical return loss and PDL measurement of broadband components and fiber. The Keysight 81663A Distributed Feedback Laser Sources are best suited for amplifier test and WDM system test applications. Keysight covers PON and common WDM wavelengths with its 81663A Distributed Feedback (DFB) laser source modules. The precise tunability around ITU-grid center wavelength gives you the flexibility to match test setups to the latest requirements of the DWDM-system. The fine-tuning allows to shift the center wavelength from one DWDM transmission channel to the adjacent channel in dense WDM systems. The built-in isolator ensures highest laser stability, even when reflections are present in the optical path.
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Testing Aircraft Components
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Sun Test Systems develops, produces, installs and services high-quality test equipment for testing various components of civil and military aircraft and helicopters.
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Synchro/Resolver Simulator, Programmable
5330A
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NAI's 5330A Synchro/Resolver Simulator is a rack-mount or bench-top instrument featuring integrated touch-screen controls and input terminals. This model represents a major step forward as it uses digital technology to produce Synchro and Resolver outputs. Improved flexibility is provided by two fully independent outputs that can be used to simulate two separate Synchro or Resolver signals simultaneously, or can be combined to operate as two-speed outputs. The versatility of this device has been substantially increased by incorporating dynamic modes that enable servo systems to be tested under various simulated stringent field conditions.
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PCI Resistor Card 2-Channel 1.5 Ohm To 4.09k Ohm With SPDT
50-293-123
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The 50-293 is a Programmable Resistor card with either two channels of 16-bit or four channels of 8-bit resistor chains in a single PCI card. The card is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Camera Testing
SWIR
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CI systems' SWIR turn-key test stations simulates low light conditions to test special application cameras. An intuitive user friendly software carries out a variety of tests. The test stations are radiometrically calibrated to perform comprehensive SWIR tests.
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PXI Programmable Resistor Card 2-Channel 2.5 Ohm to 2.04k Ohm
40-294-022
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These PXI Programmable Resistor modules are available with either two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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PCI High Density Pecision Resistor Card, 4-Channel, 2.5Ω To 3.55kΩ
50-298-123
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The 50-298-123 is a high density programmable resistor card with 4 channels which can be set between 2.5Ω and 3.55kΩ with 1Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Load Banks
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Power Test Dynamometer offers a complete high capacity load testing solution with our load bank and gen set testing systems. Capable of testing generators and AC/DC power sources, our load bank systems safely apply electrical loads across the entire spectrum of operation. By offering a one-stop-shop for your Load Bank and it's accompanying data acquisition software, Power Test is committed to Making Your Testing Easy.
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Parametric Curve Tracer Configurations
Keithley PCT
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Developing and using MOSFETS, IGBTs, diodes and other high power devices requires comprehensive device-level characterization such as breakdown voltage, on-state current and capacitance measurements. Keithley's line of high power Parametric Curve Tracer configurations supports the full spectrum of device types and test parameters. Keithley's Parametric Curve Tracer configurations include everything necessary for the characterization engineer to develop a complete test system quickly.
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DRAM Module Test
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We provide our customers with Automated SLT (System Level Test) Solutions for DRAM Module HVM test. Our solution gives our customers the best possible combination of technologies for the best performances and manufacturing effiencies - increasing yield, reducing cost of ownership and accelerating time-to-market.
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EMI and EMC Test System
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EMI receiver system. It is a main test system for EMI (Electro Magnetic Interference) testing. The EMI-9KB is produced by the full closure structure and strong electro-conductibility material, which has high shielding effect. Due to the new technology for the EMI Test System, it solved the instrument self-EMI problem.
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Testing Multi-Radio Mobile Devices
IQxstream
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With LitePoint's IQxstreamTM mobile test system you will have all the capability you need to fully test many 3G and even 4G cellular radios and standards. Moreover, the system is designed to reduce per-device test time and cost because of its unique parallelism architecture. A 100 MHz capture capability means that it can test adjacent channel leakage ratios (ACLR) in one, five-channel capture.
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Non-Hydraulic Steering Module Test Simulator
SMTS
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The Steering Module Test Simulator (SMTS) from MB Dynamics is a non-hydraulic turnkey lab test system, offering accurate, reliable and repeatable in-laboratory simulations of driver, road & vehicle inputs acting on a steering system, and their associated effects on steering system performance and annoying noises. Supports troubleshooting, identification, diagnosis, and resolution of root causes of unwanted noise and other performance issues common to EPS, EPHS, EPAS, MDPS, and HPS steering systems.
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PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope
780319-02
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1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
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Intermediate Test Cells
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Atec’s modular intermediate test cells are the most versatile on the market today. Over the last 40 years the A/M37T-20 jet engine test system developed by Atec and Celtech has become the leading test bed solution for over 15 engines and their variants, including:F100, F101, F110, F119, F124, F125, F404, F414, J85, TF33, TF34, TFE731
