Laser Diode
generate genuine laser oscillation with a semiconductor diode.
See Also: Diode, Zener Diode, Diode Test, Photodiode, Pulsed Laser Diode Drivers
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Laser Diode Driver
LDD100
Artifex Engineering GmbH & Co. KG
The LDD100 employs a digitally programmable analogue end stage for flexible and accurate current control. Currents of up to 600A with pulse durations of 50ns to 3s are generated with rise and fall times of 70ns (F-version) or 600ns (XL-version) – essentially without overshoot. Due to the flexibility in setup and control, the LDD100 is practical for many laboratory applications. For automated measurements, the unit may be directly controlled via the USB interface. Alternatively, all parameters may be input via the graphical software or via the integrated keypad and OLED display.
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Laser Diode Characterization Testing
The Yelo Laser Diode Characterization system performs automated characterization of a laser device. The system will allow the operator to load a single packaged Laser device into a TEC controlled fixture mount. Each test station (LIV, Spectrum, Far Field/Beam Divergence) will then automatically align with the Laser Device in a sequential order and perform the automated tests required of each station.
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Laser Diode Drivers
Berkeley Nucleonics Corporation
Provides a laser diode with a stable, low-noise current source.
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Laser Diode Life Test
Life-tests consist of the highly accelerated ageing, under controlled conditions, of a group of lasers taken as a representative sample. Optical degradation of the laser diodes is observed and recorded by precisely measuring changes in the laser's operating characteristics during the test. Life-tests are used for vendor qualification of the laser diodes during product development and can be conducted throughout the production life of the laser.
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Laser Diode
Is an electrically pumped semiconductor laser in which the active laser medium is formed by a p-n junction of a semiconductor diode similar to that found in a light-emitting diode.
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Pump Laser Diode Driver
S-110
•LD Driver, EDFA, ASE Broadband Source, 1X4 Optical Switch•Variable Optical Attenuator, Wavelength Meter•SOA Driver, SLED Driver, Pump LD Driver•Pattern Generator & BERT, SFP Transceiver Driver•4Channel Optical Return Loss Meter (Light Source & Power Meter)
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Compact Laser Diode Modules: 635nm-639nm Visible Wavelength, 11mm Diameter
The Optoelectronics Company Ltd
Custom lasing wavelengths, from 405 nm to 852 nm, output power options and laser engraving are available to your specifications. Both standard and custom configurations provide complete cost-effective laser solutions.
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Laser Diode Driver
S-101
LD Driver slot module of FOTS system is an efficient module that is user centered, which can drive various kinds of laser diode for the use of optical signal transmission or light source. The module has a built in LD socket, in which LD of 14 pin butterfly type is installed, which makes it possible for the user to change the LD he or she wants to drive when needed. It is leaded to get rid of the inefficiency of expense, at which various types of expensive united source module needed are purchased. By operating monitoring PD and high-performance processor that are installed inside the module, the output power and temperature of LD can be driven accurately and stably. The laser diodes can be modulated internally in square, sinusoidal, and triangular waves and its output power and temperature can also be maintained the level set by the user. In order to realize the various functions, the efficient and multi-functioned control programs with high speed processor, LCD monitor or GUI for remote control are available.
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Laser Diode Drivers
Renesas offers a portfolio of laser diode driver (LDD) ICs for DVD/CD/Blue-ray optical drive and laser projection applications.
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Modular Laser Diode Test System (PXI/PXIe)
LTS8620
The LTS8620 test system is a modular PXI test system for testing and qualifying laser diodes. The system is able to generate extremely short current pulses. This minimizes the effects of heat on the laser diode.
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Laser Diode Characterization System
58620
The Chroma 58620 Laser Diode Characterization Station is a state-of-the-art full turnkey system specially designed for laser diode testing. Features range from macro inspection of the facet or aperture active area to a full suite of electro-optical parametic tests.
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Laser Diode Driver
Fibotec offers special laser diode drivers, especially versions that accommodate laser diodes via integrated terminal bases. Two standard products for different applications accommodate laser diodes in butterfly packages with up to 2 A forward current. The "Pump Laser Pinout" is standard. The configuration for "Signal Laser" is available on request.
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High Power Laser Diode Drivers
Lumina Power state-of the art laser diode drivers are designed for the emerging high power laser diode industry.
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Laser Diode Testing
The low power series of burn-in and life test systems are designed to test the reliability of low power laser diodes up to 1 Amp in current. The modular design means they can test up to 2,048 lasers, however due to the flexibility of the system, it can be adapted to suit both low volume R&D environments and high volume production environments.
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Laser Diode
Yisinc Optical Technology Co., Ltd
Laser diode is an efficient radiation source for CW and pulsed operations.
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Laser Diode Burn-In Testing
Laser reliability testing consists of a series of tests that laser diodes can be put under in order to ensure their reliability for post-production use. There are different types of tests that can be carried out and there are multiple measurements that can be taken in order to evaluate the reliability of the device. One of these tests is laser diode burn-in.
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Laser Diode Modules
Fiber-coupled laser diodes are finding more and more industrial applications, for example in printing technology, comparable graphic areas, material processing or sensor technology.
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High-power Laser Diode Assembly
The laser diode is one of the most common devices used throughout photonics. The micro-assembly process calls for the placement and bonding (align-&-attach) of single emitters, or multiple laser diodes (stacked or complete bars), the placement, active alignment and bonding of necessary micro-optical elements, subsequent device testing, and ultimately packaging and quality control. ficonTEC’s machine systems are capable of all the steps necessary for assembling laser diodes, even high-power devices. Multiple in-line systems can be configured to address entire process segments.
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Laser Diode Collimators, 520nm - 785nm, Elliptical Beam
The Optoelectronics Company Ltd
Custom lasing wavelengths and power options are available. Both standard and custom configurations provide OEMs, end-users and systems integrators with complete, cost-effective laser solutions.
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Laser Diode Source Product Family
LDS-7200
5 nanometers tuning range• 10 picometer setpoint accuracy• 0.1 picometer resolution• 20mW output power• 0.005 dB power stability• Built-in coherence control• Integrated function generator• USB remote interface• Application program with source code
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SpikeSafe DC / Continuous Pulsed Current Sources
The Vektrex SpikeSafe™ DC / Continuous Pulse (DCP) Current Sources provide reliable DC or pulsed drive for LED or laser diode reliability testing, IESNA LM-80 maintenance testing, and other test applications requiring DC or continuous pulse current. Models support currents from 500mA to 60A and compliance voltages from 50V to 400V. All models feature individual channel control, accurate pulsing over long output cables, precise current, precision pulsing for improved measurement repeatability, and high power density — typically 6.4kW-8kW.
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Laser Diode Burn-in Reliability Test System
58604
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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FLIM Upgrades for Nikon
A1 / C1 / C2
*bh FLIM Embedded in Nikon NIS-Elements Software*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Two HPM-100-40 GaAsP Hybrid Detectors*Excitation by bh ps Diode Lasers*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Excellent Timing Stability*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Detection Wavelength Range from 360 nm to 700 nm
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LASER DIODE TESTER
LASER DIODE TESTER LD-607 Basic Functions LIV curve test. LD horizontal and vertical test. LD Spectrum test
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Light
Welcome to Thorlabs; below you will find links to light emitters, sources, and controllers, a subset of our entire line of photonics products. Our light sources are conveniently separated into coherent and incoherent sources. The coherent source category includes laser diodes, laser diode modules, tunable lasers, HeNe lasers, and femtosecond lasers, while the incoherent source link brings you to a selection of LEDs, white light, and broadband SLD sources. The Quantum Electronics category includes optical amplifiers, modulators, and gain elements that are frequently used in research and OEM applications. All of our light sources and optical amplifiers are supported by an extensive line of mounts, sockets, TEC controllers, and current controllers.
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Standard Lifetime Measurement System
Filter-Based Systems
*Excitation by bh ps Diode Lasers (BDS-SM or BDL-SMN Series)*Optional: fs Fiber Laser*Wavelength Selection by Filters*Detection by bh HPM-100 Hybrid Detectors*Excellent Dynamic Range*Ultra-High Time Resolution*IRF Width Down to 40 ps FWHM with HPM-100-06/07*Low Cost Detector Option: PMC-150 PMT Modules
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Fiber-Based TCSPC System
*Hybrid Fiber System With Implantable Fiber Tip*Tip Removable from Fiber System*Seperate Excitation and Detection Fibers*Extremly Low Background Fluorescence*One or Two bh ps Diode Laser (BDS-SM or BDL-SMN Series)*High-Efficiency HPM-100-40 or -50 Hybrid Detector*Optional: Multi-Wavelength Detector
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MPI Sorter Series
MPI’s Sorter Series are improving production efficiency and yields for market sectors related to LED chip, package production, discrete device handling, and IC substrate manufacturing. Deploying MPI’s Pick & Place technology, the Sorter Line offers dedicated sorting and defect inspection solutions particularly suited for GaN, GaAs, Vertical LED Chip, Flip Chip, and Laser Diode applications. With a proven heritage of and market-advanced technologies, MPI offers competitive and differentiated solutions that are scalable and cost-effective.
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Laser Diode Characterization Systems
Artifex Engineering GmbH & Co. KG
The LIV100 and LIV120 employ digitally programmable analogue end stages for flexible and accurate current control. A wide range of current end stages are available with maximum currents of 250mA for low power and telecom lasers or up to 1200A for high power laser bars. Custom units are available with even more current!
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FLIM Upgrades for Zeiss LSM
710 / 780 / 880
*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Detection Wavelength Range from 360 nm to 900 nm*Excitation by Ti:Sa Laser, OPO, or by bh ps Diode Lasers*Identical Systems for Multiphoton FLIM and Confocal FLIM*Detectors can be Swapped Between NDD Port and Confocal Port*Systems are Modular: More FLIM Channels can be Added
