Focused Ion Beam
A scanning electron microscope with the electron source replaced by a gallium ion gun. Used for fault analysis and modification of modern microchips and semiconductor devices. (http://www.empa.ch)
See Also: Beam
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Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
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Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
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Microscopy Software/Hardware
ZEISS Atlas 5
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Atlas 5 is your powerful hardware and software package that extends the capacity of your ZEISS scanning electron microscopes (SEM) and ZEISS focused ion beam SEMs (FIB-SEM). Use its efficient navigation and correlation of images from any source, e.g. light- and X-ray microscopes. Take full advantage of high throughput and automated large area imaging. Unique workflows help you to gain a deeper understanding of your sample.
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TEM Lamella Preparation And Volume Imaging Under Cryogenic Conditions
ZEISS Correlative Cryo Workflow
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ZEISS Correlative Cryo Workflow connects widefield, laser scanning, and focused ion beam scanning electron microscopy in a seamless and easy-to-use procedure. The solution provides hardware and software optimized for the needs of correlative cryogenic workflows, from localization of fluorescent macromolecules to high-contrast volume imaging and on-grid lamella thinning for cryo electron tomography.
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Sputtering Systems
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Known for precision and cleanliness, Veeco Ion Beam Sputtering (IBS) systems are ideal when engineers need tight control over film thickness, composition, and optical performance. Using a focused ion beam, IBS dislodges atoms from a target, depositing them onto a surface in smooth, ultra-uniform layers.
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Etch System
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When it comes to clean etches, Veeco’s Ion Beam Etch (IBE) systems deliver with sharp control and minimal disruption. Using a focused argon ion beam, this subtractive technique etches nanoscale features with precision, making it a go-to for pattern transfer, layer removal, and surface refinement where edge definition matters most.
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Ion Sources
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Veeco offers the most comprehensive array of ion beam sources for a broad range of applications, including the industry's only Linear gridded sources.
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ION 100 Portable Ion Meter
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The new addition to the Environmental Express Oakton product line features updates to measuring water quality easier and faster. The larger LCD display is 2.75 in. by 2.0 in. for a better viewing angle, and has indicators for battery life, stability, and calibration. The ION 100 meter measures pH, mV, ion concentration of 16 commonly measured ions, and temperature. The microprocessor-based meter features automatic calibration, automatic temperature compensation, function setup, self-diagnostics, automatic power-off, and low voltage display. The meter uses advanced digital processing technology, intelligently improving the response time and accuracy of your measurements. Easily switch units among pX, mol/L, and mg/L (ppm).
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Ion Chambers
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0.2 to 5000 mR/hr, 5 Ranges• Temperature Compensated• Retractable 1000 mg/cm² Beta Shield• High Background Zero Capability• Proportional Audio Output
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Beam Bender
10726A
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The Keysight 10726A bends the incoming beam at a 90-degree angle and is designed for beam diameters of 9 mm or less. This bare optic requires a user-supplied mount.
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Ion Source Packages
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RBD Instruments provides a wide range of sputter ion sources used for sample cleaning, and depth profiling. No matter what the application, RBD provides the highest performance at the lowest price.
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Headlight Beam Testers
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VLT offers a wide range of professional headlight beam testers. From simple manually operated models up to fullly automated robot type machines for use in integrated test lanes.
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Beam Diagnostics Systems
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Characterize the spatial intensity distribution and size of laser beams, and visualize beam shape, with speed and accuracy.
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Gridded RF Ion Sources
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Veeco's gridded RF ion sources are designed for improved production of long-run ion beam deposition processes.
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Gridded DC Ion Sources
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Ion-assisted processes like sputtering, etching, and surface treatment depend on a beam that’s stable, uniform, and tightly controlled. Gridded DC ion sources make that happen, giving engineers the precision they need to fine-tune ion energy and current density for reliable results.
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Beam Profiling System
BeamCheck
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BeamCheck is an integrated laser measurement system designed to measure critical laser beam parameters for laser-based additive manufacturing systems BeamCheck includes a CCD camera for spatial measurements and a NIST-traceable power sensor that will provide a complete analysis of the laser power density profile.
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Ion Blower Nozzles
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VARIO discharge products consist of a separate AC power supply unit for connecting one or more Eltex discharging components. In SINGLE discharging, the voltage generation (power supply unit) is integrated in the bar.
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50% Beam Splitter
10725A
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The 10725A 50% beam splitter, designed for beam diameters of 9 mm or less, divides the beam into equal parts. It transmits one part straight through, and bends the other part at a 90-degree angle. This optic is without housing and requires a user-supplied mount.
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Beam Profiler
WinCamD series
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CW & Pulsed laser profiling. Wavelength Range: 190 nm- 15 m*. Resolution: 5.0 m*. Smallest Beam: 42 m*.
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Shear Beam Load Cell
SB-1.0
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The Shear Beam Load Cell SB-1.0 is a single point weighing device, suitable for use in multiple applications.
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Single Beam Interferometer
10705A
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The Keysight 10705A Single Beam Interferometer, the smallest linear interferometer, is designed for making low mass or limited space single axis measurements. It is ideal for use in disk drive and other confined space applications. The single beam interferometer is called that because the outgoing and returning beams are superimposed on each other, giving the appearance of only one beam traveling between the interferometer and the retroreflector.
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Beam Load Cell
EST-70
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Technopark Automation & Control
The EST-70 Shear Beam Load Cell is commonly used on platform, hopper weighing and pallet weighing applications. It is low cost and available in capacities from 500 kg to 2000 kg.
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Scanning Slit Beam Profilers
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DataRay manufactures two types of scanning slit beam profilers: the patented BeamMap series, which offers real-time M², divergence, focus and alignment management, and the Beam’R series which provides affordable, compact, and precise beam profiling. All of our scanning slit beam profilers are available with Si, Ge, and InGaAs detectors, covering wavelengths from 190 nm to 2500 nm.
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Ion Chromatography
IC Software- MagIC Net
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MagIC Net is the software to control your Metrohm ion chromatograph and any modules for liquid handling, sample preparation, and automation connected. Intuitive operation, comprehensive system monitoring, and straightforward data management make MagIC Net, what it is: the preferred software for state-of-the art ion chromatography.
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Ion Beam System
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Veeco's unmatched Ion Beam know-how delivers proven etch and deposition performance enabling the data storage and MEMS markets for decades.
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UV-Vis Double Beam Research Spectrophotometer
UVD-3400
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UVD-3400 has an excellent performance blazed holographic grating optimized and optional reflectance attachment CT-type Monochromator and reduces stray light and widen the photometric range. Wavelength range: 190 nm – 900 nm ; Spectral bandwidth: 2nm
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Technology that Focuses on Measurable Safety
Foretify™
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A Measurable Scenario Description Language (M-SDL) used to describe both scenarios and coverage goals at a very high level (soon to be made open) to enable a ‘measurable safety’ ecosystem
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Beam Geometry & Alignment Testing
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Perform quality control testing of your Digital Radiography (DR), Computed Radiography (CR) and Fluoroscopy X-ray systems with ease. Comply with local, state, federal, and governing bodies for digital and traditional analog radiographic imaging technologies.
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Waterproof pH/mV/Ion Meter
CyberScan pH 620
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Measures pH and Ion with up to 0.001 Resolution. Cal-Due Alarm Prevents Out-dated Calibrations, while Set-Point Alarms warns when readings are outside set-point limits.
