Image Analysis
The extraction and analysis of data from images.
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Product
Destructive Physical Analysis & Failure Analysis
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DPACI's component analysis laboratory performs major analytical functions, such as destructive physical analysis, failure analysis, counterfeit analysis, and material analysis on components & devices. Our destructive physical analysis techniques are performed in accordance with standards and methods used in most military and space program requirements. Solutions for difficult production problems are resolved through our failure analysis procedures.
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Product
Embedded Serial Triggering and Analysis for InfiniiVision DSOX1000 Series Oscilloscopes
DSOX1EMBD
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The IC, SPI, and UART/RS-232 serial decode option for InfiniiVision 1000 X-Series oscilloscopes (DSO models) displays responsive, time-aligned, on-screen decode of Inter-Integrated Circuit (IC), 3-wire Serial Peripheral Interface (SPI), and UART/RS232 serial communication buses. Because it is hardware-based, this option provides the fastest throughput solution for triggering on and analyzing IC, SPI and UART/RS-232 serial buses found in a wide variety of embedded designs.
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Imaging Systems & Components
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Thorlabs offers a wide selection of laser scanning, widefield imaging, and OCT imaging systems, including multiphoton microscopes, confocal microscopes, electrophysiology rigs, swept-source OCT systems, and spectral-radar OCT systems.
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Product
Chemical Analysis + Surface Analysis
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Rocky Mountain Laboratories, Inc.
An independent surface chemistry and microanalysis laboratory to serve the needs of industrial, academic, and governmental clients. Our objective – to provide real-world solutions for industries with materials and process development needs – is as fundamental to our organization today as when we began. Over the years we have strived to adapt our services to the specific needs of these clients.
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Failure Analysis
MicroINSPECT 300FA
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The MicroINSPECT 300FA is an automated wafer inspection tool used for semiconductor wafer failure analysis. Its small footprint, high speed, and low cost relative to its rich features yield a superb cost of ownership and makes this an ideal tool for your fab or failure analysis lab. The MicroINSPECT 300FA combines advanced robotics, wafer sorting, an intelligent wafer inspection microscope together with SiteVIEW Software to produce an integrated failure analysis tool.
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Product
Measuring and Analysis Software
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With over 10 years of experience, IVS-KA6000 PV Test IV software has been developed by Enli Technology. IVS-KA5000, the previous generation, has more than 500 users. IVS-KA6000 is evolved from IVS-KA5000 based on users’ feedback and experience. IVS-KA6000 can control a variety of SMUs and perform data collection of current and voltage based on setting parameters by users. The formulas and algorithms of IVS-KA6000 are …
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Product
Source/Measure Unit for Battery Drain Analysis, Multiple Ranges, 80 W, Double-wide
N6785A
Source Measure Unit
The N6785A is a source/measure unit (SMU) designed specifically for battery drain analysis of large mobile, battery-powered devices up to 20 V, up to 8 A, up to 80 W.
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Product
DIgital 3D Image Correlation System
Q-400
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The Digital 3D Image Correlation System Q-400 is an optical measuring device for true full-field, non-contact, three-dimensional measurement of shape, displacements and strains on components and structures made from almost any material.The Q-400 system is used for determination of three-dimensional material properties in tensile, torsion, bending or combined tests. In addition, deformation and strain analysis can be applied to fatigue tests, fracture mechanics, FEA validation, and much more.
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Product
Destructive Physical Analysis (DPA)
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Is the process of disassembling, testing, and inspecting a component for the purpose of determining conformance with applicable design and process requirements. This process of sample testing is used to ensure that a high reliability component or device is fabricated to the required standards. Destructive Physical Analysis is also used effectively to discover process defects for troublesome production lot problems.
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Product
Thermal Imaging Range
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Di-LOG Offer the full FLIR Thermal Imaging range. Contact us for more information and to book your on-site demonstration
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Product
On-line Water Quality Analysis
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Shimadzu is one of the world’s leading manufacturers of high-quality continuous monitoring systems that meet the application requirements of a wide range of customers for environmental testing, pharmaceuticals, chemicals, and academic research, etc.
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Product
Spectrum Analysis For P50xxB Up To 20 GHz
S970904B
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Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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Product
Spectrum Analysis Up To And Beyond 125 GHz
S93094B
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The S93094B has all of the capability of the S93090xA spectrum analyzer application with an upper frequency limit determined solely by the broadband or banded millimeter-wave frequency extenders used in the system.
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Product
Ultra Compact, Uncooled Thermal Imaging Core
Dione 640 OEM Series
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The Dione 640 OEM series is based on an uncooled 12 μm pitch microbolometer detector with a 640 × 480 resolution. The NETD is less than 40 mK (available upon request) or 50 mK. The cores are optimized for low SWaP (Size, Weight and Power). The overall size of the OEM core is 25 x 25 x 10 mm3 and weight is 6 gr. It utilizes Xenics image enhancement for advanced image processing while keeping power consumption low. All Dione 640 versions have the same SAMTEC ST5 connector and are GenICam compliant.The ultra-compact Dione 640 OEM series find application in safety and security systems, as well as in industrial thermal imaging systems.
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Product
Sensing Analysis Software
ENLIGHT
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A single suite of tools for data acquisition, computation, and analysis of optical sensor networks based on the HYPERION system.
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Product
Sound and Vibration Real-Time Analysis System
DS-3200 series
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The DS-3000 series Data Station is a PC-based FFT Analyzer with high functions and high performance. This new FFT Analyzer has two times or more of real-time analysis capability compared to the existing model the DS-2000 series, having the high-speed calculation performance, reliability, and user-friendliness based on our accumulated experience.
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Product
Advanced Data Collection, Display and Analysis Software for WIndows & Mac
PASCO Capstone
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PASCO is pushing the limits of technology, so you can push your students to their potential. Working closely with educators, we continuously develop Capstone™, making improvements and enhancing the teaching features. Capstone is designed to handle large data sets, high-speed sampling, and customized preferences to fit the needs of your lab. A straightforward user interface is approachable for beginners, yet Capstone offers all the capabilities needed for even the most advanced users. Our generous site license allows students to install PASCO Capstone on their own computers so they may perform data analysis off campus.
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Product
Spectrum Analysis, Up To 70 GHz
S930907B
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The S930907B spectrum analysis (SA) adds high-performance microwave spectrum analysis to the N522xB/N524xB PNA family up to 70 GHz. With fast stepped-FFT sweeps resulting from optimized data processing, the SA application provides quick spurious searches over broad frequency ranges. Simultaneous spectrum measurements can be done using up to five test and reference receivers. This multi-channel SA can be used with the internal swept-signal generators for efficient measurements of spurious signals emanating from mixers and frequency converters. The SA application employs source-power and receiver-response calibration as well as fixture de-embedding, providing in-fixture and on-wafer spectrum measurements with the highest level of accuracy.
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Product
Image Processing and Analysis Software Deep Learning Module
ENVI® Deep Learning
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L3Harris Geospatial Solutions, Inc
L3Harris Geospatial has developed commercial off-the-shelf deep learning technology that is specifically designed to work with remotely sensed imagery to solve geospatial problems. The ENVI Deep Learning module removes the barriers to performing deep learning with geospatial data and is currently being used to solve problems in agriculture, utilities, transportation, defense and other industries.
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Product
Microchip Electrophoresis System For DNA/RNA Analysis MCE™
202 MultiNA
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This system is used to analyze the size of DNA/RNA samples, with convenientanalytical operability. It achieves analysis costs on par with agarose gel electrophoresis, and can perform fully automatic analyses of up to 108 samples. Using optimized reagent kits (four types for DNA analysis and one type for RNA analysis), the system achieves a high resolution and high sensitivity. It can significantly improve the workflow for mutation checks in genome editing, and genotype determination.
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Product
Advanced NDT Data Acquisition & Analysis
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WeldSight™ software’s comprehensive acquisition and analysis tools enable you to engineer compliant and repeatable advanced phased array (PA), ultrasonic testing (UT), and time-of-flight diffraction (TOFD) weld inspections.
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X-ray Diffraction and Elemental Analysis
N8 HORIZON
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The N8 HORIZON is a powerful tool for both high-end research and for multi-user facilities investigating a variety of nano-materials from solid bulks, to fibers, surfaces or biological samples.
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Thermal Imaging Solutions
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Fluke Process Instruments’ thermal imaging solutions provide 24/7 monitoring capabilities to keep your process, products and site under control. Our fixed thermal imaging cameras feature IP67 (NEMA 4) rated housing and are designed for the most demanding and harsh conditions.
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Product
2D Image Sensor
Lince11M
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Lince 11M has been specifically designed as a high-speed CMOS image sensor that also allows customers to decrease the cost of ownership. The digital circuits of the sensor output images at 715fps in 4K resolution, or 1400fps when windowing in full HD resolution. To facilitate access to affordable optics, Lince11M is compatible with APS-C format in 4K resolution.
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Product
Liquid Crystal Thermographic Analysis Tool
thermVIEW
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Advanced Thermal Solutions, Inc.
thermVIEW is a high resolution liquid crystal thermography system for cost effective temperature measurement of electronic circuit boards, micro circuits, hybrid components and integrated circuits. One micron level* thermal mapping of electronic devices.
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Resistivity and IP Imaging System
ARES
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ARES represents a well equipped resistivity and IP imaging system. Groundwater explorations, geotechnical investigations, monitoring of dams and dikes, environmental studies, pollution plumes mapping, geological surveys, mineral prospecting, archaeology, detecting of cavities, underwater, marine, borehole and cross-hole measurements.
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Surface Analysis
Dimension AFP
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The Dimension AFP is the world's only fab-based metrology tool specifically designed for both CMP profiling and etch depth metrology for current and advanced technology nodes. The system combines the superb resolution of an AFM with the long-scan capability of an atomic force profiler tomonitor etch depth and dishing and erosion on submicron features with unsurpassed repeatability.
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Digital Wideband Transceiver Analysis
S94610B
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Digital Wideband Transceiver Analysis is an add-on software to Device Measurement eXpert (DMX) that adds cross-domain stimulus response measurements for digital/RF mixed-signal device characterization. Included Waveform Creator helps define digital IQ test stimulus waveforms that are used in the RF signal generators for receiver tests or downloaded to the digital-to-analog converters for transmitter tests. The DUT control is customizable to accommodate various data converters and transceiver types by defining device operation settings, transmit/receive switching, reading and writing digital IQ waveform from and to DUTs. Acquired RF or digital data is processed in the VNA’s applications for faster, accurate measurements and analysis.
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Thermal Analysis Instruments
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Typically measure heat flow, weight loss, dimension change, or mechanical properties as a function of temperature.
