Image Analysis
The extraction and analysis of data from images.
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Product
Gas Analysis
HPR-20 EPIC
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The Hiden HPR-20 EPIC gas analysis system is configured for continuous analysis of gases and vapours at pressures near atmosphere in standard form, alternative inlet systems being offered for applications requiring direct sampling from higher pressures to 30 bar.
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Product
CMOS Image Sensor
CIS
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CMOS Image Sensors (CIS) allow multiple camera functions in mobile devices, automobiles and security systems. Nidec SV Probe provides both standard and advanced versions of our CIS cards employing a wide variety of materials ensuring a durable cost-saving solution that can meet the fine pitch and multi-dut challenges of these devices. Other features and benefits include: • Proprietary AC™ Alloy Probes • Reduced Damage Under the Pad • High Frequency Capability • Better Alignment StabilityOur advanced CIS card, the Multiplexer™, is offered specifically for high density and high parallel applications. The Multiplexer™ is built with cantilever needles held into place on one side and shorter AC™ probes on the other which leads to a more stable electrical characterization over other CIS probe card options.Contact your Nidec SV Probe Representative so we can help you find the right CIS product for your testing needs.
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Product
Failure Analysis
MicroINSPECT 300FA
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The MicroINSPECT 300FA is an automated wafer inspection tool used for semiconductor wafer failure analysis. Its small footprint, high speed, and low cost relative to its rich features yield a superb cost of ownership and makes this an ideal tool for your fab or failure analysis lab. The MicroINSPECT 300FA combines advanced robotics, wafer sorting, an intelligent wafer inspection microscope together with SiteVIEW Software to produce an integrated failure analysis tool.
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Product
PAM-4 Analysis
N19306B
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PLTS N19306B extends the N19301B base product to perform PAM4 eye diagram analysis beyond the default NRZ eye diagram analysis in the base N19301B.
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Product
Failure Analysis
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Failure Analysis (FA) plays a crucial role in the production of semiconductors. It provides process and design feedback to determine the root cause of any failures. Time-to-data for the FA Engineer is a critical measurement and SemiProbe’s Probe System for Life ® (PS4L) is ideally suited to excel in this application. All key components are interchangeable, making it easy to switch between individual die, wafers, and packaged parts.
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Product
Thermal Imager with App
testo 872
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The testo 872 thermal imager is ideally suited for professional industrial and building thermography - at the same time it ensures your work is both quick and easy. It is versatile to use, for example in industrial and mechanical maintenance or for detecting structural defects. You can generate error-free and objectively comparable infrared images using its handy functions. The IFOV warner, testo -Assist and testo ScaleAssist mean you can avoid measurement errors and not only effortlessly achieve optimum setting of emissivity () and reflected temperature (RTC) for building thermography, but also of thermal image scale.
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Product
AFM-Raman for Physical and Chemical Imaging
XploRA Nano
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Fully integrated system based on SmartSPM state of the art scanning probe microscope and XploRA Raman micro-spectrometer.Compact, fully automated and easy-to-use, the XploRA Nano concentrates the power of AFM-Raman into an affordable yet full-featured package, making TERS imaging a reality for all. The TERS proven system.
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Product
4D Imaging Radar Chipset Solution
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Through enhanced FMCW technology, Arbe’s chipset technology transmits and receives signals from multiple antennas. By converting information from time to frequency domains (FFT), Arbe provides a 4D image with unparalleled element density in high azimuth and elevation resolution while simultaneously sensing the environment in long range with a wide field of view in real time. Additionally, Arbe technology reduces sidelobe occurrence levels close to zero, resolving range-doppler ambiguities and avoiding interference from other radars.
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Product
High-Speed Digital Image Correlation System
Q-450
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The 3D High-Speed Image Correlation System Q-450 allows the full-field, non-contact and three-dimensional dynamic measurement of shape, displacements and strains on components and structures made from almost any material. Based on the digital image correlation technique, the Q-450 system is designed for full-field vibration analysis and high speed transient events. This makes it ideal for ballistics testing, fracture mechanics, shock excitations, the Hopkinson Bar test, or Impact Testing.
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Product
Structural Analysis
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With proven accuracy every time, Altair offers industry-leading engineering analysis and optimization tools from simulation-driven design concepts to detailed virtual product validation and simplified modeling workflows to advanced high-fidelity model building. Whether big or small, our customers trust their decision making to Altair, the pioneer of simulation-driven design.
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Product
Acoustic Imaging Solutions
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Visualize the unheard and the unseen with the power of fixed acoustic imaging solutions from Fluke Process Instruments. Fixed acoustic imaging enables users to detect, locate and visualize air and gas leaks or changes in sound signatures across their process and equipment in real-time before they become costly problems.
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Product
Battery Analysis Software
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Battery characteristics vary over time and depend very much on maintenance and the environmental conditions of the specific application. Each installation tends to have its own 'fingerprint'. Capturing and managing this critical operational data has always presented a challenge to facilities managers. Recording and analysing data using traditional pencil and paper methods is both time consuming and prone to error.
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Product
Multimodal Imaging System
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MALDI-MS molecular imaging data and LA-ICP-MS elemental imaging data can be analyzed on a single software solution. That makes multimodal imaging more accessible.
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Product
Inorganic Elemental Analysis
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Elementar Analysensysteme GmbH
The elemental composition of a material determines its properties. Elemental analysis is therefore essential for the characterization and quality control of materials that need to meet certain requirements.Elementar's user-friendly inductar® series for inorganic elmental analysis uses the high-temperature combustion method to determine elemental concentrations of carbon, sulfur, oxygen, nitrogen, and hydrogen and is the ideal solution for R&D, routine, and high-throughput laboratories.
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Product
Gas Analysis
HPR-20 TMS
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The Hiden HPR-20 TMS Transient MS is configured for fast event gas analysis of gases and vapours at pressures near atmosphere. Ideal for fast gas switching experiments the MS features the Hiden QIC quartz-lined 0.9 m sampling interface.
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Product
Evaluation Units and Analysis Software
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Benefit from over 40 years of experience in inline and laboratory beverage analysis: Connect Anton Paar’s versatile and well-proven evaluation units to all generations of Anton Paar density, sound velocity, concentration and CO2 sensors. Let the data acquisition and visualization software master complex measuring tasks for you – bringing home the precision that marks measurement solutions from Anton Paar.
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Product
2D CMOS Image Sensor
Lince6M5
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Lince6M5 is a single chip, fully digital, high speed CMOS active pixel sensor which is designed for maximum flexibility. It has excellent performance in a large variety of applications, ranging from low noise, high dynamic range surveillance, to high speed slow motion analysis, including high resolution machine vision applications. Lince6M5 incorporates a high speed 6.5MP CMOS active pixel image sensor providing both global and rolling electronic shutter, as well as High Dynamic Range (HDR) features. The sensor array utilizes active CMOS pixels with pinned photodiodes to deliver high image quality whilst maintaining the size, cost, and integration advantage of the CMOS technology.
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Product
Handheld UV Imaging Solution
UVCorder™
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The compact unit is designed for viewing scenes in the near-UV waveband in real time on a 3.5-inch LCD display and for acquiring near-UV digital video and stills quickly and easily. Oculus Photonics' ultraviolet camera module (UVM) features enhanced ultraviolet response in the 300-400nm range, with a peak response at 370nm, and excellent rejection of visible and infrared light.
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Product
*Beam Propagation Analysis
M²
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M², or Beam Propagation Ratio, is a value that indicates how close a laser is to being a single mode TEM00 beam, which in turn determines how small a beam waist can be focused. For the perfect Gaussian TEM00 condition the M² equals 1. M² cannot be determined from a single beam profile measurement. The ISO/DIS 11146 requires that M² be calculated from a series of measurements. M² is measured on real beams by focusing the beam with a fixed position lens of known focal length, and then measuring the characteristics of the artificially created beam waist and divergence. We have a number of solutions for the measurement of M² ranging from simple manual processes to fully automated dedicated instruments, depending on the frequency of the need to measure M² of lasers and laser systems.
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Product
Hybrid Worst-Case Timing Analysis
TimeWeaver
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AbsInt Angewandte Informatik GmbH
TimeWeaver combines static path analysis with timing measurements to provide worst-case execution time estimates.The tool estimates the worst-case execution time (WCET) of tasks based on the execution time of trace segments obtained from real-time instruction-level tracing. The computed time bounds are valuable for soft real-time systems and provide feedback for optimizing worst-case performance.
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Product
Event Based Image Sensors
EVS
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Event-based Vision Sensors (EVS) help alleviate this issue by only sending data from pixels who have detected a change in intensity. This allows them to minimize the volume of data that is transmitted over the sensor’s data bus while minimizing the processing resources need to analyze the image. On top of this, individual pixel autonomously responds to illuminance changes allowing the sensor to detect small and/or high frequency changes with lower bandwidth requirements.
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Product
Image Resolved Luminance Measuring Camera
LMK 6
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TechnoTeam Bildverarbeitung GmbH
The LMK 6 is TechnoTeam's luminance measurement camera and used in many ways as a standalone measuring device. It is designed to be compact and lightweight and can be used in almost any light measurement application. As it is one of TechnoTeam's core products it is also used in our other camera based measurement systems.
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Product
Gas Analysis
HPR-20 DLS
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The Hiden HPR-20 DLS gas analysis system is configured for continuous analysis of gases and vapours at pressures near atmosphere in standard form, alternative inlet systems being offered for applications requiring direct sampling from higher pressures to 30 bar.
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Product
Advanced Antenna Acquisition & Analysis
SW-A4
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Introducing Advanced Antenna Acquisition and Analysis (A4), the newest antenna measurement software from NSI-MI, expertly engineered for data collection, analysis, automation, and plotting. A4 builds upon the decades of experience and optimization built into NSI-MI’s legacy software platforms, NSI2000 and MI-3000, while adding modern features and capabilities that meet the challenges of today. A4 seamlessly blends the user-friendly interface of NSI2000 with the performance and versatility of MI-3000. Its intuitive design and powerful Application Programming Interface (API) deliver the adaptability needed to handle even the most challenging measurement tasks. A4 offers multicore, multithreaded support to greatly improve processing time while adding the ability to parallelize analysis and transformation tasks. Choose the perfect solution with NSI-MI's four software tiers, each packed with tailored features to match your specific requirements. Let NSI-MI help you choose the ideal package to fully unlock the potential of your antenna measurement range.
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Product
Component Test and Analysis Laboratories
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The Component Test and Analysis team specializes in electronic and mechanical components such as hybrids, connectors, cables, harnesses, passive or discrete components, and digital or linear devices. The test lab has extensive experience in developing test software to electrically and environmentally characterize virtually any integrated circuit, including analog, digital, mixed signal, converters, FPGA and ASICs, as well as experience in developing actual radiation environments for parts testing. The component analysis team offers the analytical expertise and advanced instrumentation to identify root cause explanation for a wide range of component-level failures, as well as the resources to evaluate for possible quality and reliability issues through non-destructive and destructive techniques. With access to a detailed database, the Component Test and Analysis team offers a 25-year history of test and analysis data — a valuable resource for addressing new customer requirements.
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Product
Handheld X-Ray Backscatter Imaging System
Nighthawk™
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Nighthawk Handheld X-Ray Backscatter Imaging System sees what is invisible to the human eye, detecting concealed contraband, weapons, narcotics and explosives in luggage, barrels, vehicles, upholstery, and many other applications.
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Product
Thermal Imaging Solutions
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Fluke Process Instruments’ thermal imaging solutions provide 24/7 monitoring capabilities to keep your process, products and site under control. Our fixed thermal imaging cameras feature IP67 (NEMA 4) rated housing and are designed for the most demanding and harsh conditions.
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Product
Impact Analysis
MetaDex™
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Allows you to instantly see the impact of any changing data object or application on all downstream objects and applications.
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Product
ECHO VS System with Image Enhancement
Echo VS
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The ECHO VS system adds our Image Enhancement Suite to the ECHO platform to provide industry-leading image quality and defect identification capabilities. It’s our most accurate ultrasonic NDT equipment for development labs and for production environments that require the highest precision. The Echo system can be fitted with an optional chuck for manual wafer inspection.
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Product
Modular Logic Analysis
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With the HDA125 High-Speed Digital Analyzer, Teledyne LeCroy has defined a totally new class of instrument – a high-performance logic analyzer module that can be combined with existing high-speed oscilloscopes to provide unparalleled mixed-signal measurement and analysis.
