Protocol Test
See Also: Protocol Analyzers
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DMX Tester
DMXter4 RDM
The DMXter4 RDM takes the next step in protocol testing. It provides expanded DMX testing along with growing support for RDM testing and configuration. Who else would you trust to support the new standard? The DMXter4 is simple to use. Eight buttons run its menu-driven software. The DMXter4 uses a back lit 40-character display. Some functions can drive a PC using the USB port. Software updates are done via the USB port.
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Protocol Analyzer
Multi-speed, Ethernet protocol, multi-function test platform. Used in the development, qualification, manufacturing and support of equipment with external or embedded communications interfaces.
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Medium-size Reverberation Chamber
E-Series
The E medium-size multicavity Reverberation Chamber Series represents that state-of-the-art in reverberation chamber technology. The E-Series can make single measurements, batch tests, protocols or campaign tests for different frequency bands, different technologies and different channel models, running overnight without human intervention. Embedded frequency-, mode-, source- and platform-stirring in a double-shielded set of cavities allow Passive MIMO (Efficiency, Correlation, Diversity Gain, MIMO Capacity and others), Active MIMO OTA (TRP, TIS, TPUT, MTS, CQI, M2TxDT, RSRP, MCL and others) and Time-Domain MIMO (DL/UL TCP/UDP TPUT, RMS DS, STD, PL, CBW, Mute%, eNodeB, VDT-OTA) measurements up to 8x8 and 8DLCC to be performed for antennas and devices up to 50cm and 50kg ranging from 2G to 4G, covering all available cellular and wireless technologies to date, including wearables devices, sound acoustic mute, WLAN and W-IoT testing. There is no RC in the market more advanced than the E-Series.
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PCIe 6.0 Protocol Analyzer
P5570A
Keysight PCIe 6.0 Protocol Analyzer redefines protocol debugging and validation through a new innovative CEM card form factor, bringing vast improvement in signal integrity and equalization with instant link-up to systems as well as devices under test
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PCI Express (PCIe) 5.0 and Compute Express Link (CXL) Protocol Analyzer
Summit T516
The Summit T516 is targeted at high-speed PCI Express 5.0 and CXL I/O-based applications such as workstation, desktop, graphics, storage, and network card applications.
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PCIe 3.0 Protocol Analyzer
Summit T3-8
PCIe 3.0 technology achieves twice the effective data throughput rate of the PCIe 2.0 standard through a combination of increased data bit rate (5 GT/s moving to 8 GT/s) and the elimination of 8b/10b data encoding, which previously added an overhead of 20 percent to all data transfers. In eliminating 8b10b encoding, PCIe 3.0 technology now relies on the existing data scrambling techniques similar to those used for PCIe 2.0 technology to ensure that receivers maintain lock on the incoming data stream.
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PCIe 3.0 Protocol Analyzer
Summit T3-16
The Summit T3-16 is Teledyne LeCroy's fifth generation of protocol analyzers targeted at high speed PCI Express I/O-based applications such as workstation, desktop, graphics, storage, and network card applications.
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Imperial Test Executive
ITE
The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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PCIe 5.0 Protocol Exerciser
P5551A
Keysight PCIe 5.0 Protocol Exerciser gives the flexibility in emulating either as a root complex or as an endpoint device when validating PCIe designs.
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Semiconductors Testing
Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Protocol Analyzer for PCI Express 5.0
Summit T54
The Summit T54 Protocol Analyzer captures, decodes and displays PCIe 5.0 protocol traffic data rates for x1, x2, x4 lane widths.
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Protocol Analyzer / Exerciser
Summit M616
The Summit M616 is Teledyne LeCroy's latest generation of protocol analyzers targeted at high speed PCI Express 6.0 and CXL I/O-based applications such as server, workstation, desktop, graphics, storage, AI, and network card applications.
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SAS 4.0 Protocol Analyzer
Sierra T244
The Sierra T244 is a SAS 4.0 protocol analyzer designed to non-intrusively capture up to four 24 Gb/s SAS logical links providing unmatched analysis and debug capabilities for developers working on next generation storage systems, devices and software.
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Test Workflow Standard
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Cable Free ATE
CABLEFREEATE
Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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Wafer-Level Parametric Test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Automatic Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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Scienlab Battery Test System – Module Level
SL1001A Series
The SL1001A and SL1006A Battery Test Systems – Module Level Series help you emulate sink and source for battery modules for automotive and industrial applications.
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Fast and Flexible WLAN Measurements up to 802.11ax
WLAN Test Toolkit
The WLAN Test Toolkit gives you direct and fine control over the generation and analysis of IEEE 802.11a/b/g/n/ac and ax signals, as well as 802.11j/p/ah/af waveforms, with industry-leading speed and accuracy. It empowers you to characterize, validate, and test a variety of WLAN connectivity products, such as RF front end components, wireless modules, and user devices.The toolkit includes extensive support for the latest features of the 802.11ax standard, including extended single-user packets, multiuser OFDMA, and multiuser multiple input, multiple output (MIMO) functionality with per-user configuration and measurement results. The WLAN Test Toolkit helps you solve demanding new access point test cases by generating signals that simulate multiuser environments, including per-user impairments. You can also use the new software to generate trigger frames to test the real-time response of client devices and make power precorrection and relative center frequency measurements.
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Test Fixture (SMD Components)
16034E
Perform impedance evaluation on a minimum SMD size of 1.6(L) x 0.8(W) [mm]
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Bottom Electrode SMD Test Fixture
16197A
The 16197A is designed for impedance evaluations of bottom electrode SMDs. It achieves stable frequency characteristics up to 3 GHz and provides highly repeatable measurements. The Keysight 16197A supports various SMD sizes, as small as 1005 (mm)/0402 (inch) and as large as 3225 (mm)/1210 (inch). Accommodation of the 0603 (mm)/0201 (inch) size is available with option 001.
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NI's Wireless Connectivity Functional Test Solution
The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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EMI Test System
TS9975
The R&S®TS9975 is the base system for conducted and radiated EMI measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for large equipment under test. Combinations of different applications or incremental expansion are easily possible.
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PCI Express 3.0 Test Platform with SMBus Support
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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Functional Test System
TS-5040
The Keysight TS-5040 Functional Test System is a cost effective, robust and reliable test system that gives you the lowest cost of ownership. In addition, the open architecture Test Exec SL gives you the flexibility to do just about anything you want.
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FADEC/EEC Test Platform
The FADEC/EEC Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of full-authority digital engine control (FADEC) and electronic engine control (EEC) units of both rotary- and fixed-wing airframes. The system simulates one or more turbofan engines, including its sensors and actuators for use with the most sophisticated FADECs and EECs on the market. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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High Speed Test Bench
AT444
AC motor with mechanical multiplying gearbox test benches allow precise programming of all drive parameters required for accurate rotating devices test.The use of special high-speed bearings, mechanical components and parts wear resistant leads to a large life. The supply includes the electronic drive and control as well as the entire oil cooling unit.
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Scienlab Battery Test System – Pack Level, 330 KW
SL1740A
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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802.1 Core Test Software
IOL vIOLett®
The same tool used for testing everyday in the UNH-IOL Ethernet Switching Protocols (ESP) Testing Services is now available to use in your own labs. See the below list of available testing packages. Each test package contains a complete set of tests for use with IOL vIOLett® Software, which is included with any test package license.
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Functional Test System Optimized For Real-Time Digital Bus Test
Spectrum HS
Spectrum HS is Teradyne’s fully integrated functional test system. Optimized for real-time test of low latency buses, it’s a high-performance system delivering excellent test coverage of current and future products.





























