Spring Probes
Spring loaded electrical conductor contacting elements. Also known as: Pogo Pin
See Also: Pogo Pin, Test Fixtures, Bed of Nails
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Product
Passive Probe, 10:1, 200 MHz, 1.3 M
N2871A
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Compact 2.5-mm probe head diameter, low input capacitance, and various fine-pitch probe tip accessories make the Keysight N2870A Series passive probes ideal for probing densely populated IC components or surface-mount devices used in today’s high-speed digital applications.
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Product
Standard 1.50 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-25L36-4
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Alternate 2.64 (75.00) - 6.50 (184.00) General Purpose Probe
EPA-2D-1
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Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
Standard 1.08 (31.00) - 3.50 (99.00) General Purpose Probe
EPA-2L
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Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
Standard 1.10 (31.00) - 2.50 (71.00) General Purpose Probe
HPA-1F
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 655Overall Length (mm): 16.64
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Product
Ultra High 6.70 (190.00) - 11.80 (335.00) General Purpose Probe
EPA-4G-2
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Current Rating (Amps): 7Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,320Overall Length (mm): 33.53
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Product
Alternate 2.65 (75.00) - 6.50 (184.00) Bead Probe
BTP-25HF-6.5
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Calibration Devices For Spring Impact Hammer
CX-TF06A
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Shenzhen Chuangxin Instruments Co., Ltd.
Calibration Devices for Spring Impact Hammer
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Product
Super 3.90 (111.00) - 16.00 (454.00) High Performance Lead Free Probe
LFRE-25UN-16
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
AC/DC High Sensitivity Clamp-On Current Probe
N7026A
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The Keysight N7026A is a 150 MHz bandwidth, active current probe for InfiniiVision and Infiniium oscilloscopes. The probe features wide and flat bandwidth (DC-150 MHz), lower noise (<250 µArms), and wide input range (up to continuous 30 Arms or non-continuous 40 Apeak). This enables you to measure down to 1 mA/div, giving you a much more accurate view of your low-level signals.
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Product
IEC60068-2-75 Spring Impact Hammer
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Shenzhen Chuangxin Instruments Co., Ltd.
Adjust the impact severity by rotating the knurled cap until the desired energy- value is displayed. Pull the knob slowly out of the device until it locks in place. If moved too fast, the clamp may skip its arrester and will lock at its way back when the pulling-force declines. Hold the device horizontally at it’s housing tube and press the (black) release cone to the specimens plane of impact. The strike is automatically released when the release force threshold is reached.
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Product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-1L-6
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
CP-2XX-12 Battery Probes
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Current Rating (Amps): 5Average Probe Resistance (mOhm): 50Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 128Full Travel (mm): 3.25Recommended Travel (mil): 118.1Recommended Travel (mm): 3.00Overall Length (mil): 472Overall Length (mm): 12.00Overall Length Remark: Overall length does not include tail.Recommended Drill Size: #53 or 1.51 mmRec. Mounting Hole Size (mil): 61Rec. Mounting Hole Size (mm): 1.55
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Product
Standard 1.50 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-25T30-4
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 1.08 (31.00) - 4.00 (114.00) Long Travel Bead Probe
BPLT-25HL-4
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,460Overall Length (mm): 37.08Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, Alternate Spring 400 mil / 10,16 mm, High Spring: 400 mil / 10,16 mm, Ultra High Spring: 350 mil / 8,89 mm
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Product
Standard 1.71 (48.00) - 3.00 (85.00) General Purpose Probe
HPA-74E
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1T-4-S
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 0.70 (20.00) - 1.30 (37.00) Non Replaceable General Purpose Probe
A-S-R
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Current Rating (Amps): 2Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 30Full Travel (mm): 0.76Recommended Travel (mil): 20Recommended Travel (mm): 0.51Overall Length (mil): 230Overall Length (mm): 5.84Rec. Mounting Hole Size (mil): 38Rec. Mounting Hole Size (mm): 0.97Recommended Drill Size: #62 or 0.97 mm
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1V-7-S
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 1.50 (42.00) - 3.30 (94.00) General Purpose Probe
P2663G-1R1S
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Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 810Overall Length (mm): 20.57
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Product
Spring loaded type sample mounting board
SPCB
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Mount samples on SPCB board without bonding wires.Spring loaded clamps helps to move probe pin easily x, y, z direction.Gold plated Non-magnetic phosphor-bronze constructionContacts on sample’s four point corner by soldering materials, such as InSn may still be required for good ohmic contact.
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Product
Super 3.90 (111.00) - 16.00 (454.00) High Performance Lead Free Probe
LFRE-25I40-16
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1A-4
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 1.50 (43.00) - 3.00 (85.00) General Purpose Probe
P2665G-1V1S
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Current Rating (Amps): 15Average DC Resistance lower than (mOhm): 10Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 230Full Travel (mm): 5.84Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,290Overall Length (mm): 32.77Overall Length Remark: Tip 2W: 1270 mil (32.26 mm)
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Product
Standard - 1.44 (41.00 - 4.50 (128.00) High Current Probe
HCP-13H
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Current Rating (Amps): 15Average Probe Resistance (mOhm): 25Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 250,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Premium 4.49 (127.00) - 12.00 (340.00) High Performance Lead Free Probe
LFRE-25A-12
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 0.70 (20.00) - 1.30 (37.00) Non Replaceable General Purpose Probe
A-S-C
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Current Rating (Amps): 2Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 30Full Travel (mm): 0.76Recommended Travel (mil): 20Recommended Travel (mm): 0.51Overall Length (mil): 230Overall Length (mm): 5.84Rec. Mounting Hole Size (mil): 38Rec. Mounting Hole Size (mm): 0.97Recommended Drill Size: #62 or 0.97 mm
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Product
Differential Active Probe, 250 MHz
DP0010A
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The Keysight DP0010A is the 250 MHz model of the DP001xA Series differential active probes. These probes provide the superior general-purpose differential signal measurements required for many of today’s high-speed power-related measurements such as motor drives, automotive differential bus measurements, and high-speed digital system designs.
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Product
BPLT-25 Long Travel Bead Probes
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cyles): 500,000Overall Length (mil): 1,460Overall Length (mm): 37.08Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, Alternate Spring 400 mil / 10,16 mm, High Spring: 400 mil / 10,16 mm, Ultra High Spring: 350 mil / 8,89 mm
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Product
Near Zero Footprint SMT Spring Pin Sockets
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Ironwood Electronics socket is a device size or near device size footprint test socket incorporating industry standard high performance spring pins. Ironwood can design a socket to work with any type IC packages- BGA, LGA, QFN, DFN and even leaded devices where you need to fit a socket in place of your device to allow fast, easy testing and development.
