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Current Transformer Test
measures insulation, excitation current, turns ratio, winding polarity saturation and/or winding resistance. Current Transformers
See Also: Transformer Test, Transformer Testers, Current Transformer Test Set
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Current Transformer Field Test Set
1043
The Catalog 1043 Current Transformer Field Test Set is a simple and inexpensive means whereby a current transformer installation may be quickly checked for many sources of trouble. The tests are made without interrupting the Customer's service and while the load is on.
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CT Analyzer
PCT200i
PCT200 series CT test set (CT Analyzer) is a current transformer test equipment specially designed for current transformer characteristic test and with additional PT test functions for reference test. PCT200i owns more test items and higher technical parameters.
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ANSI Metering Current Transformer Burden
The ANSI Current transformer burden is designed for loading the current transformer during accuracy Tests. The ANSI burden is designed as per ANSI burden C57.13.It can be used along with the Eltel Automatic Instrument Transformer Test Set to test CTs as per ANSI Standards.
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ANSI Relaying Current Transformer Burden
The ANSI Current transformer burden is designed for loading the current transformer during accuracy Tests. The ANSI burden is designed as per ANSI burden C57.13.It can be used along with the Eltel Automatic Instrument Transformer Test Set to test CTs as per ANSI Standards.
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CT-PT-CVT Measuring
Testing object: S current transformer, normal current transformer, voltage transformer● Testing item: ratio error, phase error, impedance, admittance of the transformer, etc● Rated current:5A,1A ( Customized )● Rated voltage: 100V, 100/√3V, 100/3V, 110V, 110/√3V, 110/3V, 120V, 120/√3V, 120/3V, 220V (or other)● Measurement range: ratio error measurement range : 0.0001%-19.99% phase error measurement range : 0.01 ' -900 '● Error minimum resolution:ratio error:0.0001%; phase error:0.01 ' ● Communication function : provide RS232 serial communication port● Measurement accuracy: ±1%● Consumed power: less than 20VA● Dimension :460×380×160 mm● Weight: 12kg
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Current Transformer Test Set
Vanguard Instruments Company, Inc.
The EZCT-2000C is Vanguard’s third-generation microprocessor-based current transformer test set. Designed specifically for CT testing, the EZCT-2000C has the following outstanding features that can greatly increase productivity and save time during the commissioning stage:
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20 Amp Current Transformer Burden Test Set
1044A
Due to overwhelming demand, TESCO is pleased to re-introduce the 1044A 20 Amp Current Transformer Burden Test Set. This light weight, hand held unit is a simple and inexpensive means whereby a current transformer installation may be quickly checked for many sources of trouble. The 1044A provides utilities a less expensive and more traditional option for checking larger services for potential meter circuit related issues.
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Current Transformer Analyzer
CT Analyzer
Current transformer testing in a multifunctional instrument performing excitation, ratio, polarity and winding resistance tests on current transformers as well as burden impedance measurement.
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Current Transformers Test Set
Supreme Instrument Laboratories
The basic unit is sensitive magnetic comparator and also it incorporates electronic null detector to facilitate the balance. The reference Current 5A. or IA. obtained from Standard Current Transformer and in comparison to that the vector length and phase displacement is measured. The ratio error in percentage and phase displacement in minutes are directly compared and indicated on dials.
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Automatic Current Transformer Comparator
KATC-C2
Got older, slower equipment? Knopp’s Automatic Current Transformer Comparator (KATC-C2) is faster, more robust and more accurate! Knopp’s KATC-C2 is a high accuracy current comparator that is compatible with all older generation Knopp comparators, and is designed to be a direct, plug-in replacement requiring no modification of the existing Knopp Current Transformer Test Systems. Save time and money on service by upgrading your comparator to our new next generation model!
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Testing of Current Measuring Transformers
All components from this category can be integrated into an existing current transformer test system. When selecting CT test components, both the type of converter to be tested and the required current are important.
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Transformer Testing Equipment
Offering you a complete choice of products which include Automatic Transformer Turns Ratio Instruments (ATRI- 3), Automatic Transformer Turns Ratio Instrument (ATRI-201), VTRI-2000 ( Transformer turns ratio instrument ), Current Transformer Test Set (CTC-1), Potential Transformer Tester ( PT Tester ) and Current Transformer Tester ( CT Tester ).
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Primary Current Injection Test Set
T 2000
T 2000 is a portable current transformer test set which allows to perform many different measurements such as saturation, ratio and polarity tests and CT winding resistance test. Substation maintenance and commissioning test equipment, T 2000 is extremely appreciated by electrical engineers for its high accuracy and portability.
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Automatic Instrument Transformer Test Set
*ARM 9 processor controlled measurements*Measures total burden connected to test sample*Internal data storage facility upto 1 lakh readings*Digital display of test results on 800 x 480 TFT color display.*Latest IEC 61869 / ANSI C57.13-2008 / IS-2705 standards incorporated*VGA Port to interface with bigger display / monitor*Both Voltage & Current Transformer testing with one test set*5 and 1 Amp CT testing using either 5 or 1 Amp standard CT*Identifies ANSI, IEC, IS-P, IS-PR, BS, BS-S, IEC-S, IS, IS-S, AS, AS-M, AS-ME standards for CT & VT*USB memory storage*Available in three versions: AITTS Plus , ACTTS Plus & AVTTS Plus
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ACP Portable Electrical Current Transformer Test,CT/PT Analyzer
Chongqing Assen Power Equipment Co., Ltd
ACP portable Current transformer analyzer is mainly used for field or lab testing, it can finish the measurements (M) and protection (P) class CT, PT and TYP class CT. Adopt 7 inch touch TFT LCD, self-equipped mini type printer supporting field printing; supporting to use USB flash disk to dump data. The CT PT Analyzer is the most complete and easy-to-use testing system for protection and metering CTs according to IEEE and IEC standards.
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Transockets
TESCO Single & Three-Phase Transockets offer the flexibility of a single enclosure for current transformer metering and allow mounting of current transformers and a test switch. By combining the meter socket and transformer cabinet, TESCO provides a cost-effective metering solution.
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Primary Current Injection Testers
Primary current injection tests are carried out during commissioning and certification of various types of switchgear and current transformers (CT), as well as during diagnostics of grounding circuits, testing circuit breakers and other devices. Primary current injection testers can also be used for determining the terminals polarity and transformation ratio of current transformers, thermal testing of electrical devices, testing automatic reclosers and sectional disconnectors.
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NI Automated Test Software Suite
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Test Workflow Pro
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Test Instruments
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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NI Vehicle Radar Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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sbRIO-9227, Non-Enclosed, 50 kS/s/ch, 5 Arms, 24-Bit, 4-Channel C Series Current Input Module
781118-01
Non-Enclosed, 50 kS/s/ch, 5 Arms, 24-Bit, 4-Channel C Series Current Input Module - The sbRIO‑9227 was designed to provide high-accuracy measurements to meet the demands of data acquisition and control applications. It includes built-in anti-aliasing filters. When used with a C Series Voltage Input Module, the sbRIO‑9227 can measure power and energy consumption for applications such as appliance and electronic device test. You can not only measure and meter current and power but also look at quality factors such as noise, frequency, and harmonics. Non-enclosed modules are designed for OEM applications.
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EV Power Components End of Line Test Platform
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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Semiconductor Testers
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Audio and Acoustic Functional Test Solution
With the growing popularity of Internet of Things devices worldwide, many electrical products are adopting voice commands as their user interface. This means that acoustic and audio test challenges are likely to impact more products than ever before. Test teams must meet extended test coverage requirements to ensure product quality while maintaining throughput and operational efficiency. For a solution to meet these sorts of demands, it must:
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VLSI Test System
3380
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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SoC Test Systems
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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NI's Electrical Functional Test Solution
PXI instrumentation ensures complete and accurate test coverage with a modular architecture mounted in ultra-reliable PXI chassis.TestStand and LabVIEW software provide rapid development of complex test steps and sequences. PXI systems conserve floorspace because of their small, light form factor. Order them preassembled and installed using NI ATE Core Configurations.SystemLink™ software deploys updates and democratizes data insights to optimize operational efficiency.
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
