Test Pattern
Test signals for the calibration and alignment of TV broadcast and reception equipment.
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Product
Asynchronous System Level Test Platform
Titan
Test Platform
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Product
Component Test Systems
Test System
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Product
PCI Express 3.0 Test Platform with SMBus Support
Test Platform
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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Product
Pattern Generators
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Active Technologies Data Pattern Generators offer a complete and unique portfolio of instruments to address a wide range of applications starting from Digital Logic and Semiconductors characterization, Aerospace & Defense compliance testing, Mixed Signal Systems testing to Signal Integrity experiments.
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Product
In-Circuit Test System Repairs
Test System
Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
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Product
ACCUplace Dot Patterns
AP-D Series
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All machine vision lenses will show some type of distortion. Minimizing or correcting that distortion is crucial in most applications. The ACCUplace Dot Patterns target is designed to check, verify, or quantify barrel distortion in vision systems, alignment between multiple optical systems, and can calibrate instruments with both vision and motion systems. The indexed columns and rows of dot features provide reference points that make alignment and distortion detection simple and straightforward. The AP-D is offered on four standard materials; Glass (CG) Opal (OP) Photopaper (RM) and Film (TM).
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Product
Omni-Directional Radiation Pattern, Compatible For WiFi5/6
AIW-510
Dipole Antenna
Dipole antenna with omni-directional radiation patternCompatible for WiFi5/6RP-SMA male connectorOperating Temperature: -40 ~ 85℃
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Product
Functional Test
cUTS
Functional Test
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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Product
Digital Test Instrumentation
EDigital-Series™
Test Instrument
Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
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Product
In-Circuit Test Systems For Sale
Test System
Forwessun offers a comprehensive range of global services for a variety of Test Systems. We provide refurbished systems that have undergone rigorous testing, giving you reliable performance at a fraction of the cost of new equipment. Whether you’re looking for a long-term solution to enhance your testing capabilities or a temporary setup to meet increased production demands, we have flexible options to suit your needs. - HP3070- Agilent - Keysight- GenRad- Teradyne Our bespoke rental agreements make it easy to scale up without permanent investment—simply return the system when it’s no longer required. For ongoing support, we offer calibration, repair, and maintenance services through convenient service contracts. If you’re looking to retire any outdated or non-functional In-Circuit Test (ICT) systems, we’ll offer fair market prices, helping you maximise value on any surplus equipment.
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Product
ACCUplace Land Pattern Kit
APKIT-1
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APPLIED IMAGE, in conjunction with Hewlett Packard Corp., has developed a unique, and extremely accurate, pick & place target set designed to check for accuracy and repeatability of your robotic system quickly and easily.
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Product
PXI Integration Platform
ATS-3100
Test Platform
The new ATS-3100 enables you to rise above the module level and shift your focus to the sophisticated test solution you’re actually building. Simply add your instruments, software, and customization to create a complete solution. Or, if you're short on time or resources, ask Astronics Test Systems to do the finishing work for you.
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Product
VPG⁺ 200/400/800 Volume Pattern Generators
VPG⁺ 200 / VPG⁺ 400 / VPG⁺ 800
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The VPG⁺ 200, VPG⁺ 400, and VPG⁺ 800 Volume Pattern Generators are advanced lithography systems that cater to meticulous mask manufacturing for i-line resists. Specifically engineered for high-resolution electronic packaging and other demanding applications, these versatile systems adeptly manage substrate sizes ranging from 9" x 9" to an impressive 32" x 32". Each model integrates a cutting-edge high-speed exposure engine, significantly lowering write times while boosting productivity in environments requiring continuous operation. This exceptional functionality allows for the creation of packaging masks, achieving results that meet the stringent line-width uniformity and edge roughness standards demanded in the industry.
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Product
USB-controlled, FPGA Configurable Bit Pattern Generator
FAB-3226
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The FAB-3226 system connects 16 bi-directional I/O ports to a user-defined FPGA logic. As the FPGA is user-programmable, all kinds of operations can be implemented: input, output, and closed loop operation where input and output are processed in real-time. All this can be controlled by a user-defined application program running on a computer system (PC or embedded).
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Product
Photonics Wafer Probing Test System
58635
Test System
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Product
Pulse Pattern Generators
PPG
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The Pulse Pattern Generator family (PPG), also knows as Serial Data Pattern Generator (SPG), is designed to generate a stream of binary information.
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Product
H(3)TRB & HTGB Test Systems
Test System
SET offers two H(3)TRB and HTGB product lines which differ in the number of test object channels and the range of technical possibilities. The innovative systems are scalable, modular and standardized.
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Product
Logic Analyzer & Digital Pattern Generator
ScanaQuad Series
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ScanaQuad (SQ) is a series of high performance 4 channels logic analyzers and digital pattern generators. They are designed to be your best companion when working on serial protocols like UART, SPI, I2C, 1-Wire, USB, I2S, CAN, LIN, RS232, RS485, and more. With ScanaQuad Logic Analyzers, you can capture signals, you can play them back, and you can even build genuine test signals and generate them!
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Product
EBIRST 200-pin LFH To 104-pin D-type Adapter
93-002-422
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Pulse Pattern Generator, 3.35 GHz, single channel
81133A
Pulse Generator
The Keysight 81133A single-channel 3.35 GHz Pulse Pattern Generator is the latest product in the long history of Keysights high-speed Pulse Pattern Generators. When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. Like its predecessor, the Keysight 8133A, the new 81133A sets the standard for high-speed applications. The Keysight 81133A lets you test your DUT instead of the pulse or data source! For applications that require multiple output channels or multi-level signaling like pre- and de-emphasis (PCI Express) or squelch (Serial ATA), please refer to the 81134A.
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Product
Self-Discharge Analyzer
BT2152B
Battery Test Platform
The Self-Discharge Analyzer accurately measures cell self-discharge current and cell voltage. Depending on the characteristics of the cells, measurements are directly made in minutes or hours instead of taking days or weeks using open-circuit cell voltage measurements to indicate which cells are good vs. bad.
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Product
Portable Logic Analyzer & Digital Pattern Generator
Digital Discovery
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The Digital Discovery is designed to be the ultimate embedded development companion. Configured and controlled by the full featured WaveForms 2015 software toolset, the Digital Discovery provides a Logic Analyzer, Pattern Generator, Digital IO, Protocol Analyzer and Script Editor. Equipped with a Xilinx Spartan 6 FPGA, the Digital Discovery can provide up to 32 channels and up to 800MSPS. Thats 8 times the sample rate of the Analog Discovery!
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Product
3-Axis Non-Robotic Automated Testing System
AT3
Test Instrument
The Instron AT3 is a space-efficient, highly adaptable 3-axis mechanical testing platform designed for automated execution of tensile, compression, flexural, and lap shear tests. Built to comply with a broad spectrum of ASTM and ISO standards, it’s well-suited for evaluating materials such as plastics, elastomers, thin films, foils, and metals. The system streamlines the entire testing workflow from specimen measurement and handling to strain measurement and specimen disposal—enabling users to load up to 160 samples and let the AT3 take care of the rest. Boost productivity, reduce manual intervention, and achieve consistent, dependable results with every test cycle.
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Product
PXIe-6571, 32-Channel 1-Slot, 100 M Vector/s PXI Digital Pattern Instrument
786320-01
Digital Pattern
The PXIe-6571 helps you perform semiconductor validation, characterization, and production test. It includes the Digital Pattern Editor for configuring pin maps, specifications, levels, timing, and patterns. Additionally, the PXIe-6571 includes debugging tools such as Shmoo, digital scope, and viewers for RAM history, pin states, and system status. The 32-channel option for the PXIe-6571 requires a chassis with a cooling capacity of 82 W for each slot, such as the PXIe-1095 PXI Chassis, while the 8-channel option for the PXIe-6571 can be used in chassis with a cooling capacity of 58 W for each slot, such as the PXIe-1084 PXI Chassis.
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Product
Pattern Matching Sensor
AI Series
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For use in wide variety of industriesfrom automotive, metal,and electronics to food, medicine, and beyond. The sensor that can betaught AUTOMATICALLY using only one button.
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Product
JTAG Functional Test
JFT
Functional Test
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Product
Lens Module Test Platform
Test Platform
The Lens Module Test Platform is a flexible solution to deliver the quality that is expected from your brand for all types of lenses and cameras. The system can be configured to measure objective, eyepiece or camera lenses. As the platform can efficiently measure lenses as small as 2 mm3, it is perfect for the critically precise applications of life sciences, consumer electronics, automotive and other industries. With 25+ years of quality experience, the Lens Module Test Platform ensures that all products shipped to market work as intended.
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Product
Pulse Pattern Generators
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The Pulse Master is a Series of Single and Dual Channel Pulse/Waveform Generators that offers a complete array of pulse, standard, arbitrary, sequenced and modulated waveforms with unmatched performance, even compared to instruments designed to generate fewer types of signals.
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Product
Pattern Generators
PG311P Series
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The MicroImage PG311 series of pattern generators are for applications to display custom designed patterns on screen. The PG311 units will overlay the pattern or patterns on top of the video signal provided to the input of the device. The PG311 can be factory programmed with one unique pattern.
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Product
DSR Pattern Editor Software
M9192A
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The Keysight M9192A DSR Pattern Editor Software adds additional advanced capability to the Keysight M9195A/B PXIe digital stimulus/response (PXI DSR) modules by providing a graphical user interface for the development system. M9195A/B error log files can be dragged-and-dropped into waveform editor which speeds up the debugging of tests; this gives immediate visibility of discrepancies between the expected state in the ATE patterns with that of the DUT.
