Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
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Product
HID Electronic Ballast
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Shanghai Yiya Electronic Instrument Co., Ltd.
Applicable to illumination of marketplace, office illumination, home illumination, architectural illumination.
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Product
High Precision Electronic Load
PEL-8000
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PEL-8000 series adopts high-performance chip high-speed and high-precision design, providing resolution of 0.1mV, 0.01mA (basic accuracy is 0.03%, basic current rise rate is 2.5A / US)
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Product
LXI/USB 12-Slot Modular Chassis With Scan List Sequencing & Triggering
60-107-002
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Our 60-107-002 modular LXI/USB chassis occupies only a small, 2U rack-height form factor, making it suitable for portable and space-restricted rack-mount applications. It features remote control via USB or LXI Ethernet. Remote control over a network enables the switching function of a test system to be located as close as possible to the target equipment, allowing for optimal performance.
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Product
Microscope Imaging Software
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Microscope imaging software from Leica Microsystems combines microscope, digital camera and accessories into one fully integrated solution.
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Product
Scanning Mobility Particle Sizer Spectrometer
3938
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TSI''s newest Scanning Mobility Particle Sizer SMPS™ spectrometer is widely used as the standard for measuring airborne particle size distributions. This system is also routinely used to make accurate nanoparticle size measurements of particles suspended in liquids. The National Institute of Standards and Technology (NIST) uses a TSI DMA to size 60 nm and 100 nm standard size reference materials.
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Product
Electronic Magnet Pole Finder
MPF-120
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The hand-held electronic magnetic pole finder / magnetic pole detector that instantly provides a positive reading of N or S polarity. Simple, push-button operation. Just point and read RED indicates NORTH, GREEN indicates SOUTH.
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Product
Electronic Test Lead Kit
U8202A
Accessory Kit
Designed for use with the U3606A DMM and DC power supply; includes leads, alligator clips, mini grabbers, and more
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Product
Variable-Frequency Scanning Matrix
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AllWin Instrument Science and Technology Co., Ltd.
1. Continuous Variable-frequency2. 4 way scanning matrix3. Constant pressure output
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Product
Electronic Boards
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Computer Gesteuerte Systeme GmbH
The relay board 8AGN is a cost-effective board of the CM series, which is also used in our load modules, for example. It can be mounted on a 35 mm DIN rail. Currents up to 1 A at 30 V are possible. The maximum wire cross-section is 0.5 mm².
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Product
Fiber Microscope
WL-C200S
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The WL-C series fiber microscopes use coaxial illumination to provide users with maximum detail. It easily can detect the finest scratches and contamination, making it ideal for critically inspecting polish quality.
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Product
Regenerative DC Electronic Load
IT8000 Series
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IT8000 series is a family of high power regenerative electronic loads with compact size. The highly integrated capability enables the e-load to simulate various e-load characteristics, and return the consumed energy back to the grid cleanly, saving costs related to energy consumption and cooling, meanwhile eco-friendly. With modular high power density design, IT8000 provide up to 18kW in 3U space.
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Product
Atomic Force Microscope (AFM)
CombiScope
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The CombiScope Atomic Force Microscope (AFM) is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale structures and (near-field) nano-optical properties investigation, the CombiScope is the right solution for you. It perfectly combines inverted optical and atomic force microscopies and unleash all the power of both techniques providing the instrument adjustment and measurement automation, high resolution and high speed. Plus it can be easily upgraded to our Raman spectrometers.
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Product
Acoustic Microscope
AMI D9650
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Specifically designed to serve as a general purpose tool for failure analysis, process development, material characterization and low volume production inspection, the capabilities of the D9650 are truly unmatched. Representing the latest in C-SAM acoustic micro imaging, the D9650 delivers the unrivaled accuracy and robustness that you would expect from Nordson Test & Inspection instruments, plus improved electronics and software that raises the performance level for laboratory acoustic microscopes.
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Product
Electronic Ballast Tester
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LCD for displaying waveforms and parameters directly, and it includes all the functions and technical parameters of WT3000. Reports can be printed if printer is connected. It also meets the latest requirements for electronic ballasts in international standards
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Product
Measuring Microscopes, Image Processing
Measuring Microscopes
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Optik Elektronik Gerätetechnik GmbH
Image processing software for dimensional measurements, motorized measuring microscopes and fully automatic measuring machines.
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Product
Electronic Warfare Development Platform
SDR430
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Abaco Systems and AMERGINT Technologies have partnered to develop an Electronic Warfare Development Platform: SDR430. This development platform comprises the latest open architecture digital signal processing hardware from Abaco combined with the SOFTLINK™ modular communications architecture from AMERGINT Technologies.
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Product
Electronic Warfare MMI and HMI Simulators
MS 1600
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The EW IFU (Electronic Warfare Interface Unit) interfaces between Cockpit electronics viz., RWR Display Unit (DU), New control Box (NCB), CMDS Control/Display units and Simulator Host Computer (HOST). The EW IFU transmits the status of the cockpit control units to the host, receives display data from the host and transfers the same to RWR DU, NCB and CMDS CCU/CDU. The display data for the RWR DU received from the host would comprise of the complete symbol data in respect of emitters that are to be displayed based on the data from the Instructor Station (IS) and control input from the cockpit. The display unit receives and presents the data as symbology on the display screen. The EW IFU based on the PC–AT.
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Product
AFM (Atomic Force Microscope) Optical Platform
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The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
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Product
Boundary Scan Tester and Programmer
JTAGMaster
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The JTAGMaster Tester and Programmer is designed to work with ABI's bespoke software - a multiple purpose platform which enables users to freely configure test procedures and instruments. Integrated functions are also available to the user to automatically learn the device status, provide pin-to-pin comparison and information as well as use some reporting facilities.
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Product
Battery Electronics
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CAES Battery Electronics provide autonomous, dissipative, and continuous cell balancing to maximize available battery capacity, and therefore battery cycle life, throughout a mission.
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Product
Electronic Brake Meter for Forklift Trucks
BrakeCheck FLT
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The BrakeCheck FLT is our portable brake tester designed specifically for forklift trucks.The Bowmonk BrakeCheck FLT is a fully self-contained, user-friendly, portable brake tester, which has been developed with a leading forklift truck manufacturer to take account of the slow speed and tilt of forklift truck vehicles. The instrument records the braking efficiency and percentage of braking imbalance in a matter of minutes.
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Product
Scanning Systems
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Electro-Optical Products Corp.
We combine deep proprietary technology expertise and competencies in photonics, with a proven ability to solve complex technical challenges to manufacture various optical scanning systems and sub-systems tailored to our customers' demanding applications.
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Product
Electronic Component Testing Services
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New Jersey Micro Electronic Testing, Inc.
NJMET is proud to provide procurement and testing services to the commercial, military, aerospace, industrial automotive and medical industries. We also provide custom engineering consultation services. NJMET Inc. is AS9100/ISO9001:2008 certified and has recently successfully completed of The Defense Logistic Agency’s (DLA) laboratory suitability assessment and is qualified to test federal stock classes (FSC) 5961 (Semiconductor Devices) and FSC 5962 (Microcircuits) to DLA’s QTSL test requirements.
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Product
Electronic Test Instruments
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We offer all types of electronic test equipment for the design, troubleshooting and repair of products and devices. Our handheld, bench, fixed and portable equipment covers virtually every electronic testing application. You can capture measurements, verify performance and conduct analysis with oscilloscopes, spectrum analyzers, decade boxes, bridges and other instruments. With one LCR meter, measure inductance, capacitance and resistance. Our frequency counters and function generators give you professional RF test equipment performance. Manufacturers such as Fluke, Keysight Technologies, Rigol and B&K Precision, provide proven technologies and innovation within our electronic instrument category.
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Product
RF Electronic Calibration Module (ECal), DC/300 KHz To 9 GHz, 7mm, 2 Port
85091D
Electronic Calibration Module
The Keysight 85091D RF electronic calibration (ECal) module makes the calibration of vector network analyzers fast, easy, and accurate. ECal is a precision, single-connection calibration technique for your vector network analyzer. Performing a full two-port calibration takes less than half the time and a number of connections using ECal versus mechanical calibration kits. Furthermore, the accuracy of the calibration is comparable between electronic and mechanical methods. Traditional mechanical calibrations require intensive operator interaction, which is prone to errors. With ECal, the operator simply connects the ECal module to the network analyzer and the software controls the rest.
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Product
Long Range Scanning
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Our contract measurement services include a variety of short-range (< 20 feet) and long-range (20 to 900 feet) high definition technologies, which use both contact and non-contact processes. With over a decade of experience in long range scanner technologies, we have the experience to determine the most affordable approach to your project and the expertise to do the job right. Our tools for long range scanner services include portable CMMs (PCMM) – both touch probes and laser trackers – and 3D laser mapping scanners.
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Product
Electronic Ballast Automatic Test Equipment
ATE-1
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Test series connection, parallel connection and series/parallel connections of the electronic ballast (about 15 kinds of connections), available for various electronic ballast. • With a precise resistance box, tube is substituted for the resistance, can act as many as 6 tubes. Resistance value: 1-4095Ω adjustable. • Measure input parameters (vrms, irms, w, pf, harmonics, etc), output parameters (on-circuit voltage, lamp voltage, filament voltage, lamp current, lamp power, oscillatory frequency), can also test the ballast efficiency, abnormity protection, and power symmetry of partial rectifier effect and etc. • Program controlled AC power source to guarantee the smart choice of input voltage and the frequency. • Equipped with 17 inch LCD controlled machine, specially designed A/D combined with special CPU, has the two left and right testing interfaces to achieve stability of data and high- speed testing. • We can make the special-designed product for you and promise to upgrade the software for free.
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Product
Electron Probe Microanalyzer
EPMA-8050G
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This instrument is equipped with a cutting-edge FE electron optical system, which provides unprecedented spatial resolution under all beam current conditions, from SEM observation conditions up to 1 μA order. Integration with high performance X-ray spectrometers that Shimadzu has fostered through the company's traditions achieves the ultimate advance in analysis performance.
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Product
Thermal Microscope Stage
TS-4MP
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With our TS-4MP Thermal Stage, a specimen on a microscope slide or culture dish can be maintained at any temperature between -20°C and +60°C. Setup is easy, takes little time, and the controller will regulate the stage temperature to within +/-0.1°C
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Product
Development Test for Electric Motors with Power Electronics
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Test bench for electric machines and inverters in hybrid applications*Control of mechanical parameters*Verification of electrical properties*Checking the LL characteristics*Short circuit measurement*Recording the performance process*Noise measurement*Temperature measurement





























