High Voltage Test
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CC3050X, 50 MHz, 30 Arms Current Oscilloscope Probe
785561-01
The CC3050X, or Hioki 3273-50, is a clamp-on current probe that offers a wide DC to 50 MHz bandwidth and 30 Arms of continuous input. It is ideal for capturing transient current signals from switching power supplies, inverters, and motor … controllers. The probe requires an external power supply.
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Explosive Test Site Range Instrumentation
Firesets, CDU’s EDU’s, Delay generators, firing panels, and custom instruments. Fiber-optic and computer-control options.
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NI-9228, ±60 V, 1 kS/s/ch, 24-Bit, Simultaneous Input, 8-Channel C Series Voltage Input Module
783861-01
±60 V, 1 kS/s/ch, 24-Bit, Simultaneous Input, 8-Channel C Series Voltage Input Module - The NI‑9228 performs differential analog input. With channel-to-channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. The NI‑9228 is simultaneous sampling with two options for filtering: a low-latency filter or a 50/60 Hz rejection filter. The low-latency filter enables users to use this module in industrial or control applications while getting better external noise rejection.
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Standard 3.74 (106.00) - 14.35 (407.00) High Frequency Probe
K-50L-QG-75R
Nominal Impedance (Ohms): 50Bandwidth @ -1dB (GHz): 12.00Return Loss @ -20dB (GHz): 3.00Test Center (mil): 550Test Center (mm): 13.97Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 1,637Overall Length (mm): 41.58
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sbRIO-9201, Non-Enclosed, ±10 V, 500 kS/s, 12-Bit, 8-Channel C Series Voltage Input Module
781113-01
Non-Enclosed, ±10 V, 500 kS/s, 12-Bit, 8-Channel C Series Voltage Input Module - The sbRIO‑9201 is an effective combination of channel count and speed at a low price for an economical multifunction system. In addition to the absolute protection from the isolation, the module features up to 100 V of overvoltage protection for errant signal connection or unexpected outputs to the individual channels. Non-enclosed modules are designed for OEM applications.
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NI-9205, ±10 V, 250 kS/s, 16-Bit, 32-Channel C Series Voltage Input Module
785184-01
±10 V, 250 kS/s, 16-Bit, 32-Channel C Series Voltage Input Module - The NI‑9205 performs single-ended or differential analog inputs, with four programmable input ranges for each. It is an effective combination of channel count and speed at a low price for an economical multifunction system. You can choose from four programmable input ranges. To protect against signal transients, the NI‑9205 includes up to 60 V of overvoltage protection between input channels and common. In addition, the NI‑9205 also includes a channel-to-earth ground double isolation barrier for safety, noise immunity, and high common-mode voltage range. It is rated for 1,000 Vrms transient overvoltage protection.
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NI-9251, 3 Vrms, 102.4 kS/s/ch Simultaneous, 2-Channel C Series Voltage Input Module
783814-01
3 Vrms, 102.4 kS/s/ch Simultaneous, 2-Channel C Series Voltage Input Module - The NI‑9251 with mini XLR is a low-distortion input channel that allows for the high dynamic range measurements necessary to fully test and evaluate modern audio outputs used in most consumer electronic devices. Unlike sound card-based solutions, you can quickly deploy the NI‑9251 to guarantee long-term measurement repeatability and increased test system uptime. To maximize low-noise benefits, the NI‑9251 differential input is provided through a mini‑XLR connector, which delivers a truly balanced input.
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AC Voltage Monitors
NAI's AC- and DC-powered AC voltage monitors are used to monitor and measure voltage characteristics of single- and three-phase power lines. Field-adjustable AC voltage monitors are also available. These monitors are specifically designed for rugged defense and industrial applications.
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sbRIO-9264, Non-Enclosed, 25 kS/s/ch Simultaneous, ±10 V, 16-Channel C Series Voltage Output Module
781119-01
Non-Enclosed, 25 kS/s/ch Simultaneous, ±10 V, 16-Channel C Series Voltage Output Module - The sbRIO‑9264 is a simultaneously updating analog output module that accommodates higher‑channel‑count systems. Higher density modules conserve chassis space, which leaves room for other measurement types. Each channel has its own digital‑to‑analog converter. The spring-terminal version of the sbRIO‑9264 uses a 36‑position connector for the output channels, and each channel has a ground connection. Non-enclosed modules are designed for OEM applications.
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Standard 1.90 (53.90) - 8.00 (226.80) High Frequency Probe
CSP-40L-013
Nominal Impedance (Ohms): 50Dielectric VTE Rating (k VAC): 1Bandwidth @ -1dB (GHz): 6.00Return Loss @ -20dB (GHz): 2.30Test Center (mil): 250Test Center (mm): 6.35Full Travel (mil): 200Full Travel (mm): 5.08Full Travel Remark: Shield: 275 (6.99) including travel of probesRecommended Travel (mil): 133Recommended Travel (mm): 3.38Recommended Travel Remark: Shield: 211 (5.36) including travel of probesOverall Length (mil): 1,151Overall Length (mm): 29.24
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NI-9209 , ±10 V, 500 S/s, 16-Channel C Series Voltage Input Module
785042-01
±10 V, 500 S/s, 16-Channel C Series Voltage Input Module - The NI‑9209 performs single-ended or differential analog input. This module provides 60 VDC CAT I isolation and built-in 50/60 Hz filtering, making it a valuable addition to industrial measurement systems.
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Test System Optimized for High Volume Production Testing of Integrated Circuits
ETS-364 / ETS-600
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture. The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to 240 analog pin channels, and offers 133 MVPS digital vector rate with up to 128 digital pin channels. Eagle's scalability includes the ability to double the capacity of an ETS-364, providing more than 480 analog pin channels and up to 256 digital I/O pin channels with the ETS-600.
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Dielectric Test Fixture
16451B
The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
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Semiconductor Test Software
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Off-Line Testing Platform
6TL22
The 6TL22 Platform is a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.A system designed around the 6TL22 is simple, easy to maintain, and cost-effective. The rack is prepared for the direct integration of the three platform-based receivers from Virginia Panel, the S6, G12 and G12X.The core of the system can be either an Industrial PC or a NI-PXI. A UPS will protect the valuable instrumentation as well as control all the steps for an automatic power-up and down of the test system.
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In-Circuit Test System Rentals
Forwessun offers flexible test system rental options to meet short-term or seasonal testing demands. Our rental systems are rigorously tested for reliability and performance, giving you access to high-quality equipment without the need for a full purchase commitment. Customised rental agreements allow you to return the equipment when it’s no longer required, providing an ideal solution for scaling up production or filling in during periods of high demand.
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High-Voltage Differential Probe, 25 MHz
N2791A
Use the N2791A 25-MHz low-cost high-voltage differential probe to make safe and accurate floating measurements with an oscilloscope. The N2791A differential probe allows conventional earth-grounded Keysight oscilloscopes to be used for floating signal measurements of up to 700 V of differential voltage and common mode voltage.
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NI-9215, ±10 V, 100 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
779011-01
±10 V, 100 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The NI‑9215 performs differential analog input. The module contains NIST-traceable calibration, a channel‑to‑earth ground double isolation barrier for safety and noise immunity, and high common-mode voltage range. It is also offered in two connectivity variants: 10‑position screw terminal or BNC.
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Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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High Current Probes for EV Battery Packs
Up to 500Amps - customized connections - battery pack charging.
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NI-9222 , ±10 V, 500 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
781397-01
±10 V, 500 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The NI‑9222 performs differential analog input. This module is well suited for applications such as ballistics, impact, and blast wave testing. The NI‑9222 can sample at the maximum sample rate per channel while the module next to it samples at a much slower rate, which is ideal for mixed-measurement test systems. There are two connector options for the NI‑9222: a 10‑position screw terminal or a 25‑pin D‑SUB connector.
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NI-9205, ±10 V, 250 kS/s, 16-Bit, 32-Channel C Series Voltage Input Module
780173-01
±10 V, 250 kS/s, 16-Bit, 32-Channel C Series Voltage Input Module - The NI‑9205 performs single-ended or differential analog inputs, with four programmable input ranges for each. It is an effective combination of channel count and speed at a low price for an economical multifunction system. You can choose from four programmable input ranges. To protect against signal transients, the NI‑9205 includes up to 60 V of overvoltage protection between input channels and common. In addition, the NI‑9205 also includes a channel-to-earth ground double isolation barrier for safety, noise immunity, and high common-mode voltage range. It is rated for 1,000 Vrms transient overvoltage protection.
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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NI's Wireless Connectivity Functional Test Solution
The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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NI-9264, 25 kS/s/ch Simultaneous, ±10 V, 16-Channel C Series Voltage Output Module
780927-02
25 kS/s/ch Simultaneous, ±10 V, 16-Channel C Series Voltage Output Module - The NI‑9264 is a simultaneously updating analog output module that accommodates higher‑channel‑count systems. Higher density modules conserve chassis space, which leaves room for other measurement types. Each channel has its own digital‑to‑analog converter. The spring-terminal version of the NI‑9264 uses a 36‑position connector for the output channels, and each channel has a ground connection.
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FPD Tester Model
27014
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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CP400X, 400 MHz, ±60 V, 10X Attenuation, Single-Ended Passive Oscilloscope Probe
784254-01
The CP400X is a coaxial passive probe with fixed 10X attenuation for oscilloscopes that provide 1 MΩ input impedance. It is 2 meters in length. The CP400X attaches to BNC connections on both the signal input and instrument sides.
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Wireless Device Functional Test Reference Solution
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
