High Voltage Test
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Standard 4.47 (127.00) - 12.00 (340.00) High Frequency Probe
K-50H-S
Current Rating (Amps): 6Bandwidth @ -1dB (GHz): 4.00Return Loss @ -20dB (GHz): 2.50Nominal Impedance (Ohms): 50Test Center (mil): 600Test Center (mm): 15.24Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 90Recommended Travel (mm): 2.29Overall Length (mil): 1,205Overall Length (mm): 30.61
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3-Axis Non-Robotic Automated Testing System
AT3
The Instron AT3 is a space-efficient, highly adaptable 3-axis mechanical testing platform designed for automated execution of tensile, compression, flexural, and lap shear tests. Built to comply with a broad spectrum of ASTM and ISO standards, it’s well-suited for evaluating materials such as plastics, elastomers, thin films, foils, and metals. The system streamlines the entire testing workflow from specimen measurement and handling to strain measurement and specimen disposal—enabling users to load up to 160 samples and let the AT3 take care of the rest. Boost productivity, reduce manual intervention, and achieve consistent, dependable results with every test cycle.
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196D
The 16196D surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results – reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement – now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Interactive Benchtop Test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Faraday Chamber for RF w/Exchangeable Cassettes 340x350mm RCV 9025 for 6TL36
AN133
The Faraday Chamber is an add-on for the 6TL36 test handler. This kit is installed into the 6TL36 in the same way a normal test fixture would be installed, being the only difference the fact that different products to be tested will, from that moment on, only need an additional exchangeable cassettes to be tested.
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Regenerative Battery Pack Test System
17020E
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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In-Circuit Test (ICT) Fixtures
At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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Wireless Test Standards Software
Generate and analyze signals for cellular and connectivity standards with NI PXI RF instrumentationPerform advanced automated test with the easy-to-use NI-RFmx software APISave on all NI RF wireless test software under a single license
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EV Power Components End of Line Test Platform
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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Desktop PCB Test System
BOARDWALKER 9627
Qmax Test Technologies Pvt. Ltd.
QT9627 is a cost effective entry level model Desktop PCB Test System. It can be configured to maximum 64 Channels of In-circuit Functional Test Channels and 64 Channels of QSM V-I Signature Test .Maximum Digital Test Speed 10MHz in the QT9627 .
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Other Test Systems
Your business challenges do not fit the typical mold. Your test requirements are different. Ball Systems has more than 50 years of experience in multiple industries that has exposed our team to a wide variety of testing applications. As a result, we’ve likely created a solution for a challenge similar to yours.
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NI-9252, ±10 V, 50 kS/s/ch, 24-Bit, 8-Channel C Series Voltage Input Module
786783-01
±10 V, 50 kS/s/ch, 24-Bit, 8-Channel C Series Voltage Input Module - The NI-9252 is an 8-channel analog input module for CompactDAQ and CompactRIO systems. Each channel provides a ±10 V measurement range and 24 bits of resolution at a 50 kS/s sample rate. The NI-9252 features a number of programmable hardware filters. By choosing the specific Butterworth and comb filters for your application, you can significantly reduce the noise in your system.
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Audio and Acoustic Functional Test Solution
With the growing popularity of Internet of Things devices worldwide, many electrical products are adopting voice commands as their user interface. This means that acoustic and audio test challenges are likely to impact more products than ever before. Test teams must meet extended test coverage requirements to ensure product quality while maintaining throughput and operational efficiency. For a solution to meet these sorts of demands, it must:
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NI-9221, ±60 V, 800 kS/s, 12-Bit, 8-Channel C Series Voltage Input Module
783732-01
±60 V, 800 kS/s, 12-Bit, 8-Channel C Series Voltage Input Module - The NI‑9221 performs single-ended analog input. The wider voltage range makes this module well suited for industrial-level, automotive, or even smaller-cell battery measurements. There are two connector options for the NI‑9221: a 36‑position spring‑terminal connector and a 37-position D‑SUB connector.
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Automated Test Equipment
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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REM-11100, 2-, 3-, 4-Wire, 4-Channel Voltage Input Module for Remote I/O
784748-01
2-, 3-, 4-Wire, 4-Channel Voltage Input Module for Remote I/O - The REM‑11100 is a voltage input module for remote I/O. Remote I/O systems are low-cost, modular systems for simple machine control and measurements. A remote I/O system consists of an EtherCAT bus coupler and individual modules mounted on a DIN rail. You control the REM‑11100 from a real-time controller, such as a CompactRIO Controller or an Industrial Controller. You can use remote I/O hardware to add low-cost I/O for simple tasks while your controller handles advanced tasks such as image processing, motion control, and high-speed or specialty measurements. This module features 2‑, 3‑, and 4‑wire spring terminal connection methods, a built-in power supply for sensors, four selectable input ranges, and simultaneous sampling.
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Sealed Beam Bulb Testing System
H710019SSL
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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FD-11605, 8-Channel, ±60 V Voltage Input Device for FieldDAQ
786469-01
The FD-11605 can measure up to eight channels with a voltage input range of ±60 V. It features 24-bit resolution with simultaneous sample rates up to 100 kS/s. The FD-11605 offers channel-to-channel isolation, which eliminates noise from ground loops and protects instrumentation circuitry from high-transient voltages of up to 1000 V. The FD-11605 has an ingress protection rating of IP65/IP67 (dust-tight and water-resistant),can operate in -40 °C to 85 °C environments, and can sustain 100 g shock and 10 g vibration. The FD-11605 incorporates Time Sensitive Networking (TSN) and features an integrated network switch and built-in power circuitry for simple daisy chaining. You program the FD-11605 with NI-DAQmx, which automatically synchronizes multiple FieldDAQ™ devices. The FD-11605 is ideal for test cell and outdoor environments.
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Universal OTP Functional Test System for the Production of Level and Fluid Sensors
Multifunctional function tester with parallel test function based on the LXinstruments OTP2 system platform. The system is used for assembly, final test and calibration of liquid and level sensors for commercial vehicles, construction machinery and shipbuilding in a high mix / medium volume environment.
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Automated Test Systems
WinSoft designs, develops and integrates automated functional test systems for use in aerospace, military, high tech and commercial applications
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NI-9209, ±10 V, 500 S/s, 16-Channel C Series Voltage Input Module
783729-01
±10 V, 500 S/s, 16-Channel C Series Voltage Input Module - The NI‑9209 performs single-ended or differential analog input. This module provides 60 VDC CAT I isolation and built-in 50/60 Hz filtering, making it a valuable addition to industrial measurement systems.
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Scienlab Battery Test System – Pack Level, 110 KW Extendable Version
SL1720A
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development.
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sbRIO-9220, Non-Enclosed, ±10 V, 100 kS/s/ch, 16-Bit, Simultaneous Input, 16-Channel C Series Voltage Input Module
787814-01
Non-Enclosed, ±10 V, 100 kS/s/ch, 16-Bit, Simultaneous Input, 16-Channel C Series Voltage Input Module - The sbRIO‑9220 helps you perform differential analog input. The sbRIO‑9220 contains NIST‑traceable calibration, a channel‑to‑earth ground double isolation barrier for safety and … noise immunity, and high common-mode voltage range. Non-enclosed modules are designed for OEM applications.
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NI-9202, ±10 V, 10 kS/s, 24-Bit, 16-Channel C Series Voltage Input Module
784400-02
±10 V, 10 kS/s, 24-Bit, 16-Channel C Series Voltage Input Module - The NI-9202 has excellent flexibility to meet the needs of your applications. The module has 16 simultaneous sampling, differential input channels to create large, distributed systems in a rugged form factor. It … also has configurable filters to eliminate noise in your system while maintaining low-latency to be used in control systems.
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SSD Test Systems
Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.
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6TL10 Table Top Test Base
H71001000
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettes.The platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Test Setup For Air Conditioner
SCR ELEKTRONIKS have developed TESTING SET UP FOR SINGLE PHASE / THREE PHASE MOTOR for carrying out Performance Test, Earth Contact Resistance Test, High Voltage Test, Megger Test and Leakage Current Test. It consists of Voltmeters, Ammeters and Wattmeters for observing the values of different parameters. OK / NOT OK lamps are also provided to display the results of Earth Contact Resistance Test, HV test, Megger Test, Leakage Current Test. All tests are provided with tripping cut off concept.
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Godzilla High Current Probes, 150 Amp
HC500
Current Rating (Amps): 150Average Probe Resistance (mOhm): 25Test Center (mil): For more details, please contact us.Test Center (mm): For more details, please contact us.Full Travel (mil): 260Full Travel (mm): 6.60Recommended Travel (mil): 250Recommended Travel (mm): 6.35Overall Length (mil): 3,215Overall Length (mm): 81.66
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Universal Test System
LEON System
A universal ICT, FCT, ISP and Boundary Scan platform.Based on the ABex platform, which directly integrates Konrad analog bus technology and PXI/PXIe in one chassis, the LEON platform can be configured to solve various test challenges. Due to this architecture only one system provides the complete test flow combining ICT, ISP, Boundary Scan and FCT.Various form factors and configurations allow a perfect combination between cost, speed and test coverage. The modular architecture provides the possibility to reconfigure or upgrade the systems based on your test needs.The LEON System software provides a powerful development and test execution environment which directly supports NI TestStand. All systems and components could be integrated into third party software using supplied APIs.
