Breaker Test Systems
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Product
Test Port Cable, 1 Mm
11500K
Test Port Cable
Connect test ports to devices, fixtures, or probe tips with this 20-cm cable featuring a return loss of 16 dB minimum
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Product
VLSI Test Systems
Test System
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Product
Switchgear Test Systems / Circuit Breaker Testing
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ACTAS test systems provide precise information as to the condition of the chamber and drive unit without requiring them to be opened. The sheer number of parameters to be determined, the wide variety of different types of switchgear equipment in use and the harsh environmental conditions encountered during on-site tests place extreme demands on test equipment.
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Product
NI Vehicle Radar Test System
Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
In-Circuit Test System
Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
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Product
200 Vdc External Voltage Bias Fixture
16065A
Test Fixture
Measure a DUT with up to +/-200 V DC bias and also measure axial/radial lead components
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Product
Modular Kiosk System
UTK-7000
Kiosk System
UTK-7000 is an innovative, modular kiosk system incorporated by Advantech's UTC-100, UTC-300, UTC-500, and USC-300 series all-in-one computers.
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Product
19” Rackmount Data Collection System
DCS-211
Data Acquisition System
- Intel Atom® x5-E3930 processor- Up to 8x DI and 6x DO with two 2A relays- 3x M12 GbE, 1x RJ-45 GbE, 2x isolated RS232/422/485, 2x USB and one lockable HDMI port- Up to 3x PCI Express mini slots with one USIM card slot each- Storage: up to 64GB eMMC 5.0, 1x 2.5” SATA drive bay
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Product
Circuit Breaker Testing
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Weshine Electric Manufacturing Co., Ltd
Time measurement: 12 fracture intrinsic points, closing time, with the same period, phase with the same period.2. Reclosing measurement: each fracture closing - minute, minute - closing, minute - closing - minute process time, one minute time,one closing time, two closing time, gold short time, no current value.3. Bounce measurement: closing bounce time, bounce times, bounce waveform of each fracture, rebound amplitude of each fracture.
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Product
Portable, Integrated O-Level Test Platform
Guardian™
Test Platform
Guardian is a ruggedized automated testing platform that quickly and accurately verifies the operational readiness of complex electronics systems in aircraft, ships, and vehicles.
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Product
Test Port Adapter Set, 3.5 Mm (Test Port) To Type-N
85130C
Test Port Adapter
The Keysight 85130C test port adapter is designed to protect the test set port when it would be directly connected to the device under test. These adapters have a special rugged female connector designed for connecting to the network analyzer test port. This special connector will not mate with a standard male connector, but converts the rugged test set port to a connection that can be mated with the device under test. The set contains a 3.5 mm to type-N male adapter and a 3.5 mm to type-N female adapter. The frequency range for these adapters is dc to 18 GHz with a return loss of 28 dB or better.
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Product
Medalist i1000D Small Foot Print Inline and Offline In-Circuit Systems
U9405A
System
Unlike traditional bridge type board handlers that add a 3rd party equipment on your offline ICT systems, we provide a one-stop shopping experience when you are automating your in-circuit test.
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Product
TO-CAN Package Inspection System
7925
System
Chroma 7925 is an automatic inspection system for TO-CAN package. The appearance defects over 30 um like lens scratch, partial are clearly conspicuous by using advanced illumination technology. Because the height variation of tray and package exists, Chroma 7925 can calculate the focus distance and compensate to overcome the variation with auto focus function.
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Product
Massively Parallel Parametric Test System
P9001A
In-Circuit Test System
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Product
Test Handler
M4872
Test Handler
Improve Efficiency in High-Volume Manufacturing and Device Characterization.
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Product
Circuit Breaker Analysis Systems
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When a fault such as a short circuit or current overload is detected by a protective relay, a trip impulse is sent to the circuit breaker. The circuit breaker must function as specified and interrupt the current as soon as possible or severe damage may occur. The damage caused by a malfunctioning circuit breaker can often be catastrophic, resulting in significant damage to the electrical system.
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Product
High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
Test Platform
The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
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Product
Test System Replication/Build-to-Print
Test System
Need to manufacture test stations? For more than 15 years we have sourced, assembled, tested and shipped fleets of robust, cost-effective solutions. We produce them at our high-volume facilities and deploy them around the world.
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Product
128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Test Fixture
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Product
110 GHz, 1.0 Mm (m-f) Test Port Cable 10 Cm
11500JK10
Test Port Cable
Connect test ports to devices, fixtures, or probe tips with this 10-cm cable
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Product
Test System for Circuit Breakers
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Spitzenberger & Spies GmbH & Co. KG
Thermal testing with long-time currents up to 550 A. Magnetic testing with short-time currents up to 2000 A. Control software. Customer specifically adapted. 4 candidate records with pneumatic adapting.
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Product
Data Acquisition and Control System
DAQ 7000
Data Acquisition System
data acquisition and control system that provides connectivity, signal conditioning and modular I/O for variety of sensors or signals, and it is an ideal DAQ for field deployment.
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Product
Functional Test Trainer System
QT65
Functional Test
Qmax Test Technologies Pvt. Ltd.
Functional Test Trainer system, is a test system which can perform various Power- On functional tests of digital devices(ssl/MSI/LSIs and analog devices in the out- circuit and in-E conditions. Unified Library of vast number of devices to effectively test devices in in-circuit as well as out of circuit conditions.
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Product
Modular Breakout System 8-Pin Power D-type Plugin Module
95-191-002
Modular Breakout System
The 95-191-002 Plugin Breakout Module is designed to be fitted to a PXI 40-191 Fault Insertion Switch as part of the Pickering MBoS. The Modular Breakout System is designed to Simplify HILS (Hardware In the Loop Simulation) Applications.
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Product
PXIe System Sync Module, 5 Port
M9033A
System Sync Module
The M9033A PXIe System Synchronization Module is a dual-slot, 5-port module that provides multi-module and multi-chassis synchronization and triggering for Keysight's modular instruments.
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Product
Display Driver Test System
T6391
Test System
High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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Product
LabVIEW Full Development System
System
LabVIEW is engineering software designed specifically for test, measurement, and control applications that require rapid access to hardware and data insights. The LabVIEW Full Development System is recommended to customize your engineering application with advanced inline analysis and control algorithms. For applications that require software engineering tools to develop, debug, and deploy professional applications, consider LabVIEW Professional Development System.
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Product
AIM System Solutions
System
AIM can provide a wide range of customized solutions:*Special-to Type Test Equipment (STTE)*High Level Bus Analysers (HLBA)*Data Acquisition Recording & Simulation Systems*Aircraft Ground Equipment (AGE)*MIL-STD-1760 Weapon Test Sets*Fibre optic MIL-STD-1553 Stub/ARINC429 Link Extension System (FoMIS/FoL)
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Product
GSM/EDGE Analysis Using NI PXI RF Test Instruments
NI-RFmx GSM/EDGE
Test Instrument
The NI-RFmx GSM/EDGE personality is a highly optimized API for performing physical layer measurements on GSM/EDGE cellular standard signals. NI-RFmx GSM/EDGE is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
AI Inference System
MIC-741-AT
Edge AI Inference System
AI Inference System Powered by NVIDIA® Jetson Thor™. Embedded with NVIDIA® Jetson T4000™ up to 1200 TFLOPS (FP4). Supports 1 x SFP28 (1 x 25GbE). Supports 2 x 1GbE, 2 x 10GbE4, 6 x USB 3.2 Gen 2, 2 x M.2 2280, 1 x M.2 Ekey (Support both WiFi AEKey), 1 x M.2 Bkey (LTE,5G).
