Breaker Test Systems
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Product
Universal Testing Systems (Up To 2000 KN)
Industrial Series (DX, HDX, KPX)
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The Instron static hydraulic universal testing systems — part of the Industrial Series — are rugged, high-capacity frames built for demanding material tests in tension, compression, flexure and shear up to 2,000 kN. Featuring large-diameter columns and rugged components for superior frame stiffness and durability, these systems deliver reliable, repeatable performance for high-force testing needs in metals, composites, concrete, fasteners, and structural materials.
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Product
HV High Performance Circuit Breaker Analyzer
CBV-32
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We conceived the CBV-32 to provide the best range of testing for electrical facilities such as circuit breakers (using gaz, oil, air, vacuum…) or synchronous condensers all the way up to 800kV and more. It combines Timing, Motion Dynamic Resistance Measurements, and Vibration, all in a single test.
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Product
Test Fixture
16047E
Test Fixture
Perform impedance evaluation of lead type devices of up to 120 MHz; includes a guard and a shorting plate
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Product
High-Temperature Test Systems
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HT-PEM (high-temperature polymer electrolyte membrane) technology represents a further development of PEM fuel cell technology. Unlike conventional PEM fuel cells, which operate at lower temperatures, HT-PEM fuel cells can reach temperatures of up to 200 °C.
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Product
SMD Test Fixture
16034G
Test Fixture
Perform impedance evaluation on a minimum SMD size of 0.6(L) x 0.3(W) [mm]
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Product
Modular Test System
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The GS-X modular system is used for functional testing of medical devices and for testing the electrical safety of medical and general portable devices.
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Product
Hydraulic Test Systems
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Genuen specializes in hydraulic test stands, including component tests, pumps, motors, valves, actuators, fatigue, load frames, and burst testers. As an industry leader in custom test systems, we focus on hydraulic solutions that leverage off-the-shelf technologies for mechanical subsystems and components. Our hydraulic test equipment has been deployed in aerospace and defense, automotive, industrial, commercial, and many other industries.
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Product
Test, Automation, And System Integration
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vast array of experiences in system integration, mechanical engineering, software development and turnkey test and automation solutions provide our customers with a confidence they can only find with Orbis Labs.ORBIS Labs is ISO 9001:2008 certified, is a National Instruments Alliance Partner, and has many certified LabVIEW programmers on staff.
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Product
ATE Test Systems
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Introducing the Procyon ATE System! When it comes to ATE Test Systems for a for low- to high-volume production, Intepro has the testing power you require to be successful. For more than three decades, Intepro Systems has designed, built and integrated power supply test equipment for the world’s largest and smallest power supply manufacturers.
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Product
Computer Based Audio Component Test System
DATS V3
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Rugged aluminum housing with detachable test leads and built-in precision calibration resistorTighter tolerances on internal components for more precise measurementsIncreased output capability means greater separation from the noise floor, resulting in more accurate measurementsDATS Linearity Test for comparing parameters and impedance plots at multiple drive levelsOptional under desk mounting brackets included to save desk spaceOnly 1" H x 2-1/2" W x 4-1/8" D for easy portability
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Product
Battery & Electrical System Testing
12-0200
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Vehicle Battery Systems fitted to modern cars require a complex system to control and maintain the best charge and discharge rates which not only ensures the longest in service life but also that systems such as Stop/Start operate correctly. The 12-0200 gives the operator access to all the functions complicated and time-consuming manufacturer scan tools have to perform the same function but in a fraction of the time. On average the total time required by the technician to reset a system will be 30 seconds.
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Product
Manual Flying Probe Test Systems
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They provide flexible measurement technologies like Kelvin and high voltage tests in combination with low tooling costs. atg Luther & Maelzer offers a wide range of different systems starting from standard systems with 8 heads up to oversized systems with 24 test heads.
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Product
Flying Prober Test System
QTOUCH2204C
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Qmax Test Technologies Pvt. Ltd.
The Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built Vision Camera for easy monitoring of probe needle contact.The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision. It also comes with in-built image processing unit with minimum 5 Mega pixel Camera ,tele-centric lens with image processing software, illuminated with LED bar light with controls.
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Product
Memory Test System
T5221
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The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
Battery Cycle Test Systems
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Chroma Systems Solutions, Inc.
High precision, integrated battery charge / discharge cycle test systems designed for lithium ion and other chemistries and applications including EV batteries and energy storage systems. Chroma’s battery test equipment provides advanced features including regenerative discharge systems that recycles energy from the battery back into the channels in the system or to the grid. Systems are configurable and flexible with multiple channel capabilities that can be upgraded as testing requirements change.
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Product
Solar Cell PL/EL/IV 3-in-1 Testing System
VS6841
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Industrial Vision Technology Pte Ltd.
This luminescence Analyzer integrates a Photoluminescence (PL), Electroluminescence (EL) , and I-V Measurement Technology, has a Device’s PL image, EL image, as well Device’s I-V characteristics in One system. It is being using to quantitatively map Minority-Carrier Lifetime, and to characterize the defect of silicon wafer & solar wafer, and measure the key parameters from solar cell I-V Curve. It is also a useful tool for scientist to develop other methodology & parameters that can be used as a promising technique for online material monitoring and process control.
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Product
Modular Breakout System 8-Pin Power D-type Plugin Module
95-191-002
Modular Breakout System
The 95-191-002 Plugin Breakout Module is designed to be fitted to a PXI 40-191 Fault Insertion Switch as part of the Pickering MBoS. The Modular Breakout System is designed to Simplify HILS (Hardware In the Loop Simulation) Applications.
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Product
Flying Probe PCB Test and Repair System
GRS500
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Designed to help troubleshoot complex boards when fixture based tools are not a viable solution, the GRS500 is designed to help you compare the characteristics of good and faulty PCBs, using nodal impedance test, and a "Videosection" technique which presents you with high resolution images of a good board for use in live video comparison with the board under test,
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Product
Multi-Stage Functional Test Systems
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Circuit Check’s bi-level and multi-stage fixtures combine multiple test levels in a single fixture using controlled actuation and selected probe travels for powered and unpowered tests.
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Product
Ultrasonic Fatigue Testing System
USF-2000A
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The USF-2000A implements materials fatigue testing at 20 kHz. Consequently, it is possible to evaluate 109 to 1010 order fatigue strength, where it had been difficult to obtain data before. Also, data for 107 cycles can be obtained in about ten minutes.
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Product
Additional hardware for our test systems
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REINHARDT System- und Messelectronic GmbH
Our test systems are made up of modules which can be added to the needs of our customers.
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Product
Resilient Modulus and Asphalt Testing System
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The Resilient Modulus software features built and test sequences, and the capability to specify user defined sequences. Contact stress is automatically adjusted according to the above procedures as selected. Available waveforms include haver sine, sine, square and triangular, along with a user defined waveform selection. Optional peak & valley compensation ensures proper and quick matching of the load parameters. Real time displays of the prescribed versus actual dynamic load or the dynamic deformation measurements by each sensor are always present. Deformation ratio of the two sensors, Rv (to ensure that the two deformation sensors are in agreement) and Mr are also calculated in real time. During export, curve fitting is done to fit the results to models that predict Mr as a function of σm, σd, and CP (cell pressure). Four different functions are calculated automatically
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Product
PCIe 5.0 Test Platform
PXP-500A
Test Platform
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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Product
Test Systems & Sub-systems Development and Integration
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Research, development and the production of electronic test equipment, systems and subsystems for the industrial, scientific, and defense markets.
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Product
High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
Test Platform
The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
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Product
Polarity & Burn in Test Systems
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Our polarity and burn-in test systems are available for components such as multilayer, disc type or hollow ceramics.
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Product
ATE & Test Systems
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Data Patterns' core business for over 20 years has been the development of Automated Test Equipment for critical aerospace requirements. Data Patterns developed a Multi Programmer with associated test automation software in 1994. Christened the DP-800 this product was adopted for the implementation of test rigs for Navigation Platform Test Benches, Engine Test Bed Automation, Cable Harness Test Systems, etc. This product was effectively utilized in the development of test benches required by Indian Space Research Organisation (ISRO) for the Polar Satellite Launch Vechicle (PSLV) and Geo Stationary Launch Vehicle (GSLV). Based on this foundation, the next generation test benches were developed in the cPCI architecture. Presently, Data Patterns develops cPCI based test systems for Laboratory applications as well as VME based test systems for challenging environmental conditions. Examples of test solutions built by Data Patterns are indicated below.
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Product
Memory Test Systems
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ICs that record and retain data are called memory devices. Our memory test systems are optimized for volume production of memory semiconductors, a market where low-mix high-volume production is the norm, and feature industry-best parallelism (the ability to test a large number of semiconductors at the same time).
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Product
CMOS/CCD Production Test System
System 1828
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The basic system consists of a 225 MHz pattern generator, 10 clock drivers, 6 DC biases, 1-4 channels of 10 MHz 14 bit analog data acquisition and/or 1-4 channels of digital acquisition. Additional options can be added to customize the system to meet your requirements.
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Product
Flexible Test Environments and Integration Services for your Integrated System Tests
TESTERLYZER® Frame 4.0
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The TESTERLYZER® Frame 4.0 provides a flexible test environment for vehicle control units in an integrated system and is easily accessible from all sides. Customized adaption is provided for panel designs, control unit holders and cable adapters. A TESTERLYZER® I-Box 4.0 is a standard component of the TESTERLYZER® Frame 4.0 and provides the basis for a wide range of structures for the testing of control units, software and services relating to vehicles in research and development. The backbone of the I-Box provides all signals required with distribution to standardized adapter sockets and interfaces. The modular assembly structure ensures swift and safe setting up of the required test environment.
