Product

Area Scan Camera

Genie Nano-5GigE

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Teledyne DALSA

Genie Nano-5GigE - Teledyne DALSA

Engineered for imaging applications that require high-speed data transfer, the all new Genie Nano 5GigE is an easy replacement for gigabit ethernet cameras built into current vision systems that rely on the existing GigE Vision interface standard. The new Genie Nano 5GigE models feature the brand new 5Gbps (5GBASE-T) link speed.

Product

Atomic Force Microscope (AFM)

CombiScope

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HORIBA, Ltd.

CombiScope - HORIBA, Ltd.

The CombiScope Atomic Force Microscope (AFM) is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale structures and (near-field) nano-optical properties investigation, the CombiScope is the right solution for you. It perfectly combines inverted optical and atomic force microscopies and unleash all the power of both techniques providing the instrument adjustment and measurement automation, high resolution and high speed. Plus it can be easily upgraded to our Raman spectrometers.

Product

Atomic Force Microscope

FlexAFM

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Nanosurf

FlexAFM - Nanosurf

For success in research, scientists depend on professional tools that can readily provide the information needed, regardless of the tasks at hand.

Product

Digital Vision Microscopes

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Sinowon Innovation Metrology Manufacture Ltd.

Sinowon Innovation Metrology Manufacture Ltd.

Video Microscope is widely used in the inspection of electronic industry production line, printed circuit board, weld detects ( such as wrong printing, edge collapse,etc)during printed circuit component, PC Board, VFD, and the identification of printing grid and painting, etc. It can display the zoom out image on the screen and save, magnify and print.

Product

STM Microscope

NaioSTM

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Nanosurf

NaioSTM - Nanosurf

The first scanning tunneling microscope (STM) was developed in 1981 by Gerd Binnig and Heinrich Rohrer at the IBM Research Laboratory in Rüschlikon, Switzerland, for the first time making individual atoms directly visible to a small group of specialists. They were awarded the Nobel Prize in physics in 1986. In 1997, Nanosurf went one step further and brought single atoms to the classroom!

Product

Radar Scan Converter PMC

Eagle

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Curtiss-Wright Defense Solutions

Eagle - Curtiss-Wright Defense Solutions

Eagle is a flexible and powerful radar scan converter that is based upon field-proven technology and comes in a compact and mechanically ruggedized PMC form factor. Eagle features a low power, rugged design, enabling it to operate in a wide range of environments, including conditions of high temperature and vibration.

Product

Atomic Force Microscope

AFM Heron

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Del Mar Photonics, Inc.

AFM Heron - Del Mar Photonics, Inc.

New, fully motorized AFM HERON (HERO of Nanotechnology) which allows to perfectly align a cantilever, laser and photodiode by just one click on a command button. The scanning settings and landing parameters are also automated that allows to avoid any time consuming adjustment operations, thus leaving more time to researcher for designing the experiment and performing more accurate measurements.

Product

Scanning XPS Microprobe

PHI Quantera II

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Physical Electronics

PHI Quantera II - Physical Electronics

The core technology of the PHI Quantera II is PHI’s patented, monochromatic, micro-focused, scanning x-ray source which provides excellent large area and superior micro-area spectroscopy performance. Spectroscopy, depth profiling, and imaging can all be performed over the full range of x-ray beam sizes including the minimum x-ray beam size of less than 7.5 µm. In addition to superior XPS performance characteristics the PHI Quantera II provides two in situ sample parking stations which enables the automated analysis of all three sample platens in a single user defined analysis queue.

Product

Atomic Force Microscope

NX10

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Park Systems Corp.

NX10 - Park Systems Corp.

Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and better data, you can focus on doing more innovative research.

Product

Probes

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Metrix

Metrix

Metrix* proximity probes are interchangeable with Bently Nevada** Series 3300, 7200, and 3000. All probes incorporate the latest technology and include agency approvals.

Product

Boundary Scan Software

ACUTAP Toolkit

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ACUGEN Software, Inc.

ACUTAP Toolkit - ACUGEN Software, Inc.

The ACUTAP Toolkit is a handy collection of tools for reading, writing, modifying, checking, testing and working with BSDL files and boundary scan testing situations.

Product

Digital Microscope

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Aven Inc.

Aven Inc.

A variation of a traditional optical microscope in which a digital/microscope camera is connected, and image output is displayed on a screen and/or monitor. Most models include software and a computer for use.

Product

Scanning Electron Microscopy

SEM

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Materials Evaluation and Engineering

SEM - Materials Evaluation and Engineering

JEOL JSM-6610 LV LaboratoryScanning electron  microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.