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- Scientific Test, Inc.
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Automated Discrete Semiconductor Tester (ATE)
5000E
Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
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Thermal Characterization Testing Services
Thermal Engineering Associates, Inc.
Thermal Characterization - TEA offers this service to customers having need for precise thermal parameter values for product data sheets, purchase specifications, specific application configurations, and/or device comparisons. This service is offered for a wide range of Discrete Devices (i.e., Bipolar Junction Transistors, MOSFETs, IGBTs, Diodes, SCRs, Triacs) and Integrated Circuits (i.e., digital, linear and mixed-signal devices).
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Device Thermal Test Systems
Thermal Engineering Associates, Inc.
Thermal test system combines the test and measurement capability of dedicated instruments with the ease of operation and data collecting capability offered by graphical-user-interface-driven software operating on an integrated computer.Diodes (PN, Schottky, LED, varactor, PIN), Stacked Diodes (Hi-V Rectifiers & LEDs), Laser Diodes, Transistors (Bipolar, MOSFET, IGBT) & Diodes, Integrated Circuits (Application & Thermal Test Die).
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High Voltage DC Load ISSRs
Series SI
Series SI relays are designed to switch high voltage (high power) DC loads. These devices feature the latest generation of High Voltage IGBT Technology as well as an innovative isolated driver to ensure fast power turn on and OFF. The relays feature triggered control input to avoid linear control risks and fast switching times. The relays also offer an LED for status.Available options include:SI60DC100 100A, 0-500 Vdc Load; 4.5-32 Vdc Control
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DC ISSRs
SHI Series
Your product description goes here.Series SHI relays are designed to switch high voltage (high power) DC loads. These devices feature the latest generation of High Voltage IGBT Technology. This SSR comes with built-in Diagnostic features. The SHI Series is built with many protection features including protection for transient voltage bursts, overload and short circuits of the load.Available options include:SHI75DC50-6 50A, 750 Vdc Load; 24-48 Vdc ControlSHI75DC50-9 50A, 750 Vdc Load; 72-110 Vdc Control
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Power device test system
This system is suitable for DC testing of IGBT, IGBT module (1in1～7in1). Built-in hi-current switching relay circuit inside test head, it is capable ofDC testing from device itself to module. Highly accurate repeatability testing is available by high speed rise time which is suppressed its heat in hi-current
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Rail Traction Inverter Test System
The rail inverter test system uses a pulse test methodology to verify proper operation of the IGBT switching elements in a subway car motor control. The system is designed to verify proper commutation of the switching elements. A large capacitor bank allows testing at DC voltages up to 1kV and peak currents of up to 3kA into reactive loads.The system also integrates self test capabilities and safe-to-turn-on (STTO) diagnostics to ensure no gross faults are present prior to the application of high voltages. Further the system includes dielectric withstand (hi-pot) test capability to ensure electrical safety.
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20KVA to 200KVA Industrial UPS (3Ø – 3Ø)
NSP Series 20KVA to 200KVA
- Designed for powering critical Industrial and IT systems- DSP controlled IGBT based PWM technology- Design topology enables N+1 parallel redundancy- Industrial grade high speed CAN bus communication- User Friendly Matrix LCD and LED mimic front control and digital monitoring- Fully rated make before break maintenance bypass operation- Optional break-less load transfer via static switch- Low harmonic distortion- High crest factor tolerance and dynamic stability- Lower TCO- Continuous full rated power at ambient as high as 45°C- N+1 Parallel operation of UPS without any common hardware- Advanced Communication Capability (RS485/Modbus/SNMP)- High branch fuse clearing capacity- On-line battery bank test without load disconnection- Compact, elegant, and light weight enclosure- Easy installation with wheels for maneuverability and front bottom terminals
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5KVA to 100KVA Industrial UPS (3Ø – 1Ø)
NSP Series 5KVA to 100KVA
- Designed for powering critical Industrial and IT systems- DSP controlled IGBT based PWM technology- Design topology enables N+1 parallel redundancy- Industrial grade high speed CAN bus communication- User Friendly Matrix LCD and LED mimic front control and digital monitoring- Fully rated make before break maintenance bypass operation- Optional break-less load transfer via static switch- Low harmonic distortion- High crest factor tolerance and dynamic stability- Lower TCO- Continuous full rated power at ambient as high as 45°C- N+1 Parallel operation of UPS without any common hardware- Advanced Communication Capability (RS485/Modbus/SNMP)- High branch fuse clearing capacity- On-line battery bank test without load disconnection- Compact, elegant, and light weight enclosure- Easy installation with wheels for maneuverability and front bottom terminals
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Power Cycling Semiconductor Life Test System
ITC52300
The ITC52300 is designed for high-volume intermittent or steady-state operating life testing on Insulated Gate Bipolar Transistors (IGBTs), power MOSFETs, diodes, and other bipolar devices in a production environment. (The ITC52300 is an enhanced version of the ITC5230.)
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Parametric Curve Tracer Configurations
Keithley PCT
Developing and using MOSFETS, IGBTs, diodes and other high power devices requires comprehensive device-level characterization such as breakdown voltage, on-state current and capacitance measurements. Keithley's line of high power Parametric Curve Tracer configurations supports the full spectrum of device types and test parameters. Keithley's Parametric Curve Tracer configurations include everything necessary for the characterization engineer to develop a complete test system quickly.
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Unclamped Inductive Load Tester
ITC55100STD
Model ITC55100STD performs ruggedness testing of power MOSFETs and IGBTs. It also tests single and dual diodes, and forward and reverse bias of IGBTs when used with an optional ITC55-RSF Output Selector Box.
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AC Source
AMF
The Intepro AMF Series is a complete line of single and three phase, 400Hz AC Frequency Converter products. With Power levels ranging from 6kVA up to 300kVA, the AMF series of frequency converter products are the ideal and cost effective solutions for precise frequency conversion in all avionics and higher frequency electronic applications. Power and frequency conversion is supplied by state-of-the-art IGBT pulse-width-modulated power amplifiers resulting in highly efficient power conversion, compact design and maximized performance with minimum downtime.
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Test System Mainframe
ITC59000
The ITC59000 Test Platform is a desktop DynamicParametric Test System mainframe. The ITC59000Test Platform accepts up to four Test MeasurementUnits (TMUs) that perform transient measurements onsemiconductor devices such as power MOSFETs,IGBTs, and diodes.
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IGBT For IH
IGBT devices for induction heating (IH) (soft switching), recommended for 10 to 100 kHz frequencies, and not guaranteed against short circuit.
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IGBT Drivers
These products directly drive Renesas IGBTs for strobe, simplifying circuit design.
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Design Topologies
By using these design topologies, you can quickly and easily find appropriate power devices (IGBTs) for your power supply circuit.
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FAult Detector and OScilloscope 7 Functions in 1 Device
FADOS7F1
Prot-Ar-Ge Industrial Project Design R&D Ltd. Co.
Usage of FADOS7F1: Determining faults of all types of electronic cards such as electronic cards of medical devices, textile and any other machines; automobile electronics; computer, monitor, TV, etc. Electronic Components Test: IC, transistor, FET, IGBT, resistor, capacitor, indicator, ect. This device is used to determine the faults at all these electronic components.
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Capacitor to Dim
DAM1
Lifasa - International Capacitors, SA
DAM switching capacitors are used to protect semiconductors (IGBT transistors). These are charged and discharged repeatedly with high current peaks. This series is especially indicated for applications that require high capacities at high voltages.
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LV Iron Core Line & Load Reactors
Line and load reactors are generally serial-connected to the input and/or output terminals of three phase equipment such as motor speed controllers, inverters and UPS systems. These equipment make use of semiconductor switches such as IGBTs, thyristors, and diodes and therefore create harmonic distortion and high switching over-voltages (dv/dt). Use of such equipment has been becoming more widespread as the technology advances. However, the negative effects of these equipment should not be overlooked.
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Power Semiconductors
IGBT modules designed to be used as switching elements for power converters of variable-speed drives for motors, uninterruptable power supplies, and more. IGBT has superior characteristics combining the high-speed switching performance of a power MOSEFT with the high-voltage/high-current handling capabilities of a bipolar transistor.
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Condenser for Damping
DAM3
Lifasa - International Capacitors, SA
DAM switching capacitors are used to protect semiconductors (IGBT transistors). These are charged and discharged repeatedly with high current peaks.
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Capacitor to Dampen
DAM2
Lifasa - International Capacitors, SA
DAM switching capacitors are used to protect semiconductors (IGBT transistors). These are charged and discharged repeatedly with high current peaks.
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Unclamped Inductive Load Tester
ITC55300C
Model ITC55300C performs ruggedness testing of power MOSFETs, discretes and modules and IGBTs, discretes and modules. It also tests single and dual diodes, and forward and reverse bias of IGBTs when used with an optional ITC55-RSF Output Selector Box.
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Air Core Line & Load Reactors
Line and load reactors are generally serial-connected to the input and/or output terminals of three phase equipment such as motor speed controllers, inverters and UPS systems. These equipment make use of semiconductor switches such as IGBTs, thyristors, and diodes and therefore create harmonic distortion and high switching over-voltages (dv/dt). Use of such equipment has been becoming more widespread as the technology advances. However, the negative effects of these equipment should not be overlooked.
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DC Power Supplies
SGe Series
AMETEK Programmable Power, Inc.
The SGe is an economical, FET based, high switching speed, programmable, dc power supply alternative to SCR and IGBT based dc supplies.
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Power Semiconductor Device
IGBT/SIC
Hitachi High Voltage IGBTs have been corresponding to a wide range of applications such as railway applications and various power conveters, leading companies for domestic and overseas adopt them, since they were adopted as a railway application in 1992. Will continue to contribute to the developing energy society by pursuing more easy-to-use, high-performance and high -quality products with leading-edge research and development.
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Motor Termination Units
Since the rise time of IGBTs are in the range of a few tens of nanoseconds (between 50ns-200ns), even short cables between PWM motor drives and motors cause voltage doubling at the motor terminals due to Travelling Wave Phenomenon as in transmission lines. The insulation of motor windings are prone to failure due to high voltage spikes if necessary precautions are not sufficiently taken. RC Type Output Filter Modules reduce these high voltage spikes to protect motors by connecting to stator terminals.
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Temporary Bonding andDebonding Systems
Increased demand for applications based on thin wafers and thin microelectronic-substrates result in the need for processing and handling of thin- and ultra-thin substrates during the manufacturing step. Thin substrates in the area of IC manufacturing (like memory, CMOS, 3D-TSV integration or ChipCard applications), power devices (e.g. IGBTs), compound semiconductors (e.g. for high brightness LEDs or RF-power amplifiers), as well as emerging technologies that also involve thin or flexible substrates (MEMS; RFID-tags, flexible displays, etc.) require reliable handling and support techniques in order to ensure safe processing.
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IGBT Snubber Capacitor
SMKP2
We can customize IGBT Snubber Capacitor according to your application need.Different applications can have very different capacitor electrical and mechanical profile requirements.Please feel free to send your application details, we might have a solution for your need.Production Lead Time will be about 30 - 50 days, depending on order quantity, material and production status.
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Making Invisible Visible
Quadra 3
Quadra™ 3 is your partner for high quality X-ray inspection for production line quality control. Detect a wide range of manufacturing defects including BGA, QFN and IGBT attachment, PTH filling, interfacial voiding, component cracking and counterfeit device screening. High quality, high magnification inspection for product applications.
