Loop Impedance Test
See Also: Impedance Testers
-
Product
Single Loop Controller
1462
-
The N4400 is a sophisticated, single loop controller which provides extensive profiling programming options for complex processes. The controller can create a profile with up to 121 segments, store up to 8 programs and configure and store extra programs on a PC.
-
Product
Single Loop Controller
1166
-
The 1166 is a powerful, single loop profile controller for complex processes. It offers profiling capability with 4 programs each of 16 free format segments making it a leader in its class.
-
Product
Low Impedance Voltage Tester
K-60
-
K-60 KNOPP VOLTAGE TESTER for AC and DC with polarity indicator. Double safety indication is by solenoid and by neon lamp. Knopp’s K-60 Low Impedance Voltage Tester (Cat. 14460) offers portability and ease of use with full protection. These exceptionally versatile and useful tools are backed by a reputation for quality in the design and manufacturing of electrical test equipment.
-
Product
Test System Optimized for High-Performance Digital and SoC
ULTRAWAVEMX44 and ULTRAWAVEMX20-D16
Test System
Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
-
Product
Impedance Matching Pads
-
Impedance matching pads from BroadWave eliminate impedance discontinuity (mismatches) without introducing reflection to the circuit. Custom units are available in a variety of impedance and connector types from DC to 4 GHz. BroadWave Technologies impedance matching pads preserve signal integrity by matching virtually any transmission line.
-
Product
Medalist i1000D
U9401B
In-Circuit Test System
The Keysight Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless.
-
Product
Antenna, Loop
EM-6879 | 10 KHz – 30 MHz
-
The EM-6879 Loop Antenna is used for magnetic field measurements over the frequency range of 10 kHz to 30 MHz. The EM-6879 is designed for use with any 50 ohm Receiver System. The antenna has a balanced Faraday shield that reduces its response to electric fields to a vanishingly small amount so that it can produce a practically pure magnetic field response.
-
Product
EBIRST 50-pin D-type To 25-pin D-type Adapter
93-005-414
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
-
Product
Functional Test System Optimized For Real-Time Digital Bus Test
Spectrum HS
Test System
Spectrum HS is Teradyne’s fully integrated functional test system. Optimized for real-time test of low latency buses, it’s a high-performance system delivering excellent test coverage of current and future products.
-
Product
Manual Tuners / Impedance Tuners
-
Maury manual tuners are based on precision slide screw technology that utilizes broadband slab line transmission structure and passive probes to create impedances for devices. The probes are designed to be very close to onequarter wavelength in the linear dimension at the mid-band of each range. Since each tuner has two probes, this results in improved matching characteristics for each unit. Another key feature of this series of tuners is the inclusion of a LCD position readout of the carriage position on those units operating below 18 GHz. Higher frequency tuners utilize a micrometer carriage drive. The positional repeatability and high matching range of these tuners make them ideally suited for use as a variable impedance source in applications like device characterization. Such measurements depend upon the ability of the tuner to establish impedances out near the edge of the Smith chart and to reproduce the electrical characteristics as a function of mechanical position. The tuners in this series are also easy to use due to the nearly independent electrical results of the mechanical motions. The depth of penetration of the probe into the transmission line determines the magnitude of the reflection, while the position of the probe along the line determines the phase. While there is some interaction, the effects are almost independent of each other. https://www.maurymw.com/images/mw-rf/mst982e35.jpg
-
Product
PCIe 2.0 Test Platform
PXP-100B
Test Platform
The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
-
Product
Memory Test System
T5830/T5830ES
Test System
Highly flexible tester which has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories
-
Product
Micro-Ohmmeter and Loop Resistance Tester
LRT 6000
-
LRT 6000: The right solution for impedance resistance measurement in compliance with all aircraft specifications on plane, helicopter, rocket, army vehicles for both production andmaintenance. It is a very easy-to-use and versatile instrument. Its ergonomics allow the user to use it either placed on the ground or across one's shoulder or chest. Awide back-lit LCDdisplay combinedwith an intuitive keyboard ensures simple and easy operation.
-
Product
Test Port Adapter Set, 2.4 Mm To 3.5 Mm
85130F
Test Port Adapter
The Keysight 85130F test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector designed for connecting to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. The set contains a 2.4 mm to PSC-3.5 mm male adapter and a 2.4 mm to PSC-3.5 mm female adapter. The frequency range for these adapters is dc to 26.5 GHz with a return loss of 26 dB or better.
-
Product
Multiple Module Serial Bus Test Instrument
Bi4-Series
Test Instrument
The wide variety of serial buses used in defense and aerospace applications typically requires multiple single-purpose instruments. Too often, they are difficult to reconfigure in order to test a different application.The Bi4-Series provides all the capabilities needed for complete communications bus access test for up to four serial buses used in board level (SRA/SRU) and box level (WRA/LRU) equipment—all in a single VXI module.The instrument includes test applications, industry-compliant software drivers and hardware enabling straightforward integration into automatic test systems.With the configuration flexibility needed to effectively test every bus format used in defense and aerospace applications, the Bi4-Series instrument plays a key role in reducing implementation time and test system cost.
-
Product
Test Port Cable, 1 Mm
11500L
Test Port Cable
Connect test ports to devices, fixtures, or probe tips with this 24-cm cable featuring a return loss of 16 dB minimum.
-
Product
High Impedance Probes
-
Everbeing offers GGB’s high impedance active probe for failure analysis of your devices. The high impedance with low capacitive design allows measurements of internal nodes without loading the device. For more information, please visit http://www.ggb.com.Everbeing offers GGB’s high impedance active probe for failure analysis of your devices. The high impedance with low capacitive design allows measurements of internal nodes without loading the device. For more information, please visit http://www.ggb.com.
-
Product
Antenna Impedance Analyzer
TZ-900 AntennaSmith
-
Analysis Parameters: SWR, Complex Impedance, R+jX, reflection coefficient, Smith Chart. 0.2 - 55 MHz• SWR
-
Product
Impedance Analyzers
HTF-1100.
-
A laboratory furnace used specifically for the electrical characterization of materials and also for heat treatment between ambient temperature and 1100 °C.
-
Product
Quad Op-Amp Loop
QOAL400
-
The QOAL400 module is a precision instrument capable of measuring all common parameters of an Op Amp, including AC as well as DC parameters. The QOAL400 has four completely independent channels, which allow a quad device to be tested in a minimum amount of time. Each channel has a full set of resources to measure all common parameters.
-
Product
VXI Digital Multiplier
4152A
Test System
The 4152A’s advanced features like limit testing, averaging, speed/resolution trade-offs, and fast function changes provide the high “test system” throughput required in today’s production test environments.
-
Product
Radar Test System
UTP 5065
Test System
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
-
Product
Monitoring Loops
-
The Loop Sensor was designed to monitor the generated magnetic fields in radiated susceptibility tests.
-
Product
Audio Impedance Testers
1106 IM
-
Standard Electric Works Co., Ltd
Large LCD : 68 × 34mm (2.677" × 1.338"). True measurement of speaker systems actural impedance at 1kHz. Three test ranges allow testing of home theater and commercial sound systems. Measures transformer impedances. Battery operation. Low battery indication. Data hold function. 0Ω adjustment.
-
Product
Antenna, Loop
EM-6871 | 30 Hz – 1 MHz
-
The EM-6871 Antenna can be used with any 50 ohm /Receiver/Field Strength Meter to obtain magnetic field measurements from 30 Hz to 1 MHz.
-
Product
Positioning Test System
TS-LBS
Test System
The R&S®TS-LBS is a comprehensive test solution for network and satellite based location technology testing of wireless devices and chipsets.It is highly configurable for testing various location technologies and uses Rohde & Schwarz location based test systems.The R&S®TS-LBS test system family fulfills the requirements of LBS conformance testing and operator acceptance testing on GSM, WCDMA, LTE and 5G devices and chipsets as well as regulatory testing consisting of adjacent channels and spurious emissions for EN 303 413 receiver testing. It also fulfills the requirements of E112 (EU) 2019/320 testing consisting of GNSS testing such as Galileo and AML mobile testing.
-
Product
High Impedance Active Probes
12C
-
A high speed, high input impedance active probe for measuring the internal node voltage of integrated circuits. The input is 1 megohm shunted by 0.1 pf and the rise/fall times are 0.8 ns. This instrument has full dc capability and can be used with any oscilloscope. The Model 12C was specially designed so that when used in conjunction with a high input impedance oscilloscope, signal attenuation is 10:1 and with a 50 Ohm input, signal attenuation is 20:1.
-
Product
Step & Touch & Earth Impedance
-
The kit applyed with STS 5000, STS 4000 or eKAM, allows to perform the following types of test: soil resistivity, ground grid resistance, step and touch tests and overhead lines zero sequence and mutual coupling coefficients
-
Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Test System
Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
-
Product
Component Test Systems
Test System
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
