Frequency Sources
A stable oscillator used for frequency calibration or reference. (atis.org)
-
Product
SNS Series Noise Source 10 MHz to 18 GHz (ENR 6 dB)
N4000A
-
The SNS series N4000A noise source is designed for accurately measuring devices with low noise figure, with a frequency range of 10 MHz to 18 GHz and nominal ENR 6 dB.
-
Product
Tunable Laser Source, High Power And Lowest SSE, Top Line
N7776C
-
The new Keysight N7776C top line tunable laser source is designed to reach best-in-class accuracy in static and swept operation for outstanding test efficiency. Two-way sweeps up to 200 nm/s speed with sub-picometer repeatability and without impacting the specified dynamic accuracy accelerate wavelength-dependent alignment processes and the automated calibration of wavelength-selective devices. Shorter time to testing and faster swept-wavelength tests help reduce test cost per device, improve test margins and lower the cost of ownership.
-
Product
Source Measurement Unit
SMU32
-
The SMU32 is a low cost solution for V/I source and measurement. The SMU32 offers PMU/DPS in a compact, 3U PXI form factor. The SMU32 supports -1V to +10V +- 32 mA FVMI/FIMV modes. 8~32 PMUs can be ganged to DPS for high current driving.
-
Product
Standard 6.20 (175.20) - 8.00 (226.80) High Frequency Probe
CSP-40A-015
-
Bandwidth @ -1dB (GHz): 6.00Return Loss @ -20dB (GHz): 2.30Nominal Impedance (Ohms): 50Dielectric VTE Rating (k VAC): 1Test Center (mil): 250Test Center (mm): 6.35Full Travel (mil): 200Full Travel (mm): 5.08Recommended Travel (mil): 133Recommended Travel Remark: Shield: 211 (5.36) including travel of probesOverall Length (mil): 1,231Overall Length (mm): 31.28Full Travel Remark: Shield: 275 (6.99) including travel of probes
-
Product
High Precision Source Measure Unit (SMU) - Hybrid Compatible PXI, 100ks/S Programming/Measurement Speed
52400 series
-
Hybrid Compatible PXIFour quadrant operationHigh source/measurement resolution (multiple ranges)Low output noiseHigh programming/measurement speed (100k s/S) & slew rateOptional measurement logDIO bitsOutput profiling by hardware sequencerProgrammable output resistanceFloating & Guarding output16 Control Bandwidth SelectionMaster / Slave operationDriver with LabView/LabWindows & C/C# APISoftpanel GUI
-
Product
110 GHz Frequency Extender
N5293AX01
-
The N5293AX01 modules are compact lightweight modules designed to interface to the N5292A test set controller that is driven with a PNA/PNA-X B model vector network analyzer.
-
Product
DC - 12 GHz Packaged High Efficiency Divide by 8 Prescaler
HMMC-3128-BLK
-
TheHMMC-3128-BLK is a packaged DC - 12 GHz divide by eight prescaler designed for use in high frequency communications, microwave instrumentation, and EW radar systems where low phase-noise PLL control circuitry or broadband frequency translation is required.
-
Product
Standard 0.79 (23.40) - 1.75 (49.60) High Frequency Probe
CSP-40G-021
-
Your product description goes here.
-
Product
Source Measurement Unit
PEMU4
-
The PEMU4 represents a new level of performance and capabilities for USB-based SMU (Source MeasurementUnit) instrumentation. The PEMU4 supports -1V to +6.5V 0.5A with FVMI, FVMV, FIMV, FIMI modes. 4 channel can be ganged to support high current driving. I2C/SPI/RFFE function for serial port device testing. 4 Counter for frequency measurement.
-
Product
Standard 3.74 (106.00) - 14.35 (407.00) High Frequency Probe
K-50L-QG-75
-
Nominal Impedance (Ohms): 50Bandwidth @ -1dB (GHz): 12.00Return Loss @ -20dB (GHz): 3.00Test Center (mil): 550Test Center (mm): 13.97Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 1,575Overall Length (mm): 40.00
-
Product
Step-Tunable Laser Source, High Power and Low SSE, Basic Line
N7779C
-
The new N7779C basic line step-tunable laser source is ideal for cost-effective testing of broadband optical devices. It can also serve as a highly stable, tunable local oscillator for receiver testing or transmission experiments.
-
Product
Source/Measure Unit for Battery Drain Analysis, Multiple Ranges, 80 W, Double-wide
N6785A
-
The N6785A is a source/measure unit (SMU) designed specifically for battery drain analysis of large mobile, battery-powered devices up to 20 V, up to 8 A, up to 80 W.
-
Product
DFB Laser Source Module
LaserPXIe 1200 Series
-
The LaserPXIe 1200 Series is a highly customizable DFB laser source available in a wide range of wavelengths and powers.
-
Product
120 GHz Frequency Extender
N5295AX03
-
The N5295AX03 modules are compact lightweight modules designed to interface to the N5292A test set controller that is driven with a PNA/PNA-X B model vector network analyzer.
-
Product
PXIe-4136, 200 V, 1 A System PXIe Source Measure Unit
783760-01
-
±200 V, 1 A System PXI Source Measure Unit—The PXIe‑4136 system source measure unit (SMU) delivers high power, precision, and speed. It is ideal for a broad range of applications including manufacturing test; board-level test; lab characterization with devices such as integrated circuits (ICs), power management integrated circuits (PMICs), and radio frequency integrated circuits (RFICs); and discrete devices including LEDs and optical transceivers. The PXIe‑4136 features 4-quadrant operation. The PXIe‑4136 is a hardware-timed instrument with a high-speed sequencing engine for synchronizing acquisitions between multiple SMUs. The module supports direct DMA streaming between the host PC and SMU, so you can stream large waveforms and measurement data at the full update rate and sample rate of the instrument.
-
Product
Standard 3.74 (106.00) - 14.35 (407.00) High Frequency Probe
K-50B-QG-75
-
Nominal Impedance (Ohms): 50Bandwidth @ -1dB (GHz): 12.00Return Loss @ -20dB (GHz): 3.00Test Center (mil): 550Test Center (mm): 13.97Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 1,575Overall Length (mm): 40.00
-
Product
PXI-4132, 100 V, 2 W Precision PXI Source Measure Unit
780558-01
-
±100 V, 10 pA Precision PXI Source Measure Unit—The PXI-4132 is a programmable, high-precision source measure unit (SMU). It has a single isolated SMU channel that offers a four-quadrant output that incorporates remote (4-wire) sense as well as external guarding. With its high measurement resolution integrated guarding, the PXI-4132 is ideal for high-accuracy leakage measurements on integrated circuits, discrete components, PCBs, and cables. You can also perform high-speed I-V measurements on a variety of components including diodes and organic LEDs using the onboard hardware sequencing engine. In addition, you can synchronize multiple PXI-4132 modules using the PXI backplane to provide high-speed I-V measurements on transistors and more complex devices.
-
Product
350 MHz RF Frequency Counter, 10 digits/s
53210A
-
Single-channel, RF frequency counter One 350 MHz input channel, plus optional second channel (6 GHz or 15 GHz)10 digits/second resolution Built-in math analysis and color, graphical display (trend and histogram)LXI-C/LAN, USB, GPIB Optional: Lithium Ion Battery BenchVue software enabled: Do more with your PC and instrument together, no programming required. Easily control your counters, quickly build automated tests and log data for faster analysis and save precious time.
-
Product
Optical Switches
-
Fast and reliable optical switches to streamline your test procedures. Can be customized with a wide range of switch configurations, fiber types and connectors.
-
Product
High-Density Precision SMU (10 PA, 30 V)
PZ2131A
-
The Keysight PZ2131A is a high-channel density precision source / measure unit (SMU) having 5 channels per module and saving space for a wide range of applications requiring numerous precision power supplies. The narrow-pulse function and fast Digitizer Mode allow the PZ2131A to expand the conventional static DC measurements to emerging dynamic measurements. Its seamless current measurement ranging function eliminates the time it takes to change the range and expands the dynamic range to cover multiple measurement ranges, which reduces test duration. These capabilities make the PZ2131A suitable for applications that require numerous precision power supplies, such as semiconductor reliability tests and integrated circuit (IC) tests. The Keysight PX0107A low noise filter adapter lowers its voltage source noise level, which makes the PZ2131A suitable for noise-sensitive applications such as quantum computing as well.
-
Product
Precision Source / Measure Unit (2 Ch, 10 FA)
B2912B
-
The Keysight B2912B precision source / measure unit (SMU) is a 2-channel, compact, and cost-effective benchtop SMU with the capability to source and measure both voltage and current. It easily measures current versus voltage (I/V) with high accuracy. The 4-quadrant source and measurement capabilities enable taking I/V measurements without configuring multiple instruments.
-
Product
2 Channel IV Analyzer / Source Monitor Unit
E5263A
-
Keysight E5262A and E5263A 2ch IV Analyzers are the low cost solution for current-voltage characterization. The E5262A and E5263A support two channels of SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 5 pA. The Easy EXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU's versatile measurement capabilities and GUI based characterization software makes the E5262A and E5263A the best solutions for characterization and evaluation of two or three terminal devices such as materials and active/passive components with uncompromised measurement reliability and efficiency.
-
Product
Performance AC Power Source, 1750 VA, 300 V, 13 A
6813C
-
Maximize your investment with five instruments in one device Increase your productivity with extensive built-in power measurement capabilities Flexible IO: LAN/LXI Core, USB and GPIB Lower your cost of ownership with global support & the longest standard warranty in the industry
-
Product
SNS Series Noise Source 10 MHz to 18 GHz (ENR 15 dB)
N4001A
-
The SNS series N4001A noise source is ideal for general purpose use with a low reflection coefficent and a nominal ENR of 15 dB from 10 MHz to 18 GHz.
-
Product
Standard 4.47 (127.00) - 12.00 (340.00) High Frequency Probe
K-50B-S
-
Current Rating (Amps): 6Bandwidth @ -1dB (GHz): 4.00Return Loss @ -20dB (GHz): 2.50Nominal Impedance (Ohms): 50Test Center (mil): 600Test Center (mm): 15.24Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 90Recommended Travel (mm): 2.29Overall Length (mil): 1,205Overall Length (mm): 30.61
-
Product
350 MHz Universal Frequency Counter/Timer, 12 digits/s, 100 ps
53220A
-
Two 350 MHz input channels, plus optional third channel (6 GHz or 15 GHz)12 digits/second resolution, 100 p sec time interval resolution LXI-C/LAN, USB, GPIB Built-in math analysis and color, graphical display (trend and histogram)Optional: Lithium Ion Battery Bench Vue software enabled: Do more with your PC and instrument together, no programming required. Easily control your counters, quickly build automated tests and log data for faster analysis and save precious time.
-
Product
Noise Source, 1 GHz up to 50 GHz
346CK01
-
The Keysight 346CK01 is the ideal companion to Keysight´s noise figure solutions when working on high frequency applications. Since it is broadband (1 GHz to 50 GHz), it eliminates the necessity for several sources at different frequency bands. The low SWR of the noise source reduces a major source of measurement uncertainty, which are reflections of the test signals. This is a coaxial noise source with a 2.4 mm coaxial connector. ENR typically 20 dB at 1 GHz, decreasing to typically 7 dB at 50 GHz.
-
Product
PXIe-4144, 4-Channel, ±6 V, 500 mA PXI Source Measure Unit
782432-01
-
PXIe, 4-Channel, ±6 V, 500 mA PXI Source Measure Unit - The PXIe-4144 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4144 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
-
Product
PXIe-4135, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit
783762-01
-
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit - The PXIe-4135 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology and native triaxial connectors help you perform high-precision measurements with a current resolution of 10 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4135 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
-
Product
PXIe High-Speed Source/Measure Unit, 13 V, ± 1 A or 6 V, ± 3 A, 18 W
M9111A
-
The M9111A is a 1-slot, 2-quadrant PXIe module that provides stable, glitch-free sourcing and sinking, and high accuracy measurements. It offers high-throughput and measurement quality for design validation and production test of RF power amplifiers. With industry-leading output stability under extreme, dynamic load conditions and unmatched transient performance to dramatically reduce voltage droop due to pulse loading, the M9111A SMU speeds test time. The high-speed M9111A can change its output voltage, stabilize that voltage, and accurately measure current from Amps down to micro-Amps all in less than 1 ms so that you can move on to the next test as quickly as possible.
