Base Station
Radio receiver / transmitter serving as the hub.
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PCIe/104-Based Data Acquisition (DAQ) And Control
PCIe/104 boards are typically intended for use in small, space-constrained industrial control or vehicles systems. The standard size of these modules is just 3.550 × 3.775 inches (90 × 96 mm).
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Endpoint / Chamber Health Monitor based on Optical Emission Spectroscopy and MWL Interferometry
EV 2.0 Series
To address new requirements in Semiconductor, lighting devices, automotive components, flat panels, MEMS sensors, memory chips, and logic electronics processed in the industry using dry etch, cleaning and (PE)CVD, HORIBA has introduced a unique generation of sensor dedicated to Advanced Endpoint Control, Fault Detection and Chamber Health Monitoring.
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Station Of Acceptance Testing
The acceptance test station consists of a personal computer - the workstation of the operator of the testing station, contact mechanisms, as well as current and voltage sensors. The station allows to test up to 10 electric motors of various types simultaneously. The operator of the testing station indicates the test sites at which the engine tests will be conducted, their type (from the database), serial numbers and a set of tests.
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Probe Station
S-1160
S-1160 Probe Station 100mm, 150mm and 200mm wafer stage's completely manual and user friendly.
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Electrolyser Test Stations
Greenlight is the world''s leading supplier of test stands for both PEM and Alkaline electrolyser research. We have been manufacturing electrolyser testing equipment since 1996, and can provide references from major companies and research institutes worldwide.
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6TL19 Off-Line Base Test Platform
H71001900
The 6TL19 is a bare half-rack with castors for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 11U (580mm depth).
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PXIe-1435, Base-, Medium-, Full-Configuration Camera Link PXI Frame Grabber Module
781699-01
Base-, Medium-, Full-Configuration Camera Link PXI Frame Grabber Module—The PXIe‑1435 is a Camera Link image acquisition device designed for machine vision and scientific imaging applications that require high data throughput. The PXIe‑1435 works with any base‑, medium‑, and full‑configuration Camera Link camera, and it is ideal for many industrial, life science, and biomedical imaging applications. The PXIe‑1435 also supports Power over Camera Link (PoCL) and can power cameras through PoCL‑enabled cables. The onboard digital I/O includes four TTL, two optoisolated inputs, and one quadrature encoder.
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Rack based antenna test system
R&S®ATS800R CATR
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique rack based CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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PCB repair / rework station
XJInvestigator
Much more than a production line test tool, XJInvestigator is a repair focused, integrated test and debug environment for fault analysis, helping you efficiently recover your failing boards.
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3U OpenVPX Rugged Gigabit Ethernet Cisco ESR6300 Based Router
NetKit-3110
NetKit-3110 is a 3U conduction-cooled (VITA 48.2) VPX Gigabit Ethernet router based on Cisco’s ESR6300 Embedded Series router and is designed for harsh deployed environments. NetKit-3110 provides six high-performance Gigabit Ethernet interfaces (two routed and four switched) along with Cisco’s IOS® XE Software, giving deployed applications a rugged routing engine with a separate encryption/decryption processor, and providing highly secure yet scalable video, voice, and data services.
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X-RAY Cameras Based On CCD
XiRAY
*High resolution direct phosphor imaging, ideal for Micro CT*Ultra-low readout noise with CCD and especially the new sCMOS sensors*Crystal clear 14 bit/pixel images*Partial readout and binning modes for enhanced sensitivity and higher speed*Non-linearity over full dynamic range <2% (of full scale) to 95% of full scale*External triggering, LVTTL*Low power consumption 6 Watt with Cooling or 2W without*Antiblooming, Enhanced Statistical Extra-Mural Absorption*Radiation hardened, Support of Energy levels 7 to 100keV*Measures just 63 x 63 x 46 mm*Peltier TE Cooled with Heatsink and optional fan
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Optics Test Stations For Single Lenses And Optical Systems
OTS
Optik Elektronik Gerätetechnik GmbH
The optics test stations of the OTS series enable the computer-based, software-controlled measurement of optical parameters of individual lenses (including cylindrical lenses) and optical systems. Measured variables are, for example, focal length, MTF, focal length, radius, contact dimension, centering, wedge angle and deflection angle. The optional software module LensTest enables the measurement of the center thickness of lenses and air gaps in complete lenses as well as the measurement of the centering error of individual surfaces.
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RJ45 (Ethernet 100 Base T) to 90 Series Interface
J90RJ45I
RJ45 Ethernet connector for VPC Tripaddle ITA moduleUp to 3 connectors per moduleFor Cat 5 Fast Ethernet cable IEEE 802.3 standard100 Base-T
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Transmitter System for Low Signal Power Relay Stations
AM3000 Series
Japan Communication Equipment Co., Ltd.
This system is a minimal low signal power transmitter for the relay of ISDB-T Digital Terrestrial Broadcasting. As the need arises, it's possible to have the compensation function built-in for integrate-type basic equipment.
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I-Pi SMARC Development Kit Based On NXP® I.MX 95 Six-Core Arm® Cortex-A55, M7 & M33
I-Pi SMARC IMX95
The ADLINK LEC-IMX95 is a powerful and versatile SMARC module that delivers high-performance computing, graphics, machine learning, and vision capabilities for IoT and industrial applications. It is based on the NXP i.MX95 processor, which integrates six Arm Cortex-A55 cores, one Arm Cortex-M7 core, one Arm Cortex-M33 core, an Arm Mali GPU, an ISP, and an eIQ Neutron NPU that can run at up to 2 TOPS.
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PC Based Comprehensive Test Setup for Luminaires
Our zest for innovation has resulted in continuous upgrades in the existing line of products. Till now we used to manufacture 3 different equipments for Driver, MCPCB and Luminaires Component testing. We at SCR Elektroniks have developed our comprehensive tester to incorporate all the 3 systems in a single bench. Here in this tester one can test all the three DUT in a single bench. Since all the 3 testing procedures have many tests in common, we have incorporated all the tests in a single bench such that testing of Luminaire driver, Luminaire PCB and Final Luminaire set is performed in single test bench. Only these tests are performed over the DUT else other are disabled for them.
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COM-HPC Server Type Development Kit based on Ampere® Altra® SoC
Ampere Altra Dev Kit
Ampere Altra Dev Kit consists of a COM-HPC Server Base carrier paired with a COM-HPC Server Type Size E module and heatsink with fan. The module features Ampere® Altra® SoC (Arm Neoverse N1-based architecture) harnessing 32/64/96/128 Arm v8.2 64-bit cores for up to 1.7/2.2/2.8/2.6 GHz and providing support for up to 768GB DDR4 memory, offering unprecedented performance and power per watt with exceptional scalability.
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RJ45 (Ethernet 100 Base T) to 90 Series Interface (R)
J90RJ45R
RJ45 Ethernet connector for VPC Tripaddle 90 series RCV moduleUp to three connectors per moduleFor Cat 5 Fast Ethernet cable IEEE 802.3 standard100 Base-T
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Bench-top Insertion & Return Loss Test Station
STC-IRL3201
Shanghai Stone Communication tech Co., Ltd
STC-IRL3201 is a high performance loss test station that is designed specially for Optical Passive Components production Test and Lab Test. It combines three different working modes as a return loss meter, optical power and loss meter and a stable laser source in one test station.
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Power Tube Burn-in Station
Maxi-Burn
The MaxiBurn Tube Preheater is a 2U rack mountable or bench top unit for heating 30 Octal Base Tubes. Designed for continuous use heating standard power pentodes to normalize their characteristics before testing or matching the MaxiBurn powers the tube filaments and drives a nominal plate current through each tube. Normal function of each tube is indicated by a glowing LED associated with the tube.
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Volumetric Sample Preparation Station
APS‑7450V
The APS-7450V is made to keep pace with the increased speed of wear metals labs, where analysis time is often shorter than 30 seconds per sample, by simply and quickly handling the dilution step in less time.
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"Condulet" Style CP Test Station
T2
Fits 3/4" Riser pipe3+ hole terminal board3 binding postsExternal terminals7 colors from stockUV Stabilized color protectionHigh impact resistanceFire resistantGasket seal to protect inside
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Sealing Kit for PHD-4001A on Cascade Elite E300, Octagon CM300 Probe Station
PHD-4001-TH-Seal
High Power Pulse Instruments GmbH
*Sealing Kit for PHD-PPM10-H9 and PHD-4001A on Cascade Octagon CM300 probe station*High temperature range -40 °C to +200 °C
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AIR SURVEILLANCE AND GROUND BASED AIR DEFENCE
GIRAFFE AMB
The system monitors the air volume 360 degrees for air targets and simultaneously locates and warns against incoming rocket, artillery and mortar rounds, and at the same time able to provide coastal surveillance.
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PXI Based Multifunction Measurement and ICT Instrument
PXI-501
The PXI-501 is a multifunction measurement instrument for functional and in-circuit measurements.It combines two parametric measurement units with a digital voltmeter, a high voltage current source and a discharge unit. This powerful combination makes it the ideal instrument for classical analog in-circuit test and manufacturing defect analysis with additional functional test capabilities.With it’s fast sampling rate of up to 4MSps it speeds up measurements and is capable of measuring and generating AC signals up to 100kHz.To enhance the PXI-501 capabilities it can be combined with an ABex TM-501 or an ABex TM-404. The ABex TM-501 enhances the in and output range of the PXI-501. Furthermore, it provides a shunt current measurement upgrade. In combination with the ABex TM-404 it’s a complete in-circuit test solution with 86 channels in one ABex slot. For sure it can be upgraded to 2838 test points in one rack by simply adding additional matrix modules.With the above-mentioned terminal modules, the PXI-501 is able to act as a ABex system controller, so that no additional controller is required in the cassis.
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Flow Battery Test Stations
Greenlight's turn-key flow battery test systems include load/power supply modules, automated control of flow, pressure and temperature of electrolyte fluids, cell voltage monitoring, 3-level safety system and computer with Emerald dynamic automation software. All Greenlight flow battery test systems come with a our standard 1 year warranty. Our customer service team is available to travel to your facility for commissioning and training.Greenlight''s Automation Division also offers flow battery assembly equipment.
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Power System Recorder with CDR , PMU and IEC 61850 station bus protocol
TESLA 4000
ERLPhase Power Technologies Ltd
The new TESLA 4000 is an intelligent, state of the art, user-friendly multi-timeframe dynamic power system recorder with advanced Phasor Measurement Unit (PMU) and Continuous Disturbance Recording (CDR) capabilities. Wide area swing recording accomodates system performance analysis in minutes Meets NERC continuous disturbance recording standards with non-volatile on board flash memory No mechanical moving parts – flash drive eliminates most common mode of failure in recorders. Each flash drive holds 1000 records. IEEE C37.118-2005 SynchroPhasor Standard
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PCI Based JTAG Controller
PCI-1149.1/Turbo
The PCI-1149.1/Turbo is a powerful PCI-based JTAG/boundary-scan controller that is used for testing and in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard.
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Camera Endpoint Monitor based on Real Time Laser Interferometry
LEM Series
Our Real Time Interferometric Process Monitor provides high precision detection of film thickness and trench depth during the etching/deposition process.Depending on applications, LEM camera includes a 670 or 905 or 980 nm laser and when mounted on any dry etch/deposition process chamber with a direct top view of the wafer this generates a small laser spot on the sample surface.Interference occurs when monochromatic light hits the sample surface, resulting in different optical path lengths due to film thickness and height variations in the film.This allows the etch/deposition rate and thus thickness to be monitored in real time, also fringes counting or more complex analysis, providing enhanced process control Endpoint for a wide variety of processes. Additionally interfaces can be detected by their change in reflectivity.
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Semi-Automatic Probe Station
P300A
The P300A probe station is the most stable, intuitive, and space efficient 300mm semi-automatic analytical probe station available today. Designed for low current, sub-micron positioning applications, the P300A comes standard with features such as single-point ground, dry/dark environment, and integrated thermal chuck plumbing.
