Filter Results By:
Products
Applications
Manufacturers
UUT
assures a constituent's interoperability in a system.
See Also: Unit Under Test, DUT, System Under Test
-
product
CMK Mechanical Kits
Columbia has created a unique mechanical click system using ball bearings and guiding sleeves. The UUT is connected to the spring contact pins that are connected to the testing environment in a completely linear fashion. Connecting the UUT to probes can be approached both from the top and the bottom and, optionally, even from the side. The ergonomic housing provides generous space for additional measuring electronics. The back and bottom of the housing can be adapted to the various test system interfaces.
-
product
VXI Analog Instrument
Ai-710
The Ai-710 is a Core System Instrument (CSi)—a single-slot, multi-function VXI analog test instrument. It eliminates the requirement for multiple discrete instruments that often provide inadequate test coverage for newer Units Under Test (UUTs). The single-slot VXI form factor reduces tester footprint, as well.
-
product
Linear Testfixture (Cassette Not Included), UTT 586 x 248 mm
MG-03
FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 586 x 248 mm (wxd• Outer dimensions: 750 x 490 x 100 x 170 mm (wxdxh1xh2)• Designed for changeable cassette
-
product
Universal A/V Tester
This tester was built for our client with the specific requirement that specific UUTs can be added to the system by our client. We handled developing test software for the first 2 UUTs utilizing an open programming structure that allowed programming modules to be strung together to create test programs for any additional UUT that our client wants to add in the future.
-
product
Intermittent Fault Detection & Isolation System
IFDIS
The IFDIS™ uses patented Intermittent Fault Detector technology that simultaneously and continuously monitors every circuit path within a Unit Under Test (UUT) - such as a Line Replaceable Unit (LRU) chassis' interconnects - for intermittent continuity failures that occur for as short as 50 nanoseconds. This state of the art technology is combined with an environmental chamber and vibration table, which simulate the UUT’s operational environment and cause intermittent faults to manifest, creating a system that is unsurpassed in intermittent fault detection.
-
product
3-Phase Programmable AC Source
Chroma Systems Solutions, Inc.
Delivers the right solution to simulate all kinds of input condition of UUT to be utilized in R&D and QA, suitable for commercial applications from laboratory testing to mass production
-
product
Customized Test Fixtures
Test fixture is a device designed to mount a device under test (DUT), equipment under test (EUT) and unit under test (UUT) in place and allow it to be tested by being subjected to controlled electronic test signals and procedures.
-
product
Dual Bus 64-Channel 2A PCI Fault Insertion Switch
50-190-102
This PCI fault insertion switch range is available with 75, 64 or 36 channels. It is primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. The Stimulus/Measurement to UUT path is suitable for supporting CAN and FlexRay bus systems.
-
product
In-Circuit Tester Integration
The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.
-
product
LXI Low-Frequency Matrices
Our LXI low-frequency matrices provide complete flexibility for connecting test equipment and the unit under test (UUT)together and are compliant with LXI Standard 1.4
-
product
RWR ATE MKII
MS 1111
Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out LRU and card level testing for TARANG systems of all platforms. The purpose of ATE is to provide a user-friendly environment to test the LRUs and sub-systems (individually) for their functionality, perform specific tests of each LRU / sub-system and Card Level Testing. The card level testing facilitates troubleshooting down to a faulty signal flow path. The UUT tests are carried out by injection of the stimuli generated by the computer or the programmable test equipments and the responses from UUT / test equipments are feedback to the computer for evaluation and generation of reports.
-
product
Manual Fixture Kit With Changeable Cassette, Max number of probes (2N) 1000 units, Max UUT 580 x 400 mm (wxd)
CMK-04
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
-
product
Manual Fixture Kit With Changeable Cassette, Max number of probes (2N) 1000 units, Max UUT 585 x 250 mm (wxd)
CMK-03
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
-
product
Dual Bus 75-Channel 2A PCI Fault Insertion Switch
50-190-002
This PCI fault insertion switch range is available with 75, 64 or 36 channels. It is primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. The Stimulus/Measurement to UUT path is suitable for supporting CAN and FlexRay bus systems.
-
product
Chassis Controllers and Bus Expanders
With over 20 different chassis configurations, our Smart PXI chassis product line (3U chassis, 6U chassis, 3U/6U chassis) offers the most features, slot configurations, UUT interface options, system power, and embedded / external controller options in the industry.
-
product
PXI 16x4 Signal Insertion and Monitor Matrix
40-525A-002
This is a PXI signal insertion and monitor matrix with switched pass thru connections on both X and Y axis. It is also available in a 34x4 format and can be used for signal insertion and monitoring purposes on connections between the UUT and test system.
-
product
PXI 5A Fault Insertion Switch 10-Channel
40-196-001
The 40-196 is a 10 Channel 5A Fault Insertion Switch, primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. It is designed to be able to insert different fault conditions between the test fixture and the equipment under test: Open-Circuit, Short-Circuit between signal pairs, Short-Circuit between signal pairs and user applied fault conditions e.g. Power or GND. Shorting relays on each channel enable UUT signals to be subjected to external user applied fault conditions or to be shorted to the adjacent signal in the same channel. Relays in line with the signal allow open circuit conditions to be simulated on either side or both sides of a channel signal pair. The switching topology of the 40-196 allows channels to be interconnected so that complex fault insertion systems can be constructed.
-
product
Linear Testfixture (Cassette Not Included), UTT 456 x 320 mm
MG-07
FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 456 x 320 mm (wxd)• Outer dimensions: 620 x 590 x 100 x 184 mm (wxdxh1xh2)• Designed for changeable cassette
-
product
Power Supply Testers
Qmax Test Technologies Pvt. Ltd.
Power Supply Tester is an integrated package of hardware such as AC/DC Power Sources, DC Loads, Noise Measurement Unit, and DMM etc configured as per user applications, which makes it suitable for testing wide range of Power Supplies and provide economic solution for testing AC/ DC and DC/DC power supplies and converters. The Power Supply Boards that passed in the first level of screening for Go-No Go tests will undergo a second level testing. The second level of testing measures all the key parameters of the power supply such as line regulation, load regulation, efficiency etc and check whether the results are within the mentioned limit, if not declare the UUT (Power Supply Board Under Test) as a failed one.
-
product
Linear Testfixture Testfixture for Mass Interconnect Cassette Interface Cassette and VPC ITA Frame Not Included, UUT 306 x 248 mm
MG-02-01 VPC G12
FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 306 x 248 mm (wxd)• Outer dimensions: 470 x 490 x 100 x 170 mm (wxdxh1xh2)• Designed for Mass interconnect changeable cassette• Up to a maximum of 8 interface blocks of 160 or 170 signals• All interface blocks can be customized
-
product
Camera Testing
FLIR
CI Systems' FLIR turn-key test stations carry out all the necessary tests to verify and compare the quality of an infrared/thermal camera. The FLIR test systems are based on CI Systems' NIST traceable blackbody radiation sources, collimators and special thermally controlled targets, designed to provide very accurate IR test patterns. All these combine to project standardized targets with known geometry and intensity to the Unit Under Test(UUT).
-
product
Test Program Execution for High-Volume Production Systems
ScanExpress Runner Gang
Electronic manufacturing test systems must be fast and efficient. Schedules today are shorter, products are more complex, and the market demands higher speed—the product needs to be built and shipped yesterday.ScanExpress Runner Gang Edition is a concurrent boundary-scan and in-system programming test executive designed specifically for high volume production. Unlike traditional test systems which execute sequentially on a single unit under test (UUT) at a time, ScanExpress Runner Gang Edition provides concurrent (gang) testing on up to 8 UUTs for improved test and programming times.
-
product
Platforms
The use of switching systems to route instrumentation and stimulus signals to appropriate test points on a unit under test has a very crucial role to play in most electronics test systems. The sharing of test resources, connection of calibration references, load management, and many other functions are all managed by the switching system, the switching system acts as the interface between the unit under test (UUT) and the test equipment.
-
product
MIL-STD-1553 Fiber Optic Bus Extender
FO-1553
Avionics Interface Technologies
Extends MIL-STD-1553 bus access to over 1 mile for remote access - Dual redundant, single and dual stream options available - Both Transformer and Direct coupling modes supported - Uses fiber optic 1.0625 Gbps data rates for low latency over long distances - Optical signaling is not affected by electrical noise and interference - Simple and easy to use solution, no software setup or configuration required - Ideal for applications where test equipment is separated from UUT
-
product
GENASYS High Density Matrix Switch Card, 104 X 8 X 8
GX6188 Series
The GX6188 is a 6U PXI, high density matrix, GENASYS architecture switching card. The card provides the user with the ability to connect and interface resources to multiple UUT connections. The board consists of two matrices - a 104x8 and a 8x8 matrix. The GX6188 can connect to 104 UUT switching points, eight external resources and an eight channel global bus via front panel connectors. Multiple GX6188 cards can be connected using the global bus. Like other GENASYS switch cards, the GX6188 features an integral, 3-dimensional switching architecture which provides the flexibility to connect test system resources to multiple UUT connections as well as supporting an expansion bus connection without sacrificing I/O matrix connections when building multiple switch card configurations.
-
product
Digital Test Instrumentation
Di-Series™
The Di-Series tests all levels of integration from board level (SRA/SRU) to box level (WRA/LRU) units under test (UUTs), while maintaining full compatibility with previous generations of Teradyne instrumentation and systems. Excellent usability and reliability reduce programming and support effort, as well as straightforward upgrades of existing test program sets (TPS).
-
product
PXI 34x4 Signal Insertion and Monitor Matrix
40-525A-001
This is a PXI signal insertion and monitor matrix with switched pass thru connections on both X and Y axis. It is also availablein a 16x4 format and can be used for signal insertion and monitoring purposes on connections between the UUT and test system. Each pass thru connection from LX to X can be open or closed to allow the programmatic disconnection of the signal to check the response of the UUT. The matrix can be used to connect test equipment, such as a DMM or scope, to monitor the pass thru signals via Y connections while the LY connections can be used to insert a fault condition or insert external signals. When external signals are injected the LX connections can be opened and the LY connections closed.
-
product
PXI/PXIe Microwave Multiplexer, Single SP6T, 6 GHz, 50 Ω, SMA, Failsafe
42-784B-001
The single slot remote multiplexer versions occupy less PXI panel space and allow the microwave relays to be placed closer to the UUT and other RF test equipment. In some applications it can shorten the length of RF cable runs and improve system performance. The remote multiplexers are supplied complete with a 1.5 m interface cable.
-
product
3-Phase AC Power Source
61700 series
The Chroma Programmable AC Power Source model 61700 series delivers pure, 5-wire, 3-phase AC power. Unlike the traditional 3-phase AC power source, it includes low power rating models at very low cost. Users can program voltage and frequency, measure the critical characteristics of the output on its LCD display. It delivers the right solution to simulate all kinds of input condition of UUT to be utilized in R&D and QA. It is also suitable for commercial applications from laboratory testing to mass productions. The 61700 supplies the output voltage from 0 to 300VAC and it can be set individually for each phase. Users also can set the phase angle from 0? to 360?. These kinds of function make the 61700 series can simulate unbalance 3-phase power. Because of the wide output frequency from 15 to 1200Hz, it is suitable for avionics, marine and military application. The AC+DC mode extends the output function to simulate abnormal situation when power line contains DC offset.
-
product
Digital and Analog Test Sets
Our analog and digital automated test system experience covers a wide variety of applicationsfrom multiple path resistance, capacitance, and inductance testing using various Interface Test Adapters (ITA)to inter-connect multiple customer units under test (UUT). Other systems have included: equipment to monitor and record telemetry, digital data streams, and systems that evaluate packet data using a variety of VME, VXI, PXI, and LXI equipment.
