Test Adapters
See Also: Interface Test Adapters
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Product
Adapter, 1.0 mm (m) to 2.4 mm (f), DC to 50 GHz
11922C
Coax Adapter
The Keysight 11922C precision 2.4 millimeter coax in adapter offers a simple way of measuring coaxial devices at higher frequencies. It is designed for the measurement of components with 50 ohms impedance and a frequency range from dc to 50 GHz.
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Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
test
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
PCB Adapter, Receiver, QuadraPaddle, 192 Position, to PCB-Mounted 1x100 Pin Female SCSI Connector
510150127
PCB Adapter
PCB Adapter, Receiver, QuadraPaddle, 192 Position, to PCB-Mounted 1x100 Pin Female SCSI Connector
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Product
PXI Pull-Thru Adapter, Wired, QuadraPaddle, to 78 Pin Female D-Sub
510140194
Pull-Thru Adapter
PXI Pull-Thru Adapter, Wired, QuadraPaddle, to 78 Pin Female D-Sub
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Product
In-Circuit Test (ICT) Fixtures
Test Fixture
At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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Product
NI-6583, 200 MHz, 32 Single-Ended and 16 LVDS Channels, Digital I/O Adapter Module for FlexRIO
781320-01
Digital I/O Adapter
200 MHz, 32 Single-Ended and 16 LVDS Channels, Digital I/O Adapter Module for FlexRIO—The NI-6583 is a digital I/O adapter module that, when combined with a PXI FPGA Module for FlexRIO or the Controller for FlexRIO, creates a digital instrument for interfacing with 32 single-ended and 16 low-voltage differential signaling (LVDS) digital pins. A digital I/O adapter module for FlexRIO can be used to do real-time interfacing of standard protocols and implement customized protocols. The NI-6583 can sample digital waveforms at up to 200 MHz. It includes support for selectable single-ended voltages from 1.2 to 3.3 Volts with 10 bit resolution and common LVDS voltages.
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Product
Adapter, 2.4 mm (f) to 3.5 mm (f), DC to 26.5 GHz
11901B
Coax Adapter
The Keysight 11901B is a 2.4 mm female to 3.5 mm female, metrology-grade adapter with dc to 26.5 GHz operation.
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Product
Adapter, 2.4 mm (f) to 2.4 mm (f), DC to 50 GHz
11900B
Coax Adapter
The Keysight 11900B is a metrology-grade, 2.4 mm female to 2.4 mm female adapter with dc to 50 GHz operation.
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Product
Laser Diode Reliability Burn-In / Life-Test System
58602
Test System
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Product
Semi-Rigid Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131C
Test Port Cable
The Keysight 85131C is an 81 cm (32 in) long1 semi-rigid cable with a 3.5 mm female2-to-PSC-3.5 mm female connector. Cable frequency range is DC to 26.5 GHz with a return loss of 17 dB or better. Insertion loss is 0.43 * sqrt(f) + 0.3, where f is frequency in gigahertz, for the test port connector and 2.5 dB at maximum frequency for the device connector. Phase stability of the semi-rigid / flexible cables is specified with a 90-degree bend using a 4 to 3-inch radius. Stability1 of the 85131C is less than 0.06 dB, and phase is 0.16 * f + 0.5, where f is frequency in gigahertz.
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Product
PXIe Optical Test Modules
Test Module
Coherent Solutions’ expanding portfolio of PXIe optical test modules bring a wide range of new mixed-signal test capabilities to the PXI platform. The new modules offer seamless integration with PXI Platform and deliver reliable and repeatable results across a wide range of optical and mixed-signal test applications.
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Product
DisplayPort To DVI Adapter For Embedded Controllers
Y1261A
Digital I/O Adapter
Achieve backward compatibility between DisplayPort and a DVI computer monitor.
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Product
PCB Adapter, ITA, QuadraPaddle, 192 Position, To PCB-Mounted 2x68 Pin Female VHDCI Connectors
510151123
PCB Adapter
PCB Adapter, ITA, QuadraPaddle, 192 Position, to PCB-Mounted 2x68 Pin Female VHDCI Connectors
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Product
In-Circuit Test System Calibrations
Test System
Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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Product
BMS Manufacturing Test System
Test System
The Battery Management System (BMS) Manufacturing Test System performs functional testing of product during end-of-line manufacturing. The system hardware includes all instrumentation to test a BMS, including multiple cell simulators, a mass interconnect for quick product transition and bed-of-nail fixtures to ensure less down time, higher throughput, and easy maintenance. The system application easily integrates into manufacturing processes, provides a method to test multiple product types, and optimizes tests to ensure only good product is released from manufacturing.
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Product
Attenuator Interconnect Kit, SMA
11716C
Interconnect Adapter
The Keysight 11716C quickly and conveniently connects 1 dB step and 10 dB step attenuators together to achieve greater dynamic range with 1 dB steps. The Keysight 11716C can be utilized to connect any of the two Keysight 8494/95/96 attenuators in series.
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Product
Test Handler
M4872
Test Handler
Improve Efficiency in High-Volume Manufacturing and Device Characterization.
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Product
Passive Probe Interface Adapter
CX1151A
Digital I/O Adapter
The CX1151A is an adapter for passive probes for the voltage waveform measurements by the CX3300 series Device Current Waveform Analyzer.
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Product
ITA 192-Pin PCB Adapter to 3x IDC 64
YAV90Q06
PCB Adapter
3x 2 IDC 64 x 1000mmCables set J6200560 (Order Separately)
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Product
Digital I/O Adapter Module For FlexRIO
Digital I/O Adapter
Digital I/O Adapter Modules for FlexRIO offer up to 54 channels of configurable digital I/O that can interface with single‐ended, differential, and serial signals at a variety of voltage levels. When combined with a large, user‐programmable FPGA, you can use these modules to solve a variety of challenges, from high‐speed communication with a device under test to emulating custom protocols in real time.
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Product
Functional Test
UTS
Functional Test
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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Product
Sampling Scope Adapter
N5477A
Adapter Module
The N5477A sampling scope adapter makes the InfiniiMax III probing system fully compatible with the Infiniium 86100 DCA sampling scope family. With the N5477A, the DCA modules have 30 GHz of probing, increasing their performance and flexibility.
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Product
SoC/Analog Test System
3650-S2
Test System
The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
Terotest iTest
iTest
Test Platform
iTest is primarily a Functional Test platform which is easily configured to test PCB's, complete assemblies or individual devices. In addition, iTest's MDA capability offers the user the opportunity to perform low cost In- Circuit (MDA) testing as well as Combinational testing. Easy integration of 3U & 6U PXI modules, LXI, USB, GPIB and more.
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Product
Fastest In-Circuit Test Platform
TestStation
Test Platform
Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.
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Product
In-Circuit Test System Rentals
Test System
Forwessun offers flexible test system rental options to meet short-term or seasonal testing demands. Our rental systems are rigorously tested for reliability and performance, giving you access to high-quality equipment without the need for a full purchase commitment. Customised rental agreements allow you to return the equipment when it’s no longer required, providing an ideal solution for scaling up production or filling in during periods of high demand.
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Product
Electronics Testing Solutions
Test System
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Product
Electronic Control Unit Functional Test
Functional Test
End-of-line tests are critical to ensure passenger safety in the era of smarter vehicles. A flexible test solution is needed to ensure extensive test coverage and high test throughput with a low total cost of ownership.
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Product
NI Semiconductor Test Systems
Test System
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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Product
Audio and Acoustic Functional Test Solution
Functional Test
With the growing popularity of Internet of Things devices worldwide, many electrical products are adopting voice commands as their user interface. This means that acoustic and audio test challenges are likely to impact more products than ever before. Test teams must meet extended test coverage requirements to ensure product quality while maintaining throughput and operational efficiency. For a solution to meet these sorts of demands, it must:
