Test Adapters
See Also: Interface Test Adapters
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EV Power Components End of Line Test Platform
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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Parallel Electrode SMD Test Fixture
16192A
The 16192A test fixture is designed for impedance evaluations of side electrode SMD components. The minimum SMD size that this fixture is adapted to evaluate is 1(L)[mm].
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PCB Adapter, ITA, SIM, VTAC, 16 Pos, 6 Slot, to (1) Cat6
510171105
A small, modular PCB board that connects high speed digital inserts (VTAC) to a single Cat 6 connector. Great for COTS cable configurations. Compatible with all VTAC/SIM ITA modules. Please note this part is too wide for use in multiple adjacent slots.
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Interconnect Adapter, C-Size, Single Slot, 2 Module Positions, Clamp Style
510109179
Interconnect Adapter, C-Size, Single Slot, 2 Module Positions, Clamp Style
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Threaded Coupling Adapter, G2, G6, G10, ITA, For Conduit Harnessing Assemblies/Clamps
410112599
The Adapter is designed to accommodate military and commercial circular backshells for conduit or strain relief when designing for general and heavy-duty applications. The male thread size is 1.625-18 for this application.
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Fixture Self-Test Controller and Calibration Check
AQ818
The module AQ818 includes all the electronic blocks required to perform an effective test platform self-test. Thanks to this module, a chain of tests can be performed, which will end up not only with a report of the defective instruments or switch modules, but also with the relay contacts live expectancy report.
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Laser Diode Reliability Burn-In / Life-Test System
58602
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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PCB Adapter, ITA, QuadraPaddle, 192 Position, To PCB-Mounted 2x96 Male SCSI Connector
510109591
PCB Adapter, ITA, QuadraPaddle, 192 Position, to PCB-Mounted 2x96 Male SCSI Connector
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Rack based antenna test system
R&S®ATS800R CATR
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique rack based CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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PXI Module Adapter, Pull Thru Adapter, Receiver, 1 Position
510109462
PXI Module Adapter, Pull Thru Adapter, Receiver, 1 Position.
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SoC/Analog Test System
3650-S2
The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Open Test Platform for High Performance Automotive Applications
TSVP
The R&S®TSVP family of products is an open test platform from Rohde & Schwarz ideal for high performance automated test equipment (ATE) applications. The chassis contains a mechanical frame, digital backplane, analog backplane, mains switching and filtering, power supply and diagnostic extensions. A highlight is the analog bus for routing measurement signals between different slots without additional external wiring.
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Scalable Tester System for Functional Testing
UTP6010
The UTP6010 is a scalable tester system for functional testing, comprising an integrated main switching unit, a keyboard drawer and a swivelling monitor. It is the reliable, modular, low priced UTP starter kit. The system is suitable for tester applications, where space-saving devices are required, because its construction height is only 12 HU (excluding keyboard drawer and main switching unit).
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In-Circuit Test System
TestStation LX
TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
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PCIe 5.0 Test Platform
PXP-500A
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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Compact EMS/EMI Test Platform
CEMS100
Setting up an EMS/EMI test system is a very complex process requiring significant investment. The steps involved include custom planning, design, installation and configuration of various components and standalone instruments as well as the RF shielded anechoic chamber. Rohde & Schwarz offers the standardized R&S®CEMS100 test platform that is the company's first flexible, reliable and cost-effective off-the-shelf solution for radiated EMS measurements in line with IEC/EN 61000-4-3.
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Radio Frequency, Communications, & Navigation Test Systems
Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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Pull-Thru Adapter, Wired, TriPaddle, f/ NI PXIe-5423
510140249
Pull-Thru Adapter, Wired, TriPaddle, f/ NI PXIe-5423.
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Semiconductor Testers
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Universal Test System
LEON System
A universal ICT, FCT, ISP and Boundary Scan platform.Based on the ABex platform, which directly integrates Konrad analog bus technology and PXI/PXIe in one chassis, the LEON platform can be configured to solve various test challenges. Due to this architecture only one system provides the complete test flow combining ICT, ISP, Boundary Scan and FCT.Various form factors and configurations allow a perfect combination between cost, speed and test coverage. The modular architecture provides the possibility to reconfigure or upgrade the systems based on your test needs.The LEON System software provides a powerful development and test execution environment which directly supports NI TestStand. All systems and components could be integrated into third party software using supplied APIs.
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RF Adapter Module For FlexRIO
RF Adapter Modules for FlexRIO feature frequency coverage from 200 MHz to 4.4 GHz, with up to 200 MHz instantaneous bandwidth. When paired with a PXI FPGA Module for FlexRIO or the Controller for FlexRIO, you can program the FPGA using LabVIEW to implement custom signal processing, including modulation and demodulation, channel emulation, spectral analysis, and even closed-loop control. These modules are all based on a direct conversion architecture and feature an onboard local-oscillator which can be shared with adjacent modules for synchronization. RF adapter modules also provide digital I/O capability for interfacing with external hardware.
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In-Circuit Test
TestStation LH
The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family. TestStation LH features SafeTest protection technologies for accurate, reliable, and safe testing of the latest low-voltage technologies.
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Flight Control System Test Platform
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Pull-Thru Adapter, Wired, TriPaddle, 68 Pin ML VHDCI, f/ AIT PXI-C1553
510140197
Pull-Thru Adapter, Wired, TriPaddle, 68 Pin ML VHDCI, f/ AIT PXI-C1553.
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Adapter Plate, ITA, f/ G20x or G40x
410112996
The G20x adapter plate allows the G20x or G40x ITA to accept 2 modules (iCon) in the lower tier.
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PCB Adapter, Receiver, QuadraPaddle, 192 Position, to NI PXI-2529 with six 20" cables
510150153
PCB Adapter, Receiver, QuadraPaddle, 192 Position, to NI PXI-2529 with six 20" cables
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Test Fixture Adapters for In-Circuit Test Fixtures
Circuit Check test fixture adapters are utilized when the target ICT tester is not available or has been replaced with a newer technology tester. The tester adapter will often allow existing test fixtures from one test manufacturer to be utilized on another manufacturer test platform, eliminating the need for replacement fixtures. Contact Circuit Check to discuss your tester and fixture combinations for the best choice of a cost effective solution.
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AC Power Adapter For Handheld Component Testers
U1780A
The Keysight U1780A consists of an AC Power Adapter and power cord (according to country). The adapter is to be used with the U1700 Series Handheld Capacitor and LCR meters. This optional adapter enables users to power up their U1700 Series handhelds without using the meter´s supplied battery.
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Attenuator Interconnect Kit, Type-N
11716A
Quickly and conveniently connect 1 dB step and 10 dB step attenuators together to achieve greater dynamic range with 1 dB steps. The Keysight 11716A interconnect kit contains a rigid RF cable, mounting bracket, and necessary hardware to connect any pair of Keysight 8494/5/6/7 attenuators in series. Attenuators must be ordered separately.
