3D
three dimensions.
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Product
Magnetic Field Scanner
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MAGNET-PHYSIK Dr. Steingroever GmbH
Magnetic field scanners measure the magnetic field around permanent magnets or magnetic systems. The results can be output as a colored 2D, 3D representation or as a table.
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Product
MultiBeam System
FIB
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An easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun, as well as a new FIB column capable of large current processing (maximum ion current 90nA) installed into one chamber. JIB-4610F enables high-resolution SEM observation after high-speed cross-section milling with FIB, and high-speed analysis with a variety of analytical instruments, such as energy dispersive X-ray spectroscopy (EDS) that takes advantage of the Schottky electron gun delivering a large probe current (200nA), electron back scatter diffraction (EBSD) to perform crystallographic characterization, and cathodoluminescence (CLD). In addition, the 3D analysis function Cut & See is included in the standard configuration, allowing cross-section milling to be executed automatically at fixed intervals, while acquiring SEM images for each cross section.
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Product
Test Pattern Generator Delay & AV Sync Analyzer
VQDM-100
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Versatile compact and robust multi-purpose tool for R&D and glass-to-glass QA/QC Instant visual-aural quality estimation plus automatic latency, AV sync and 3D LR sync measurement Multi-channel time-line analysis, including video frames continuity testing 4 Light Sensors with vacuum caps, 4 Audio inputs (standard line levels) 2 channels of AV timing analysis, simultaneous measurements of Video and Audio Latencies Real time multi-channel data acquisition via USB port Unique sophisticated set of static and dynamic test patterns up to 1080p@60fps - see more details in separate VQL page Source of VQDM, VQMA2, and VQMA3 Test Patterns for VideoQ Analyzers Multi-format digital and analog AV outputs: HDMI, YPrPb, S-video, SPDIF, LR analog audio Networkable unit, easy expansion with any external USB storage device: live clips, user content, etc.
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Product
Visual Analysis Tool for GNSS Receiver Data
Panorama
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Panorama is the flagship tool when it comes to analyzing receiver data. When engineers use Panorama they spend more time looking at plots and making decisions, instead of making plots and writing reports. Panorama takes receiver data (.csv files) from PANACEA and RxStudio (other ODS products) and turns it into over 60 engineering plots ready to view at the click of your mouse. These plots give engineers and analysts the ability to view summary level data, head to head comparisons, receiver specific results, and 3D LLA replays using STK.
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Product
Micro-CT for material science
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Micro computed tomography is X-ray imaging in 3D, by the same method used in hospital CT scans, but on a small scale with massively increased resolution. It really represents 3D microscopy, where very fine scale internal structure of objects is imaged non-destructively. Bruker microtomography is available in a range of easy-to-use desktop instruments, which generate 3D images of your sample’s morphology and internal microstructure with resolution down to the sub-micron level.
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Product
AATCC Wrinkle Recovery Tester
M272
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To determine a fabric's ability to recover after wrinkling under a predetermined load for a set period of time. Set of 3-D plastic replicas are available to grade fabrics.
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Product
ATR 3D Layout Machine
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ATR Model is standrad layout machine for marking work and 3D measruing.
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Product
UV Meters
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OAI’s UV Measurement Instrumentation are the standard for Semiconductor Lithography, MEMS, Sensors, Microfluidics, UV Curing, 3-D Printing, Sterilization, Water Purification and Solar/PVC industries. For over 45 years our meters have earned a reputation for accuracy, repeatability and dependability. We offer full calibration and support services worldwide.
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Product
Universal 3D Profilometer
NanoMap-D (Dual mode)
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NanoMap-D (Dual mode) takes imaging to next level. It brings competing techniques – contact and optical profilometer - on one platform. Automatic sample movement and one click measurement, makes NanoMap-D a step forward in imaging world.
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Product
RZ/G1 32-bit MPUs
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The RZ/G1 high-performance 32-bit processors have 1GHz+ Arm® Cortex®-A cores, a 3D graphics engine, a full high-definition (HD) video engine, secure IP, high-speed interfaces such as PCIe, SATA and Gigabit Ethernet, and other functions necessary for embedded devices in the industrial segment.
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Product
HDI 3D Scanners
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Quickly capture high resolution digital 3D scansaccurately from objects in the physical world. The High Definition Imaging (HDI) 3D scanners use structured-light technology for capturing high-resolution digital 3D scans from real world objects. These systems are great for companies, manufacturers, academic institutions, visual effect studios, and research labs that need 3D scan data for visualization and measurement applications including: 3D modeling, documentation/archiving, reverse engineering, scientific measurement, computer-aided inspection, rapid prototyping/3D printing.
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Product
Configurable CAN And LIN Data Logger
Rebel CT4
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The Influx Rebel CT 4 is a compact data logger, making it an ideal choice for engineering applications that require vehicle CAN 2.0 and LIN network data. The Rebel CT 4 can optionally be expanded to include GNSS , 3D accelerometer, 3D Gyro, Wi-Fi and 4G LTE.
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Product
Optical Measurement Methods and Characterization Services
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The Fraunhofer IOF develops optical measurement methods and systems to customer requirements. Key areas include the characterization of optical and non-optical surfaces, coatings, components and systems in the micro and sub-nano range as well as 3D shape acquisition.
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Product
Stereo Vision
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Our active Stereo Vision systems from ams provide high quality 3D imaging, representing an attractive cost versus performance ratio solution.With the hardware and software stack offered by ams, 3D vision and applications such as face-ID can be easily designed in to a product and brought up to high volume production.
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Product
3D CT AXI
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PCB manufacturers can enjoy comprehensive, high-speed inspection with Omron’s revolutionary technology that reliably captures defects in hidden areas.
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Product
PDS Trailing Dredging Suction Hopper Software
PDS-TSHD
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TELEDYNE PDS for Trailing Suction Hopper Dredge (TSHD) is designed to meet the dynamic demands of today’s dredge operator.TELEDYNE PDS-TSHD is an easy to use monitoring system that visualizes the dredge process real time in 3D, top, and profile views. The system gives an instant overview of the horizontal and vertical position of the suction tube, the vessel outline, and the dredge heads along with the surveyed depths, design, and dredged depth. Dredged areas are shown in various views, which are updated as soon as new data is available. Alarms can be generated for safety of the operation and to maintain the quality of the dredge progress.
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Product
AS-Interface for Hazardous Areas
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*I/O modules for field applications with quick mounting technology*Airboxes for the combination of AS-i inputs and pneumatic output valves*Valve position feedback with solenoid actuation*For silo level applications in hazardous areas*Approval for zone 22, category II 3D
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Product
Enhanced Vision Systems
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Elbit Systems of America’s Degraded Visual Environment (DVE) solution uses intuitive 3D grid symbology along with a helmet tracker to provide critical helicopter/tilt-rotor cues during brownout operations. This system, which is an upgrade to the head-up display installed on many military helicopters, removes weight or drag penalties by eliminating nose-mounted sensors. The helmet tracker provides numerous ancillary benefits such as depicting the other pilot’s Line of Sight (LOS) for improved crew coordination, as well as providing the ability to slew weapons or optical payloads to the pilot’s LOS, hands-free and heads-up.
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Product
Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
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Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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Product
Werklicht® Pro
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*Intelligent laser projector, *Exact positional representation on assemblies in 3D *For attachments, holes, bolts and more *Stencils, fixtures and coordinate measuring machines are superfluous *Avoid mistakes before they arise. *Simplifies, streamlines and speeds up work steps *Over the entire process chain - from data preparation to quality assurance With Werklicht® Pro , the "digital template", you build an elegant bridge between CAD data and the real object.
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Product
EM & Thermal Simulation Software
SEMCAD X
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Schmid & Partner Engineering AG
SEMCAD X is the latest generation of 3-D FDTD full-wave simulation software offering unprecedented levels of user-friendliness, speed & memory efficiency. Its application range has been further greatly extended by incorporating the world's first EM ADI-FDTD solver.
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Product
X-ray Microscopy
Xradia Family
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✔ Characterize the properties and behaviors of your materials non-destructively.✔ Reveal details of microstructures in three dimensions (3D).✔ Develop and confirm models or visualize structural details.✔ Achieve high contrast and submicron resolution imaging even for relatively large samples.
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Product
3D Optical Profiler
Nexview™ NX2
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Designed for the most demanding applications, the Nexview™ NX2 3D optical profiler combines exceptional precision, advanced algorithms, application flexibility, and automation into a single package that represents ZYGO's most advanced Coherence Scanning Interferometric (CSI) profiler.
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Product
Universal High Resolution 3D Scanner
Spectrum
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A multipurpose, high-resolution 3D scanner that combines the technical capabilities of professional 3D scanners with the availability of a desktop solution.
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Product
In-Line Vision & Rejection
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Customizable 3D, full color, 360-degree Product Quality Inspection Solution that integrates seamlessly into existing production lines to measure multiple quality parameters at speeds of up to 100 objects per second. For advanced process control, each system is equipped with a conveyor, cameras selected for your specific application, and a choice of rejection options.
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Product
Micro-spot DUV Spectroscopic Reflectometry
FilmTek 2000 PAR
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Scientific Computing International
A low-cost solution for high-throughput, fully-automated mapping of patterned wafers for development and production environments. Utilizes patented parabolic mirror technology to measure wavelengths from DUV to NIR with a spot size as small as 13µm. Fully user-customizable wafer mapping capabilities rapidly generate 2D and 3D data maps of any measured parameter.
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Product
Non Destructive Analysis
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The submicron resolution of a submicron focus X-ray tube and digital image detection offers in 2D and Oblique View with High Magnification imaging mode high resolution X-ray images. A 3D image of the sample can be reconstructed from multiple image recordings during a 360° rotation of the sample. Virtual any cross section can be viewed at an offline workstation. This mode is a strong tool for multi-material components.
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Product
Three-Dimensional Electromagnetic Simulation Package
QuickWave-3D
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QuickWave 3D (QW-3D), is a universal user-friendly three-dimensional electromagnetic simulation package (winner of the European Information Technology Prize in 1998) based on the conformal FDTD method and supplemented with a range of unique models for curved boundaries, media interfaces, modal excitation, and parameter extraction. Complete 3D electromagnetic simulation offer a set of various results from wide area of applications. A lot of processing/postprocessings present a complete offer of comprehensive solutions from microwave components (filters, couplers, resonators, etc.) through antennas, TDR applications, optimisation and parameters sweep to simulation of microwave heating process (with Basic Heating Module) with temperature dependent media, static, rotated or moved heated object(s), and heat transfer.
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Product
Your Automated Microscope For Live Cell Imaging
ZEISS Celldiscoverer 7
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Combine the ease of use of an automated microscope with the image quality and flexibility of a research microscope. Whether working with 2D or 3D cell cultures, tissue or small model organisms, you will acquire better data in shorter times with this automated live cell imaging platform. Add LSM 900 with Airyscan 2 to gently image dynamic processes with highest framerates in superresolution.
