Net Probes
Monitor and analyze networks.
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Differential Probe
DP-35
*High Sensitivity, High Voltage Model .*35MHz/1600 Vp-p Max.*Input Impedance 8MΩ//2.5PF*x10, x100 Attenuator, Easy to Convert.*Separating Design(Standard No.114205) Convenient & Durable.
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High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1UN-8
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Differential Probe
DP-30K
*30KVp-p, High Voltage Model .*Input Impedance 81.6MΩ//1PF *x200, x2000 Attenuator, Easy to Convert.*Separating Design(Standard No.114205)*Convenient & Durable.
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Elevated 2.67 (76.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-72U-7
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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SPM Probes
AppNano silicon probes are manufactured out of prime grade, low resistivity (0.01- 0.025 Ω-cm), n-type antimony doped, single crystal siliconOur well-established silicon technologies combined with novel micro-fabrication processes achieve consistent high quality monolithic probes with unprecedented tip sharpnessWe have many standard silicon probe series designed for a wide variety of applications that are compatible with most AFM equipment in the market
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Standard 1.10 (31.00) - 3.85 (109.00) General Purpose Probe
HPA-64-10
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3,9,10: 0,365″; Tip 8: 0,385″
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Test Probes
Petracarbon is a leading supplier and provider of spring contact probes and semiconductor test sockets.
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Probe Card
Japan Electronic Materials Corp.
The probe card is a tool for testing semiconductors used at "Wafer Test" to check quality of IC or LSI in the first process of semiconductor manufacturing. The probe card is expendable.
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Advanced High-Performance Logging & Tracing for .NET, Java & Delph
SmartInspect
SmartInspect is an advanced .NET logging, Java logging and Delphi logging tool for debugging and monitoring software applications. Identify and fix software bugs faster. Monitor and analyze applications in real-time. Find solutions to user-reported issues. Debug production systems while they run.
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High 2.90 (82.20) - 12.60 (357.00) Switch Probe
TSP100-H150-3
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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Coaxial Probes
Smiths Interconnect offers the industry's most extensive line of high reliability coaxial probes. Our coaxial probes provide a low noise, controlled impedance signal path with reliable and easy connect/disconnect options.
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Differential Probe
With signals becoming faster, and power supply voltages going lower, these active differential probes will allow floating measurements from 100uVolts to as high as 7000 volts. These probes provide high CMRR and a broad frequency range.
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Probe Station
EPS300
Reasonable price and compact design. - Sellectable chuck size : 4inch, 6inch, 8inch when ordering probe station. - Hot chuck can be installed. Temp range: RT ~ 300°C - Hot and cool chuck from 0 °C ~ 300 °C can be provided.
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Alternate 2.52 (71.00) - 6.50 (184.00) General Purpose Probe
EPA-3F-1
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Standard 0.62 (18.00) - 4.00 (114.00) Bead Probe
BTP-1HC-4
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Standard 2.20 (62.00) - 4.80 (136.00) General Purpose Probe
EPA-4E
Current Rating (Amps): 7Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,320Overall Length (mm): 33.53
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Probes
72 Series
American Probe & Technologies, Inc.
20 mil (0.020") shank sizesAvailable in straight and bent shapes to fit most industry standard analytical probe holders
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Standard 3.06 (86.70) - 4.00 (113.40) RF Probe For SMA Connectors
CSP-30ES-013
Nominal Impedance (Ohms): 50Current Capacity (Amps) @ 20° C: 1.00Bandwidth @ -1dB (GHz): 35.00Return Loss @ -20dB (GHz): 22.00Test Center (mil): 328Test Center (mm): 8.33Recommended Travel (mil): 100Recommended Travel (mm): 2.54Full Travel (mil): 200Full Travel (mm): 5.08Overall Length (mil): 1,033Overall Length (mm): 26.24Rec. Mounting Hole Size (mil): 297Rec. Mounting Hole Size (mm): 7.54
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Probing Solutions
ES62X-CMPS
The ES62X-CMPS compact manual probe station is a rugged wafer probing solution designed for high reliability, compact size and low investment cost. It enables manual wafer level measurements up to 300 mm wafers. The probing station can also be used for TLP, HMM, HBM, LV-Surge, RF, S-parameter and DC-measurements. Micro positioners with vacuum as well as magnetic base can be attached. The chuck has a vacuum interface for the wafer and is electrically isolated. Multiple 4 mm connectors can be used to connect a voltage potential to the wafer backside.
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Standard 1.50 (42.00) - 3.30 (94.00) General Purpose Probe
P2663G-1C1S
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 810Overall Length (mm): 20.57
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BMP-5 Board Marker Probe
BMP-5
Voltage Rating (VDC): 12Recommended Duty Cycle: 2 sec. On (min.), 3 sec. OffCurrent Rating (Amps): .020Test Center (mil): 1,000Test Center (mm): 25.40Full Travel (mil): 79Full Travel (mm): 2.01Recommended Travel (mil): 50Recommended Travel (mm): 1.27Full Marker Travel (mil): 62Full Marker Travel (mm): 1.57Direction of Rotation: CCWScribed Diameter (mil): 50Scribed Diameter (mm): 1.27Test Center Remark: Ø .472 (12.1) or M12
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Elevated 2.67 (76.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-72I-7
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Standard 2.00 (57.00) - 4.00 (113.00) General Purpose Probe
P2757G-1C1S
Current Rating (Amps): 20Average DC Resistance lower than (mOhm): 10Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 230Full Travel (mm): 5.84Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,210Overall Length (mm): 30.73Overall Length Remark: Tip 2C: 1140 mil (28.96 mm) Tip 1W: 1205 mil (30.61 mm) Tip 2W: 1205 mil (30.61 mm)
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Java, .Net, or PHP apps Release Automation
LiveRebel
Release multiple applications onto their environments, at once Hotpatching is deprecated and will be supported in 3.0.x only JetBrains TeamCity is now officially supported
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Energy Probes
RjP-700 Series
The RjP-700 Series probes are designed to measure lower pulse repetition rate, longer duration pulses - up to 1msec pulse width at a maximum rep rate of 40Hz. This allows for measurement of pulsed flashlamps and other sources not possible with other probes. The combination of large area detector surface and long pulse width allow for measurements up to several Joules total energy. Integrated preamplifiers allow for longer probe-to-instrument cable runs, useful for manufacturing environments.
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High 1.73 (49.00) - 8.00 (127.00) High Performance Lead Free Probe
LFRE-1J-8
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
