Highly Accelerated Life Test
Processes a product through extreme temperature, vibration and product tailored stresses to expose design limits.
See Also: HALT
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Product
EMC Actuator for Accelerator Pedal
PSE-G
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Pneumatically operated actuator for operation of accelerator handle. External set-point of the pedal actuator position via analog voltage to closed-loop pressure regulator in external valve box.
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
Test Platform
Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Product
PCIe Based FPGA Processing / Acceleration Card
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iWave’s PCIe based FPGA Processing / Acceleration Card is a half-length PCIe x4 card featuring a high-performance user-configurable Xilinx® Kintex®-7 FPGA enhanced with high-speed memory and a high-throughput serial interface. Front I/O adds dual SFP ports, 1x HDMI1.4a IN, 1x HDMI1.4a OUT. All of these features combine to make the card ideal for a wide range of applications such as Edge Computing, ARINC818 Avionics Video Bus, Acceleration.
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Product
High Temperature Component Test Fixture
16194A
Test Fixture
Measure both axial/radial leaded devices and SMD within the temperature range from -55 to +200°C.
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Product
Mini LED Backlight Module Automatic Optical Test System
7661-K003
Test System
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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Product
Highly Linear InGaAs Photodiode (HLPD) Lab Buddy To 22 GHz
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Discovery Semiconductors, Inc.
O/E bandwidth up to 10 GHzRF Output up to 4 VppPhase linearity < 5 rad/WWavelength Range: 1000 - 1650 nmBuilt-in TE cooler and tempearture sensor
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Product
PV Accelerating Tester
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King Design Industrial Co., Ltd.
*Spectrum mis-match: IEC 60904-9 class A*Non-uniformity <5%*Instability <5% ( within 30 mins)*Irradiance range: 800 W/m2 ~ 1200W/m2*Effective range: 30cm x 30cm; 1.1m x 1.4m*(customize accepatble)*Temperature：40℃ ~ 90℃*Humidity: 20% ~ 85%
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Product
Life Cyclic Durability Testing
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Environment Associates can provide everything you need for cyclic durability testing and performance fixturing. Services include mechanical cycling to a position or load, fatigue cycling to a fixed load, rotational torque cycling, and simple push/pull cycling. EA can design your fixture with electro-dynamic, air, or hydraulic assistance to mechanically move your part. All of our fixtures can be manufactured to withstand a wide range of temperature, humidity and vibration inputs. If required, forces can be monitored electronically, using a wide variety of inputs (i.e. strain gages, load cells, rotational transducers, thermocouples, shunts, and more). EA can create holding and check fixtures to perform “pre” and “post” evaluation for dimensional issues that may occur during testing. EA can provide fixtures for single tests run internally for EA test labs and can manufacture fixtures to be purchased directly by the customer for their internal use.
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Product
SKYvec: Accelerates Software Development
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The SKYvec software development tools simplify code development for large multiprocessor systems by automating many of the processes which otherwise would have to be designed or managed by the programmer.
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Product
Standalone Bench Test System for FCT, ICT, ISP and Boundary Scan
LEON Bench
Test System
The LEONBench test system is a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors. The system is optimized for high pin count test applications. Furthermore, it can be equipped with vacuum and pneumatic. Support for multi-level contact fixtures enables separate contact levels for FCT and ICT. The Konrad ITA (Interchangeable Test Adapter) frame allows various fixture houses all over the world to build custom fixtures for the LEONBench. Up to 15U additional rack space allows adding a bunch of high-performance measurement devices from various manufactures. An integrated power distribution unit takes care about power on and off sequencing.As part of the LEON Family, LEONBench is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
Highly Sensitive, Lightweight Backpack Radiation Detector (BRD)
identiFINDER® R700
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The identiFINDER R700 Backpack Radiation Detector (BRD) offers new spectroscopic broad-search capabilities. Once dismounted, the identiFINDER R700 provides the capabilities required to successfully perform wide-area searches quickly and efficiently while offering exceptional sensitivity, communication, and trusted spectroscopic algorithms in a lightweight, ergonomic form-factor.
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Product
Pressure Accelerated Aging Test Chamber (HAST)
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Guangdong Test EQ Equipment co., Ltd.
- Hyper-Accelerated Aging: Combines high temperature, 100% RH, and pressure to simulate decades of environmental degradation in days.- Precision Control: Triple-redundant PT100 sensors and PID algorithms for<1% pressure fluctuation.- Safety Systems: Auto-pressure release valves, hydrogen gas detection (for battery/polymer tests), and emergency cooling.- Corrosion-Resistant Build: SUS316L stainless steel interior, PTFE-coated seals, and ceramic-coated heaters.- Smart Connectivity: IoT-enabled remote monitoring, predictive maintenance alerts, and compliance with FDA 21 CFR Part 11 data integrity.
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Product
Graphics Cards And Edge AI Acceleration Modules
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Advantech offers the first industrial-grade PCIe GPU cards powered by Intel® Arc™ GPUs, as well as Nvidia Quadro and AMD Radeon.
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Product
VLSI Test Systems
Test System
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Product
NI Vehicle Radar Test System
Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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Product
Network Interface & Acceleration Cards
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Advantech's PCIe accelerators and network interface cards bring high-speed connectivity and fast packet processing to network appliances and servers.
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Product
Highly Collimated Solar Simulators
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This solar simulator is based on a Fresnel lens to collimate the light beam from the arc lamp source to infinity, which results in highly collimated illumination of the target spot. A 2.5kW xenon ozone free lamp is used as the light source. The spectral distribution of the xenon light source, along with the use of specially calibrated AirMass filters, closely simulates the sun’s true spectral distribution in various conditions on Earth.
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
In-Circuit Test System
Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
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Product
Acceleration Simulation Mode (ASM)
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Maschinenbau Haldenwang GmbH & Co. KG.
MAHA Acceleration Simulation Mode (ASM) Products
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
Test Fixture
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
NI Real-Time Test Cell Reference System
778820-35
test
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Product
Hailo-8™ M.2 AI Acceleration Module
EAI-1200
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26 TOPS AI Computing delivered by Hailo-8 NPU. Compact M.2 AI module key B+M / A+E. -40~65°C operating temp. w/ optional heatsink. Typical 2.5W low power consumption. Rich AI Dev. Toolkits including Model Library, Model Converter, Runtime SDK Integration.
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Product
Edge AI Acceleration Modules
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The EAI series provides low power plug-in AI modules and GPU cards to help accelerate deep learning inference on the edge
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Product
PCB Systems Vibration and Acceleration Simulation Solution
Xpedition
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As the industry’s market share leader in PCB design software, the Mentor Graphics® Xpedition product augments mechanical analysis and physical testing by introducing virtual accelerated lifecycle testing much earlier in the design process. This is the industry’s first PCB-design-specific vibration and acceleration simulation solution targeting products where harsh environments can compromise product performance and reliability, including the military, aerospace, automotive and industrial markets. Traditional, physical HALT (highly accelerated lifecycle testing) is conducted just before volume manufacturing, and requires expert technicians, which can result in costly schedule delays. Bridging mechanical and electronic design disciplines, the Xpedition product provides vibration simulation significantly faster than any existing method. This results in increased test coverage and shortened design cycles to ensure product reliability and faster time to market. The Xpedition component modeling library is the most extensive in the industry, comprised of over 4,000 unique 3D solid models which are used to create highly defined parts for simulation. The 3D library allows users to easily match geometries to their 2D cell database. Designers can assemble the parts models on board and automatically mesh them for performance analysis, including stiffeners and mechanical parts. The system modeling tool is ultra-fast since it can model over 1,000 components per minute.
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Product
Micro-CT for Life Science
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Micro computed tomography is X-ray imaging in 3D, by the same method used in hospital CT scans, but on a small scale with massively increased resolution. It really represents 3D microscopy, where very fine scale internal structure of objects is imaged non-destructively. Bruker microtomography is available in a range of easy-to-use desktop instruments, which generate 3D images of your sample’s morphology and internal microstructure with resolution down to the micron level.
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Product
UV Accelerated Weathering Testers
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Weice Testing Instrument Co.,Ltd.
UV accelerated weathering testers utilize fluorescent lamp to simulate the UV spectrum of sun shine, combined with temperature control, humidity system.
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Product
OLED Life Time Test System
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A system for measuring measurement items (brightness and so forth through Voltage, Current, and Photodiode) and their lifetime in intervals of set time, while supplying power to multiple (32 Channel) OLED panel stably.
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Product
Massively Parallel Parametric Test System
P9001A
In-Circuit Test System
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Product
Active Alignment Assembly & Test Platform
Test Platform
Quickly deliver flawless camera & LiDAR modules, MEMS devices, die based sensors, LED and laser-based headlights and other high-end products with a supremely accurate standardized platform.
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Product
Test System Replication/Build-to-Print
Test System
Need to manufacture test stations? For more than 15 years we have sourced, assembled, tested and shipped fleets of robust, cost-effective solutions. We produce them at our high-volume facilities and deploy them around the world.
