In-circuit Probes
Contact test pads on completed PCBs.
See Also: In-circuit, Incircuit, In-Circuit Debuggers, In-circuit Emulators, In-Circuit Test, In-circuit Testers, In-circuit Test Systems
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ICT Test Probes
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C.C.P. Contact Probes Co., LTD.
Our In-Circuit Test Probes are used for all kinds of PCB tests. We offer a standard portfolio as well as customized parts.
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RealProbe RF Probes
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Unmatched performance In-Circuit RF Probes covering up to 18GHz. These are must tools for any in-circuit RF and Microwave testing and troubleshooting.
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Spring Probes & Hyperboloid Contacts
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In-Circuit / Functional Probes, Socketless X Probes®, High Current Probes, Double Ended Probes, ATE Interface Probes, integraMate®
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Massively Parallel Parametric Test System
P9001A
In-Circuit Test System
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Product
2-Module ICT System, I317x Series 6
E9902G
In-Circuit Test System
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988EL
In-Circuit Test System
The i3070 Series 5i Inline ICT retains the popular and proprietary Keysight short-wire fixturing technology used in our stalwart Keysight 3070 and i3070 systems.
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
In-Circuit Test System
Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
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Product
Massively Parallel Board Test System
I7090
In-Circuit Test System
The Keysight i7090 is a massively parallel board test system designed to help PCBA test engineers improve manufacturing efficiency while reducing costs. Unlike traditional in-circuit testers, the i7090 supports up to 20 In-Circuit Test cores in parallel, which means engineers can test multiple Units Under Test (UUTs) simultaneously without the need for multiple systems. This reduces scaling and infrastructure costs and frees up valuable testing space.
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In-line High-Density ICT System Series 7i
E9988GL
In-Circuit Test System
The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line, saving resources and optimizing your automated test strategy.
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Lower-Cost Small Footprint In-Circuit Test System
TestStation LHS
In-Circuit Test System
The TestStation LHS in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne’s popular, award winning TestStation product family. Compatible with existing TestStation LH fixtures.TestStation LH features the voltage accuracy and backdrive current measurement embedded in Teradyne’s SafeTest protection technology for accurate, reliable and safe powered-up testing of new low-voltage software.
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Product
Passive Probe, 10:1, 200 MHz, 2-Pack
N2140A
Oscilloscope Probe
The Keysight N2140A is an extremely low-cost passive probe that provides a switchable 10:1 / 1:1 attenuation and up to 200 MHz bandwidth. It features a high input resistance of 10 MΩ (switchable to 1 MΩ) to address a wide range of measurement needs with low probe loading. The probe can be adjusted for both low-frequency compensation and high-frequency compensation. For the best measurements, you should compensate your probe to match its characteristics to the oscilloscope. This probe is compatible with Keysight InfiniiVision Series oscilloscopes with 1 MΩ input.
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Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-1UN-6
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Premium 4.49 (127.00) - 12.00 (340.00) High Performance Lead Free Probe
LFRE-25L-12
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-1I8-7
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
6 GHz ProBus2 Differential Probe with Adjustable Tip
D600A-AT-PB2
Differential Probe
- Choice of 4 GHz or 6 GHz bandwidth models- Up to 5 Vpk-pk dynamic range with low noise- ±3 V offset range- Low loading and high impedance for minimal signal disturbance- Ideal for DDR2, DDR3, LPDDR2- Deluxe soft carrying case- Innovative QuickLink architecture- Wide variety of tips and leads-- Solder-In Lead-- Optional Positioner (Browser) Tip-- Quick Connect Lead-- Square Pin Lead-- HiTemp Solder-In Lead
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Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1J-10
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Standard 0.62 (18.00) - 4.00 (114.00) High Performance Lead Free Probe
LFRE-1J-4
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Standard 1.18 (33.30) - 3.25 (97.00) Battery Probe
BIP-1
Battery Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 16Test Center (mil): 150Test Center (mm): 3.81Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 250,000Overall Length (mil): 323Overall Length (mm): 8.20
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Product
BMP-1 Board Marker Probe
BMP-1
ICT/FCT Probe
Current Rating (Amps): .05Voltage Rating (VDC): 15Recommended Duty Cycle: 1 sec. On (min.), 5 sec. OffTest Center (mil): 1,000Test Center (mm): 25.40Full Travel (mil): 62Full Travel (mm): 1.57Recommended Travel (mil): 50Recommended Travel (mm): 1.27Full Marker Travel (mil): 62Full Marker Travel (mm): 1.57Direction of Rotation: CCWScribed Diameter (mil): 50Scribed Diameter (mm): 1.27Rec. Mounting Hole Size (mil): 468Rec. Mounting Hole Size (mm): 11.89Recommended Drill Size: 15/32 (in) or 11.90 mm
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Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1Z1-10
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-1L-6
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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SPL-03C-114 Step Probe
SPL-03C-114
Step Probe
Current Rating (Amps): 6Average DC Resistance lower than (mOhm): 50Test Center (mil): 125Full Travel (mil): 170Full Travel (mm): 4.32Recommended Travel (mil): 127Recommended Travel (mm): 3.23Overall Length (mil): 1,530Overall Length (mm): 38.86Rec. Mounting Hole Size (mil): 95Rec. Mounting Hole Size (mm): 2.40Rec. Mounting Hole Remark: 94 to 96 mil / 2.39 to 2.44 mmRecommended Wire Gauge: 22-26 AWGRecommended Drill Size: #41 or 2.40 mm
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Product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1T1-6
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Ultra High 3.83 (109.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-72I-10
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,700Overall Length (mm): 43.18
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Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1B-2-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Light 0.75 (21.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-25Z-2
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Standard 1.32 (37.40) - 4.50 (128.00) Battery Probe
CP-2LB-6
Battery Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 50Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 69Full Travel (mm): 1.75Recommended Travel (mil): 59Recommended Travel (mm): 1.50Overall Length (mil): 236Overall Length (mm): 6.00Overall Length Remark: Overall length does not include tail.Recommended Drill Size: #53 or 1.51 mmRec. Mounting Hole Size (mil): 61Rec. Mounting Hole Size (mm): 1.55
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Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1H-2
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
4 GHz ProBus2 Differential Probe with Adjustable Tip
D400A-AT-PB2
Differential Probe
- Choice of 4 GHz or 6 GHz bandwidth models- Up to 5 Vpk-pk dynamic range with low noise- ±3 V offset range- Low loading and high impedance for minimal signal disturbance- Ideal for DDR2, DDR3, LPDDR2- Deluxe soft carrying case- Innovative QuickLink architecture- Wide variety of tips and leads-- Solder-In Lead-- Optional Positioner (Browser) Tip-- Quick Connect Lead-- Square Pin Lead-- HiTemp Solder-In Lead
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1I-7
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
