Unit Under Test
assures a constituent's interoperability in a system.
See Also: UUT, EUT, System Under Test, Device Under Test
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Product
Benchtop Automated Functional Test
midUTS
Functional Test
Combining bench-top portability with powerful automated test functionality, the midUTS is an extremely versatile yet cost-effective solution for your electronics functional test needs. Comprised of high-performance commercial-off-the-shelf (COTS) instruments, along with Bloomy’s medium-density signal-routing PCBAs, a built-in or USB-connected PC, and a pair of high-integrity, production-grade cables connected to an adjacent benchtop fixture, the midUTS can be used in engineering for PCBA bring up, as well as scaled to manufacturing to perform high-volume PCBA and sub-assembly functional testing. It is also ideal for depot diagnostic test, debug, and repair of field returns. The two mass-interconnected cables connect the midUTS to as many as 320 test points on the unit under test (UUT), supporting an extreme wide variety of products using bed-of-nails as well as cable-connected UUT test fixtures. Most importantly, the midUTS helps you automate sequences of functional tests using NI TestStand and the Bloomy EFT Module for TestStand. This ideal balance between powerful features and affordable cost allow you to automate earlier in the product development lifecycle, substantially increasing product quality and minimizing time-to-market!
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Product
Intermittent Fault Detection & Isolation System
IFDIS
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The IFDIS™ uses patented Intermittent Fault Detector technology that simultaneously and continuously monitors every circuit path within a Unit Under Test (UUT) - such as a Line Replaceable Unit (LRU) chassis' interconnects - for intermittent continuity failures that occur for as short as 50 nanoseconds. This state of the art technology is combined with an environmental chamber and vibration table, which simulate the UUT’s operational environment and cause intermittent faults to manifest, creating a system that is unsurpassed in intermittent fault detection.
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Product
SWB-2815, 4x86, 0.3 A, Row Access, Reed Relay Matrix Module for SwitchBlock
781420-15
Reed Relay
4x86, 0.3 A, Row Access, Reed Matrix Module for SwitchBlock - The SWB‑2815 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
Day Camera Testing
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CI Systems' CCD test stations are used to carry out all the necessary tests to verify and compare the quality of a CCD based camera. These stations are based on CI Systems' reflective collimators, Visible Radiation Sources, special targets and integrated software, to project standard patterns with known geometry and intensity to the Unit Under Test. As a result, these stations are turnkey solutions for the CCD camera testing needs.
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Product
AC Fuel Flow Signal Generator
TA-100
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The TA-100 signal generator was designed to facilitate testing of aircraft fuel flow indicators that require two input signals designated as “Drum” and “Impeller”. This generator provides both signals so as to provide a direct interface to the fuel flow indicator under test. The generator also provides switched power out to the unit under test as well as a 5v source for testing the bezel lighting. The original design was built around the requirements for the AMETEK series indicators (pn: 10171 series). This generator simulates a reference and a time delayed signal of appropriate amplitude for an indication of up to 1200pph for the indicator under test. The “PPH Select” switch provides fixed signal delays representing 0, 200, 400, 800, 1000 and 1200pph flow rates respectively, this provides the mechanic with an expedient check of the indicators accuracy. The “PPH Adjust” control allows the mechanic to vary the signal delay throughout the full range and serves as a good method for checking of pointer smoothness from stop to stop. The unit’s front panel also provides test jacks to monitor the “FDR Output” as well as the drum and impeller signals. The TA-100 requires only 28Vdc to operate. This generator provides a very economical approach to any repair facility or flight department as it becomes an alternative to purchasing two bench top signal generators. The TA-100 generator at the very least can provide a simple functional test and eliminate the high cost of exchanging an indicator as a function of troubleshooting the aircraft system.
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Product
SIMRC - RS232 to I2C Converter PCB
1080-001
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Pickering Interfaces Series 1000 SIM Reed Relay Cards offer a choice of switching configurations using low cost industry standard SIM connectors. They are ideal for placing switching systems in fixtures close to the unit under test.
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Product
Torque Measuring and Monitoring System
WISER 4000
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TECAT Performance Systems, LLC
The WISER 4000 system is the latest release of TECAT’s low-cost, ultra-low power and extremely accurate torque sensor. The wireless system has the optional ability to measure 3-axis acceleration, barometric pressure and ambient temperature, all within the same incredibly small footprint. The 4000 includes on-board data logging without PC or DAQ connectivity, and remote flash capability, which enables firmware upgrades without removing the system from the unit under test. Featuring shunt calibration, TECAT’s latest WISER system is designed to simplify instrumentation verification for users, while allowing them to check calibration of the system in the field. In addition, the WISER 4000 has been enhanced with two additional outputs, a higher-speed recording, and is available with custom-built remote enclosures to protect the system’s remote unit and battery from damage due to debris.
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Product
M/MA Module Carrier
VX405C
Carrier Board
The VX405C carrier provides the mechanical and electrical interfaces between the VXIbus and up to six (6) VITA 12-1996 standard M/MA-Modules. The carrier provides VXI register configuration and access to the M/MA-Module I/O space and memory (if present). Each M/MA-Module is controlled separately and appears as a different logical address in the VXI environment. Over 100 M/MA-Modules are available that can provide custom interfacing to the unit under test (UUT). Up to six (6) unique interfaces may be provided in a single VXI slot.
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Product
Platforms
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The use of switching systems to route instrumentation and stimulus signals to appropriate test points on a unit under test has a very crucial role to play in most electronics test systems. The sharing of test resources, connection of calibration references, load management, and many other functions are all managed by the switching system, the switching system acts as the interface between the unit under test (UUT) and the test equipment.
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Product
SWB-2833, 4x71, 2 A, Electromechanical Relay Matrix Module for SwitchBlock
781421-33
Relay Matrix Module
4x71, 2 A, Electromechanical Relay Matrix Module for SwitchBlock - The SWB‑2833 is an electromechanical relay matrix card for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
LXI Low-Frequency Matrices
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Our LXI low-frequency matrices provide complete flexibility for connecting test equipment and the unit under test (UUT)together and are compliant with LXI Standard 1.4
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Product
PXI RF Multiplexer Switch Module
RF Multiplexer
PXI RF Multiplexer Switch Modules are ideal for high-channel-count applications that need to connect measurement or signal generation instruments to various test points on devices or units under test(DUTs or UUTs). PXI RF Multiplexer Switch Modules use a variety of relay types, including electromechanical armature relays, reed relays, field-effect transistor(FET) relays, and solid-state relays, each with their own benefits, allowing you to choose a multiplexer that fits your requirements. To program the switches, you can use the IVI-compliant NI-SWITCH driver software, complete with help documentation, example programs, and a soft front panel application for interactive control of switches. For intelligent management of complex switch systems, NISwitch Executive provides additional software tools to help you design, build, and deploy your switching system.
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Product
Energy Saving System
ECO-Vibe neo
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ECO-Vibe neo has been designed for an eco-friendly vibration test system. The test conditions with a vibration test system depends on a unit under test. Generally, the exciting force required for performing a vibration test can be calculated by the product of mass (e.g. test article, jig, table, etc.) and test acceleration. But, when the required exciting force is smaller than the maximum rated exciting force of the vibration test system, the field power supply that the constant current has to be continuously provided to produce the DC magnetic field constitutes a large part of power consumption compared with the drive power for the moving element. ECO-Vibe neo can reduce the power consumption by choosing the exciting force in this case. In addition, you can enjoy a reduction merit of the running cost from the first year when the system is introduced because initial cost is zero.
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Product
SWB-2810, 4x43, 1 A, No Row Access, Reed Relay Matrix Module for SwitchBlock
781421-10
Reed Relay
4x43, 1 A, No Row Access, Reed Matrix Module for SwitchBlock - The SWB‑2810 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
Universal Breakout Test Fixture
CA-323
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The CA-323 Universal Breakout test fixture was designed to provide, as the name suggests, a universal test solution for aircraft trouble-shooting. The unit gives the technician the ability to monitor (100) different conductors or open an individual conductor for simulation or measurement. Any avionics component can be extended and in many cases with only a voltmeter and oscilloscope the operation in question of the Unit Under Test can be determined.
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Product
SWB-2816, 8x46, 0.3 A, No Row Access, Reed Relay Matrix Module for SwitchBlock
781421-16
Reed Relay
8x46, 0.3 A, Reed Matrix Module for SwitchBlock - The SWB‑2816 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
QuadraPaddle 90 Series Modules
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The versatility of VPC's QuadraPaddle twin female contacts provide four beams per end to ensure signal integrity from instrumentation to the Unit Under Test (UUT).Twin male contacts interconnect to ribbon cable, headers, and other standard connectors.Makes system configuration a simple “plug & play” operation and delivers high density, high performance interconnectivity at a lower cost per point.
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Product
Multiple Channel Burn In Power Supply
MCPS
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The most important features of this burn in power supply is its ability to hold a constant output for each channel even in the event that a unit under test on one channel may short and fail. Since each channel has it''s own transformer, no glitches or voltage spikes can get into any of the other channels. This image shows the results as the second channel from the left is shorted with a small wire and the circuit breaker pops out. Used for burn-in testing and other timed testing where power isolation is required. Very basic simple circuit, see schematic below. Cleans and frees up benchtops, burn in racks and work space clutter. Available in benchtop or rackmount.
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Product
Press Down Rods Bed of Nails Testers
Prober Press Rods Family
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Production volume test fixture with swappable test plates, front and rear panel inlays, and multi-testing compatibility with process carrier pallets. Swappable test plates provide the ability for one fixture base to support a variety of units under test. Interchangeable front and rear panel inserts provide further customization. Interoperability with process carrier pallets provide multiple board testing capabilities, panelized testing, and flex circuit testing. A selection of interfaces to general testing equipment provide for a wide selection of customized testing features.
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Product
Adjustable Press Plate Bed of Nails Testers
Prober Adjustable Family
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Production volume test fixture with swappable test plates, front and rear panel inlays, and multi-testing compatibility with process carrier pallets. Swappable test plates provide the ability for one fixture base to support a variety of units under test. Interchangeable front and rear panel inserts provide further customization. Interoperability with process carrier pallets provide multiple board testing capabilities, panelized testing, and flex circuit testing. A selection of interfaces to general testing equipment provide for a wide selection of customized testing features.
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Product
Averna LAUNCH
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Are you optimizing your time managing your smart data? Averna Launch consolidates all test data from your smart factories and delivers results in both real-time and user-friendly reports. By automatically detecting the unit under test (UUT) Launch runs all required test sequences, predetermined by you.
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Product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Product
Multiport JTAG Tester
XJQuad
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XJQuad is a 4-port version of the XJLink2 USB-to-JTAG controller targeted at PCB manufacturers. It is supplied with XJRunner software for running XJDeveloper test systems. With a range of special features it is particularly suitable for concurrent/parallel testing on the production line. Each of the four ports has a high-speed interface which can be connected to up to four JTAG chains on each Unit Under Test (UUT).
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Product
Thermal Shock Testing
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DATASYST Engineering & Testing Services, Inc.
Thermal shot testing is a accomplished through the use of two-zone temperature chambers where the unit under test is shuttled between chambers.
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Product
SWB-2834, 8x34, 2 A, Electromechanical Relay Matrix Module for SwitchBlock
781421-34
Relay Matrix Module
8x34, 2 A, Electromechanical Relay Matrix Module for SwitchBlock - The SWB‑2834 is an electromechanical relay matrix card for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
USB JTAG controller
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The small, lightweight design means the XJLink2 can easily be moved to the Unit Under Test (UUT). Advanced features, like their programmable JTAG signal pin position, switchable power supply and auto signal skew, make it easy to connect to a wide range of circuit boards. Simple to install and use due to the USB plug-and-play ability.
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Product
Second Level Protection Product Range
RO-1000
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Rovsing has developed a range of Second Level Protection (SLP) products to ensure that the electric subsystem of the unit under test is not inadvertently damaged by the test equipment. Our SLP solutions are separated into High and Low current variants.
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Product
Massively Parallel Board Test System
I7090
In-Circuit Test System
The Keysight i7090 is a massively parallel board test system designed to help PCBA test engineers improve manufacturing efficiency while reducing costs. Unlike traditional in-circuit testers, the i7090 supports up to 20 In-Circuit Test cores in parallel, which means engineers can test multiple Units Under Test (UUTs) simultaneously without the need for multiple systems. This reduces scaling and infrastructure costs and frees up valuable testing space.
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Product
Temperature & Humidity Testing
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DATASYST Engineering & Testing Services, Inc.
DATASYST can simulate both high and low temperature with humidity conditions. Cycle rates are dependent upon individual chamber capabilities and whether or not a unit under test is powered or not. DATASYST provides humidity testing for a range of industry specifications and can work with you on your customized testing requirements.
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Product
Interface Panel for SLSC
THROUGHPOINT™
Interface
Bloomy's ThroughPoint™ Interface Panel provides a simple, yet highly-flexible connection between the unit under test and resources in a National Instruments Switch/Load/Signal Conditioning (SLSC)-based test system.
