Depot Level Test
faults diagnosis down to nth degree for repair analysis and recovery.
See Also: System Level Test, Level, SRU
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In-Circuit Tester
Sparrow MTS 30
The Sparrow MTS 30 is a 19“ test system that can be integrated into any standard rack. The In-Circuit tester can also be used as benchtop test system. With this compact and flexible tester you can perform both analog and digital In-Circuit and functional tests.
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Level Test Set
ET 91
100 Hz to 2.4 MHz selective/wideband Level Meter & Generator,with Spectrum Analyser and Z/RL/LCL Bridge
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Wafer Level Test
Double sided wafer inspection system is an automatic inspection system for afterdicing wafer chip. It can do double side inspection simultaneously. The appearance defects of wafer chip are clearly conspicuous by using advanced illumination technology. Illumination and camera acquisition mode can be adjusted for various wafer process, like vertical chip or flip chip.
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Level System
Universal II
The Universal II level transmitter offers increased reliability, low maintenance and an intrinsically safe design for dependable level measurements in all kinds of process liquids, slurries, granulars and interfaces.Universal IIThe Universal II is a two wire level transmitter that eliminates the need for line power in the field and saves costs for additional hardware. It provides reliable level measurements in all kinds of process liquids, slurries, granulars and interfaces.When powered from an approved source this level transmitter can be made intrinsically safe. Its rugged contruction resists corrosion and abraision. The no moving parts design eliminates break downs.The Universal II level transmitter utilizes RF Admittance technology with manual calibration and a 4 – 20 mA output signal. The patented Cote-Shield circuitry ensures accuracy and reliability regardless of product build-up on the level transmitter.This level system is unaffected by changes in the process material density, pressure, or temperature variations.
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Scienlab Battery Test System – Pack Level
SL1700A Series
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increase the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 90 and 270 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Fully-Automated CTIA-Compliant OTA Test System
TS8991
The R&S®TS8991 OTA performance test system measures the spatial radiation and sensitivity characteristic as specified by CTIA and 3GPP.The system software provides ready-to-use test templates for OTA measurements and supports all wireless standards.The integrated report function collects all measured test data such as graphics or numeric results, test environments, EUT information and hardware setup in one document.
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In-Circuit Test (ICT) Fixtures
At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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System Level Test and Burn-in Solutions
System Level Test (SLT) is a paradigm shift from traditional structural and functional testing. The device is tested in a complete, integrated system to evaluate its compliance against specified requirements. The system approach allows for higher and more cost-effective test coverage especially for multi-function and non-deterministic devices. It also brings new integration and test challenges like: ..Designing test fixtures on Burn-in Boards with system components ...
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Wafer Level Test Handler
Kronos
Wafer level test handler for 6/9DOF sensors with real stimulus. Very high UPH capacity and the lowest cost of test (COT). KRONOS is one of the only wafer level test solutions for motion sensors with real stimulus.
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ESD Test System
58154 Series
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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Dielectric Test Fixture
16451B
The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
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Test Fixture
16047E
Perform impedance evaluation of lead type devices of up to 120 MHz; includes a guard and a shorting plate
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Communications Test System for Frontline Diagnostics
CTS-2750
The CTS-2750 is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The field-upgradeable, software-defined architecture features easy-to-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets can be created easily using the included TestEZ® software suite.
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Universal OTP Functional Test System for the Production of Level and Fluid Sensors
Multifunctional function tester with parallel test function based on the LXinstruments OTP2 system platform. The system is used for assembly, final test and calibration of liquid and level sensors for commercial vehicles, construction machinery and shipbuilding in a high mix / medium volume environment.
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6TL29 Semi-Automated Test Platform
AQ377
- Compact, transportable and modular test platform.- Ready for ICT, FCT, Boundary Scan, HiPot, Vision or any combination of the previous technologies.- Mass interconnect 9025 Receiver from Virginia Panel.- 100% Compatibility with Inline Test Fixtures (P/N: AT799, AN133 and EB773).- Free available rack space: 47U height- Multi-stage pressure at 3 levels.- FastATE Technology & YAV Modules compatible.- Phi6 Dispatcher Interface.- CE Compliant.
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Laser Levels
Use a laser, an amplified, focused beam of light emitted from a solid-state device called a diode.
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Liquid Test Fixture
16452A
The 16452A provides accurate dielectric constant and impedance measurements of liquid materials. The 16452A employs the parallel plate method, which sandwiches the liquid material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixure.
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In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
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Level Sensors
Intelligent solutions for level and point level measurementWhether for continuous level measurement, point level measurement or both – SICK offers a wide range of solutions for process engineering, storage, and protection. Based on the installation situation, medium properties, and environmental conditions, SICK provides sensors that ensure efficient processes. As the provider of one of the broadest technology portfolios, SICK brings its knowledge to the forefront.
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Electronics Testing Solutions
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Combinational Base Test Platform
6TL24
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid-volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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Sound Level Meter
SoundTrack LxT N/Forcer
For Community Noise Ordinance Enforcement and Nuisance Complaint Response. Portable, compact and simple to use, the Larson Davis LxT N/Forcer Sound Level Meter produces accurate, citation-ready noise data on-the-spot, with its compact portable printer.
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Entry level potentiostat-galvanostat
VERTEX
The Vertex is an entry level potentiostat/galvanostat with optional FRA/EIS and optional I/O port. Its price easily matches its application in educational and applied electrochemistry. A complete suite of IviumSoft control and data processing software is included (for Windows based PC's).
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Level Measurement
HighReach Measuring & Controlling System Co.,Ltd
The process of measuring the level of a liquid or solid material inside a vessel for monitoring and process control.
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Radar Level Transmitter
DR6400
The DR6400, FMCW 24-26 GHz open air radar is a market entry level transmitter for solids from granulates to rocks. This model has proven PP Drop antenna design which is insensitive to product build-up.
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Sound Level Test System
In a world where precision and performance rule, measuring and controlling sound levels can be crucial to the success of your product or project. The team at Integrated Test & Measurement (ITM) have developed a customized solution that not only measures and collects sound-level data, but will help your team identify the specific components causing all that noise.
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Radar Level Transmitter
DR6500
The Drexelbrook DR6500 is a two-wire open air radar level transmitter for measuring level in applications with powder and dusty atmosphere.
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Advanced SoC/Analog Test System
3650
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Radar Level Gauge
HRRD730 Series
HighReach Measuring & Controlling System Co.,Ltd
At The Radar Level gauge Antenna emits and Narrows at The Microwave Pulse. This Pulse propagates in Space AT at The Speed of Light. The When IT Encounters at The Surface of at The the Measured Medium, Part of the ITS Energy IS the REFLECTED the Back and Received by at The Same, Antenna. At The Time interval The Between the transmitted pulse and the received pulse is proportional to the distance from the antenna to the surface of the measured medium.Because the electromagnetic wave propagation speed is extremely high, the time interval between the transmitted pulse and the received pulse is very small (on the order of nanoseconds). It is difficult to confirm. The 90X series 26G radar level gauge uses a special demodulation technology To accurately identify the transmitted pulse and the time interval of the pulse is received to further calculate the distance of the antenna from the surface of the measured medium.
