Test Heads
1) interchangeable assembly connecting test signals between DUT and ATE. 2) representation of a human head. 3) provide network test access.
See Also: Heads, Test Probes
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RSE Wireless EMC Spurious Emission
TS8996
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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LVDT Displacement Sensors With Ball Swivel Heads
INELTA Sensorsysteme GmbH & Co. KG
This LVDT Series is made for a rough, industrial use. The housing having a diameter of 20mm is fastened "floating" to the application using two ball swivel heads. There is a diversity of displacements up to 200m possible.
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High Temperature Component Test Fixture
16194A
Measure both axial/radial leaded devices and SMD within the temperature range from -55 to +200°C.
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Hydrostatic Head Tester
TESTEX Testing Equipment Systems Ltd.
Hydrostatic Head Tester, used for determining the resistance of fabrics (canvas, coated fabrics, cover cloth, rainproof clothing fabrics and geotextile materials) and films to water penetration under pressure while firmly clamped in the test rig of standard area, by means of dynamic test method and static test method.
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Motorised and Automated Probe Heads
Motorised heads enable automated, repeatable re-orientation of probes to allow access to features on all faces of the part, improving the capability of the CMM and maximising productivity.
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WLCSP Probe Heads
Smiths Interconnect offers Wafer Level Chip Scale Package (WLCSP) Probe Heads utilizing spring probe technology which provide high parallelism in test, superior signal integrity and high speed / RF testing capability.
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High Power Optical Head With Integrating Sphere
81628C
The 81628C High-Power Optical Head features an integrated sphere that enables it to handle power levels up to +40 dBm (with heat sink), across 800 nm to 1700 nm wavelength range. It provides the highest accuracy at high power within the family.
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Display Driver Test System
T6391
High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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Adjustable Distance Detecting Head Laser
LV-S31 Series
Adjustable Distance Detecting Head Laser. Bright output indicator. 0.08" Spot Diameter. Unaffected Target Color
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Universal Scanning Head
CF106
Calmet Smart Calibration Devices
Universal miniature scanning head for detecting (counting) impulses from inductive, LED and LCD energy meters. Additionally it enables counting of manually triggered impulses (Start/Stop push button function). Sometimes (when access is difficult) it is the only way to count pulses from inductive, LED and LCD meters.
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Isocratic Pumps - Single Headed, Positive Displacement Piston Pumps
ReaXus MX Class
The economical MX Class consists of single-headed, positive displacement piston pumps incorporating additional features for challenging applications. With pressure capability up to 5,000 psi, the MX Class can be used in both analytical and smallscale preparative HPLC separations. Further applications include demanding metering and dispensing, as well as Sample Injection, Infusion, or Cone Wash for Mass Spectrometers. Standard fluid path material is Stainless Steel.Features include available pressure monitoring with automatic pressure compensation, Pulse Dampener, integrated Prime-Purge Valve, interactive keypad control, and complete PC control and status through RS-232 and Micro USB 2.0 ports. Requiring minimal bench space for the performance, the MX Class will easily integrate into most workspaces.
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Mixed Signal Battery Test System
The Mixed-Signal Battery-Test System is an automated test platform designed to meet today’s advanced battery test requirements. The platform is ideal for testing a range of battery cells and packs, and can be used in applications such as research and design, quality control, and end-of-line manufacturing. Its distributed architecture provides a scalable solution with configurable system components to accommodate specific applications.
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Constant Pressure Dual Head Pump
ReaXus CP Class
The high performance CP Class consists of dual-headed, positive displacement piston pumps with constant pressure control, covering a wide range of flows, with pressures up to 25,000 psi. Standard fluid path material is Stainless Steel. Other available features include Hastelloy fluid path with jacketed pump heads for temperature controlled processes.The CP Class pumps are widely used for Liquid Chromatography Column packing for 4.6 mm columns, as well as many process applications. The constant-pressure feedback loop automatically adjusts solvent flow to maintain constant system pressure and allows the user to select a wide range of process parameters, including desired pressure set point, ramp rate, and upper flow rate limit.The CP Class is available as standalone units, and also with the Teledyne SSI Column Packing System (called Pack-in-a-Box). Features include:20 mL packing reservoir assembly4.6 mm pre-column assemblyTwo (2) 4.6 mm x 150 mm columns10 gram bottle of C18 stationary phaseBracket assembly to mount packing reservoir to pumpQuick-set disk to allow full control of the packing process through a computerTubing, cables and other necessary fittings for connectionsWith 5 mL/min, 24 mL/min, and 100 mL/min versions, the CP Class will meet most Liquid Chromatography Column packing and process needs.
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Thermocouples With Terminal Heads
Thermocouples with Terminal Heads including Mineral Insulated, Industrial Style & remote wall mounted housing thermocouples.
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PXI Functional Test System
U8989A
The TS-8989 PXI functional test system is an integrated, all in one switch, load and measurement system in a box for high voltage or current mechatronics functional test applications of up to 104 nodes and 40A current loads.
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Radio Frequency, Communications, & Navigation Test Systems
Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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Kelvin Test Contactor/Probe HEad
cPython
cPython™ Kelvin contactors and probe heads provide superior electrical and thermal performance with significant cost savings. This makes cPython Kelvin ideal for lab and high-volume production test of analog and mixed signal integrated circuits – for applications such as power control, A-D and D-A converters, audio, video, power amplifiers, photonics, optical MEMS and sensors.cPython Kelvin probes are electrically isolated and mechanically independent force and sense paths for true Kelvin contact for taking accurate measurements, even under high current conditions. These robust probes provide hundreds of thousands of insertions or touchdowns, and a bandwidth up to 26 GHz.
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Chromapoint Large Slope Angle Optical Heads
EVEREST
Sciences et Techniques Industrielles de la Lumière
Born from the last STIL innovation, EVEREST chromatic confocal sensor head contains the best of research and development in terms of sensors.EVEREST series offers an extended measurement range with the highest performances.
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Wireless Device Functional Test Reference Solution
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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Next Generation Subsea Attitude and Heading Reference Systems
TOGS
The new TOGS subsea navigation system is built on core TSS fibre optic gyro (FOG) navigation technology with significant improvements in efficiency and functionality. It is available in three standard heading accuracy variants: 0.1° (TOGS1), 0.3° (TOGS3) and 0.5° (TOGS5), all rated for operational depths to 4,000m or 6,000m. Attitude data is delivered via accurate roll/pitch measurement capabilities of 0.01° (TOGS1) and 0.05° (TOGS3 and TOGS5), and a heave performance of 5cm or 5%.
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Erase Magnetic Recording Heads
International Electro-Magnetics, Inc.
*Dual Gap Ferrite Cores*Cassette - 2" Formats*MultiTrack Interlace*Full Track 1" Video
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Remote Radio Head
CMPHEAD
The separate one-box tester and the R&S®CMPHEAD30 RRH concept allow short RF cable lengths for an optimal link budget in radiated test environments. This approach enables testing of fully assembled FR2 devices and RFICs with both IF and mmWave RF interfaces. The multi-band R&S®CMPHEAD30 covers all important FR2 bands
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SoC Test Systems
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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SoC/Analog Test System
3650-S2
The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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No. 10A x 1/2 Phillips Pan Head for Chassis Slides/Support Angles.
HW-53
HW-53: Package of 100 screws No. 10A x 1/2 Phillips Pan head for chassis slides and support angles.
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Custom Magnetic Recording Heads
International Electro-Magnetics, Inc.
We have manufactured over 5,000 different head designs. If we don't have one to suit your requirements, we will design and build to your specification. Our toolroom is well equipped to produce precision parts, and our design projects have included flux sensing systems, magnetic disk encoding, and electronic test equipment.
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Laser Head
5517B
The Keysight 5517B is used primarily in VME and PC based laser interferometer systems where the velocity of motion is slower, such as machine tool applications. Please contact Keysight for custom requirements.
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Kelvin Test Contactor/Probe Head
Gemini
At 3.22 mm test height, the Gemini™ Kelvin test contactor is an excellent all-around spring probe with low inductance, high bandwidth, and excellent current-carrying capacity. The device under test (DUT) side tip design accurately maintains its 100 µm spacing for the life of the probe. Customers report typical probe life of 500 k to 800 k package insertions, or over 2M touchdowns at wafer-level test. The offset tip allows manageable board layout with a board-side spacing of 0.4 mm.Gemini Kelvin probes and contactors provide a first-rate solution that effortlessly makes reliable, true Kelvin contact for high-volume final test of both singulated packages and wafer-level devices. Gemini Kelvin is an ideal solution for devices such as power controllers, A-D and D-A converters, power amplifiers and audio and video circuits.
