Functional Test Systems
See Also: Functional Test, Functional ATE
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LVDT With Pneumatic Function
INELTA Sensorsysteme GmbH & Co. KG
2-3 bar compressed air moves the strings out the integrated return spring pulls the output back into the housing
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Manual Flying Probe Test Systems
They provide flexible measurement technologies like Kelvin and high voltage tests in combination with low tooling costs. atg Luther & Maelzer offers a wide range of different systems starting from standard systems with 8 heads up to oversized systems with 24 test heads.
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Functional Safety
More and more devices, machinery, plants and systems contain electrical, electronic and/or programmable electronic systems and components. Malfunctions – also in sub-systems and components – can lead to hazardous situations for people, machines and the environment. If these systems contribute to the safety of the product, it is necessary that they function correctly under all circumstances (including possible failures and malfunctions). One speaks of functional safety in this context.
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Dynamic and Fatigue Testing Systems
Instron offers an extensive range of fully-integrated dynamic and fatigue testing systems from 1000 N up to 5000 kN. Incorporating servohydraulic, servo-electric and linear motor technologies, these test instruments cover a broad range of fatigue, dynamic, and static testing applications. These applications include high-cycle fatigue, low-cycle fatigue, thermo-mechanical fatigue, fracture mechanics, crack propagation and growth studies, fracture toughness, bi-axial, axial-torsional, multi-axial, high strain rate, quasi-static, creep, stress-relaxation, and other types of dynamic and static tests.
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Voice Quality Test System
MultiDSLA
MultiDSLA solution is a state of the art measurement system for Voice Quality Testing and Performance Assessment used by many organisations as the reference measurement in applications ranging from core technology development to network operations.
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Analog IC test system
A paradigm shift has been occurred in Japan’s major brand WL25 series tester. Ultimate simple system is available by effective analog pin architecture.This cost performance system is covered analog IC extensively, which are high accuracy, speed and multi-site test function.
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Test Systems
In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Gas-insulated AC Test System
Yangzhou Power Electric Co., Ltd
The test system is used to do AC voltage withstand test and PD measurement for high voltage insulation products, combined electrical equipment, instrument transformers, etc.
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Function Generators
Scientific Mes-Technik Private Ltd
Scientific offer wide range of function generators from 3 MHz to 10 MHz in general purpose and multifunction. Selection of waveform shapes apart from standard sine, triangle , square to ramp, pulse are available. SM5071 , SM5074 , SM5061 & SM5075 have built-in auto ranging frequency counter. The outputs are protected against short circuits and overload.
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System Test
Testing a complete system is very different from unit and integration test. It starts with the V model that defines the system requirements, and this needs an effective system test capability that includes both the system and the environment around it. If the system has interfaces to the outside world, communications links or human control, these interfaces have to be tested.
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Test System
4003 TLP+™
The Model 4002 TLP+™ test system was the first turn-key commercial TLP developed for the ESD industry and has remained the leader in the ESD square pulse testing field since this method was first introduced in 1989. This tester is the ultimate design and analysis tool for ESD protection circuits. It provides Pulse Curve Traces of circuit characteristics which simulate ESD tests. This allows you to see into a chip’s operation taking out the guesswork which speeds your design and minimizes lost time.
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Function Generator
FG-281
The FG-281 is a function generator using DDS (Direct Digital Synthesis) for superior frequency stability. Possible to output sign wave and square wave at wide oscillation range from 10mHz to 15Mhz. A 10-key keypad provides user-friendly operation even though various functions are available. Possible to memorize 9 kinds of panel settings and they can be recalled easily. RS-232C and GP-IB interfaces are available as standard and enable to be controlled by PC (full remote control).
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Function / Arbitrary Waveform Generator
DG1000Z Series
DG1000Z series function / arbitrary waveform generator is a multi-functional signal generator which integrates function generator, arbitrary waveform generator, noise generator, pulse generator, harmonic generator, analog / digital modulator, frequency meter and other functions.
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Function Generators
Waveform : Sine, Triangle, Square, Pulse, Sawtooth, Ramp 0.2Hz-150MHz EXT Frequency Counter(Option : 1:6 GHz or 2.7GHz) Self made insert ASIC Function : Total, RPM, Period, LPF, COUPL(AC/DC), ATT(X10) Fast,High-Resolution, 8Digits LED display Internal or External AM,FM Modulation Internal or External Burst and Linear Sweep Countrol from 1 : 1 to 100:1 TTL/CMOS Leveled Square Wave Output Maximum Attenuation of 20 dB cna be obtained Output impedance : 50 INPUT SENSITMTYKHz Range : 100mVms, MHz Range : 300mVms SWEEP WIDTH : Variable from 1:1 -100:1 RATE : 0.5Hz - 50Hz(20ms-2s) INTERNAL : Linear Bilt-in 5digits Green LED display
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Mixed Signal Test Systems
MTS2010i
The MTS-2010i are a cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process.
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Test Systems
Testing is more than just finding defects on Printed Circuit Boards. It is also about how to predict defects before they occur. A true economy can only be achieved when you see testing as an integrated part of manufacturing. To achieve this we provide Advanced Diagnostic Tools and Electronic Manufacturing Systems (EMS) that integrate testing with design, manufacturing, and repair.
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Automatic Circuit Breaker Test Systems
UPA-1 (UPA-3)
These portable systems for primary injection testing of circuit breakers which are used in in AC circuits of industrial frequency.
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Automated Test System
Automated Test System is a production-ready solution that combines test software and various hardware for validation test in both manufacturing and R&D. The solution provides a high performance and cost-effective system based on National Instruments technology.
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Nanomechanical Test Systems
Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others.
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Transformer Test System
Transformer testing instrument, can be used as a stand-alone device and has the highest efficiency. Can be used in power transformers, network communication transformers, etc.
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High Temperature Component Test Fixture
16194A
Measure both axial/radial leaded devices and SMD within the temperature range from -55 to +200°C.
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Automatic Transformer Test System
TH2829AX-48
Changzhou Tonghui Electronic Co., Ltd.
Number of Test PIN: 48 ■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz ■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms) ■ Test Speed: max. 13ms ■ 7-inch TFT LCD display with a resolution of 800×RGB×480
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Ferroelectric Test System
RT66B
Radiant's Rt66B offers amazing performance at an affordable price. The Rt66B is a perfect entry level system for measuring Ferroelectrics. This system does include Radiant's famous Vision Data Management System which offers all the standard measurements of ferroelectrics including Hysteresis, Fatigue, Waveform, C/V, I/V, PUND and much more.
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Regenerative AC load function
61800 Series Optional Function
The regenerative AC load function consists of various modes such as CC Rectified mode, CP Rectified mode, CR mode, CC Phase lead/lag mode and CP Phase lead/ lag mode. The Rectified Mode is capable of simulating non-linear rectified loads with characteristics similar to Chroma 63800 series AC load where the voltage and current operate at the 1st and 3rd quadrant. The Rectified Mode supports both CC and CP functions with current, power and CF as parameter settings.
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Photoelectrochemical Test System
SolarLab XM
SolarLab XM is an application specific XM (Xtreme Measurement) product that is primarily focused on solar cell / photovoltaic research, developed in conjunction with Professor Laurie Peter of the University of Bath, UK.
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Nanomechanical Test System
Hysitron TI Premier
Bruker’s Hysitron TI Premier nanoindenter was specifically designed to deliver industry-leading, quantitative nanomechanical characterization within a compact platform. Built upon proven Hysitron technology, the TI Premier provides a broad suite of nanoscale mechanical and tribological testing techniques.
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Fixed Batteries (Constant Function)
Lifasa - International Capacitors, SA
Fixed compensation equipment has different variants depending on the type of enclosure / support and the configuration of the equipment (type of capacitor).
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At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
